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Employment (4)

European XFEL GmbH: Schenefeld, Hamburg, DE

2011-10-01 to present | Group Leader (Sample Environment and Characterization)
Employment
Source: Self-asserted source
Joachim Schulz

Center for Free Electron Laser Science: Hamburg, Hamburg, DE

2007-11-15 to 2011-09-30
Employment
Source: Self-asserted source
Joachim Schulz

University of Oulu: Oulu, FI

2005 to 2007 | Senior Scientist
Employment
Source: Self-asserted source
Joachim Schulz

Lund University: Lund, SE

2002 to 2005 | Postdoc (MAX-lab)
Employment
Source: Self-asserted source
Joachim Schulz

Works (50 of 71)

Items per page:
Page 1 of 2

Convolutional neural network approach for the automated identification of in cellulo crystals

Journal of Applied Crystallography
2024-04-01 | Journal article
DOI: 10.1107/S1600576724000682
Contributors: Amirhossein Kardoost; Robert Schönherr; Carsten Deiter; Lars Redecke; Kristina Lorenzen; Joachim Schulz; Iñaki de Diego
Source: check_circle
Crossref

Enhancing electrospray ionization efficiency for particle transmission through an aerodynamic lens stack

Journal of Synchrotron Radiation
2024-03-01 | Journal article
DOI: 10.1107/S1600577524000158
Contributors: Safi Rafie-Zinedine; Tej Varma Yenupuri; Lena Worbs; Filipe R. N. C. Maia; Michael Heymann; Joachim Schulz; Johan Bielecki
Source: check_circle
Crossref

Kilohertz droplet-on-demand serial femtosecond crystallography at the European XFEL station FXE

Structural Dynamics
2024-03-01 | Journal article | Author
DOI: 10.1063/4.0000248
Part of ISSN: 2329-7778
Contributors: Samuel Perrett; Alisia Fadini; Christopher D. M. Hutchison; Sayantan Bhattacharya; Cade Morrison; Oleksii Turkot; Mads Sielemann Jakobsen; Michael Größler; José Licón-Saláiz; Florian Griese et al.
Source: Self-asserted source
Joachim Schulz

Mix-and-extrude: high-viscosity sample injection towards time-resolved protein crystallography

Journal of Applied Crystallography
2023-05-21 | Journal article | Author
DOI: 10.1107/s1600576723004405
Part of ISSN: 1600-5767
Contributors: Mohammad Vakili; Huijong Han; Christina Schmidt; Agnieszka Wrona; Marco Kloos; Iñaki de Diego Martinez; Katerina Dörner; Tian Geng; Chan Kim; Faisal Hammad Mekky Koua et al.
Source: Self-asserted source
Joachim Schulz

Convolutional neural network approach for the automated identification ofin cellulocrystals

2023-03-29 | Preprint
DOI: 10.1101/2023.03.28.533948
Contributors: Amirhossein Kardoost; Robert Schönherr; Carsten Deiter; Lars Redecke; Kristina Lorenzen; Joachim Schulz; Iñaki de Diego
Source: check_circle
Crossref

Towards real-time analysis of liquid jet alignment in serial femtosecond crystallography

Journal of Applied Crystallography
2022-08-01 | Journal article
DOI: 10.1107/S1600576722005891
Contributors: Jaydeep Patel; Adam Round; Johan Bielecki; Katerina Doerner; Henry Kirkwood; Romain Letrun; Joachim Schulz; Marcin Sikorski; Mohammad Vakili; Raphael de Wijn et al.
Source: check_circle
Crossref

3D printed devices and infrastructure for liquid sample delivery at the European XFEL

Journal of Synchrotron Radiation
2022-03-01 | Journal article | Author
DOI: 10.1107/s1600577521013370
Part of ISSN: 1600-5775
Contributors: Mohammad Vakili; Johan Bielecki; Juraj Knoska; Florian Otte; Huijong Han; Marco Kloos; Robin Schubert; Elisa; Grant Mills; Raphaël de Wijn et al.
Source: Self-asserted source
Joachim Schulz

Megahertz x-ray microscopy at x-ray free-electron laser and synchrotron sources

Optica
2019-09-20 | Journal article
DOI: 10.1364/optica.6.001106
Part of ISSN: 2334-2536
Source: Self-asserted source
Joachim Schulz

Native mass spectrometry provides sufficient ion flux for XFEL single-particle imaging

Journal of Synchrotron Radiation
2019-05-01 | Journal article
DOI: 10.1107/S1600577519002686
Contributors: Charlotte Uetrecht; Kristina Lorenzen; Matthäus Kitel; Johannes Heidemann; Jesse Huron Robinson Spencer; Hartmut Schlüter; Joachim Schulz
Source: check_circle
Crossref

A versatile liquid-jet setup for the European XFEL

Journal of Synchrotron Radiation
2019-03-01 | Journal article
DOI: 10.1107/S1600577519000894
Contributors: J. Schulz; J. Bielecki; R. B. Doak; K. Dörner; R. Graceffa; R. L. Shoeman; M. Sikorski; P. Thute; D. Westphal; A. P. Mancuso
Source: check_circle
Crossref

Rapid sample delivery for megahertz serial crystallography at X-ray FELs

IUCrJ
2018-09-01 | Journal article
DOI: 10.1107/s2052252518008369
Part of ISSN: 2052-2525
Source: Self-asserted source
Joachim Schulz

Femtosecond and nanometre visualization of structural dynamics in superheated nanoparticles

Nature Photonics
2016-02 | Journal article
DOI: 10.1038/nphoton.2015.264
Part of ISSN: 1749-4885
Part of ISSN: 1749-4893
Source: Self-asserted source
Joachim Schulz

Imaging single cells in a beam of live cyanobacteria with an X-ray laser

Nature Communications
2015-05 | Journal article
DOI: 10.1038/ncomms6704
Part of ISSN: 2041-1723
Source: Self-asserted source
Joachim Schulz

Soft x-ray free-electron laser induced damage to inorganic scintillators

Optical Materials Express
2015-02-01 | Journal article
DOI: 10.1364/ome.5.000254
Part of ISSN: 2159-3930
Source: Self-asserted source
Joachim Schulz

Femtosecond x-ray photoelectron diffraction on gas-phase dibromobenzene molecules

Journal of Physics B: Atomic, Molecular and Optical Physics
2014-06-28 | Journal article
DOI: 10.1088/0953-4075/47/12/124035
Part of ISSN: 0953-4075
Part of ISSN: 1361-6455
Source: Self-asserted source
Joachim Schulz

X-Ray Diffraction from Isolated and Strongly Aligned Gas-Phase Molecules with a Free-Electron Laser

Physical Review Letters
2014-02-28 | Journal article
DOI: 10.1103/physrevlett.112.083002
Part of ISSN: 0031-9007
Part of ISSN: 1079-7114
Source: Self-asserted source
Joachim Schulz

Toward unsupervised single-shot diffractive imaging of heterogeneous particles using X-ray free-electron lasers

Optics Express
2013-11-18 | Journal article
DOI: 10.1364/oe.21.028729
Part of ISSN: 1094-4087
Source: Self-asserted source
Joachim Schulz

Mesoscale morphology of airborne core–shell nanoparticle clusters: x-ray laser coherent diffraction imaging

Journal of Physics B: Atomic, Molecular and Optical Physics
2013-08-28 | Journal article
DOI: 10.1088/0953-4075/46/16/164033
Part of ISSN: 0953-4075
Part of ISSN: 1361-6455
Source: Self-asserted source
Joachim Schulz

Invited Article: Coherent imaging using seeded free-electron laser pulses with variable polarization: First results and research opportunities

Review of Scientific Instruments
2013-05 | Journal article
DOI: 10.1063/1.4807157
Part of ISSN: 0034-6748
Part of ISSN: 1089-7623
Source: Self-asserted source
Joachim Schulz

Sensing the wavefront of x-ray free-electron lasers using aerosol spheres

Optics Express
2013-05-20 | Journal article
DOI: 10.1364/oe.21.012385
Part of ISSN: 1094-4087
Source: Self-asserted source
Joachim Schulz

Sample refreshment schemes for high repetition rate FEL experiments

Advances in X-ray Free-Electron Lasers II: Instrumentation
2013-05-03 | Conference paper
DOI: 10.1117/12.2019754
Source: Self-asserted source
Joachim Schulz

In vivo protein crystallization opens new routes in structural biology

Nature Methods
2012-03 | Journal article
DOI: 10.1038/nmeth.1859
Part of ISSN: 1548-7091
Part of ISSN: 1548-7105
Source: Self-asserted source
Joachim Schulz

Lipidic phase membrane protein serial femtosecond crystallography

Nature Methods
2012-03 | Journal article
DOI: 10.1038/nmeth.1867
Part of ISSN: 1548-7091
Part of ISSN: 1548-7105
Source: Self-asserted source
Joachim Schulz

Femtosecond free-electron laser x-ray diffraction data sets for algorithm development

Optics Express
2012-02-13 | Journal article
DOI: 10.1364/oe.20.004149
Part of ISSN: 1094-4087
Source: Self-asserted source
Joachim Schulz

Self-terminating diffraction gates femtosecond X-ray nanocrystallography measurements

Nature Photonics
2012-01 | Journal article
DOI: 10.1038/nphoton.2011.297
Part of ISSN: 1749-4885
Part of ISSN: 1749-4893
Source: Self-asserted source
Joachim Schulz

Time-resolved protein nanocrystallography using an X-ray free-electron laser

Optics Express
2012-01-30 | Journal article
DOI: 10.1364/oe.20.002706
Part of ISSN: 1094-4087
Source: Self-asserted source
Joachim Schulz

Radiation damage in protein serial femtosecond crystallography using an x-ray free-electron laser

Physical Review B
2011-12-20 | Journal article
DOI: 10.1103/physrevb.84.214111
Part of ISSN: 1098-0121
Part of ISSN: 1550-235X
Source: Self-asserted source
Joachim Schulz

Unsupervised classification of single-particle X-ray diffraction snapshots by spectral clustering

Optics Express
2011-08-15 | Journal article
DOI: 10.1364/oe.19.016542
Part of ISSN: 1094-4087
Source: Self-asserted source
Joachim Schulz

Femtosecond X-ray protein nanocrystallography

Nature
2011-02 | Journal article
DOI: 10.1038/nature09750
Part of ISSN: 0028-0836
Part of ISSN: 1476-4687
Source: Self-asserted source
Joachim Schulz

Single mimivirus particles intercepted and imaged with an X-ray laser

Nature
2011-02 | Journal article
DOI: 10.1038/nature09748
Part of ISSN: 0028-0836
Part of ISSN: 1476-4687
Source: Self-asserted source
Joachim Schulz

Single-shot femtosecond x-ray diffraction from randomly oriented ellipsoidal nanoparticles

Physical Review Special Topics - Accelerators and Beams
2010-09-14 | Journal article
DOI: 10.1103/physrevstab.13.094701
Part of ISSN: 1098-4402
Source: Self-asserted source
Joachim Schulz

Cryptotomography: Reconstructing 3D Fourier Intensities from Randomly Oriented Single-Shot Diffraction Patterns

Physical Review Letters
2010-06-02 | Journal article
DOI: 10.1103/physrevlett.104.225501
Part of ISSN: 0031-9007
Part of ISSN: 1079-7114
Source: Self-asserted source
Joachim Schulz

Sacrificial Tamper Slows Down Sample Explosion in FLASH Diffraction Experiments

Physical Review Letters
2010-02-12 | Journal article
DOI: 10.1103/physrevlett.104.064801
Part of ISSN: 0031-9007
Part of ISSN: 1079-7114
Source: Self-asserted source
Joachim Schulz

Aerosol Imaging with a Soft X-Ray Free Electron Laser

Aerosol Science and Technology
2010-02-10 | Journal article
DOI: 10.1080/02786820903485800
Part of ISSN: 0278-6826
Part of ISSN: 1521-7388
Source: Self-asserted source
Joachim Schulz

Core level absorption of laser-excited Rb and Cs atoms

Journal of Physics B: Atomic, Molecular and Optical Physics
2009-09-14 | Journal article
DOI: 10.1088/0953-4075/42/17/175001
Part of ISSN: 0953-4075
Part of ISSN: 1361-6455
Source: Self-asserted source
Joachim Schulz

Term-dependent lifetime broadening effect on the 4d photoelectron spectrum of atomic thulium

Journal of Physics B: Atomic, Molecular and Optical Physics
2008-11-14 | Journal article
DOI: 10.1088/0953-4075/41/21/215002
Part of ISSN: 0953-4075
Part of ISSN: 1361-6455
Source: Self-asserted source
Joachim Schulz

A method to characterize electronic states of 4s ionized Rb by combined laser and synchrotron spectroscopy

EPL (Europhysics Letters)
2008-09 | Journal article
DOI: 10.1209/0295-5075/83/53001
Part of ISSN: 0295-5075
Part of ISSN: 1286-4854
Source: Self-asserted source
Joachim Schulz

Shake-up satellites accompanying the inner shell ionization of alkali atoms

Journal of Electron Spectroscopy and Related Phenomena
2007-10 | Journal article
DOI: 10.1016/j.elspec.2006.10.003
Part of ISSN: 0368-2048
Source: Self-asserted source
Joachim Schulz

Valence photoelectron spectra of Na, K, Rb and Cs with s or p outermost electron: Evolution of the states from LS-coupling to jK-coupling

Journal of Electron Spectroscopy and Related Phenomena
2007-10 | Journal article
DOI: 10.1016/j.elspec.2007.02.031
Part of ISSN: 0368-2048
Source: Self-asserted source
Joachim Schulz

Localized versus delocalized excitations just above the 3d threshold in krypton clusters studied by Auger electron spectroscopy

The Journal of Chemical Physics
2007-09-28 | Journal article
DOI: 10.1063/1.2770460
Part of ISSN: 0021-9606
Part of ISSN: 1089-7690
Source: Self-asserted source
Joachim Schulz

Many-electron effects in 2p photoionization and Auger decay of atomic aluminium

Journal of Physics B: Atomic, Molecular and Optical Physics
2007-09-14 | Journal article
DOI: 10.1088/0953-4075/40/17/011
Part of ISSN: 0953-4075
Part of ISSN: 1361-6455
Source: Self-asserted source
Joachim Schulz

Free nanoscale sodium clusters studied by core-level photoelectron spectroscopy

Physical Review B
2007-06-06 | Journal article
DOI: 10.1103/physrevb.75.235407
Part of ISSN: 1098-0121
Part of ISSN: 1550-235X
Source: Self-asserted source
Joachim Schulz

Core-level electron spectroscopy on the sodium dimer Na2plevel

Physical Review A
2007-03-19 | Journal article
DOI: 10.1103/physreva.75.032510
Part of ISSN: 1050-2947
Part of ISSN: 1094-1622
Source: Self-asserted source
Joachim Schulz

Strong influence of configuration interactions on the orientation and alignment dichroism in the3pphotoelectron spectra of free laser-polarized Fe atoms

Physical Review A
2007-01-25 | Journal article
DOI: 10.1103/physreva.75.012718
Part of ISSN: 1050-2947
Part of ISSN: 1094-1622
Source: Self-asserted source
Joachim Schulz

Effects of initial-state laser excitation on inner-shell photoionization and Auger decay of Rb

Physical Review A
2006-12-07 | Journal article
DOI: 10.1103/physreva.74.062704
Part of ISSN: 1050-2947
Part of ISSN: 1094-1622
Source: Self-asserted source
Joachim Schulz

Characterization of weakly excited final states by shakedown spectroscopy of laser-excited potassium

Physical Review A
2006-07-06 | Journal article
DOI: 10.1103/physreva.74.012705
Part of ISSN: 1050-2947
Part of ISSN: 1094-1622
Source: Self-asserted source
Joachim Schulz

5pphotoemission from laser-excited cesium atoms

Physical Review A
2006-06-28 | Journal article
DOI: 10.1103/physreva.73.062721
Part of ISSN: 1050-2947
Part of ISSN: 1094-1622
Source: Self-asserted source
Joachim Schulz

Laser excitation combined with2pphotoionization and Auger decay of potassium

Physical Review A
2006-02-27 | Journal article
DOI: 10.1103/physreva.73.022720
Part of ISSN: 1050-2947
Part of ISSN: 1094-1622
Source: Self-asserted source
Joachim Schulz

Final state selection in the4pphotoemission of Rb by combining laser spectroscopy with soft-x-ray photoionization

Physical Review A
2005-09-16 | Journal article
DOI: 10.1103/physreva.72.032718
Part of ISSN: 1050-2947
Part of ISSN: 1094-1622
Source: Self-asserted source
Joachim Schulz

The electronic structure of free water clusters probed by Auger electron spectroscopy

The Journal of Chemical Physics
2005-08 | Journal article
DOI: 10.1063/1.1989319
Part of ISSN: 0021-9606
Part of ISSN: 1089-7690
Source: Self-asserted source
Joachim Schulz
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