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SciProfiles: 2571728

Keywords

High-k dielectric, Trap characterizations, Radio frequency switch

Biography

Yiyi Yan received the B.S degree in electronic science and technology from Beijing University of Chemical Technology, Beijing, China, in 2017. She received the M.S. degree in electrical engineering from Université catholique de Louvain (UCLouvain), Louvain-la-Neuve, Belgium, in 2019. Currently, she is studying for the Ph.D. degree in applied sciences at ICTEAM institute, UCLouvain, Belgium. She published 7 articles in international journals and conferences. Her research interests are the characterization of advanced CMOS dielectric materials (high-k materials, and Al2O3), including the extraction of intrinsic material properties at nanometer scale, On-wafer RF & mm-wave measurements. Presently, she is working on the design and fabrication of RF switches based on memristor as well as the simulation of gas sensors.

Activities

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Employment (1)

Uclouvain: Louvain la Neuve, Wallonia, BE

2019-10-20 to present | Ph.D. student (ICTEAM)
Employment
Source: Self-asserted source
Yiyi Yan

Works (17)

Traps characterization in RF SOI substrates including a buried SiGe layer

Solid-State Electronics
2025-06 | Journal article
DOI: 10.1016/j.sse.2025.109103
Part of ISSN: 0038-1101
Contributors: Y. Yan; M. Rack; M. Vanbrabant; M. Nabet; A. Goebel; P. Clifton; J.-P. Raskin
Source: Self-asserted source
Yiyi Yan

Analysis of anomalous C-V behavior for extracting the traps density in the undoped polysilicon with a double-BOX structure

Solid-State Electronics
2024 | Journal article
HANDLE: 2078.1/296997
Part of ISSN: 0038-1101
Part of ISSN: 1879-2405
Contributors: Huang, Yang; Yiyi Yan; Massinissa Nabet; Liu, Fanyu; Li, Bo; Li, Binhong; Han, Zhengsheng; Cristoloveanu, Sorin; Raskin, Jean-Pierre
Source: check_circle
DIAL

C-V characterization of the trap-rich layer in a novel Double-BOX structure

Solid-State Electronics
2024 | Journal article
HANDLE: 2078.1/296999
Part of ISSN: 0038-1101
Part of ISSN: 1879-2405
Contributors: Huang, Yang; Liu, Fanyu; Cristoloveanu, Sorin; Ma, Shiqi; Massinissa Nabet; Yiyi Yan; Li, Bo; Li, Binhong; Nguyen, Bich-Yen; Han, Zhengsheng et al.
Source: check_circle
DIAL

C-V Measurement and Modeling of Double-BOX Trap-Rich SOI Substrate

9th Joint Intl EuroSOI Workshop and International Conf On Ultimate Integration on Silicon 2023
2023 | Conference paper
HANDLE: 2078.1/275592
Contributors: Huang, Yang; Yiyi Yan; Massinissa Nabet; Liu, Fanyu; Li, Bo; Li, Binhong; Han, Zhengsheng; Nguyen, Bich-Yen; Cristoloveanu, Sorin; Raskin, Jean-Pierre
Source: check_circle
DIAL

Double Buried Oxide Trap-Rich Substrates for High Frequency Applications

IEEE Electron Device Letters
2023 | Journal article
DOI: 10.1109/LED.2023.3243693
Contributors: Massinissa Nabet; Martin Rack; Yiyi Yan; Bich-Yen Nguyen; Jean-Pierre Raskin
Source: check_circle
Crossref
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C-V measurement and modeling of double-BOX Trap-Rich SOI substrate

Solid-State Electronics
2023-11 | Journal article
DOI: 10.1016/j.sse.2023.108763
Contributors: Yang Huang; Yiyi Yan; Massinissa Nabet; Fanyu Liu; Bo Li; Binhong Li; Zhengsheng Han; Bich-Yen Nguyen; Sorin Cristoloveanu; Jean-Pierre Raskin
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Crossref
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Analysis of trap distribution and NBTI degradation in Al2O3/SiO2 dielectric stack

Solid-State Electronics
2023-09 | Journal article
DOI: 10.1016/j.sse.2023.108675
Contributors: Yiyi Yan; Valeriya Kilchytska; Denis Flandre; Jean-Pierre Raskin
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Crossref
grade
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Characterization of thin Al2O3/SiO2 dielectric stack for CMOS transistors

Microelectronic Engineering
2022 | Journal article
DOI: 10.1016/j.mee.2022.111708
HANDLE: 2078.1/259850
Contributors: Yiyi Yan; Kilchytska, Valeriya; Bin, Wang; Faniel, Sébastien; Zeng, Yun; Raskin, Jean-Pierre; Denis Flandre
Source: check_circle
DIAL

Hexagonal Boron Nitride Memristor based on a nanogap self-formed by silicidation

Mini Colloquia (MQ) on "Memristive Devices", The 6th Symposium on Schottky Barrier MOS Devices (SSBMOS)
2022 | Conference paper
HANDLE: 2078.1/270747
Contributors: Yiyi Yan; Reckinger, Nicolas; Kilchytska, Valeriya; Denis Flandre; Tang, Xiaohui; Malik, Mohammad Wasil; Hackens, Benoît; Raskin, Jean-Pierre
Source: check_circle
DIAL

Investigation and optimization of traps properties in Al2O3/SiO2 dielectric stacks

The 8th Joint International EuroSOI Workshop and International Conference on Ultimate Integration on Silicon - EuroSOI-ULIS'2022
2022 | Conference paper
HANDLE: 2078.1/269853
Contributors: Yiyi Yan; Kilchytska, Valeriya; Faniel, Sébastien; Denis Flandre; Raskin, Jean-Pierre
Source: check_circle
DIAL

Investigation and optimization of traps properties in Al2O3/SiO2 dielectric stacks using conductance method

Solid-State Electronics
2022 | Journal article
DOI: 10.1016/j.sse.2022.108347
HANDLE: 2078.1/260500
Part of ISSN: 0038-1101
Part of ISSN: 1879-2405
Contributors: Yiyi Yan; Kilchytska, Valeriya; Denis Flandre; Raskin, Jean-Pierre
Source: check_circle
DIAL

Enhanced Gas Detection by Altering Gate Voltage Polarity of Polypyrrole/Graphene Field-Effect Transistor Sensor

Chemosensors
2022-11 | Journal article | Author
DOI: 10.3390/chemosensors10110467
Contributors: Xiaohui Tang; Jean-Pierre Raskin; Nicolas Reckinger; Yiyi Yan; Nicolas André; Driss LAHEM; Marc Debliquy
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Multidisciplinary Digital Publishing Institute
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A Physical Model of Contact Resistance in Ti-Contacted Graphene-Based Field Effect Transistors

IEEE Transactions on Electron Devices
2021 | Journal article
DOI: 10.1109/TED.2020.3046166
HANDLE: 2078.1/243620
Part of ISSN: 0018-9383
Part of ISSN: 1557-9646
Contributors: Wang, Bin; Malik, Mohammad Wasil; Yiyi Yan; Kilchytska, Valeriya; Zeng, Yun; Denis Flandre; Raskin, Jean-Pierre
Source: check_circle
DIAL

A Review on Functionalized Graphene Sensors for Detection of Ammonia

Sensors
2021 | Journal article
DOI: 10.3390/s21041443
HANDLE: 2078.1/243740
Contributors: Tang, Xiaohui; Debliquy, Marc; Lahem, Driss; Yiyi Yan; Raskin, Jean-Pierre
Source: check_circle
DIAL

Determination of Carrier Lifetime in Silicon Using an Ultra-thin Al2O3/SiO2 Dielectric Stack

2021 IEEE Latin America Electron Devices Conference (LAEDC)
2021 | Conference paper
HANDLE: 2078.1/248901
Contributors: Yiyi Yan; Denis Flandre; Kilchytska, Valeriya; Faniel, Sébastien; Tang, Xiaohui; Raskin, Jean-Pierre
Source: check_circle
DIAL

Graphene sensors

Encyclopedia
2021 | Conference paper
HANDLE: 2078.1/269519
Contributors: Tang, Xiaohui; Debliquy, M.; Lahem, D.; Yiyi Yan; Raskin, Jean-Pierre
Source: check_circle
DIAL

Impact of oxygen on CVD grown boron nitride layers

2021 MRS Spring Meeting & Exhibit
2021 | Conference paper
HANDLE: 2078.1/269304
Contributors: Malik, Mohammad Wasil; Wang, Bin; Jaddi, Sahar; Yiyi Yan; Reis, Victor; Zeng, Yun; Thomas Pardoen; Hackens, Benoît; Raskin, Jean-Pierre
Source: check_circle
DIAL
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