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Works (3)

Scan-Based Radiation Test Method Using SRAM Dosimeter for Beam Characterization

IEEE Transactions on Nuclear Science
2025 | Journal article
DOI: 10.1109/TNS.2024.3500376
Contributors: Saqib A. Khan; Daeyong Eom; Changhee Cho; Seungjoo Woo; Hyeonju Kim; Sung S. Chung; Joongsik Kih; Kiseog Kim; Stephen Wender; Keunwoo Lee et al.
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Evaluation of Neutron Radiation Impact for 1200-V Class 4H-SiC MOSFET at Gate Switching Mode With TCAD Simulation

IEEE Transactions on Nuclear Science
2023-08 | Journal article
DOI: 10.1109/TNS.2023.3272918
Contributors: Dongwoo Bae; Kiseog Kim; Hyeokjae Lee; Sung S. Chung; Joongsik Kih; Seungjoo Woo; Changhee Cho; Saqib Ali Khan; Changheon Yang; Stephen A. Wender et al.
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New Real-Time Fluence Correction Method With SRAM Dosimeter for High Accuracy Single-Event Upset Evaluation

IEEE Transactions on Nuclear Science
2023-05 | Journal article
DOI: 10.1109/TNS.2023.3243555
Contributors: Raehwan Yoon; Dongwoo Bae; Kiseog Kim; Sung S. Chung; Joongsik Kih; Hyeokjae Lee; Seungjoo Woo; Changhee Cho; Jonghoon Yoo; Stephen A. Wender et al.
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