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Hefei University of Technology: Hefei, Anhui, CN

2006-05-10 to present | Professor (School of instrument science and opto-electronics engineering)
Employment
Source: Self-asserted source
Rongsheng Lu

Works (50 of 134)

Items per page:
Page 1 of 3

Advantages of multiple field of view spectrometer

Optics and Lasers in Engineering
2023 | Journal article
EID:

2-s2.0-85139062834

Part of ISSN: 01438166
Contributors: Feng, Z.; Xia, G.; Zhang, L.; Li, Y.; Shi, W.; Gao, L.; Lu, R.
Source: Self-asserted source
Rongsheng Lu via Scopus - Elsevier

Monochromatic LED-based spectrally tunable light source for chromatic confocal sensors

Optical Engineering
2023 | Journal article
EID:

2-s2.0-85149386954

Part of ISSN: 15602303 00913286
Contributors: Zhang, Z.; Lu, R.; Zhang, A.; Li, H.; Liu, J.
Source: Self-asserted source
Rongsheng Lu via Scopus - Elsevier

Quantitative differential phase contrast phase reconstruction for sparse samples

Optics and Lasers in Engineering
2023 | Journal article
EID:

2-s2.0-85146289247

Part of ISSN: 01438166
Contributors: Peng, T.; Ke, Z.; Zhang, S.; He, J.; Wang, P.; Wang, F.; Zhong, Z.; Fang, S.; Shi, H.; Lu, R. et al.
Source: Self-asserted source
Rongsheng Lu via Scopus - Elsevier

YOLO-HR: Improved YOLOv5 for Object Detection in High-Resolution Optical Remote Sensing Images

Remote Sensing
2023 | Journal article
EID:

2-s2.0-85147911831

Part of ISSN: 20724292
Contributors: Wan, D.; Lu, R.; Wang, S.; Shen, S.; Xu, T.; Lang, X.
Source: Self-asserted source
Rongsheng Lu via Scopus - Elsevier

Binocular Camera Calibration Based on Directional Target and Multi-Constraint Optimization,基于方向性靶标和多约束优化的双目相机标定

Guangxue Xuebao/Acta Optica Sinica
2022 | Journal article
EID:

2-s2.0-85133564021

Part of ISSN: 02532239
Contributors: Yang, P.; Yin, Y.; Lu, R.; Zhu, H.
Source: Self-asserted source
Rongsheng Lu via Scopus - Elsevier

Development of a confocal line-scan laser scattering probe for dark-field surface defects detection of transmissive optics

Review of Scientific Instruments
2022 | Journal article
EID:

2-s2.0-85137097614

Part of ISSN: 10897623 00346748
Contributors: Dong, J.; Chang, K.; Tian, Z.; Zhang, T.; Lang, X.; Zhang, Y.; Lu, R.; Xie, X.
Source: Self-asserted source
Rongsheng Lu via Scopus - Elsevier

Effects of sample surface morphology on laser-induced breakdown spectroscopy

Journal of Analytical Atomic Spectrometry
2022 | Journal article
EID:

2-s2.0-85134411678

Part of ISSN: 13645544 02679477
Contributors: Yang, L.; Zhang, Y.; Zhang, Z.; Li, Y.; Xiang, Y.; Dong, J.; Wei, Y.; Chang, S.; Lu, R.
Source: Self-asserted source
Rongsheng Lu via Scopus - Elsevier

High Dynamic Range Imaging Method Based on YCbCr Color Space Fusion,基于 YCbCr 空间融合的高动态范围成像方法

Laser and Optoelectronics Progress
2022 | Journal article
EID:

2-s2.0-85133684172

Part of ISSN: 10064125
Contributors: Tang, L.; Lu, R.; Shi, Y.; Hu, H.
Source: Self-asserted source
Rongsheng Lu via Scopus - Elsevier

High-reflective surfaces shape measurement technology based on adaptive fringe projection

Sensors and Actuators A: Physical
2022 | Journal article
EID:

2-s2.0-85139179427

Part of ISSN: 09244247
Contributors: Cai, X.; Xu, R.; Li, H.; Wang, Y.; Lu, R.
Source: Self-asserted source
Rongsheng Lu via Scopus - Elsevier

High-Reflective Surfaces Shape Measurement Technology Based on Adaptive Fringe Projection

SSRN
2022 | Other
EID:

2-s2.0-85129420412

Part of ISSN: 15565068
Contributors: Cai, X.; Xu, R.; Li, H.; Wang, Y.; Lu, R.
Source: Self-asserted source
Rongsheng Lu via Scopus - Elsevier

Performance Evaluation Method for Focusing Evaluation Operator in Superposed Large Depth Imaging,叠 焦 大 景 深 成 像 中 的 聚 焦 评 价 算 子 性 能 评 估 方 法

Laser and Optoelectronics Progress
2022 | Journal article
EID:

2-s2.0-85133700059

Part of ISSN: 10064125
Contributors: Yu, C.; Lu, R.
Source: Self-asserted source
Rongsheng Lu via Scopus - Elsevier

Random Interpolation Resize: A Free Image Data Augmentation Method for Object Detection in Industry

SSRN
2022 | Other
EID:

2-s2.0-85143577121

Part of ISSN: 15565068
Contributors: Wan, D.; Lu, R.; Xu, T.; Shen, S.; Lang, X.; Ren, Z.
Source: Self-asserted source
Rongsheng Lu via Scopus - Elsevier

Spectral preprocessing to improve accuracy of quantitative detection of elemental Cr in austenitic stainless steel by laser-induced breakdown spectroscopy

Review of Scientific Instruments
2022 | Journal article
EID:

2-s2.0-85126479727

Part of ISSN: 10897623 00346748
Contributors: Yang, L.; Zhang, Y.; Liu, J.; Zhang, Z.; Xu, M.; Ji, F.; Chen, J.; Zhang, T.; Lu, R.
Source: Self-asserted source
Rongsheng Lu via Scopus - Elsevier

Adaptive Fringe Projection Measurement Method for High Dynamic Range Surface,高动态范围表面自适应条纹投影测量方法

Guangxue Xuebao/Acta Optica Sinica
2021 | Journal article
EID:

2-s2.0-85119095000

Part of ISSN: 02532239
Contributors: Wang, J.; Lu, R.; Liu, D.
Source: Self-asserted source
Rongsheng Lu via Scopus - Elsevier

Automatic defect inspection of thin film transistor-liquid crystal display panels using robust one-dimensional Fourier reconstruction with non-uniform illumination correction

Review of Scientific Instruments
2021 | Journal article
EID:

2-s2.0-85117140548

Part of ISSN: 10897623 00346748
Contributors: Zhang, T.; Dong, J.; Yang, L.; Liu, S.; Lu, R.
Source: Self-asserted source
Rongsheng Lu via Scopus - Elsevier

High-performance ultra-thin spectrometer optical design based on Coddington’s equations

Sensors (Switzerland)
2021 | Journal article
EID:

2-s2.0-85099084945

Part of ISSN: 14248220
Contributors: Feng, Z.; Xia, G.; Lu, R.; Cai, X.; Cui, H.; Hu, M.
Source: Self-asserted source
Rongsheng Lu via Scopus - Elsevier

Influence of target surface morphology on LIBS spectrum

Proceedings of SPIE - The International Society for Optical Engineering
2021 | Conference paper
EID:

2-s2.0-85122436127

Part of ISSN: 1996756X 0277786X
Contributors: Yang, L.; Zhang, Z.; Zhang, Y.H.; He, P.; Ji, F.; Lu, R.S.
Source: Self-asserted source
Rongsheng Lu via Scopus - Elsevier

Initial structure of dispersion objective for chromatic confocal sensor based on doublet lens

Optics and Lasers in Engineering
2021 | Journal article
EID:

2-s2.0-85097636631

Part of ISSN: 01438166
Contributors: Zhang, Z.; Lu, R.
Source: Self-asserted source
Rongsheng Lu via Scopus - Elsevier

Sensitivity enhancement in photothermal interferometry by balanced detection of the complex response to moving excitation

Optics Letters
2021 | Journal article
EID:

2-s2.0-85108159575

Part of ISSN: 15394794 01469592
Contributors: Dong, J.; Xie, X.; Yang, L.; Lang, X.; Lu, R.; Zhang, T.; Zhang, L.; Zhou, S.; Li, J.
Source: Self-asserted source
Rongsheng Lu via Scopus - Elsevier

Calibration of a stereo microscope based on non-coplanar feature points with iteratively weighted radial alignment constraint

Optics and Lasers in Engineering
2020 | Journal article
EID:

2-s2.0-85075989929

Part of ISSN: 01438166
Contributors: Liu, X.; Lu, R.
Source: Self-asserted source
Rongsheng Lu via Scopus - Elsevier

Decoupling of thermo-electronic effect by traveling photothermal mirror method for characterization of thermal properties of semiconductors

Applied Physics Letters
2020 | Journal article
EID:

2-s2.0-85082390887

Part of ISSN: 00036951
Contributors: Dong, J.; Li, J.; Yang, L.; Zhang, T.; Lu, R.; Li, J.; Zhang, L.; Zhou, S.
Source: Self-asserted source
Rongsheng Lu via Scopus - Elsevier

FPGA-accelerated textured surface defect segmentation based on complete period Fourier reconstruction

Journal of Real-Time Image Processing
2020 | Journal article
EID:

2-s2.0-85076204899

Part of ISSN: 18618219 18618200
Contributors: Pan, Y.; Lu, R.; Zhang, T.
Source: Self-asserted source
Rongsheng Lu via Scopus - Elsevier

FPGA-assisted high-precision, high-speed 3D shape measurement

Sensors and Actuators, A: Physical
2020 | Journal article
EID:

2-s2.0-85092639564

Part of ISSN: 09244247
Contributors: Liu, D.; Pan, Y.; Lu, R.
Source: Self-asserted source
Rongsheng Lu via Scopus - Elsevier

Measurement method of three-dimensional shape of bright surface with binocular stereo vision

Laser and Optoelectronics Progress
2020 | Journal article
EID:

2-s2.0-85082747336

Part of ISSN: 10064125
Contributors: Cheng, Z.; Lu, R.; Mao, C.
Source: Self-asserted source
Rongsheng Lu via Scopus - Elsevier

Measurement Technique of High-reflected Surface Based on Phase Measuring Deflectometry,基于相移偏折法的高反射表面面形测量技术

Guangzi Xuebao/Acta Photonica Sinica
2020 | Journal article
EID:

2-s2.0-85083890710

Part of ISSN: 10044213
Contributors: Zhang, L.-T.; Lu, R.-S.; Cheng, Z.-Y.
Source: Self-asserted source
Rongsheng Lu via Scopus - Elsevier

Scalable Multicamera Heterogeneous Processing Architecture for Phase Measuring Profilometry

IEEE Sensors Journal
2020 | Journal article
EID:

2-s2.0-85091741167

Part of ISSN: 15581748 1530437X
Contributors: Pan, Y.; Liu, D.; Lu, R.
Source: Self-asserted source
Rongsheng Lu via Scopus - Elsevier

Sequence Image Registration for Large Depth of Microscopic Focus Stacking

IEEE Access
2020 | Journal article
EID:

2-s2.0-85078232895

Part of ISSN: 21693536
Contributors: Wu, A.; Shi, Y.; Lu, R.; Zhang, Z.
Source: Self-asserted source
Rongsheng Lu via Scopus - Elsevier

Testing system for the mechanical properties of small-scale specimens based on 3d microscopic digital image correlation

Sensors (Switzerland)
2020 | Journal article
EID:

2-s2.0-85086989587

Part of ISSN: 14248220
Contributors: Liu, X.; Lu, R.
Source: Self-asserted source
Rongsheng Lu via Scopus - Elsevier

Characterization of surface roughness by double blanket model from laser speckle images

Proceedings of SPIE - The International Society for Optical Engineering
2019 | Conference paper
EID:

2-s2.0-85062848306

Part of ISSN: 1996756X 0277786X
Contributors: Yang, L.; Ji, F.; Zhang, Y.Z.; Xu, M.J.; Chen, J.J.; Lu, R.S.
Source: Self-asserted source
Rongsheng Lu via Scopus - Elsevier

Comparison of photothermal responses under spatial and temporal modulations of CW Gaussian beam excitation: A numerical study

Journal of Applied Physics
2019 | Journal article
EID:

2-s2.0-85063147142

Part of ISSN: 10897550 00218979
Contributors: Dong, J.; Lu, R.; Wu, Z.; Chen, J.
Source: Self-asserted source
Rongsheng Lu via Scopus - Elsevier

Directional phase-shift circular arrays targets for out-of-focus camera calibration

Proceedings of SPIE - The International Society for Optical Engineering
2019 | Conference paper
EID:

2-s2.0-85062855448

Part of ISSN: 1996756X 0277786X
Contributors: Liu, X.; Lu, R.
Source: Self-asserted source
Rongsheng Lu via Scopus - Elsevier

Dual-loop Sagnac interferometer with a geometric phase shifter for quadrature phase bias locking

Optics Letters
2019 | Journal article
EID:

2-s2.0-85075075421

Part of ISSN: 15394794 01469592
Contributors: Dong, J.; Lu, R.
Source: Self-asserted source
Rongsheng Lu via Scopus - Elsevier

FPGA-accelerated one-dimensional Fourier reconstruction LCD defect detection algorithm

Proceedings of SPIE - The International Society for Optical Engineering
2019 | Conference paper
EID:

2-s2.0-85062859587

Part of ISSN: 1996756X 0277786X
Contributors: Pan, Y.; Lu, R.
Source: Self-asserted source
Rongsheng Lu via Scopus - Elsevier

Heat coupling effect on photothermal detection with a moving Gaussian excitation beam

Applied Optics
2019 | Journal article
EID:

2-s2.0-85074413506

Part of ISSN: 21553165 1559128X
Contributors: Dong, J.; Lu, R.
Source: Self-asserted source
Rongsheng Lu via Scopus - Elsevier

Performance analysis of three-dimensional measurement algorithm with focus variation microscopic imaging

Laser and Optoelectronics Progress
2019 | Journal article
EID:

2-s2.0-85064461080

Part of ISSN: 10064125
Contributors: Shi, Y.; Ying, Q.; Lu, R.
Source: Self-asserted source
Rongsheng Lu via Scopus - Elsevier

Spatial modulation of heat source for highly sensitive photothermal detection

Applied Physics Letters
2019 | Journal article
EID:

2-s2.0-85064074609

Part of ISSN: 00036951
Contributors: Dong, J.; Zhang, T.; Zhang, Y.; Yang, L.; Lu, R.
Source: Self-asserted source
Rongsheng Lu via Scopus - Elsevier

A multi-frequency inverse-phase error compensation method for projector nonlinear in 3D shape measurement

Optics Communications
2018 | Journal article
EID:

2-s2.0-85044056100

Part of ISSN: 00304018
Contributors: Mao, C.; Lu, R.; Liu, Z.
Source: Self-asserted source
Rongsheng Lu via Scopus - Elsevier

Characterization of weakly absorbing thin films by multiple linear regression analysis of absolute unwrapped phase in angle-resolved spectral reflectometry

Optics Express
2018 | Journal article
EID:

2-s2.0-85046353222

Part of ISSN: 10944087
Contributors: Dong, J.; Lu, R.
Source: Self-asserted source
Rongsheng Lu via Scopus - Elsevier

Inverse Error Compensation Method for Improvement of Phase Recovery Accuracy of Multi-Frequency Fringe Projection

Guangxue Xuebao/Acta Optica Sinica
2018 | Journal article
EID:

2-s2.0-85050858701

Part of ISSN: 02532239
Contributors: Mao, C.; Lu, R.
Source: Self-asserted source
Rongsheng Lu via Scopus - Elsevier

Investigation of the normal spectral band emissivity characteristic within 7.5 to 13 μm for Molybdenum between 100 and 500 °C

Infrared Physics and Technology
2018 | Journal article
EID:

2-s2.0-85034610107

Part of ISSN: 13504495
Contributors: Zhang, Y.; Zhang, Y.; Lu, R.; Shu, S.; Lang, X.; Yang, L.
Source: Self-asserted source
Rongsheng Lu via Scopus - Elsevier

Multi-channel averaging detection for fast imaging of weakly absorbing defects in surface thermal lensing

Review of Scientific Instruments
2018 | Journal article
EID:

2-s2.0-85057053894

Part of ISSN: 10897623 00346748
Contributors: Dong, J.; Lu, R.; Zhang, T.; Yang, L.; Zhang, Y.; Wu, Z.; Chen, J.
Source: Self-asserted source
Rongsheng Lu via Scopus - Elsevier

Overview of the 3D Profilometry of Phase Shifting Fringe Projection,相移条纹投影三维形貌测量技术综述

Jiliang Xuebao/Acta Metrologica Sinica
2018 | Journal article
EID:

2-s2.0-85058650121

Part of ISSN: 10001158
Contributors: Mao, C.-L.; Lu, R.-S.; Dong, J.-T.; Zhang, Y.-Z.
Source: Self-asserted source
Rongsheng Lu via Scopus - Elsevier

Research on the normal spectral band emissivity of tungsten between 150 and 500 °c

Review of Scientific Instruments
2018 | Journal article
EID:

2-s2.0-85055343664

Part of ISSN: 10897623 00346748
Contributors: Zhang, Y.; Ji, F.; Zhang, Y.; Shu, S.; Lu, R.
Source: Self-asserted source
Rongsheng Lu via Scopus - Elsevier

Retrieval of the thickness and refractive index dispersion of parallel plate from a single interferogram recorded in both spectral and angular domains

Journal of Applied Physics
2018 | Journal article
EID:

2-s2.0-85045844603

Part of ISSN: 10897550 00218979
Contributors: Dong, J.; Lu, R.
Source: Self-asserted source
Rongsheng Lu via Scopus - Elsevier

Review on Automated Optical (Visual) Inspection and Its Applications in Defect Detection,自动光学(视觉)检测技术及其在缺陷检测中的应用综述

Guangxue Xuebao/Acta Optica Sinica
2018 | Journal article
EID:

2-s2.0-85054519258

Part of ISSN: 02532239
Contributors: Lu, R.; Wu, A.; Zhang, T.; Wang, Y.
Source: Self-asserted source
Rongsheng Lu via Scopus - Elsevier

Automatic neighbor r selection for one-dimensional DFT method in the surface defect inspection of TFT-LCD

Zhongguo Jixie Gongcheng/China Mechanical Engineering
2016 | Journal article
EID:

2-s2.0-84995946153

Part of ISSN: 1004132X
Contributors: Zhang, T.; Lu, R.; Dang, X.
Source: Self-asserted source
Rongsheng Lu via Scopus - Elsevier

CFD simulation and optimization of the capillary throttling of air-flotation unit

Proceedings of SPIE - The International Society for Optical Engineering
2016 | Conference paper
EID:

2-s2.0-84959896710

Part of ISSN: 1996756X 0277786X
Contributors: Bin, H.; Yi, J.; Tao, J.; Lu, R.
Source: Self-asserted source
Rongsheng Lu via Scopus - Elsevier

Development and calibration of an air-floating six-axis force measurement platform using self-calibration

Review of Scientific Instruments
2016 | Journal article
EID:

2-s2.0-84986625371

Part of ISSN: 10897623 00346748
Contributors: Huang, B.; Wang, X.; Li, C.; Yi, J.; Lu, R.; Tao, J.
Source: Self-asserted source
Rongsheng Lu via Scopus - Elsevier

Dual fitting for sub-pixel edge detection of high temperature image

Proceedings of SPIE - The International Society for Optical Engineering
2016 | Conference paper
EID:

2-s2.0-84959913210

Part of ISSN: 1996756X 0277786X
Contributors: Lu, Y.; Lu, R.-S.; Guo, G.-P.
Source: Self-asserted source
Rongsheng Lu via Scopus - Elsevier

Stretched distance measurement using dynamic tracking based on the fast normalized cross-correlation algorithm

Chinese Journal of Sensors and Actuators
2016 | Journal article
EID:

2-s2.0-84994174457

Part of ISSN: 10041699
Contributors: Lu, Y.; Lu, R.; Guo, G.; Zhang, T.
Source: Self-asserted source
Rongsheng Lu via Scopus - Elsevier
Items per page:
Page 1 of 3

Peer review (13 reviews for 4 publications/grants)

Review activity for Advanced engineering informatics. (4)
Review activity for International journal, advanced manufacturing technology. (1)
Review activity for Measurement. (1)
Review activity for Optics and lasers in engineering. (7)