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Education and qualifications (1)

Indian Institute of Technology Kharagpur Department of Chemistry: Kharagpur, West Bengal, IN

(Department of Chemistry )
Qualification
Source: Self-asserted source
Towshif Ali

Works (3)

Scribe Line Defect-Induced Yield Loss in FINFET Technology

IEEE Transactions on Semiconductor Manufacturing
2019-11 | Journal article
DOI: 10.1109/TSM.2019.2942268
Contributors: Fauzia Khatkhatay; Haiting Wang; Amit Gupta; Julie Lee; Towshif Ali; Joseph Matthew Kaule; Ludmila Popova; Chih-Chieh Huang; Hye Jin Lee; Yining Zang et al.
Source: check_circle
Crossref

Impact of scribe line (kerf) defectivity on wafer yield

2018 29th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC)
2018-04 | Conference paper
DOI: 10.1109/asmc.2018.8373180
ISBN: 9781538637487
Source: Self-asserted source
Towshif Ali

Microscopic Dynamics of the Orientation of a Hydrated Nanoparticle in an Electric Field

Physical Review Letters
2009-11-10 | Journal article
DOI: 10.1103/physrevlett.103.207801
Part of ISSN: 0031-9007
Part of ISSN: 1079-7114
Source: Self-asserted source
Towshif Ali
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