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United States, Germany

Activities

Works (8)

Reliability effects of lateral filament confinement by nano-scaling the oxide in memristive devices

Nanoscale Horizons
2024 | Journal article
Contributors: Pascal Stasner; Nils Kopperberg; Kristoffer Schnieders; Tyler Hennen; Stefan Wiefels; Stephan Menzel; Rainer Waser; Dirk J. Wouters
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Synaptogen: A Cross-Domain Generative Device Model for Large-Scale Neuromorphic Circuit Design

IEEE Transactions on Electron Devices
2024 | Journal article
Contributors: Tyler Hennen; Leon Brackmann; Tobias Ziegler; Sebastian Siegel; Stephan Menzel; Rainer Waser; Dirk J. Wouters; Daniel Bedau
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Full factorial analysis of gradual switching in thermally oxidized memristive devices

Journal of Applied Physics
2024-06-21 | Journal article
Contributors: P. Stasner; T. Hennen; E. Gorbunova; A. Garcia Munoz; R. Waser; D. J. Wouters
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Stabilizing amplifier with a programmable load line for characterization of nanodevices with negative differential resistance

Review of Scientific Instruments
2022-02-01 | Journal article
Contributors: T. Hennen; E. Wichmann; R. Waser; D. J. Wouters; D. Bedau
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Erratum: “Study of the SET switching event of VCM-based memories on a picosecond timescale” [J. Appl. Phys. 127, 204501 (2020)]

Journal of Applied Physics
2021-10-28 | Journal article
Contributors: M. von Witzleben; T. Hennen; A. Kindsmüller; R. Waser; S. Menzel; U. Böttger
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Current-limiting amplifier for high speed measurement of resistive switching data

Review of Scientific Instruments
2021-05-01 | Journal article
Contributors: T. Hennen; E. Wichmann; A. Elias; J. Lille; O. Mosendz; R. Waser; D. J. Wouters; D. Bedau
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Comprehensive model for the electronic transport in Pt/SrTiO3 analog memristive devices

Physical Review B
2020-07-21 | Journal article
Contributors: Carsten Funck; Christoph Bäumer; Stefan Wiefels; Tyler Hennen; Rainer Waser; Susanne Hoffmann-Eifert; Regina Dittmann; Stephan Menzel
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Study of the SET switching event of VCM-based memories on a picosecond timescale

Journal of Applied Physics
2020-05-29 | Journal article
Contributors: M. von Witzleben; T. Hennen; A. Kindsmüller; S. Menzel; R. Waser; U. Böttger
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