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University of South Carolina: Columbia, SC, US

2009-09 to present | Professor (Electrical Engineering)
Employment
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Krishna Mandal

Works (22)

High-Resolution Cr/4H-SiC Schottky Barrier Radiation Detector

IEEE Transactions on Nuclear Science
2025 | Journal article
DOI: 10.1109/TNS.2025.3547998
Contributors: Ritwik Nag; Sandeep K. Chaudhuri; Frank H. Ruddy; Krishna C. Mandal
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Crossref

A Review of the Effects of Fast-Neutron Irradiation on the Performance of 4H-SiC Schottky Barrier Detectors

IEEE Transactions on Nuclear Science
2024 | Journal article
DOI: 10.1109/TNS.2024.3355293
Contributors: Frank H. Ruddy; Sandeep K. Chaudhuri; Krishna C. Mandal
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Crossref

Deep Learning-Based Classification of Gamma Photon Interaction in Room-Temperature Semiconductor Radiation Detectors

IEEE Access
2024 | Journal article
DOI: 10.1109/ACCESS.2024.3354270
Contributors: Sandeep K. Chaudhuri; Qinyang Li; Krishna C. Mandal; Jianjun Hu
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Crossref

Self-Biased (p⁺)Diamond/(n)4H-SiC Vertical Schottky Diodes for UV Detection

IEEE Electron Device Letters
2024-12 | Journal article
DOI: 10.1109/LED.2024.3468369
Contributors: Krishna C. Mandal; Sandeep K. Chaudhuri; Ritwik Nag
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Crossref

High-Resolution γ -Ray Spectroscopy in Capacitive Frisch Grid CdZnTeSe Detectors

IEEE Electron Device Letters
2024-10 | Journal article
DOI: 10.1109/LED.2024.3437230
Contributors: Sandeep K. Chaudhuri; Ritwik Nag; Utpal N. Roy; Ralph B. James; Krishna C. Mandal
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Determination of electron‐hole pair creation energy in Cd0.9Zn0.1Te0.98Se0.02 quaternary semiconductor for room‐temperature gamma‐ray detection

Electronics Letters
2024-09 | Journal article
DOI: 10.1049/ell2.70007
Contributors: Sandeep K. Chaudhuri; Ritwik Nag; Utpal N. Roy; Ralph B. James; Krishna C. Mandal
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Crossref

High-Resolution Metal-Oxide-4H-SiC Radiation Detectors: A Review

IEEE Transactions on Nuclear Science
2024-08 | Journal article
DOI: 10.1109/TNS.2024.3422902
Contributors: Krishna C. Mandal; Sandeep K. Chaudhuri; Frank H. Ruddy
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Crossref

High-Resolution Alpha Spectrometry Using 4H-SiC Detectors: A Review of the State-of-the-Art

IEEE Transactions on Nuclear Science
2023 | Journal article
DOI: 10.1109/TNS.2023.3267996
Contributors: Krishna C. Mandal; Sandeep K. Chaudhuri; Frank H. Ruddy
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Crossref

Alpha Particle Detection Using Highly Rectifying Ni/Ga2O3/4H-SiC Heteroepitaxial MOS Junction

IEEE Transactions on Electron Devices
2023-12 | Journal article
DOI: 10.1109/TED.2023.3328329
Contributors: Sandeep K. Chaudhuri; Ritwik Nag; Iftikhar Ahmad; Krishna C. Mandal
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Crossref

Charge Trapping Effects in THM- and VGF-Grown CdZnTeSe Radiation Detectors

IEEE Transactions on Nuclear Science
2023-09 | Journal article
DOI: 10.1109/TNS.2023.3306283
Contributors: Sandeep K. Chaudhuri; Ritwik Nag; Joshua W. Kleppinger; Utpal N. Roy; Ralph B. James; Krishna C. Mandal
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Crossref

Effect of Enhanced Hole Transport on the Performance of Ni/Y2O3/n-4H-SiC Epilayer Radiation Detectors

IEEE Transactions on Nuclear Science
2023-09 | Journal article
DOI: 10.1109/TNS.2023.3306276
Contributors: Omerfaruk Karadavut; Joshua W. Kleppinger; Sandeep K. Chaudhuri; Krishna C. Mandal
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Crossref

Assessment of deep levels with selenium concentration in Cd1–xZnxTe1–ySey room temperature detector materials

Applied Physics Letters
2023-08-07 | Journal article
DOI: 10.1063/5.0159519
Contributors: Joshua W. Kleppinger; Sandeep K. Chaudhuri; Ritwik Nag; Utpal N. Roy; Ralph B. James; Krishna C. Mandal
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Crossref

High Performance Pd/4H-SiC Epitaxial Schottky Barrier Radiation Detectors for Harsh Environment Applications

Micromachines
2023-07-30 | Journal article
DOI: 10.3390/mi14081532
Contributors: Krishna C. Mandal; Sandeep K. Chaudhuri; Ritwik Nag
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Crossref
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Preferred source (of 2)‎

Self-Biased Mo/n-4H-SiC Schottky Barriers as High-Performance Ultraviolet Photodetectors

IEEE Electron Device Letters
2023-05 | Journal article
DOI: 10.1109/LED.2023.3256344
Contributors: Sandeep K. Chaudhuri; Ritwik Nag; Krishna C. Mandal
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Crossref

A novel Ni/Y2O3/4H-SiC heteroepitaxial metal–oxide–semiconductor (MOS) betavoltaic cell

Journal of Materials Science: Materials in Electronics
2023-02 | Journal article
DOI: 10.1007/s10854-023-09971-x
Contributors: Sandeep K. Chaudhuri; Ritwik Nag; Krishna C. Mandal
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Crossref

Vertical gradient freeze growth of detector grade CdZnTeSe single crystals

Journal of Crystal Growth
2022-10 | Journal article
DOI: 10.1016/j.jcrysgro.2022.126826
Contributors: Ritwik Nag; Sandeep K. Chaudhuri; Joshua W. Kleppinger; OmerFaruk Karadavut; Krishna C. Mandal
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Crossref

Enhanced Hole Transport in Ni/Y₂O₃/n-4H-SiC MOS for Self-Biased Radiation Detection

IEEE Electron Device Letters
2022-09 | Journal article
DOI: 10.1109/LED.2022.3188543
Contributors: Sandeep K. Chaudhuri; OmerFaruk Karadavut; Joshua W. Kleppinger; Ritwik Nag; Gene Yang; Dongkyu Lee; Krishna C. Mandal
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Crossref

Current Transient Spectroscopic Study of Vacancy Complexes in Diamond Schottky p-i-n Diode

IEEE Transactions on Electron Devices
2022-08 | Journal article
DOI: 10.1109/TED.2022.3182931
Contributors: Sandeep K. Chaudhuri; Mohamadali Malakoutian; Joshua W. Kleppinger; Maitreya Dutta; Franz A. Koeck; Robert J. Nemanich; Srabanti Chowdhury; Krishna C. Mandal
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Crossref

Deep-Level Transient Spectroscopy and Radiation Detection Performance Studies on Neutron Irradiated 250-μm-Thick 4H-SiC Epitaxial Layers

IEEE Transactions on Nuclear Science
2022-08 | Journal article
DOI: 10.1109/TNS.2022.3168789
Contributors: Joshua W. Kleppinger; Sandeep K. Chaudhuri; Omerfaruk Karadavut; Ritwik Nag; Daniel L. P. Watson; Douglas S. McGregor; Krishna C. Mandal
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Crossref

Performance-Improved Vertical Ni/SiO₂/4H-SiC Metal–Oxide–Semiconductor Capacitors for High-Resolution Radiation Detection

IEEE Transactions on Nuclear Science
2022-08 | Journal article
DOI: 10.1109/TNS.2022.3168792
Contributors: Omerfaruk Karadavut; Sandeep K. Chaudhuri; Joshua W. Kleppinger; Ritwik Nag; Krishna C. Mandal
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Crossref

Enhancement of radiation detection performance with reduction of EH6/7 deep levels in n-type 4H–SiC through thermal oxidation

Applied Physics Letters
2022-07-04 | Journal article
DOI: 10.1063/5.0089236
Contributors: OmerFaruk Karadavut; Sandeep K. Chaudhuri; Joshua W. Kleppinger; Ritwik Nag; Krishna C. Mandal
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Crossref

Design and Response Testing of Boron-Diffused Silicon Carbide Neutron Detectors for Dosimetry and Monitoring Applications

2018-11-01 | Book chapter
DOI: 10.1520/STP160820170042
Contributors: Krishna C. Mandal; Towhid A. Chowdhury; Cihan Oner; Frank H. Ruddy
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Crossref
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Preferred source (of 17)‎

Peer review (11 reviews for 5 publications/grants)

Review activity for Applied physics letters. (4)
Review activity for Journal of applied physics. (3)
Review activity for Journal of crystal growth. (1)
Review activity for Journal of electronic materials. (1)
Review activity for Journal of materials science. Materials in electronics (1)
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