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Works (7)

Development and implementation of an automated four-terminal-pair Josephson impedance bridge

Metrologia
2024-04-01 | Journal article
DOI: 10.1088/1681-7575/ad2539
Contributors: Yaowaret Pimsut; Stephan Bauer; Marco Kraus; Ralf Behr; Mattias Kruskopf; Oliver Kieler; Luis Palafox
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Crossref

Josephson voltage standards as toolkit for precision metrological applications at PTB

Measurement Science and Technology
2023-03-01 | Journal article
DOI: 10.1088/1361-6501/aca5a5
Contributors: Stephan Bauer; Ralf Behr; Jonas Herick; Oliver Kieler; Marco Kraus; Hao Tian; Yoawaret Pimsut; Luis Palafox
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Crossref

PTB–INRIM comparison of novel digital impedance bridges with graphene impedance quantum standards

Metrologia
2022-12-01 | Journal article
DOI: 10.1088/1681-7575/ac9187
Contributors: Martina Marzano; Yaowaret Pimsut; Mattias Kruskopf; Yefei Yin; Marco Kraus; Vincenzo D’Elia; Luca Callegaro; Massimo Ortolano; Stephan Bauer; Ralf Behr
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Crossref

Calibration of the dual-mode auto-calibrating resistance thermometer with few-parts-per-million uncertainty

Measurement Science and Technology
2022-01-01 | Journal article
DOI: 10.1088/1361-6501/ac2c48
Contributors: D Drung; M Kraus; C Krause
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Crossref

Corrigendum: ‘Linearity measurements of critical Johnson noise thermometer components with low-distortion multitones from a Josephson arbitrary waveform synthesizer’ (2021 Meas. Sci. Technol. 32 065006)

Measurement Science and Technology
2021-11-01 | Journal article
DOI: 10.1088/1361-6501/ac1234
Contributors: M Kraus; D Drung; C Krause; L Palafox; R Behr
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Crossref

Linearity measurements of critical Johnson noise thermometer components with low-distortion multitones from a Josephson arbitrary waveform synthesizer

Measurement Science and Technology
2021-06-01 | Journal article
DOI: 10.1088/1361-6501/abd1fc
Contributors: M Kraus; D Drung; C Krause; L Palafox; R Behr
Source: check_circle
Crossref

Measurement and analysis of high-frequency voltage errors in the Josephson arbitrary waveform synthesizer

Measurement Science and Technology
2020-12-01 | Journal article
DOI: 10.1088/1361-6501/aba458
Contributors: M Kraus; D Drung; R Behr; L Palafox; O Kieler; S Bauer; J Herick
Source: check_circle
Crossref
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