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Keywords

thin film texture, germanides, silicides

Countries

Belgium

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Employment (1)

Universiteit Gent Faculteit Wetenschappen: Gent, BE

2010-10-01 to present | PhD Student (FWO Scholarship) (Solid State Sciences)
Employment
Source: Self-asserted source
Bob De Schutter

Education and qualifications (1)

Universiteit Gent: Gent, BE

2005-10-01 to 2010-05-31 | Master in Physics and Astronomy
Education
Source: Self-asserted source
Bob De Schutter

Works (6)

Formation of ultrathin Ni germanides: solid-phase reaction, morphology and texture

Journal of Physics D: Applied Physics
2017-11-15 | Journal article
DOI: 10.1088/1361-6463/aa8cad
Contributors: K van Stiphout; F A Geenen; B De Schutter; N M Santos; S M C Miranda; V Joly; C Detavernier; L M C Pereira; K Temst; A Vantomme
Source: check_circle
Crossref

Texture in thin film silicides and germanides: A review

Applied Physics Reviews
2016-09 | Journal article
DOI: 10.1063/1.4960122
Contributors: B. De Schutter; K. De Keyser; C. Lavoie; C. Detavernier
Source: check_circle
Crossref

Phase formation and texture of thin nickel germanides on Ge(001) and Ge(111)

Journal of Applied Physics
2016-04-07 | Journal article
DOI: 10.1063/1.4945317
Contributors: B. De Schutter; K. Van Stiphout; N. M. Santos; E. Bladt; J. Jordan-Sweet; S. Bals; C. Lavoie; C. M. Comrie; A. Vantomme; C. Detavernier
Source: check_circle
Crossref

Visualization and classification of epitaxial alignment at hetero-phase boundaries

Thin Solid Films
2016-01 | Journal article
DOI: 10.1016/j.tsf.2015.12.051
Contributors: B. De Schutter; K. De Keyser; C. Detavernier
Source: check_circle
Crossref

Phase formation in intermixed Ni–Ge thin films: Influence of Ge content and low-temperature nucleation of hexagonal nickel germanides

Microelectronic Engineering
2014-05 | Journal article
DOI:

10.1016/j.mee.2013.09.004
Contributors: B. De Schutter; W. Devulder; A. Schrauwen; K. van Stiphout; T. Perkisas; S. Bals; A. Vantomme; C. Detavernier
Source: Self-asserted source
Bob De Schutter via Crossref Metadata Search

Phase formation and texture of nickel silicides on Si1−xCx epilayers

Microelectronic Engineering
2011-05 | Journal article
DOI:

10.1016/j.mee.2010.06.010
Contributors: K. De Keyser; B. De Schutter; C. Detavernier; V. Machkaoutsan; M. Bauer; S.G. Thomas; J. Jordan Sweet; C. Lavoie
Source: Self-asserted source
Bob De Schutter via Crossref Metadata Search
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