Personal information

Verified email addresses

Verified email domains

Beamline engineering, Monochromator, Spectrometer, Optical metrology, Diffraction grating
China

Biography

Xuewei Du received his B.S. degree in 2008 and Ph.D. degree in 2013, both from the University of Science and Technology of China (USTC).
Since 2013, he has been working as an Engineer/Senior Engineer at the National Synchrotron Radiation Laboratory (NSRL) at USTC. His areas of research include beamline engineering and spectroscopic instruments.

Activities

Employment (1)

University of Science and Technology of China: Hefei, CN

2013-07-01 to present | Senior Engineer (National Synchrotron Radiation Laboratory)
Employment
Source: Self-asserted source
Xuewei Du

Education and qualifications (2)

University of Science and Technology of China: Hefei, CN

2008-09-01 to 2013-06-30 | Ph.D. (National Synchrotron Radiation Laboratory)
Education
Source: Self-asserted source
Xuewei Du

University of Science and Technology of China: Hefei, CN

2004-09-01 to 2008-07-01 | B.S. (Precision Machinery and Precision Instruments)
Education
Source: Self-asserted source
Xuewei Du

Works (50 of 51)

Items per page:
Page 1 of 2

Vibration stability of an ultra-high-resolution plane grating monochromator at HALF

Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
2024-11 | Journal article
Contributors: Zhanglang Xu; Yang Peng; Zimeng Wang; Shen Wei; Xuewei Du; Qiuping Wang
Source: check_circle
Crossref
grade
Preferred source (of 2)‎

Thermal optimization of a high heat load liquid-metal-bath cooled mirror at the Hefei Advanced Light Facility

Review of Scientific Instruments
2024-08-01 | Journal article
Contributors: Minghao Lin; Jie Chen; Zimeng Wang; Shuaikang Jiang; Qiuping Wang; Xuewei Du
Source: check_circle
Crossref
grade
Preferred source (of 2)‎

Integrated optical design method for the synchrotron radiation beamlines

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
2023 | Journal article
EID:

2-s2.0-85153295749

Part of ISSN: 01689002
Contributors: Wang, Z.; Zhu, J.; Du, X.; Wang, Q.; Wang, P.; Tang, Y.
Source: Self-asserted source
Xuewei Du via Scopus - Elsevier
grade
Preferred source (of 2)‎

Laboratory-scale X-ray absorption spectrometer with a cylindrical Johansson crystal analyzer

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
2023 | Journal article
EID:

2-s2.0-85147092784

Part of ISSN: 01689002
Contributors: Zhang, W.; Shen, J.; Xiao, Z.; Du, X.; Wang, Q.
Source: Self-asserted source
Xuewei Du via Scopus - Elsevier
grade
Preferred source (of 2)‎

Space-resolved vacuum-ultraviolet spectroscopy for measuring impurity emission from divertor region of EAST tokamak

Plasma Science and Technology
2022 | Journal article
EID:

2-s2.0-85131414153

Part of ISSN: 20586272 10090630
Contributors: He, L.; Shen, Y.; Zhang, H.; Lyu, B.; Bae, C.; Ji, H.; Li, C.; Fu, J.; Du, X.; Wang, F. et al.
Source: Self-asserted source
Xuewei Du via Scopus - Elsevier

A compact electron beam ion trap in support of high-temperature plasma diagnostics based on conduction-cooled superconducting coils

Review of Scientific Instruments
2021 | Journal article
EID:

2-s2.0-85108066973

Part of ISSN: 10897623 00346748
Contributors: Bin, B.; Lyu, B.; Yang, Y.; Zhang, H.M.; Hao, Q.W.; Wang, F.D.; Dai, C.; Du, X.W.; Fu, J.; Li, Y.Y. et al.
Source: Self-asserted source
Xuewei Du via Scopus - Elsevier
grade
Preferred source (of 2)‎

A wavelength calibration method for variable-included-angle plane grating monochromators with sine drives

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
2021 | Journal article
EID:

2-s2.0-85101541795

Part of ISSN: 01689002
Contributors: Wang, Z.; Du, X.; Hu, J.; Wang, Q.; Wang, P.; Tang, Y.
Source: Self-asserted source
Xuewei Du via Scopus - Elsevier
grade
Preferred source (of 2)‎

Development and preliminary test of a space-resolved vacuum-ultraviolet spectroscopy in EAST

Review of Scientific Instruments
2021 | Journal article
EID:

2-s2.0-85103764746

Part of ISSN: 10897623 00346748
Contributors: He, L.; Zhang, H.M.; Lyu, B.; Shen, Y.C.; Li, C.Y.; Yang, W.C.; Fu, J.; Du, X.W.; Wang, F.D.; Wang, Q.P. et al.
Source: Self-asserted source
Xuewei Du via Scopus - Elsevier
grade
Preferred source (of 2)‎

Experimental and simulation study of impurity transport response to RMPs in RF-heated H-mode plasmas at EAST

Journal of Plasma Physics
2021 | Journal article
EID:

2-s2.0-85103402026

Part of ISSN: 14697807 00223778
Contributors: Vogel, G.; Zhang, H.; Shen, Y.; Dai, S.; Sun, Y.; Huang, J.; Gu, S.; Fu, J.; Hu, R.; Chen, J. et al.
Source: Self-asserted source
Xuewei Du via Scopus - Elsevier

Laboratory x-ray spectrometer for XAFS measurements

Proceedings of SPIE - The International Society for Optical Engineering
2021 | Conference paper
EID:

2-s2.0-85122514715

Part of ISBN: 9781510650039
Part of ISSN: 1996756X 0277786X
Contributors: Zhang, W.; Shen, J.; Xu, Z.; Lin, M.; Du, X.; Wang, Q.
Source: Self-asserted source
Xuewei Du via Scopus - Elsevier

Monochromatic Kirkpatrick-Baez microscope using two spherically bent crystals

Proceedings of SPIE - The International Society for Optical Engineering
2020 | Conference paper
EID:

2-s2.0-85098577557

Part of ISBN: 9781510640696
Part of ISSN: 1996756X 0277786X
Contributors: Shen, J.; An, N.; Zhang, W.; Du, X.; Wang, Q.
Source: Self-asserted source
Xuewei Du via Scopus - Elsevier

Monochromatic Kirkpatrick–Baez microscope combining a spherically bent crystal and a multilayer mirror

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
2020 | Journal article
EID:

2-s2.0-85088637031

Part of ISSN: 01689002
Contributors: Shen, J.; An, N.; Zhang, W.; Cao, Z.; Du, X.; Ding, Y.; Wang, Q.
Source: Self-asserted source
Xuewei Du via Scopus - Elsevier

Accurate x-ray source dimension measurement by the spherically bent crystal imaging system

Proceedings of SPIE - The International Society for Optical Engineering
2019 | Conference paper
EID:

2-s2.0-85078324633

Part of ISBN: 9781510631731
Part of ISSN: 1996756X 0277786X
Contributors: Shen, J.; Zhang, W.; Zan, G.; Xu, Z.; Du, X.; Wang, Q.
Source: Self-asserted source
Xuewei Du via Scopus - Elsevier

An efficient procedure in quantitative analysis using laser-induced breakdown spectroscopy

Plasma Science and Technology
2019 | Journal article
EID:

2-s2.0-85062272546

Part of ISSN: 20586272 10090630
Contributors: Pan, C.; He, J.; Wang, G.; Du, X.; Liu, Y.; Su, Y.
Source: Self-asserted source
Xuewei Du via Scopus - Elsevier

Identifying Ancient Ceramics Using Laser-Induced Breakdown Spectroscopy Combined with a Back Propagation Neural Network

Applied Spectroscopy
2019 | Journal article
EID:

2-s2.0-85070309671

Part of ISSN: 19433530 00037028
Contributors: He, J.; Liu, Y.; Pan, C.; Du, X.
Source: Self-asserted source
Xuewei Du via Scopus - Elsevier

Photon diagnosis and transmission for Dalian Coherent light source

Proceedings of SPIE - The International Society for Optical Engineering
2019 | Conference paper
EID:

2-s2.0-85072642706

Part of ISBN: 9781510627420
Part of ISSN: 1996756X 0277786X
Contributors: Li, Q.; Yu, Y.; Yang, J.; Ding, H.; Shi, L.; Tao, K.; Wang, G.; Wu, G.; Dai, D.; Zhang, W. et al.
Source: Self-asserted source
Xuewei Du via Scopus - Elsevier

Quantitative Analysis of Carbon with Laser-Induced Breakdown Spectroscopy (LIBS) Using Genetic Algorithm and Back Propagation Neural Network Models

Applied Spectroscopy
2019 | Journal article
EID:

2-s2.0-85067037317

Part of ISSN: 19433530 00037028
Contributors: He, J.; Pan, C.; Liu, Y.; Du, X.
Source: Self-asserted source
Xuewei Du via Scopus - Elsevier

Absolute Calibration of Laser-induced Breakdown Spectroscopy Detection System by Using a Tungsten Halogen Lamp,用卤钨灯对激光诱导击穿光谱探测系统进行绝对效率标定

Guangzi Xuebao/Acta Photonica Sinica
2018 | Journal article
EID:

2-s2.0-85056673426

Part of ISSN: 10044213
Contributors: Fei, T.; Pan, C.-Y.; Zeng, Q.; Du, X.-W.; Wang, Q.-P.
Source: Self-asserted source
Xuewei Du via Scopus - Elsevier

Design of the new soft X-ray beamline for in situ analysis of energy materials at National Synchrotron Radiation Laboratory

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
2018 | Journal article
EID:

2-s2.0-85030676124

Part of ISSN: 01689002
Contributors: Du, L.; Du, X.; Wang, Q.; Zhong, J.
Source: Self-asserted source
Xuewei Du via Scopus - Elsevier

Extreme ultraviolet spectroscopy applied to study RMP effects on core impurity concentration in EAST

IEEE Transactions on Plasma Science
2018 | Journal article
EID:

2-s2.0-85044320423

Part of ISSN: 00933813
Contributors: Vogel, G.; Zhang, H.; Shen, Y.; Sun, Y.; Zang, Q.; Gu, S.; Chu, N.; Fu, J.; Chen, J.; Hu, R. et al.
Source: Self-asserted source
Xuewei Du via Scopus - Elsevier

Online monitoring of corrosion behavior in molten metal using laser-induced breakdown spectroscopy

Spectrochimica Acta - Part B Atomic Spectroscopy
2018 | Journal article
EID:

2-s2.0-85041930313

Part of ISSN: 05848547
Contributors: Zeng, Q.; Pan, C.; Li, C.; Fei, T.; Ding, X.; Du, X.; Wang, Q.
Source: Self-asserted source
Xuewei Du via Scopus - Elsevier

Relative spectral response calibration using Ti plasma lines

Plasma Science and Technology
2018 | Journal article
EID:

2-s2.0-85045000177

Part of ISSN: 20586272 10090630
Contributors: Fei, T.; Pan, C.; Zeng, Q.; Wang, Q.; Du, X.
Source: Self-asserted source
Xuewei Du via Scopus - Elsevier

Upgrade of X-ray crystal spectrometer for high temperature measurement using neon-like xenon lines on EAST

Review of Scientific Instruments
2018 | Journal article
EID:

2-s2.0-85053883335

Part of ISSN: 10897623 00346748
Contributors: Hu, R.J.; Chen, J.; Delgado-Aparicio, L.F.; Wang, Q.P.; Du, X.W.; Shen, J.; Yang, X.S.; Wang, F.D.; Fu, J.; Li, Y.Y. et al.
Source: Self-asserted source
Xuewei Du via Scopus - Elsevier

Color Matching and Repairing of Paintings Based on Multispectral Imaging Technology

Bandaoti Guangdian/Semiconductor Optoelectronics
2017 | Journal article
EID:

2-s2.0-85027249884

Part of ISSN: 10015868
Contributors: Shao, Z.; Du, X.; Pan, C.; Dai, T.
Source: Self-asserted source
Xuewei Du via Scopus - Elsevier

Construction and performance of combustion beamline at NSRL

AIP Conference Proceedings
2016 | Conference paper
EID:

2-s2.0-84984585990

Part of ISBN: 9780735413986
Part of ISSN: 15517616 0094243X
Contributors: Du, X.; Li, C.; Wei, S.; Du, L.; Yang, J.; Zhou, Z.; Qi, F.; Wang, Q.
Source: Self-asserted source
Xuewei Du via Scopus - Elsevier

Multi-element detection in molten steel with laser-induced breakdown spectroscopy

Guang Pu Xue Yu Guang Pu Fen Xi/Spectroscopy and Spectral Analysis
2016 | Journal article
EID:

2-s2.0-84981326622

Part of ISSN: 10000593
Contributors: Yu, Y.-S.; Pan, C.-Y.; Zeng, Q.; Du, X.-W.; Wei, S.; Wang, S.-B.; Wang, Q.-P.
Source: Self-asserted source
Xuewei Du via Scopus - Elsevier

Performance of the undulator based ultraviolet and soft x-ray beamline for catalysis and surface science at National Synchrotron Radiation Laboratory

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
2016 | Journal article
EID:

2-s2.0-84990935143

Part of ISSN: 01689002
Contributors: Du, L.; Du, X.; Wei, S.; Li, C.; Pan, C.; Ju, H.; Wang, Q.; Zhu, J.
Source: Self-asserted source
Xuewei Du via Scopus - Elsevier

Quantitative analysis of carbon steel with multi-line internal standard calibration method using laser-induced breakdown spectroscopy

Applied Spectroscopy
2016 | Journal article
EID:

2-s2.0-84964311221

Part of ISSN: 19433530 00037028
Contributors: Pan, C.; Du, X.; An, N.; Zeng, Q.; Wang, S.; Wang, Q.
Source: Self-asserted source
Xuewei Du via Scopus - Elsevier

The vacuum ultraviolet beamline/endstations at NSRL dedicated to combustion research

Journal of Synchrotron Radiation
2016 | Journal article
EID:

2-s2.0-84976634685

Part of ISSN: 16005775 09090495
Contributors: Zhou, Z.; Du, X.; Yang, J.; Wang, Y.; Li, C.; Wei, S.; Du, L.; Li, Y.; Qi, F.; Wang, Q.
Source: Self-asserted source
Xuewei Du via Scopus - Elsevier

Two-dimensional groove density measurement for gratings by diffraction method

AIP Conference Proceedings
2016 | Conference paper
EID:

2-s2.0-84984571967

Part of ISBN: 9780735413986
Part of ISSN: 15517616 0094243X
Contributors: Du, L.; Du, X.; Wang, Q.
Source: Self-asserted source
Xuewei Du via Scopus - Elsevier

A study of the laser-induced breakdown spectroscopy of carbon in the ultraviolet wavelength range under vacuum conditions

Plasma Science and Technology
2015 | Conference paper
EID:

2-s2.0-84938501203

Part of ISSN: 20586272 10090630
Contributors: Pan, C.; Du, X.; Zeng, Q.; Yu, Y.; Wang, S.; Wang, Q.
Source: Self-asserted source
Xuewei Du via Scopus - Elsevier

Calibration of the toroidal Charge eXchange Recombination Spectroscopy system on EAST

Fusion Engineering and Design
2015 | Conference paper
EID:

2-s2.0-84942832476

Part of ISSN: 09203796
Contributors: Zhang, Y.; Li, Y.; Fu, J.; Yin, X.; Lyu, B.; Shi, Y.; Du, X.; Wang, Q.; Yu, Y.; Ye, M. et al.
Source: Self-asserted source
Xuewei Du via Scopus - Elsevier

Development of a high spectral resolution UV flat-field spectrograph

Guang Pu Xue Yu Guang Pu Fen Xi/Spectroscopy and Spectral Analysis
2015 | Journal article
EID:

2-s2.0-84932083413

Part of ISSN: 10000593
Contributors: Du, L.-L.; Du, X.-W.; Li, C.-Y.; An, N.; Wang, Q.-P.
Source: Self-asserted source
Xuewei Du via Scopus - Elsevier

Impurity Emission Behavior in the Soft X-Ray and Extreme Ultraviolet Range on EAST

Plasma Science and Technology
2015 | Journal article
EID:

2-s2.0-84930027012

Part of ISSN: 20586272 10090630
Contributors: Shen, Y.; Lyu, B.; Du, X.; Li, Y.; Fu, J.; Wang, F.; Pan, X.; Chen, J.; Wang, Q.; Shi, Y.
Source: Self-asserted source
Xuewei Du via Scopus - Elsevier

On-line spectral diagnostic system for Dalian Coherent Light Source

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
2015 | Journal article
EID:

2-s2.0-84924217493

Part of ISSN: 01689002
Contributors: Li, C.; Wei, S.; Du, X.; Du, L.; Wang, Q.; Zhang, W.; Wu, G.; Dai, D.; Yang, X.
Source: Self-asserted source
Xuewei Du via Scopus - Elsevier

The auto-focusing remote laser-induced breakdown spectroscopy system

Guang Pu Xue Yu Guang Pu Fen Xi/Spectroscopy and Spectral Analysis
2015 | Journal article
EID:

2-s2.0-84923467263

Part of ISSN: 10000593
Contributors: Han, Z.-Y.; Pan, C.-Y.; An, N.; Du, X.-W.; Yu, Y.-S.; Du, L.-L.; Wang, S.-B.; Wang, Q.-P.
Source: Self-asserted source
Xuewei Du via Scopus - Elsevier

Toroidal charge exchange recombination spectroscopy on EAST

Fusion Engineering and Design
2015 | Conference paper
EID:

2-s2.0-84942821706

Part of ISSN: 09203796
Contributors: Ye, M.; Li, Y.; Yu, Y.; Shi, Y.; Lyu, B.; Fu, J.; Du, X.; Yin, X.; Zhang, Y.; Wang, Q. et al.
Source: Self-asserted source
Xuewei Du via Scopus - Elsevier

Development of the charge exchange recombination spectroscopy and the beam emission spectroscopy on the EAST tokamak

Review of Scientific Instruments
2014 | Journal article
EID:

2-s2.0-84906509655

Part of ISSN: 10897623 00346748
Contributors: Li, Y.Y.; Fu, J.; Lyu, B.; Du, X.W.; Li, C.Y.; Zhang, Y.; Yin, X.H.; Yu, Y.; Wang, Q.P.; Von Hellermann, M. et al.
Source: Self-asserted source
Xuewei Du via Scopus - Elsevier

Kirkpatrick-Baez microscope with spherical multilayer mirrors around 2.5keV photon energy

Proceedings of SPIE - The International Society for Optical Engineering
2014 | Conference paper
EID:

2-s2.0-84922809203

Part of ISBN: 9781628412383
Part of ISSN: 1996756X 0277786X
Contributors: An, N.; Du, X.; Wang, Q.; Cao, Z.; Jiang, S.; Ding, Y.
Source: Self-asserted source
Xuewei Du via Scopus - Elsevier

Alignment of the photoelectron spectroscopy beamline at NSRL

Chinese Physics C
2013 | Journal article
EID:

2-s2.0-84888376183

Part of ISSN: 16741137
Contributors: Li, C.-Y.; Pan, H.-B.; Wei, S.; Pan, C.-Y.; An, N.; Du, X.-W.; Zhu, J.-F.; Wang, Q.-P.
Source: Self-asserted source
Xuewei Du via Scopus - Elsevier

Laser-induced breakdown spectroscopy system for elements analysis in high-temperature and vacuum environment

Guang Pu Xue Yu Guang Pu Fen Xi/Spectroscopy and Spectral Analysis
2013 | Journal article
EID:

2-s2.0-84891119302

Part of ISSN: 10000593
Contributors: Pan, C.-Y.; Du, X.-W.; An, N.; Han, Z.-Y.; Wang, S.-B.; Wei, W.; Wang, Q.-P.
Source: Self-asserted source
Xuewei Du via Scopus - Elsevier

Space-resolved extreme ultraviolet spectrometer system for impurity behavior research on experimental advanced superconducting Tokamak

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
2013 | Journal article
EID:

2-s2.0-84869879597

Part of ISSN: 01689002
Contributors: Shen, Y.; Du, X.; Zhang, W.; Wang, Q.; Li, Y.; Fu, J.; Wang, F.; Xu, J.; Lu, B.; Shi, Y. et al.
Source: Self-asserted source
Xuewei Du via Scopus - Elsevier

Spatially-resolved flat-field soft X-ray spectrometer on experimental advanced superconducting tokamak

Fusion Engineering and Design
2013 | Journal article
EID:

2-s2.0-84885960267

Part of ISSN: 09203796
Contributors: Shen, Y.; Lu, B.; Du, X.; Li, Y.; Fu, J.; Wang, F.; Zhang, H.; Xiong, Y.; Wang, Q.; Shi, Y. et al.
Source: Self-asserted source
Xuewei Du via Scopus - Elsevier

EUV flat field grating spectrometer and performance measurement

Guang Pu Xue Yu Guang Pu Fen Xi/Spectroscopy and Spectral Analysis
2012 | Journal article
EID:

2-s2.0-84865827204

Part of ISSN: 10000593
Contributors: Du, X.-W.; Shen, Y.-C.; Li, C.-Y.; An, N.; Shi, Y.-J.; Wang, Q.-P.
Source: Self-asserted source
Xuewei Du via Scopus - Elsevier

Accurate wavelength calibration method for flat-field grating spectrometers

Applied Spectroscopy
2011 | Journal article
EID:

2-s2.0-80052923029

Part of ISSN: 00037028
Contributors: Du, X.; Li, C.; Xu, Z.; Wang, Q.
Source: Self-asserted source
Xuewei Du via Scopus - Elsevier

Flat-field EUV spectrometer and its performance test by Penning discharge source

Proceedings of SPIE - The International Society for Optical Engineering
2011 | Conference paper
EID:

2-s2.0-84862926271

Part of ISBN: 9780819488381
Part of ISSN: 0277786X
Contributors: Du, X.; Shi, Y.; Zhang, W.; Shen, Y.; Wang, Q.
Source: Self-asserted source
Xuewei Du via Scopus - Elsevier

High resolution EUV spectrometer diagnostic system on EAST

He Jishu/Nuclear Techniques
2011 | Journal article
EID:

2-s2.0-80052107630

Part of ISSN: 02533219
Contributors: Zhang, W.; Shi, Y.; Wang, Q.; Shen, Y.; Du, X.; Li, Y.; Fu, J.; Wang, F.; Lü, B.; Xu, J. et al.
Source: Self-asserted source
Xuewei Du via Scopus - Elsevier

Measuring method of spatial and spectral distribution of hollow cathode lamp

Guang Pu Xue Yu Guang Pu Fen Xi/Spectroscopy and Spectral Analysis
2011 | Journal article
EID:

2-s2.0-80054703161

Part of ISSN: 10000593
Contributors: Wu, Z.-Z.; Du, X.-W.; Li, C.-Y.; Ke, G.-Y.; Wang, Q.-P.
Source: Self-asserted source
Xuewei Du via Scopus - Elsevier

Modelling of Offner imaging spectrometers and aberration analysis

Guangxue Xuebao/Acta Optica Sinica
2011 | Journal article
EID:

2-s2.0-79954459807

Part of ISSN: 02532239
Contributors: Liu, G.; Wu, G.; Ling, Q.; Wang, Q.; Du, X.
Source: Self-asserted source
Xuewei Du via Scopus - Elsevier

Spectral response and SNR analysis of an Offner imaging spectrometer

Proceedings of SPIE - The International Society for Optical Engineering
2011 | Conference paper
EID:

2-s2.0-80052560840

Part of ISBN: 9780819488350
Part of ISSN: 0277786X
Contributors: Wu, Z.-Z.; Du, X.-W.; Ma, Z.-H.; Huang, W.-J.; Wang, Q.-P.
Source: Self-asserted source
Xuewei Du via Scopus - Elsevier
Items per page:
Page 1 of 2

Peer review (3 reviews for 2 publications/grants)

Review activity for Optics and lasers in engineering. (1)
Review activity for Optics communications. (2)