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ResearcherID: X-5248-2018

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Works (4)

High-Performance Ellipsometry With 2-D Expanded Channels for Spectroscopy and Polarization Analysis

IEEE Transactions on Instrumentation and Measurement
2021 | Journal article
DOI: 10.1109/TIM.2021.3110323
Contributors: Huatian Tu; Yuxiang Zheng; Yao Shan; Yao Chen; Haotian Zhang; Pian Liu; Haibin Zhao; Rongjun Zhang; Songyou Wang; Jing Li et al.
Source: check_circle
Crossref

Measuring ultrathin metal coatings using SPR spectroscopic ellipsometry with a prism-dielectric-metal-liquid configuration

Optics Express
2019-03-18 | Journal article
DOI: 10.1364/OE.27.007912
Contributors: Yao Shan; Guohang Hu; Maria Luisa Grilli; Hongbo He; Meiping Zhu; Yuanan Zhao; Jianda Shao
Source: check_circle
Crossref

Measuring optical constants of ultrathin layers using surface-plasmon-resonance-based imaging ellipsometry

Applied Optics
2017-10-01 | Journal article
DOI: 10.1364/ao.56.007898
Part of ISSN: 1559-128X
Part of ISSN: 2155-3165
Source: Self-asserted source
Yao Shan

Polarization-independent almost-perfect absorber controlled from narrowband to broadband

Optics Express
2017-06-12 | Journal article
DOI: 10.1364/oe.25.013916
Part of ISSN: 1094-4087
Source: Self-asserted source
Yao Shan
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