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Works (6)

Reliability effects of lateral filament confinement by nano-scaling the oxide in memristive devices

Nanoscale Horizons
2024 | Journal article | Author
DOI: 10.1039/d3nh00520h
Part of ISSN: 2055-6756
Part of ISSN: 2055-6764
Contributors: Pascal Stasner; Nils Kopperberg; Kristoffer Schnieders; Tyler Hennen; Stefan Wiefels; Stephan Menzel; Rainer Waser; Dirk Wouters
Source: Self-asserted source
Kristoffer Schnieders

Experimental Verification of Uncoupled Memristive Cellular Nonlinear Network by Processing the EDGE Detection Task

Proceedings of the 18th ACM International Symposium on Nanoscale Architectures
2023-12-18 | Conference paper | Author
DOI: 10.1145/3611315.3633274
Contributors: Yongmin Wang; Kristoffer Schnieders; Vasileios Ntinas; Alon Ascoli; Felix Cüppers; Susanne Hoffmann-Eifert; Stefan Wiefels; Ronald Tetzlaff; Vikas Rana; Stephan Menzel
Source: Self-asserted source
Kristoffer Schnieders

Impact of the switching mode on the read noise of ReRAM devices

Proceedings of the 18th ACM International Symposium on Nanoscale Architectures
2023-12-18 | Conference paper | Author
DOI: 10.1145/3611315.3633248
Contributors: Kristoffer Schnieders; Stephan Aussen; Felix Cüppers; Susanne Hoffmann-Eifert; Stefan Wiefels
Source: Self-asserted source
Kristoffer Schnieders

A Physical Description of the Variability in Single‐ReRAM Devices and Hardware‐Based Neuronal Networks

Advanced Intelligent Systems
2023-11 | Journal article
DOI: 10.1002/aisy.202300129
Part of ISSN: 2640-4567
Part of ISSN: 2640-4567
Contributors: Carsten Funck; Stefan Wiefels; Christopher Bengel; Kristoffer Schnieders; Susanne Hoffmann-Eifert; Regina Dittmann; Stephan Menzel
Source: Self-asserted source
Kristoffer Schnieders

Advanced Electrical Characterization of Memristive Arrays for Neuromorphic Applications

2023 IEEE International Conference on Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE)
2023-10-25 | Conference paper | Author
DOI: 10.1109/metroxraine58569.2023.10405805
Contributors: Stefan Wiefels; Xiaohua Liu; Kristoffer Schnieders; Mathias Schumacher; Rainer Waser; Lutz Nielen
Source: Self-asserted source
Kristoffer Schnieders

Effect of electron conduction on the read noise characteristics in ReRAM devices

APL Materials
2022-10-01 | Journal article | Author
DOI: 10.1063/5.0109787
Part of ISSN: 2166-532X
Contributors: Kristoffer Schnieders; C. Funck; Felix Cüppers; Stephan Aussen; Tim Kempen; Alexandros Sarantopoulos; Regina Dittmann; Stephan Menzel; Vikas Rana; Susanne Hoffmann-Eifert et al.
Source: Self-asserted source
Kristoffer Schnieders
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