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Education and qualifications (3)

Southeast University: Nanjing, Jiangsu, CN

2014-09-01 to present
Education
Source: Self-asserted source
Hao Yan

Southeast University: Nanjing, Jiangsu, CN

2012-09-01 to 2014-11-05 | Master of Engineering
Education
Source: Self-asserted source
Hao Yan

Dalian University of Technology: Dalian, Liaoning, CN

2007-09 to 2011-06 | Bachelor of Science
Education
Source: Self-asserted source
Hao Yan

Works (20)

Learning-driven Physically-aware Large-scale Circuit Gate Sizing

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
2024 | Journal article
DOI: 10.1109/TCAD.2024.3488577
Contributors: Yuyang Ye; Peng Xu; Lizheng Ren; Tinghuan Chen; Hao Yan; Bei Yu; Longxing Shi
Source: check_circle
Crossref

Timing-Driven Technology Mapping Approximation Based on Reinforcement Learning

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
2024 | Journal article
DOI: 10.1109/TCAD.2024.3379016
Contributors: Yuyang Ye; Tinghuan Chen; Yifei Gao; Hao Yan; Bei Yu; Longxing Shi
Source: check_circle
Crossref

FACT: Fast and Accurate Multi-Corner Predictor for Timing Closure in Commercial EDA Flows

2024-09-09 | Conference paper
DOI: 10.1145/3670474.3685941
Contributors: Jiajie Xu; Ziyue Han; Leilei Jin; Shiyang Wu; Hao Yan; Longxing Shi
Source: check_circle
Crossref

ICDaIR: Distribution-aware Static IR Drop Prediction Flow Based on Image Classification

2024-09-09 | Conference paper
DOI: 10.1145/3670474.3685942
Contributors: Pinquan Li; Yunfan Zuo; Yuwei Sun; Hao Yan; Longxing Shi
Source: check_circle
Crossref

Fast and Accurate Aging-Aware Cell Timing Model via Graph Learning

IEEE Transactions on Circuits and Systems II: Express Briefs
2024-01 | Journal article
DOI: 10.1109/TCSII.2023.3298917
Contributors: Yuyang Ye; Tinghuan Chen; Zicheng Wang; Hao Yan; Bei Yu; Longxing Shi
Source: check_circle
Crossref

Aging-Aware Critical Path Selection via Graph Attention Networks

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
2023-12 | Journal article
DOI: 10.1109/TCAD.2023.3276944
Contributors: Yuyang Ye; Tinghuan Chen; Yifei Gao; Hao Yan; Bei Yu; Longxing Shi
Source: check_circle
Crossref

Optimized matrix ordering of sparse linear solver using a few-shot model for circuit simulation

Integration
2023-11 | Journal article
DOI: 10.1016/j.vlsi.2023.102062
Contributors: Qian Chen; Yuyang Ye; Meng Li; Hao Yan; Longxing Shi
Source: check_circle
Crossref

FPGNN-ATPG: An Efficient Fault Parallel Automatic Test Pattern Generator

2023-06-05 | Conference paper
DOI: 10.1145/3583781.3590250
Contributors: Yuyang Ye; Zonghui Wang; Zun Xue; Ziqi Wang; Yifei Gao; Hao Yan
Source: check_circle
Crossref

Topology-Aided Multicorner Timing Predictor for Wide Voltage Design

IEEE Design & Test
2023-02 | Journal article
DOI: 10.1109/MDAT.2021.3117745
Contributors: Peng Cao; Tai Yang; Kai Wang; Wei Bao; Hao Yan
Source: check_circle
Crossref

Quality Driven Systematic Approximation for Binary-Weight Neural Network Deployment

IEEE Transactions on Circuits and Systems I: Regular Papers
2022-07 | Journal article
DOI: 10.1109/TCSI.2022.3164170
Contributors: Yu Gong; Hao Cai; Haige Wu; Wei Ge; Hao Yan; Zhen Wang; Longxing Shi; Bo Liu
Source: check_circle
Crossref

A Statistical Cell Delay Model for Estimating the 3σ Delay by Matching Kurtosis

IEEE Transactions on Circuits and Systems II: Express Briefs
2022-06 | Journal article
DOI: 10.1109/TCSII.2022.3157981
Contributors: Leilei Jin; Wenjie Fu; Hao Yan; Longxing Shi
Source: check_circle
Crossref

A Cascaded MEMS Amplitude Demodulator for Large Dynamic Range Application in RF Receiver

Micromachines
2021-12 | Journal article | Author
DOI: 10.3390/mi12121515
Contributors: Hao Yan; Xiaoping Liao; Chenglin Li; Chen Chen
Source: check_circle
Multidisciplinary Digital Publishing Institute
grade
Preferred source (of 2)‎

Research of a Compact MEMS-Based Integrated Detector for X-Band Application: Theory, Design, Fabrication, and Measurement

IEEE Sensors Journal
2021-11-15 | Journal article
DOI: 10.1109/JSEN.2021.3120408
Contributors: Hao Yan; Xiaoping Liao
Source: check_circle
Crossref

An Efficient Adaptive Importance Sampling Method for SRAM and Analog Yield Analysis

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
2020-12 | Journal article
DOI: 10.1109/TCAD.2020.2966481
Contributors: Xiao Shi; Hao Yan; Jinxin Wang; Jiajia Zhang; Longxing Shi; Lei He
Source: check_circle
Crossref

Balanced-Bridge Method for the Characterization of Dielectric Charging in RF MEMS Cantilever Switches

IEEE Sensors Journal
2020-02-15 | Journal article
DOI: 10.1109/JSEN.2019.2950104
Contributors: Hao Yan; Xiaoping Liao
Source: check_circle
Crossref

High-Power Handling Analysis of a Capacitive MEMS Power Sensor at <inline-formula> <tex-math notation="LaTeX">$X$ </tex-math> </inline-formula>-Band

IEEE Sensors Journal
2018-07-01 | Journal article
DOI: 10.1109/JSEN.2018.2839687
Contributors: Hao Yan; Xiaoping Liao; Chen Chen; Chenglin Li
Source: check_circle
Crossref

An Integrated Microwave Detector Based on MEMS Technology for X-Band Application

IEEE Electron Device Letters
2018-05 | Journal article
DOI: 10.1109/LED.2018.2817562
Contributors: Hao Yan; Xiaoping Liao; Chen Chen; Chenglin Li
Source: check_circle
Crossref

A Four-Port Microwave Phase Detector at X-band Based on MEMS Power Sensors

IEEE Sensors Journal
2017 | Journal article
DOI: 10.1109/JSEN.2017.2659802
Contributors: Hao Yan; Xiao Ping Liao; Hua Di
Source: check_circle
Crossref

A Dual-Channel MEMS Amplitude Demodulator for On-Line Detection in Radio Relay Station

IEEE Electron Device Letters
2017-08 | Journal article
DOI: 10.1109/LED.2017.2718005
Contributors: Hao Yan; Xiaoping Liao; Chenglin Li
Source: check_circle
Crossref

An <inline-formula> <tex-math notation="LaTeX">$X$ </tex-math> </inline-formula>-Band Dual Channel Microwave Phase Detector Based on GaAs MMIC Technology

IEEE Sensors Journal
2016-09 | Journal article
DOI: 10.1109/JSEN.2016.2587802
Contributors: Hao Yan; Xiaoping Liao; Di Hua
Source: check_circle
Crossref
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