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Works (7)

Characterization of Fragmented Ultrahigh-Energy Heavy Ion Beam and Its Effects on Electronics Single-Event Effect Testing

IEEE Transactions on Nuclear Science
2024-08 | Journal article
DOI: 10.1109/TNS.2024.3396737
Contributors: Mario Sacristán Barbero; Ivan Slipukhin; Matteo Cecchetto; Daniel Prelipcean; Ygor Aguiar; Kacper Bilko; Natalia Emriskova; Andreas Waets; Andrea Coronetti; Maria Kastriotou et al.
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Very-High-Energy Heavy Ion Beam Dosimetry Using Solid State Detectors for Electronics Testing

IEEE Transactions on Nuclear Science
2024-08 | Journal article
DOI: 10.1109/TNS.2024.3350667
Contributors: Andreas Waets; Kacper Bilko; Andrea Coronetti; Natalia Emriskova; Mario Sacristan Barbero; Rubén García Alía; Marco Durante; Christoph Schuy; Tim Wagner; Luigi Salvatore Esposito et al.
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Mixed-Field Radiation Monitoring and Beam Characterization Through Silicon Diode Detectors

IEEE Transactions on Nuclear Science
2024-04 | Journal article
DOI: 10.1109/TNS.2024.3350342
Contributors: Kacper Biłko; Rubén García Alía; Mario Sacristan Barbero; Sylvain Girard; Ygor Q. Aguiar; Matteo Cecchetto; Camille Belanger-Champagne; Salvatore Danzeca; Wojtek Hajdas; Alex Hands et al.
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Ultra-Large Silicon Diode for Characterizing Low-Intensity Radiation Environments

IEEE Transactions on Nuclear Science
2024-04 | Journal article
DOI: 10.1109/TNS.2023.3337839
Contributors: Kacper Biłko; Rubén García Alía; Sylvain Girard; Mario Sacristan Barbero; Matteo Cecchetto; Camille Belanger-Champagne; Matteo Brucoli; Salvatore Danzeca; Alex Hands; Pedro Martín Holgado et al.
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Analysis of the Radiation Field Generated by 200-MeV Electrons on a Target at the CLEAR Accelerator at CERN

IEEE Transactions on Nuclear Science
2023-08 | Journal article
DOI: 10.1109/TNS.2023.3252808
Contributors: Giuseppe Lerner; Pierre Pelissou; Ygor Q. Aguiar; Mario Sacristan Barbero; Matteo Cecchetto; Kacper Biłko; Louise Coussen; Natalia Emriskova; Rubén García Alía; Luke Dyks et al.
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Electronics Irradiation With Neutrons at the NEAR Station of the n_TOF Spallation Source at CERN

IEEE Transactions on Nuclear Science
2023-08 | Journal article
DOI: 10.1109/TNS.2023.3242460
Contributors: Matteo Cecchetto; Mario Sacristan Barbero; Giuseppe Lerner; Rubén García Alía; Ygor Aguiar; Dominika Senajova; Francisco Garcia Infantes; Jose Antonio Pavon Rodriguez; Marta Sabate Gilarte; Vasilis Vlachoudis et al.
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How the Analysis of Archival Data Could Provide Helpful Information About TID Degradation. Case Study: Bipolar Transistors

IEEE Transactions on Nuclear Science
2022-07 | Journal article
DOI: 10.1109/TNS.2022.3185940
Contributors: Pedro Martin-Holgado; Amor Romero-Maestre; Jose de-Martin-Hernandez; Jose J. Gonzalez-Lujan; Ivan Illera-Gomez; Yolanda Jimenez-de-Luna; Fernando Morilla; Mario Sacristan Barbero; Ruben Garcia Alia; Manuel Dominguez et al.
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