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Works (22)
Science and Technology of Advanced Materials
2018
|
Journal article
Source:
Simon Züfle
grade
Preferred source
(of
2)
Journal of Applied Physics
2018-09
|
Journal article
Contributors:
S. Jenatsch;
S. Altazin;
P.-A. Will;
M. T. Neukom;
E. Knapp;
S. Züfle;
S. Lenk;
S. Reineke;
B. Ruhstaller
Source:
Simon Züfle
via
Crossref Metadata Search
physica status solidi (a)
2018-08
|
Journal article
Contributors:
Daniel Fluhr;
Simon Züfle;
Burhan Muhsin;
Rolf Öttking;
Marco Seeland;
Roland Roesch;
Ulrich S. Schubert;
Beat Ruhstaller;
Stefan Krischok;
Harald Hoppe
Source:
Simon Züfle
via
Crossref Metadata Search
ACS Applied Materials & Interfaces
2018-08
|
Journal article
Contributors:
Markus Regnat;
Kurt P. Pernstich;
Simon Züfle;
Beat Ruhstaller
Source:
Simon Züfle
via
Crossref Metadata Search
Solar Energy Materials and Solar Cells
2017
|
Journal article
EID:
2-s2.0-85019416759
Contributors:
Neukom, M.T.;
Züfle, S.;
Knapp, E.;
Makha, M.;
Hany, R.;
Ruhstaller, B.
Source:
Simon Züfle
via
Scopus - Elsevier
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(of
3)
Journal of Applied Physics
2017-09
|
Journal article
Contributors:
S. Züfle;
S. Altazin;
A. Hofmann;
L. Jäger;
M. T. Neukom;
W. Brütting;
B. Ruhstaller
Source:
Simon Züfle
via
Crossref Metadata Search
grade
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2)
Journal of Applied Physics
2017-05-04
|
Journal article
Contributors:
Simon Züfle;
Stéphane Altazin;
Alexander Hofmann;
Lars Jäger;
Martin T. Neukom;
Tobias D. Schmidt;
Wolfgang Brütting;
Beat Ruhstaller
Source:
Simon Züfle
via
Crossref Metadata Search
grade
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2)
Advanced Energy Materials
2016
|
Journal article
EID:
2-s2.0-84983499614
Contributors:
Gevorgyan, S.A.;
Espinosa, N.;
Ciammaruchi, L.;
Roth, B.;
Livi, F.;
Tsopanidis, S.;
Züfle, S.;
Queirós, S.;
Gregori, A.;
Benatto, G.A.D.R.
et al.
Source:
Simon Züfle
via
Scopus - Elsevier
Digest of Technical Papers - SID International Symposium
2016
|
Conference paper
EID:
2-s2.0-85019115304
Contributors:
Altazin, S.;
Züfle, S.;
Knapp, E.;
Kirsch, C.;
Schmidt, T.D.;
Jäger, L.;
Brütting, W.;
Ruhstaller, B.
Source:
Simon Züfle
via
Scopus - Elsevier
Proceedings of SPIE - The International Society for Optical Engineering
2016
|
Conference paper
EID:
2-s2.0-85006868274
Contributors:
Altazin, S.;
Züfle, S.;
Knapp, E.;
Kirsch, C.;
Schmidt, T.D.;
Jäger, L.;
Brütting, W.;
Ruhstaller, B.
Source:
Simon Züfle
via
Scopus - Elsevier
Organic Electronics: physics, materials, applications
2016
|
Journal article
EID:
2-s2.0-84991577790
Contributors:
Altazin, S.;
Züfle, S.;
Knapp, E.;
Kirsch, C.;
Schmidt, T.D.;
Jäger, L.;
Noguchi, Y.;
Brütting, W.;
Ruhstaller, B.
Source:
Simon Züfle
via
Scopus - Elsevier
SID Symposium Digest of Technical Papers
2016-05
|
Journal article
Contributors:
Stéphane Altazin;
Simon Züfle;
Evelyne Knapp;
Christoph Kirsch;
Tobias D. Schmidt;
Lars Jäger;
Wolfgang Brütting;
Beat Ruhstaller
Source:
Simon Züfle
via
Crossref Metadata Search
Advanced Energy Materials
2015
|
Journal article
EID:
2-s2.0-84944590613
Contributors:
Züfle, S.;
Neukom, M.T.;
Altazin, S.;
Zinggeler, M.;
Chrapa, M.;
Offermans, T.;
Ruhstaller, B.
Source:
Simon Züfle
via
Scopus - Elsevier
Physical Chemistry Chemical Physics
2014
|
Journal article
EID:
2-s2.0-84901753185
Contributors:
Eck, M.;
Pham, C.V.;
Züfle, S.;
Neukom, M.;
Sessler, M.;
Scheunemann, D.;
Erdem, E.;
Weber, S.;
Borchert, H.;
Ruhstaller, B.
et al.
Source:
Simon Züfle
via
Scopus - Elsevier
Journal of Physical Chemistry C
2014
|
Journal article
EID:
2-s2.0-84905460124
Contributors:
Jenatsch, S.;
Hany, R.;
Véron, A.C.;
Neukom, M.;
Züfle, S.;
Borgschulte, A.;
Ruhstaller, B.;
Nüesch, F.
Source:
Simon Züfle
via
Scopus - Elsevier
Organic Electronics: physics, materials, applications
2012
|
Journal article
EID:
2-s2.0-84867237640
Contributors:
Neukom, M.T.;
Züfle, S.;
Ruhstaller, B.
Source:
Simon Züfle
via
Scopus - Elsevier
Physical Review B - Condensed Matter and Materials Physics
2011
|
Journal article
EID:
2-s2.0-79961116960
Contributors:
Christ, N.;
Kettlitz, S.W.;
Züfle, S.;
Valouch, S.;
Lemmer, U.
Source:
Simon Züfle
via
Scopus - Elsevier
grade
Preferred source
(of
2)
Materials Research Society Symposium Proceedings
2011
|
Conference paper
EID:
2-s2.0-84860120650
Contributors:
Valouch, S.;
Kettlitz, S.W.;
Christ, N.;
Züfle, S.;
Ögün, C.M.;
Nintz, M.;
Lemmer, U.
Source:
Simon Züfle
via
Scopus - Elsevier
Applied Physics Letters
2010
|
Journal article
EID:
2-s2.0-77955757678
Contributors:
Züfle, S.;
Christ, N.;
Kettlitz, S.W.;
Valouch, S.;
Lemmer, U.
Source:
Simon Züfle
via
Scopus - Elsevier
Sensor Letters
2010
|
Journal article
EID:
2-s2.0-77954939556
Contributors:
Valouch, S.;
Öǧün, C.M.;
Kettlitz, S.W.;
Züfle, S.;
Christ, N.S.;
Lemmer, U.
Source:
Simon Züfle
via
Scopus - Elsevier
10th International Conference on Numerical Simulation of Optoelectronic Devices, NUSOD 2010
2010
|
Conference paper
EID:
2-s2.0-78449267331
Contributors:
Christ, N.;
Kettlitz, S.W.;
Züfle, S.;
Valouch, S.;
Lemmer, U.
Source:
Simon Züfle
via
Scopus - Elsevier
grade
Preferred source
(of
2)
Journal of Applied Physics
2009
|
Journal article
EID:
2-s2.0-66549113768
Contributors:
Christ, N.S.;
Kettlitz, S.W.;
Valouch, S.;
Züfle, S.;
Gärtner, C.;
Punke, M.;
Lemmer, U.
Source:
Simon Züfle
via
Scopus - Elsevier