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Works (25)
Applied Surface Science
2021
|
Journal article
EID:
2-s2.0-85102626658
Contributors:
Škuta, R.;
Matějka, V.;
Foniok, K.;
Smýkalová, A.;
Cvejn, D.;
Gabor, R.;
Kormunda, M.;
Smetana, B.;
Novák, V.;
Praus, P.
Source:
Daniel Cvejn
via
Scopus - Elsevier
grade
Preferred source
(of
2)
Scientific Reports
2021
|
Journal article
Contributors:
Smykalova, Aneta;
Foniok, Krystof;
Cvejn, Daniel;
Gorecki, Kamil Maciej;
Praus, Petr
Source:
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Web of Science Researcher Profile Sync
Catalysis Today
2021
|
Journal article
EID:
2-s2.0-85091257948
Contributors:
Cvejn, D.;
Martausová, I.;
Martaus, A.;
Přech, J.;
Veselý, O.;
Čejka, J.;
Lacný, Z.;
Nedoma, J.;
Martínek, R.
Source:
Daniel Cvejn
via
Scopus - Elsevier
grade
Preferred source
(of
2)
NANOCON Conference Proceedings - International Conference on Nanomaterials
2020
|
Conference paper
EID:
2-s2.0-85097158093
Contributors:
Cvejn, D.;
Smýkalová, A.;
Foniok, K.;
Matějka, V.;
Praus, P.
Source:
Daniel Cvejn
via
Scopus - Elsevier
grade
Preferred source
(of
2)
NANOCON Conference Proceedings - International Conference on Nanomaterials
2020
|
Conference paper
EID:
2-s2.0-85097155702
Contributors:
Kuzníková, Ľ.;
Peikertová, P.;
Hundáková, M.;
Mančík, P.;
Bednář, J.;
Cvejn, D.;
Rajhelová, H.;
Kukutschová, J.
Source:
Daniel Cvejn
via
Scopus - Elsevier
grade
Preferred source
(of
2)
Nanomaterials
2020
|
Journal article
EID:
2-s2.0-85078483335
Contributors:
Praus, P.;
Smýkalová, A.;
Foniok, K.;
Velíšek, P.;
Cvejn, D.;
Žádný, J.;
Storch, J.
Source:
Daniel Cvejn
via
Scopus - Elsevier
grade
Preferred source
(of
2)
Applied Surface Science
2020
|
Journal article
EID:
2-s2.0-85087272360
Contributors:
Praus, P.;
Smýkalová, A.;
Foniok, K.;
Matějka, V.;
Kormunda, M.;
Smetana, B.;
Cvejn, D.
Source:
Daniel Cvejn
via
Scopus - Elsevier
grade
Preferred source
(of
2)
Catalysis Today
2019
|
Journal article
EID:
2-s2.0-85050586667
Contributors:
Martausová, I.;
Spustová, D.;
Cvejn, D.;
Martaus, A.;
Lacný, Z.;
Přech, J.
Source:
Daniel Cvejn
via
Scopus - Elsevier
grade
Preferred source
(of
2)
IFAC-PapersOnLine
2018
|
Journal article
EID:
2-s2.0-85052885478
Contributors:
Nedoma, J.;
Fajkus, M.;
Martinek, R.;
Vanus, J.;
Kepak, S.;
Kahankova, R.;
Jaros, R.;
Cvejn, D.;
Prauzek, M.
Source:
Daniel Cvejn
via
Scopus - Elsevier
grade
Preferred source
(of
2)
Proceedings of SPIE - The International Society for Optical Engineering
2018
|
Conference paper
EID:
2-s2.0-85050604404
Contributors:
Jargus, J.;
Novak, M.;
Kepak, S.;
Cvejn, D.;
Vasinek, V.;
Martinek, R.
Source:
Daniel Cvejn
via
Scopus - Elsevier
grade
Preferred source
(of
2)
Turkish Journal of Electrical Engineering and Computer Sciences
2018
|
Journal article
EID:
2-s2.0-85062948580
Contributors:
Nedoma, J.;
Fajkus, M.;
Kahankova, R.;
Martinek, R.;
Dvorsky, M.;
Vanus, J.;
Vasinek, V.;
Cvejn, D.
Source:
Daniel Cvejn
via
Scopus - Elsevier
grade
Preferred source
(of
2)
Proceedings of SPIE - The International Society for Optical Engineering
2018
|
Conference paper
EID:
2-s2.0-85050623680
Contributors:
Jargus, J.;
Novak, M.;
Fajkus, M.;
Cvejn, D.;
Vasinek, V.;
Martinek, R.
Source:
Daniel Cvejn
via
Scopus - Elsevier
grade
Preferred source
(of
2)
IFAC-PapersOnLine
2018
|
Journal article
EID:
2-s2.0-85052901782
Contributors:
Vanus, J.;
Martinek, R.;
Nedoma, J.;
Fajkus, M.;
Cvejn, D.;
Valicek, P.;
Novak, T.
Source:
Daniel Cvejn
via
Scopus - Elsevier
grade
Preferred source
(of
2)
Proceedings of SPIE - The International Society for Optical Engineering
2017
|
Conference paper
EID:
2-s2.0-85038428513
Contributors:
Jargus, J.;
Nedoma, J.;
Fajkus, M.;
Novak, M.;
Mec, P.;
Cvejn, D.;
Bujdos, D.;
Vasinek, V.
Source:
Daniel Cvejn
via
Scopus - Elsevier
grade
Preferred source
(of
2)
Proceedings of SPIE - The International Society for Optical Engineering
2017
|
Conference paper
EID:
2-s2.0-85038421609
Contributors:
Novak, M.;
Fajkus, M.;
Jargus, J.;
Bednarek, L.;
Cubik, J.;
Cvejn, D.;
Vasinek, V.
Source:
Daniel Cvejn
via
Scopus - Elsevier
grade
Preferred source
(of
2)
Materials Chemistry and Physics
2017
|
Journal article
EID:
2-s2.0-85020430712
Contributors:
Dědková, K.;
Kuzníková, Ľ.;
Pavelek, L.;
Matějová, K.;
Kupková, J.;
Čech Barabaszová, K.;
Váňa, R.;
Burda, J.;
Vlček, J.;
Cvejn, D.
et al.
Source:
Daniel Cvejn
via
Scopus - Elsevier
grade
Preferred source
(of
2)
Proceedings of SPIE - The International Society for Optical Engineering
2017
|
Conference paper
EID:
2-s2.0-85038437179
Contributors:
Jargus, J.;
Nedoma, J.;
Fajkus, M.;
Novak, M.;
Cubik, J.;
Cvejn, D.;
Vasinek, V.
Source:
Daniel Cvejn
via
Scopus - Elsevier
grade
Preferred source
(of
2)
Physical Chemistry Chemical Physics
2017
|
Journal article
EID:
2-s2.0-85024113386
Contributors:
Seintis, K.;
Agathangelou, D.;
Cvejn, D.;
Almonasy, N.;
Bureš, F.;
Giannetas, V.;
Fakis, M.
Source:
Daniel Cvejn
via
Scopus - Elsevier
grade
Preferred source
(of
2)
Proceedings of SPIE - The International Society for Optical Engineering
2017
|
Conference paper
EID:
2-s2.0-85038420485
Contributors:
Novak, M.;
Nedoma, J.;
Jargus, J.;
Bednarek, L.;
Cvejn, D.;
Vasinek, V.
Source:
Daniel Cvejn
via
Scopus - Elsevier
grade
Preferred source
(of
2)
Journal of Materials Chemistry C
2016
|
Journal article
EID:
2-s2.0-84954124645
Contributors:
Bureš, F.;
Cvejn, D.;
Melánová, K.;
Beneš, L.;
Svoboda, J.;
Zima, V.;
Pytela, O.;
Mikysek, T.;
Růžičková, Z.;
Kityk, I.V.
et al.
Source:
Daniel Cvejn
via
Scopus - Elsevier
grade
Preferred source
(of
2)
RSC Advances
2016
|
Journal article
EID:
2-s2.0-84956938240
Contributors:
Cvejn, D.;
Michail, E.;
Seintis, K.;
Klikar, M.;
Pytela, O.;
Mikysek, T.;
Almonasy, N.;
Ludwig, M.;
Giannetas, V.;
Fakis, M.
et al.
Source:
Daniel Cvejn
via
Scopus - Elsevier
grade
Preferred source
(of
2)
Dyes and Pigments
2016
|
Journal article
EID:
2-s2.0-84942903067
Contributors:
Cvejn, D.;
Achelle, S.;
Pytela, O.;
Malval, J.-P.;
Spangenberg, A.;
Cabon, N.;
Bureš, F.;
Robin-Le Guen, F.
Source:
Daniel Cvejn
via
Scopus - Elsevier
grade
Preferred source
(of
2)
Journal of Materials Chemistry C
2015
|
Journal article
EID:
2-s2.0-84938510644
Contributors:
Cvejn, D.;
Michail, E.;
Polyzos, I.;
Almonasy, N.;
Pytela, O.;
Klikar, M.;
Mikysek, T.;
Giannetas, V.;
Fakis, M.;
Bureš, F.
Source:
Daniel Cvejn
via
Scopus - Elsevier
grade
Preferred source
(of
2)
Dalton Transactions
2014
|
Journal article
EID:
2-s2.0-84902683054
Contributors:
Melánová, K.;
Cvejn, D.;
Bureš, F.;
Zima, V.;
Svoboda, J.;
Beneš, L.;
Mikysek, T.;
Pytela, O.;
Knotek, P.
Source:
Daniel Cvejn
via
Scopus - Elsevier
grade
Preferred source
(of
2)
Central European Journal of Chemistry
2012
|
Journal article
EID:
2-s2.0-84867036835
Contributors:
Cvejn, D.;
Klimešová, V.;
Bureš, F.
Source:
Daniel Cvejn
via
Scopus - Elsevier
grade
Preferred source
(of
2)