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Works (8)

The early development of a combined micro- and full-field X-ray fluorescence analysis system using white X-rays at PLS-II

Journal of Synchrotron Radiation
2025-01-01 | Journal article
DOI: 10.1107/S1600577524011111
Contributors: Min Woo Kim; Kangwoo Ahn; Chang Hun Lee; Tae Joo Kim; JongYul Kim; Min-Su Han; Hyeong Uk Mo; Jina Kim; Hyun Wook Park; Ho Jae Kwak et al.
Source: check_circle
Crossref

Synchrotron X-ray fluorescence imaging study on chloride-induced stress corrosion cracking behavior of austenitic stainless steel welds via selective corrosion of δ-ferrite

Corrosion Science
2023-07 | Journal article
DOI: 10.1016/j.corsci.2023.111176
Contributors: Seunghyun Kim; Kangwoo Ahn; Gidong Kim; Sang-Woo Song
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Crossref

Stochastic chromatin packing of 3D mitotic chromosomes revealed by coherent X-rays

Proceedings of the National Academy of Sciences
2021-11-16 | Journal article
DOI: 10.1073/pnas.2109921118
Contributors: Daeho Sung; Chan Lim; Masatoshi Takagi; Chulho Jung; Heemin Lee; Do Hyung Cho; Jae-Yong Shin; Kangwoo Ahn; Junha Hwang; Daewoong Nam et al.
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Crossref

Oxidation-induced three-dimensional morphological changes in Ni nanoparticles observed by coherent X-ray diffraction imaging

Journal of Synchrotron Radiation
2021-03-01 | Journal article
DOI: 10.1107/S1600577520015945
Contributors: Kangwoo Ahn; In Hwa Cho; Junhyung Kim; Su Yong Lee; Daeho Sung; Chulho Jung; Changyong Song; Hyon Chol Kang; Do Young Noh
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Crossref

Phase separated bi-metallic PtNi nanoparticles formed by pulsed laser dewetting

Nanotechnology
2021-02-19 | Journal article
DOI: 10.1088/1361-6528/abc9e9
Part of ISSN: 0957-4484
Part of ISSN: 1361-6528
Source: Self-asserted source
Ahn Kangwoo

Laser-induced metastable mixed phase of AuNi nanoparticles: a coherent X-ray diffraction imaging study

Journal of Synchrotron Radiation
2020-05-01 | Journal article
DOI: 10.1107/s1600577520001617
Part of ISSN: 1600-5775
Source: Self-asserted source
Ahn Kangwoo

Characterizing the intrinsic properties of individual XFEL pulses via single-particle diffraction

Journal of Synchrotron Radiation
2020-01-01 | Journal article
DOI: 10.1107/s1600577519015443
Part of ISSN: 1600-5775
Source: Self-asserted source
Ahn Kangwoo
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The early development of synchrotron white-beam X-ray topography analysis for crystal investigations at Pohang light source-II

Journal of the Korean Physical Society
Journal article
DOI: 10.1007/s40042-023-00740-x
Source: Self-asserted source
Ahn Kangwoo via Crossref Metadata Search
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