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Funding (2)

Mechanizm formowania bariery Schottky`ego oraz zjawiska zachodzące w wysokich temperaturach w strukturach epitaksjalnych GaN-na-Si z kontaktami z krzemów metali

2019-07-11 to 2020-07-10 | Grant
National Science Center (Krakow, PL)
URL: https://app.dimensions.ai/details/grant/grant.9182792
GRANT_NUMBER:

2018/31/D/ST7/02901
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Marek Wzorek via DimensionsWizard

Badanie wpływu reakcji metal-półprzewodnik na kontakty do węglika krzemu w celu opracowania metody uzyskiwania kontaktów omowych o niskiej rezystywności i jednorodnej mikrostrukturze

2012-04-06 to 2014-04-05 | Grant
Ministry of Science and Higher Education (Warsaw, PL)
URL: https://app.dimensions.ai/details/grant/grant.7395354
GRANT_NUMBER:

IP2/2011/71/0625
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Marek Wzorek via DimensionsWizard

Works (26)

Low‐Resistivity Ti/Al/TiN/Au Ohmic Contacts to Ga‐ and N‐Face n‐GaN for Vertical Power Devices

physica status solidi (a)
2024-11 | Journal article
DOI: 10.1002/pssa.202400076
Contributors: Oskar Sadowski; Maciej Kamiński; Andrzej Taube; Jarosław Tarenko; Marek Guziewicz; Marek Wzorek; Justyna Maleszyk; Iwona Jóźwik; Anna Szerling; Paweł Prystawko et al.
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Crossref

Nanoporous Copper Films: How to Grow Porous Films by Magnetron Sputter Deposition

Crystals
2024-11-07 | Journal article
DOI: 10.3390/cryst14110965
Contributors: Michał A. Borysiewicz; Patrycja Barańczyk; Jakub Zawadzki; Marek Wzorek; Rafał Zybała; Beata Synkiewicz-Musialska; Paweł Krzyściak
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Crossref
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Schottky Barrier Formation Mechanism and Thermal Stability in Au-Free Cu/Metal–Silicide Contacts to GaN-Cap/AlGaN/AlN-Spacer/GaN-on-Si Heterostructure

Electronics
2024-08-29 | Journal article
DOI: 10.3390/electronics13173429
Contributors: Marek Wzorek; Marek Ekielski; Krzysztof Piskorski; Jarosław Tarenko; Michał A. Borysiewicz; Ernest Brzozowski; Andrzej Taube
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Crossref
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Spectroscopic properties of close-to-perfect-monolayer quasi-free-standing epitaxial graphene on 6H SiC(0001)

Applied Surface Science
2024-01 | Journal article | Author
DOI: 10.1016/j.apsusc.2023.158617
Part of ISSN: 0169-4332
Contributors: Artur Dobrowolski; Jakub Jagiełło; Karolina Piętak-Jurczak; Marek Wzorek; Dariusz Czołak; Tymoteusz Ciuk
Source: Self-asserted source
Marek Wzorek
grade
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Thermal Stability of Cu/Pd<sub>2</sub>Si/, Cu/, and Au/Ni/ Schottky Contacts to AlGaN/GaN Heterostructures

IEEE Transactions on Electron Devices
2024-01 | Journal article | Author
DOI: 10.1109/ted.2023.3337752
Part of ISSN: 0018-9383
Part of ISSN: 1557-9646
Contributors: Marek Wzorek; Marek Ekielski; Jarosław Tarenko; Michał A. Borysiewicz; Ernest Brzozowski; Andrzej Taube
Source: Self-asserted source
Marek Wzorek
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All‐Oxide Transparent Vertical Indium Tin Oxide and Aluminum‐Doped Zinc Oxide/<i>β</i>‐Ga<sub>2</sub>O<sub>3</sub> Schottky Diodes

physica status solidi (a)
2023-10 | Journal article | Author
DOI: 10.1002/pssa.202300251
Part of ISSN: 1862-6300
Part of ISSN: 1862-6319
Contributors: Andrzej Taube; Michał Borysiewicz; Oskar Artur Sadowski; Aleksandra Wójcicka; Jarosław Tarenko; Marek Wzorek
Source: Self-asserted source
Marek Wzorek
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Energy-Transfer Processes in Nonstoichiometric and Stoichiometric Er3+, Ho3+, Nd3+, Pr3+, and Cr3+ -Codoped Ce:YAG Transparent Ceramics: Toward High-Power and Warm-White Laser Diodes and LEDs

Physical Review Applied
2023-07-21 | Journal article | Author
DOI: 10.1103/physrevapplied.20.014047
Part of ISSN: 2331-7019
Contributors: Karol Bartosiewicz; Agnieszka Szysiak; Robert Tomala; Przemysław Gołębiewski; Helena Węglarz; Vitali Nagirnyi; Marco Kirm; Ivo Romet; Maksym Buryi; Vitezslav Jary et al.
Source: Self-asserted source
Marek Wzorek

Investigation of amorphous (Ir,Ru)-Si and (Ir,Ru)-Si-O Schottky contacts to (001) β-Ga2O3

Materials Science in Semiconductor Processing
2023-02 | Journal article | Author
DOI: 10.1016/j.mssp.2022.107218
Part of ISSN: 1369-8001
Contributors: Andrzej Taube; Michał Borysiewicz; Oskar Artur Sadowski; Aleksandra Wójcicka; Jarosław Tarenko; Krzysztof Piskorski; Marek Wzorek
Source: Self-asserted source
Marek Wzorek
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Electrical properties of Cu/Pd2Si Schottky contacts to AlGaN/GaN-on-Si HEMT heterostructures

Materials Science in Semiconductor Processing
2023-01 | Journal article | Author
DOI: 10.1016/j.mssp.2022.107157
Part of ISSN: 1369-8001
Contributors: Marek Wzorek; M. Ekielski; E. Brzozowski; A. Taube
Source: Self-asserted source
Marek Wzorek
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Empirical indication for desalinating properties of porous boron nitride

Scripta Materialia
2022-11 | Journal article | Author
DOI: 10.1016/j.scriptamat.2022.114943
Part of ISSN: 1359-6462
Contributors: Adrianna Rejmer; Aleksandra Krystyna Dąbrowska; Sylwia Kozdra; Johannes Binder; Włodzimierz Strupiński; Roman Stępniewski; Andrzej Wysmołek; STRACHOWSKI Tomasz; Marek Wzorek; Agnieszka Malinowska et al.
Source: Self-asserted source
Marek Wzorek
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Hierarchically porous GaN thin films fabricated using high fluence Ar ion implantation of epitaxial GaN on sapphire

Thin Solid Films
2022-09 | Journal article
DOI: 10.1016/j.tsf.2022.139429
Contributors: M.A. Borysiewicz; M. Juchniewicz; P. Prystawko; A. Zagojski; M. Wzorek; M. Ekielski; K. Pągowska; W. Zaleszczyk
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Crossref

Photoelectric, optical and microstructural characterization of thin palladium silicide (Pd2Si) layers fabricated by magnetron sputtering from a stoichiometric target

Materials Science and Engineering: B
2022-09 | Journal article
DOI: 10.1016/j.mseb.2022.115831
Part of ISSN: 0921-5107
Source: Self-asserted source
Marek Wzorek
grade
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Contamination-induced inhomogeneity of noise sources distribution in Al2O3-passivated quasi-free-standing graphene on 4H-SiC(0001)

Physica E: Low-dimensional Systems and Nanostructures
2022-08 | Journal article
DOI: 10.1016/j.physe.2022.115264
Contributors: T. Ciuk; Ł. Ciura; P.P. Michałowski; J. Jagiełło; A. Dobrowolski; K. Piętak; D. Kalita; M. Wzorek; R. Budzich; D. Czołak et al.
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Crossref

Sensitive Metal-Semiconductor Nanothermocouple Fabricated by FIB to Investigate Laser Beams with Nanometer Spatial Resolution

Sensors
2021-12-31 | Journal article
DOI: 10.3390/s22010287
Part of ISSN: 1424-8220
Contributors: Adam Łaszcz; Andrzej Czerwinski; Emilia Pruszyńska-Karbownik; Marek Wzorek; Dariusz Szmigiel
Source: Self-asserted source
Marek Wzorek

Vacuum-deposited thin film porous ZnO-metal oxide hybrid systems for microsupercapacitor applications with Ir/IrO<sub>2</sub> in ZnO as a new, high-performance electrode

Nanotechnology
2021-10-01 | Journal article
DOI: 10.1088/1361-6528/ac2c43
Part of ISSN: 0957-4484
Part of ISSN: 1361-6528
Contributors: Michał Borysiewicz; Marek Wzorek; Monika Kwoka; Tomasz Wojciechowski
Source: Self-asserted source
Marek Wzorek

A Study of Defects in InAs/GaSb Type-II Superlattices Using High-Resolution Reciprocal Space Mapping

Materials
2021-08-30 | Journal article | Author
DOI: 10.3390/ma14174940
Part of ISSN: 1996-1944
Contributors: Iwona Sankowska; Agata Jasik; Krzysztof Czuba; Jacek Ratajczak; Paweł Kozłowski; Marek Wzorek
Source: Self-asserted source
Marek Wzorek
grade
Preferred source (of 3)‎

Surface Photochemical Corrosion as a Mechanism for Fast Degradation of InGaN UV Laser Diodes

ACS Applied Materials &amp; Interfaces
2020-11-18 | Journal article
DOI: 10.1021/acsami.0c11864
Part of ISSN: 1944-8244
Part of ISSN: 1944-8252
Source: Self-asserted source
Marek Wzorek

AlGaN/GaN High Electron Mobility Transistors on Semi-Insulating Ammono-GaN Substrates with Regrown Ohmic Contacts

Micromachines
2018-10-25 | Journal article
DOI: 10.3390/mi9110546
Part of ISSN: 2072-666X
Source: Self-asserted source
Marek Wzorek
grade
Preferred source (of 2)‎

Flexible IGZO Schottky diodes on paper

Semiconductor Science and Technology
2018-01-01 | Journal article
DOI: 10.1088/1361-6641/aa9acb
Part of ISSN: 0268-1242
Part of ISSN: 1361-6641
Source: Self-asserted source
Marek Wzorek

Ni-Based Ohmic Contacts to<i>n</i>-Type 4H-SiC: The Formation Mechanism and Thermal Stability

Advances in Condensed Matter Physics
2016 | Journal article
DOI: 10.1155/2016/9273702
Part of ISSN: 1687-8108
Part of ISSN: 1687-8124
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Marek Wzorek
grade
Preferred source (of 2)‎

Origin of surface defects and influence of an in situ deposited SiN nanomask on the properties of strained AlGaN/GaN heterostructures grown on Si(111) using metal–organic vapour phase epitaxy

CrystEngComm
2016 | Journal article
DOI: 10.1039/c6ce01804a
Part of ISSN: 1466-8033
Source: Self-asserted source
Marek Wzorek

Influence of absolute argon and oxygen flow values at a constant ratio on the growth of Zn/ZnO nanostructures obtained by DC reactive magnetron sputtering

Applied Surface Science
2016-12 | Journal article
DOI: 10.1016/j.apsusc.2016.07.098
Part of ISSN: 0169-4332
Contributors: M. Masłyk; M.A. Borysiewicz; M. Wzorek; T. Wojciechowski; M. Kwoka; E. Kamińska
Source: Self-asserted source
Marek Wzorek

MnO2 ultrathin films deposited by means of magnetron sputtering: Relationships between process conditions, structural properties and performance in transparent supercapacitors

Superlattices and Microstructures
2016-12 | Journal article
DOI: 10.1016/j.spmi.2016.11.002
Part of ISSN: 0749-6036
Source: Self-asserted source
Marek Wzorek

The effect of Ni:Si ratio on microstructural properties of Ni/Si ohmic contacts to SiC

Applied Surface Science
2016-04 | Journal article
DOI: 10.1016/j.apsusc.2016.02.108
Part of ISSN: 0169-4332
Source: Self-asserted source
Marek Wzorek

Amorphous Ni–Zr layer applied for microstructure improvement of Ni-based ohmic contacts to SiC

Materials Science and Engineering: B
2015-09 | Journal article
DOI: 10.1016/j.mseb.2015.04.012
Part of ISSN: 0921-5107
Source: Self-asserted source
Marek Wzorek

TEM Characterisation of Silicide Phase Formation in Ni-Based Ohmic Contacts to 4H n-SiC

MATERIALS TRANSACTIONS
2011 | Journal article
DOI: 10.2320/matertrans.mb201014
Part of ISSN: 1345-9678
Part of ISSN: 1347-5320
Source: Self-asserted source
Marek Wzorek
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