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Works (16)

A Novel Energy-Efficient Scheme for RPL Attacker Identification in IoT Networks Using Discrete Event Modeling

IEEE Access
2023 | Journal article
DOI: 10.1109/ACCESS.2023.3296558
Contributors: Dipojjwal Ray; Pradeepkumar Bhale; Santosh Biswas; Pinaki Mitra; Sukumar Nandi
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OPTIMIST: Lightweight and Transparent IDS With Optimum Placement Strategy to Mitigate Mixed-Rate DDoS Attacks in IoT Networks

IEEE Internet of Things Journal
2023-05-15 | Journal article
DOI: 10.1109/JIOT.2023.3234530
Contributors: Pradeepkumar Bhale; Debanjan Roy Chowdhury; Santosh Biswas; Sukumar Nandi
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On Securing Cryptographic ICs against Scan-based Attacks: A Hamming Weight Distribution Perspective

ACM Journal on Emerging Technologies in Computing Systems
2023-04-30 | Journal article
DOI: 10.1145/3577215
Contributors: Dipojjwal Ray; Yogendra Sao; Santosh Biswas; Sk Subidh Ali
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Accelerating NoC Verification Using a Complete Model and Active Window

IEEE Access
2022 | Journal article
DOI: 10.1109/ACCESS.2022.3199671
Contributors: Surajit Das; Chandan Karfa; Santosh Biswas
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Fault Localization Scheme for Missing Gate Faults in Reversible Circuits

ACM Transactions on Design Automation of Electronic Systems
2022-07-31 | Journal article
DOI: 10.1145/3503539
Contributors: Mousum Handique; Jantindra Kumar Deka; Santosh Biswas
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Optimal work-conserving scheduler synthesis for real-time sporadic tasks using supervisory control of timed discrete-event systems

Journal of Scheduling
2021-02-23 | Journal article
DOI: 10.1007/s10951-020-00669-0
Contributors: Rajesh Devaraj; Arnab Sarkar; Santosh Biswas
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Formal Modeling of Network-on-Chip Using CFSM and its Application in Detecting Deadlock

IEEE Transactions on Very Large Scale Integration (VLSI) Systems
2020-04 | Journal article
DOI: 10.1109/TVLSI.2019.2959618
Contributors: Surajit Das; Chandan Karfa; Santosh Biswas
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An Efficient Test Set Construction Scheme for Multiple Missing-Gate Faults in Reversible Circuits

Journal of Electronic Testing
2020-02-04 | Journal article
DOI: 10.1007/s10836-020-05855-8
Contributors: Mousum Handique; Jantindra Kumar Deka; Santosh Biswas
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RSBST: an Accelerated Automated Software-Based Self-Test Synthesis for Processor Testing

Journal of Electronic Testing
2019-10-09 | Journal article
DOI: 10.1007/s10836-019-05825-9
Contributors: Vasudevan Madampu Suryasarman; Santosh Biswas; Aryabartta Sahu
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A Binary Decision Diagram Approach to On-line Testing of Asynchronous Circuits with Dynamic and Static C-elements

Journal of Electronic Testing
2019-10-07 | Journal article
DOI: 10.1007/s10836-019-05828-6
Contributors: Pradeep Kumar Biswal; Santosh Biswas
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Test Generation for Bridging Faults in Reversible Circuits Using Path-Level Expressions

Journal of Electronic Testing
2019-08-22 | Journal article
DOI: 10.1007/s10836-019-05811-1
Contributors: Mousum Handique; Santosh Biswas; Jantindra Kumar Deka
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Performance-Aware Test Scheduling for Diagnosing Coexistent Channel Faults in Topology-Agnostic Networks-on-Chip

ACM Transactions on Design Automation of Electronic Systems
2019-03-31 | Journal article
DOI: 10.1145/3291532
Contributors: Biswajit Bhowmik; Jatindra Kumar Deka; Santosh Biswas; Bhargab B. Bhattacharya
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Supervisory Control Approach and its Symbolic Computation for Power-Aware RT Scheduling

IEEE Transactions on Industrial Informatics
2019-02 | Journal article
DOI: 10.1109/TII.2018.2824564
Contributors: Rajesh Devaraj; Arnab Sarkar; Santosh Biswas
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A Game Theory Based Multi Layered Intrusion Detection Framework for Wireless Sensor Networks

International Journal of Wireless Information Networks
2018-12-28 | Journal article
DOI: 10.1007/s10776-018-0403-6
Contributors: Basant Subba; Santosh Biswas; Sushanta Karmakar
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An Efficient Scheme to Detect Evil Twin Rogue Access Point Attack in 802.11 Wi-Fi Networks

International Journal of Wireless Information Networks
2018-06 | Journal article
DOI: 10.1007/s10776-018-0396-1
Contributors: Mayank Agarwal; Santosh Biswas; Sukumar Nandi
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Reliability-Aware Test Methodology for Detecting Short-Channel Faults in On-Chip Networks

IEEE Transactions on Very Large Scale Integration (VLSI) Systems
2018-06 | Journal article
DOI: 10.1109/TVLSI.2018.2803478
Contributors: Biswajit Bhowmik; Santosh Biswas; Jatindra Kumar Deka; Bhargab B. Bhattacharya
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