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Scopus Author ID: 7006761067

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Italy

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Employment (1)

Università degli Studi di Ferrara Dipartimento di Ingegneria: Ferrara, Emilia-Romagna, IT

1995 to present | Full Professor
Employment
Source: Self-asserted source
Piero Olivo

Works (50 of 129)

Items per page:
Page 1 of 3

Machine Learning for 3D NAND Flash and Solid State Drives Reliability/Performance Optimization

2022 | Book chapter
DOI: 10.1007/978-3-031-03841-9_7
Contributors: Cristian Zambelli; Rino Micheloni; P. Olivo
Source: check_circle
Crossref

Low Conductance State Drift Characterization and Mitigation in Resistive Switching Memories (RRAM) for Artificial Neural Networks

IEEE Transactions on Device and Materials Reliability
2022-09 | Journal article
DOI: 10.1109/TDMR.2022.3182133
Contributors: Andrea Baroni; Artem Glukhov; Eduardo Perez; Christian Wenger; Daniele Ielmini; Piero Olivo; Cristian Zambelli
Source: check_circle
Crossref

Investigating 3D NAND Flash Read Disturb Reliability With Extreme Value Analysis

IEEE Transactions on Device and Materials Reliability
2021-12 | Journal article
DOI: 10.1109/TDMR.2021.3108941
Contributors: Cristian Zambelli; Luca Crippa; Rino Micheloni; Piero Olivo
Source: check_circle
Crossref

Accurate Program/Verify Schemes of Resistive Switching Memory (RRAM) for In-Memory Neural Network Circuits

IEEE Transactions on Electron Devices
2021-08 | Journal article
DOI: 10.1109/TED.2021.3089995
Contributors: Valerio Milo; Artem Glukhov; Eduardo Perez; Cristian Zambelli; Nicola Lepri; Mamathamba Kalishettyhalli Mahadevaiah; Emilio Perez-Bosch Quesada; Piero Olivo; Christian Wenger; Daniele Ielmini
Source: check_circle
Crossref

A Scalable Bidimensional Randomization Scheme for TLC 3D NAND Flash Memories

Micromachines
2021-06-27 | Journal article
DOI: 10.3390/mi12070759
Contributors: Michele Favalli; Cristian Zambelli; Alessia Marelli; Rino Micheloni; Piero Olivo
Source: check_circle
Crossref
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Assessing the Role of Program Suspend Operation in 3D NAND Flash Based Solid State Drives

Electronics
2021-06-10 | Journal article
DOI: 10.3390/electronics10121394
Contributors: Cristian Zambelli; Lorenzo Zuolo; Antonio Aldarese; Salvatrice Scommegna; Rino Micheloni; Piero Olivo
Source: check_circle
Crossref

Mitigating Self-Heating in Solid State Drives for Industrial Internet-of-Things Edge Gateways

Electronics
2020-07-20 | Journal article
DOI: 10.3390/electronics9071179
Contributors: Cristian Zambelli; Lorenzo Zuolo; Luca Crippa; Rino Micheloni; Piero Olivo
Source: check_circle
Crossref

Multilevel HfO2-based RRAM devices for low-power neuromorphic networks

APL Materials
2019-08 | Journal article
DOI: 10.1063/1.5108650
Contributors: V. Milo; C. Zambelli; P. Olivo; E. Pérez; M. K. Mahadevaiah; O. G. Ossorio; Ch. Wenger; D. Ielmini
Source: check_circle
Crossref

Performance and reliability analysis of cross-layer optimizations of NAND flash controllers

2015 | Journal article
DOI:

10.1145/2629562

EID:

2-s2.0-84921903966
Contributors: Bertozzi, D.; Di Carlo, S.; Galfano, S.; Indaco, M.; Olivo, P.; Prinetto, P.; Zambelli, C.
Source: Self-asserted source
Piero Olivo via Scopus - Elsevier

A compact model for erratic event simulation in flash memory arrays

2014 | Journal article
DOI:

10.1109/TED.2014.2356211

EID:

2-s2.0-84908407707
Contributors: Zambelli, C.; Vincenzi, T.; Olivo, P.
Source: Self-asserted source
Piero Olivo via Scopus - Elsevier

Analysis of reliability/performance trade-off in Solid State Drives

2014 | Conference paper
DOI:

10.1109/IRPS.2014.6860646

EID:

2-s2.0-84905659262
Contributors: Zuolo, L.; Zambelli, C.; Micheloni, R.; Bertozzi, D.; Olivo, P.
Source: Self-asserted source
Piero Olivo via Scopus - Elsevier

Bit error rate analysis in Charge Trapping memories for SSD applications

2014 | Conference paper
DOI:

10.1109/IRPS.2014.6861161

EID:

2-s2.0-84905659520
Contributors: Grossi, A.; Zambelli, C.; Olivo, P.
Source: Self-asserted source
Piero Olivo via Scopus - Elsevier

Electrical characterization of read window in reram arrays under different SET/RESET cycling conditions

2014 | Conference paper
DOI:

10.1109/IMW.2014.6849387

EID:

2-s2.0-84904685397
Contributors: Zambelli, C.; Grossi, A.; Olivo, P.; Walczyk, D.; Dabrowski, J.; Tillack, B.; Schroeder, T.; Kraemer, R.; Stikanov, V.; Walczyk, C.
Source: Self-asserted source
Piero Olivo via Scopus - Elsevier

Exposing reliability/performance tradeoff in non-volatile memories through erratic bits signature classification

2014 | Journal article
DOI:

10.1109/TDMR.2013.2284639

EID:

2-s2.0-84896475433
Contributors: Zambelli, C.; Koebernik, G.; Ullmann, R.; Bauer, M.; Tempel, G.; Di Tano, F.; Atti, M.; Pistone, F.P.; Siviero, A.; Olivo, P.
Source: Self-asserted source
Piero Olivo via Scopus - Elsevier

FLARES: An aging aware algorithm to autonomously adapt the error correction capability in NAND flash memories

2014 | Journal article
DOI:

10.1145/2631919

EID:

2-s2.0-84910137521
Contributors: Di Carlo, S.; Galfano, S.; Indaco, M.; Prinetto, P.; Bertozzi, D.; Olivo, P.; Zambelli, C.
Source: Self-asserted source
Piero Olivo via Scopus - Elsevier

SSDExplorer: A virtual platform for fine-grained design space exploration of Solid State Drives

2014 | Conference paper
DOI:

10.7873/DATE2014.297

EID:

2-s2.0-84903828327
Contributors: Zuolo, L.; Zambelli, C.; Micheloni, R.; Galfano, S.; Indaco, M.; Di Carlo, S.; Prinetto, P.; Olivo, P.; Bertozzi, D.
Source: Self-asserted source
Piero Olivo via Scopus - Elsevier

Statistical analysis of resistive switching characteristics in ReRAM test arrays

2014 | Conference paper
DOI:

10.1109/ICMTS.2014.6841463

EID:

2-s2.0-84904180102
Contributors: Zambelli, C.; Grossi, A.; Olivo, P.; Walczyk, D.; Bertaud, T.; Tillack, B.; Schroeder, T.; Stikanov, V.; Walczyk, C.
Source: Self-asserted source
Piero Olivo via Scopus - Elsevier

Erratic bits classification for efficient repair strategies in automotive embedded flash memories

2013 | Conference paper
DOI:

10.1109/IRPS.2013.6531964

EID:

2-s2.0-84880986608
Contributors: Zambelli, C.; Olivo, P.; Koebernik, G.; Ullmann, R.; Bauer, M.; Tempel, G.
Source: Self-asserted source
Piero Olivo via Scopus - Elsevier

Modeling erratic bits temperature dependence for monte carlo simulation of flash arrays

2013 | Journal article
DOI:

10.1109/LED.2012.2237541

EID:

2-s2.0-84874660107
Contributors: Zambelli, C.; Koebernik, G.; Ullmann, R.; Bauer, M.; Tempel, G.; Olivo, P.
Source: Self-asserted source
Piero Olivo via Scopus - Elsevier

Statistical investigation of anomalous fast erase dynamics in charge trapping NAND flash

2013 | Journal article
DOI:

10.1109/LED.2013.2247696

EID:

2-s2.0-84875639929
Contributors: Zambelli, C.; Olivo, P.
Source: Self-asserted source
Piero Olivo via Scopus - Elsevier

System interconnect extensions for fully transparent demand paging in low-cost MMU-less embedded systems

2013 | Conference paper
EID:

2-s2.0-84896989992
Contributors: Zuolo, L.; Miorandi, G.; Zambelli, C.; Olivo, P.; Bertozzi, D.
Source: Self-asserted source
Piero Olivo via Scopus - Elsevier

A cross-layer approach for new reliability-performance trade-offs in MLC NAND flash memories

2012 | Conference paper
EID:

2-s2.0-84862059627
Contributors: Zambelli, C.; Indaco, M.; Fabiano, M.; Di Carlo, S.; Prinetto, P.; Olivo, P.; Bertozzi, D.
Source: Self-asserted source
Piero Olivo via Scopus - Elsevier

Modeling of SET seasoning effects in phase change memory arrays

2012 | Journal article
DOI:

10.1016/j.microrel.2012.01.002

EID:

2-s2.0-84861527667
Contributors: Zambelli, C.; Chimenton, A.; Olivo, P.
Source: Self-asserted source
Piero Olivo via Scopus - Elsevier

Statistical modeling of secondary path during erase operation in phase change memories

2012 | Journal article
DOI:

10.1109/TED.2011.2179047

EID:

2-s2.0-84857648427
Contributors: Zambelli, C.; Chimenton, A.; Olivo, P.
Source: Self-asserted source
Piero Olivo via Scopus - Elsevier

A statistical model of erratic behaviors in flash memory arrays

2011 | Journal article
DOI:

10.1109/TED.2011.2165722

EID:

2-s2.0-80054960696
Contributors: Chimenton, A.; Zambelli, C.; Olivo, P.
Source: Self-asserted source
Piero Olivo via Scopus - Elsevier

Analysis of edge wordline disturb in multimegabit charge trapping flash NAND arrays

2011 | Conference paper
DOI:

10.1109/IRPS.2011.5784587

EID:

2-s2.0-79959298627
Contributors: Zambelli, C.; Chimenton, A.; Olivo, P.
Source: Self-asserted source
Piero Olivo via Scopus - Elsevier

Characterization of a MEMS-based embedded non volatile memory array for extreme environments

2011 | Conference paper
DOI:

10.1109/IMW.2011.5873214

EID:

2-s2.0-79960028123
Contributors: Zambelli, C.; Olivo, P.; Gaddi, R.; Schepens, C.; Smith, C.
Source: Self-asserted source
Piero Olivo via Scopus - Elsevier

Empirical investigation of SET seasoning effects in Phase Change Memory arrays

2011 | Journal article
DOI:

10.1016/j.sse.2010.11.022

EID:

2-s2.0-79952282640
Contributors: Zambelli, C.; Chimenton, A.; Olivo, P.
Source: Self-asserted source
Piero Olivo via Scopus - Elsevier

Nonvolatile memory partitioning scheme for technology-based performance-reliability tradeoff

2011 | Journal article
DOI:

10.1109/LES.2010.2092411

EID:

2-s2.0-79953125956
Contributors: Zambelli, C.; Bertozzi, D.; Chimenton, A.; Olivo, P.
Source: Self-asserted source
Piero Olivo via Scopus - Elsevier

Reliability and performance characterization of a mems-based non-volatile switch

2011 | Conference paper
DOI:

10.1109/IRPS.2011.5784472

EID:

2-s2.0-79959304686
Contributors: Gaddi, R.; Schepens, C.; Smith, C.; Zambelli, C.; Chimenton, A.; Olivo, P.
Source: Self-asserted source
Piero Olivo via Scopus - Elsevier

A new analytical model of the erasing operation in phase-change memories

2010 | Journal article
DOI:

10.1109/LED.2009.2038242

EID:

2-s2.0-77649184676
Contributors: Chimenton, A.; Zambelli, C.; Olivo, P.
Source: Self-asserted source
Piero Olivo via Scopus - Elsevier

A new methodology for two-level random-telegraph-noise identification and statistical analysis

2010 | Journal article
DOI:

10.1109/LED.2010.2046311

EID:

2-s2.0-77953028194
Contributors: Chimenton, A.; Zambelli, C.; Olivo, P.
Source: Self-asserted source
Piero Olivo via Scopus - Elsevier

Experimental characterization of SET seasoning on Phase Change Memory arrays

2010 | Conference paper
DOI:

10.1109/IMW.2010.5488326

EID:

2-s2.0-77957907108
Contributors: Zambelli, C.; Chimenton, A.; Olivo, P.
Source: Self-asserted source
Piero Olivo via Scopus - Elsevier

Preface

2010 | Book
DOI:

10.1007/978-90-481-9431-5

EID:

2-s2.0-84892086179
Contributors: Olivo, P.
Source: Self-asserted source
Piero Olivo via Scopus - Elsevier

Reliability issues of NAND Flash memories

2010 | Book
DOI:

10.1007/978-90-481-9431-5_4

EID:

2-s2.0-84892119866
Contributors: Zambelli, C.; Chimenton, A.; Olivo, P.
Source: Self-asserted source
Piero Olivo via Scopus - Elsevier

A new automated methodology for Random Telegraph Signal identification and characterization: A case study on Phase Change Memory arrays

2009 | Conference paper
DOI:

10.1109/IRPS.2009.5173237

EID:

2-s2.0-70449089005
Contributors: Chimenton, A.; Zambelli, C.; Olivo, P.
Source: Self-asserted source
Piero Olivo via Scopus - Elsevier

A statistical model of Erratic Erase based on an automated Random Telegraph Signal characterization technique

2009 | Conference paper
DOI:

10.1109/IRPS.2009.5173375

EID:

2-s2.0-70449091730
Contributors: Chimenton, A.; Zambelli, C.; Olivo, P.
Source: Self-asserted source
Piero Olivo via Scopus - Elsevier

Analysis and optimization of erasing waveform in phase change memory arrays

2009 | Conference paper
DOI:

10.1109/ESSDERC.2009.5331471

EID:

2-s2.0-72849109369
Contributors: Zambelli, C.; Chimenton, A.; Olivo, P.
Source: Self-asserted source
Piero Olivo via Scopus - Elsevier

Evidence of erratic behaviors in p-channel floating gate memories and a cell architectural solution

2009 | Conference paper
DOI:

10.1109/NVMT.2009.5429792

EID:

2-s2.0-77951681962
Contributors: Chimenton, A.; Zambelli, C.; Olivo, P.; Leisenberger, F.P.; Wiesner, A.; Schatzberger, G.; Wachmann, E.; Schrems, M.
Source: Self-asserted source
Piero Olivo via Scopus - Elsevier

Impact of short SET pulse sequence on electronic switching in phase change memory arrays

2008 | Conference paper
DOI:

10.1109/NVMT.2008.4731184

EID:

2-s2.0-62349142011
Contributors: Chimenton, A.; Zambelli, C.; Olivo, P.
Source: Self-asserted source
Piero Olivo via Scopus - Elsevier

Set of electrical characteristic parameters suitable for reliability analysis of multimegabit Phase Change Memory arrays

2008 | Conference paper
DOI:

10.1109/NVSMW.2008.20

EID:

2-s2.0-50249145234
Contributors: Chimenton, A.; Zambelli, C.; Olivo, P.; Pirovano, A.
Source: Self-asserted source
Piero Olivo via Scopus - Elsevier

Dielectric reliability for future logic and non-volatile memory applications: A statistical simulation analysis approach

2007 | Conference paper
DOI:

10.1149/1.2767314

EID:

2-s2.0-45749154193
Contributors: Padovani, A.; Larcher, L.; Chimenton, A.; Pavan, P.; Olivo, P.
Source: Self-asserted source
Piero Olivo via Scopus - Elsevier

Fast identification of critical electrical disturbs in nonvolatile memories

2007 | Journal article
DOI:

10.1109/TED.2007.902237

EID:

2-s2.0-41749122414
Contributors: Chimenton, A.; Olivo, P.
Source: Self-asserted source
Piero Olivo via Scopus - Elsevier

Impact of pulsed operation on performance and reliability of flash memories

2007 | Journal article
DOI:

10.1109/TED.2007.896366

EID:

2-s2.0-34249913949
Contributors: Chimenton, A.; Irrera, F.; Olivo, P.
Source: Self-asserted source
Piero Olivo via Scopus - Elsevier

Statistical methodologies for integrated circuits design

2007 | Conference paper
DOI:

10.1109/RME.2007.4401866

EID:

2-s2.0-47349130513
Contributors: Padovani, A.; Chimenton, A.; Olivo, P.; Fantini, P.; Vendrame, L.; Mennillo, S.
Source: Self-asserted source
Piero Olivo via Scopus - Elsevier

Effect of field enhancement due to the coupling between a cellular phone and metallic eyeglasses

2006 | Journal article
DOI:

10.1002/mop.21261

EID:

2-s2.0-33645322970
Contributors: Bellanca, G.; Caniato, G.; Giovannelli, A.; Olivo, P.; Trillo, S.
Source: Self-asserted source
Piero Olivo via Scopus - Elsevier

Impact of high tunneling electric fields on erasing instabilities in NOR flash memories

2006 | Journal article
DOI:

10.1109/TED.2005.860643

EID:

2-s2.0-33947613092
Contributors: Chimenton, A.; Olivo, P.
Source: Self-asserted source
Piero Olivo via Scopus - Elsevier

Improving performance and reliability of NOR-Flash arrays by using pulsed operation

2006 | Journal article
DOI:

10.1016/j.microrel.2006.07.014

EID:

2-s2.0-33747748116
Contributors: Chimenton, A.; Irrera, F.; Olivo, P.
Source: Self-asserted source
Piero Olivo via Scopus - Elsevier

Ultra - Short pulses improving performance and reliability in flash memories

2006 | Conference paper
DOI:

10.1109/.2006.1629487

EID:

2-s2.0-33751056927
Contributors: Chimenton, A.; Irrera, F.; Olivo, P.
Source: Self-asserted source
Piero Olivo via Scopus - Elsevier

Reliability of erasing operation in NOR-Flash memories

2005 | Journal article
DOI:

10.1016/j.microrel.2004.12.006

EID:

2-s2.0-20344367995
Contributors: Chimenton, A.; Olivo, P.
Source: Self-asserted source
Piero Olivo via Scopus - Elsevier
Items per page:
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