Personal information
Activities
Education and qualifications (3)
Ph.D. Materials Science & Engineering
(Materials Science and Engineering)
Education
Source:
William Joost
B.S. Materials Engineering
(Materials Engineering)
Education
Source:
William Joost
M.S. Materials Science & Engineering
(School of Materials)
Education
Source:
William Joost
Works (13)
Surface and Coatings Technology
2018
|
Journal article
EID:
2-s2.0-85052431189
Contributors:
Stoyanov, P.;
Dawag, L.;
Joost, W.J.;
Goberman, D.G.;
Ivory, S.
Source:
William Joost
via
Scopus - Elsevier
Corrosion
2017
|
Journal article
EID:
2-s2.0-85020002273
Contributors:
Brady, M.P.;
Joost, W.J.;
Warren, C.D.
Source:
William Joost
via
Scopus - Elsevier
Minerals, Metals and Materials Series
2017
|
Book
EID:
2-s2.0-85040085646
Contributors:
Joost, W.J.
Source:
William Joost
via
Scopus - Elsevier
ECS Transactions
2017
|
Conference paper
EID:
2-s2.0-85030568669
Contributors:
Sarkar, R.;
Miller, E.;
Vickers, J.W.;
Randolph, K.;
Joost, W.;
Fitzgerald, N.;
Craig, K.;
Olson, D.;
Trinastic, J.;
Litombe, N.
Source:
William Joost
via
Scopus - Elsevier
Scripta Materialia
2017
|
Journal article
EID:
2-s2.0-84994627133
Contributors:
Joost, W.J.;
Krajewski, P.E.
Source:
William Joost
via
Scopus - Elsevier
Acta Materialia
2016
|
Journal article
EID:
2-s2.0-84951336321
Contributors:
Joost, W.J.;
Ankem, S.;
Kuklja, M.M.
Source:
William Joost
via
Scopus - Elsevier
Modelling and Simulation in Materials Science and Engineering
2015
|
Journal article
EID:
2-s2.0-84919665769
Contributors:
Joost, W.J.;
Ankem, S.;
Kuklja, M.M.
Source:
William Joost
via
Scopus - Elsevier
JOM
2015
|
Journal article
EID:
2-s2.0-84930753195
Contributors:
Kolli, R.P.;
Joost, W.J.;
Ankem, S.
Source:
William Joost
via
Scopus - Elsevier
Procedia Engineering
2013
|
Conference paper
EID:
2-s2.0-84891677256
Contributors:
Ankem, S.;
Wyatt, Z.W.;
Joost, W.
Source:
William Joost
via
Scopus - Elsevier
International Journal of Plasticity
2012
|
Journal article
EID:
2-s2.0-84869092447
Contributors:
Wyatt, Z.W.;
Joost, W.J.;
Zhu, D.;
Ankem, S.
Source:
William Joost
via
Scopus - Elsevier
JOM
2012
|
Journal article
EID:
2-s2.0-84868545695
Contributors:
Joost, W.J.
Source:
William Joost
via
Scopus - Elsevier
Journal of Applied Physics
2009
|
Journal article
EID:
2-s2.0-70350106761
Contributors:
Joost, W.;
Das, A.;
Alford, T.L.
Source:
William Joost
via
Scopus - Elsevier
Journal of Nanoscience and Nanotechnology
2006
|
Journal article
EID:
2-s2.0-33745617458
Contributors:
Herth, S.;
Joost, W.J.;
Doremus, R.H.;
Siegel, R.W.
Source:
William Joost
via
Scopus - Elsevier