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Scopus Author ID: 57196219277

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Germany

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Employment (4)

INNOVENT e. V.: Jena, DE

2024-01 to present
Employment
Source: Self-asserted source
Thomas Friedrich

Ernst Abbe University of Applied Sciences Jena: Jena, DE

2023-04-01 to present | PostDoc (SciTec)
Employment
Source: Self-asserted source
Thomas Friedrich

University of Antwerp: Antwerp, BE

2019-02-01 to 2023-04 | PhD Student (Physics)
Employment
Source: Self-asserted source
Thomas Friedrich

Ernst Abbe University of Applied Sciences Jena: Jena, DE

2016-11 to 2018-12-31 (SciTec)
Employment
Source: Self-asserted source
Thomas Friedrich

Education and qualifications (3)

University of Antwerp: Antwerpen, BE

2019-02 to 2023-04 | PhD (Science)
Education
Source: Self-asserted source
Thomas Friedrich

Ernst Abbe University of Applied Sciences Jena: Jena, DE

2015 to 2017 | Master of Science, Scientific Instrumentation (SciTec)
Education
Source: Self-asserted source
Thomas Friedrich

Glyndwr University: Wrexham, GB

2014 to 2015 | Bachelor of Engineering, Mechanical and Aeronautical Engineering
Education
Source: Self-asserted source
Thomas Friedrich

Works (10)

Machine Learning‐Based Prediction of the Martensite Start Temperature

steel research international
2024-10 | Journal article
DOI: 10.1002/srin.202400210
Part of ISSN: 1611-3683
Part of ISSN: 1869-344X
Contributors: Marcel Wentzien; Marcel Koch; Thomas Friedrich; Jerome Ingber; Henning Kempka; Dirk Schmalzried; Maik Kunert
Source: Self-asserted source
Thomas Friedrich

Investigation of the Octahedral Network Structure in Formamidinium Lead Bromide Nanocrystals by Low-Dose Scanning Transmission Electron Microscopy

Nano Letters
2024-09-04 | Journal article
DOI: 10.1021/acs.nanolett.4c02811
Part of ISSN: 1530-6984
Part of ISSN: 1530-6992
Contributors: Nadine J. Schrenker; Tom Braeckevelt; Annick De Backer; Nikolaos Livakas; Chu-Ping Yu; Thomas Friedrich; Maarten Roeffaers; Johan Hofkens; Johan Verbeeck; Liberato Manna et al.
Source: Self-asserted source
Thomas Friedrich

Deep convolutional neural networks to restore single-shot electron microscopy images

npj Computational Materials
2024-01-09 | Journal article
DOI: 10.1038/s41524-023-01188-0
Contributors: I. Lobato; T. Friedrich; S. Van Aert
Source: check_circle
Crossref

NiMn2O4 revisited: Temperature‐dependent cation distribution from in situ neutron diffraction and thermopower studies

Journal of the American Ceramic Society
2023-03 | Journal article
DOI: 10.1111/jace.18865
Part of ISSN: 0002-7820
Part of ISSN: 1551-2916
Contributors: Jan Dinger; Thomas Friedrich; Timmy Reimann; Jörg Töpfer
Source: Self-asserted source
Thomas Friedrich

Phase Object Reconstruction for 4D-STEM using Deep Learning

Microscopy and Microanalysis
2023-02-01 | Journal article
DOI: 10.1093/micmic/ozac002
Contributors: Thomas Friedrich; Chu-Ping Yu; Johan Verbeeck; Sandra Van Aert
Source: check_circle
Crossref

Optimal experiment design for element specific atom counting using multiple annular dark field scanning transmission electron microscopy detectors

Ultramicroscopy
2022-12 | Journal article
DOI: 10.1016/j.ultramic.2022.113626
Part of ISSN: 0304-3991
Contributors: D.G. Sentürk; A. De Backer; T. Friedrich; Sandra Van Aert
Source: Self-asserted source
Thomas Friedrich

Real-Time Integration Center of Mass (riCOM) Reconstruction for 4D STEM

Microscopy and Microanalysis
2022-10-01 | Journal article
DOI: 10.1017/S1431927622000617
Contributors: Chu-Ping Yu; Thomas Friedrich; Daen Jannis; Sandra Van Aert; Johan Verbeeck
Source: check_circle
Crossref
grade
Preferred source (of 4)‎

Phase Retrieval From 4-Dimensional Electron Diffraction Datasets

2021 IEEE International Conference on Image Processing (ICIP)
2021-09-19 | Conference paper
DOI: 10.1109/ICIP42928.2021.9506709
EID:

2-s2.0-85125565939

Part of ISSN: 15224880
EID:

2-s2.0-85109825826

Part of ISSN: 23318422
EID:

2-s2.0-85126147789
Source: Self-asserted source
Thomas Friedrich
grade
Preferred source (of 4)‎

Two-body abrasion resistance of high-carbon high-silicon steel: Metastable austenite vs nanostructured bainite

Wear
2019-01 | Journal article
DOI: 10.1016/j.wear.2018.11.003
Contributors: V.G. Efremenko; O. Hesse; Th. Friedrich; M. Kunert; M.N. Brykov; K. Shimizu; V.I. Zurnadzhy; P. Šuchmann
Source: check_circle
Crossref
grade
Preferred source (of 2)‎

Application of the pattern matching approach for EBSD calibration and orientation mapping, utilising dynamical EBSP simulations

Ultramicroscopy
Journal article
DOI: 10.1016/j.ultramic.2017.10.006
Source: Self-asserted source
Thomas Friedrich
grade
Preferred source (of 2)‎

Peer review (1 review for 1 publication/grant)

Review activity for Micron. (1)
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