Personal information

Si, alloy, nanocrystallites, heterostructures, , sublimation, Knudsen, Raman , AFM, PLS, Hall, VAC

Activities

Employment (1)

Institute of Automation and Control Processes: Vladivostok, Primorsky Krai, RU

2002-01-01 to present | senior electronics engineer (Department of Surface Physics: Laboratory of Optics and Electrophysics (№ 105))
Employment
Source: Self-asserted source
Kitan' S. A.

Education and qualifications (1)

Far Eastern National University (now FEFU): Vladivostok, RU

1998-09-01 to 2003-06-17 | diploma with honors (red diploma) (Institute of Physics and Information Technologies: Department of Physics and Technology of Materials for Semiconductor Microelectronics)
Education
Source: Self-asserted source
Kitan' S. A.

Professional activities (1)

Samsung Electronics: Suwon, Gyeonggi-do, KR

2003-07-15 to 2003-08-31 | Intern Student (Samsung Advanced Institute of Technologies)
Invited position
Source: Self-asserted source
Kitan' S. A.

Works (11)

Formation of Mg <sub>2</sub> Si at high temperatures by fast deposition of Mg on Si(111) with wedge-shaped temperature distribution

Applied Surface Science
2018 | Journal article
EID:

2-s2.0-85040360903

Contributors: Gouralnik, A.S.; Maslov, A.M.; Ustinov, A.Y.; Dotsenko, S.A.; Shevlyagin, A.V.; Chernev, I.M.; Il'yashenko, V.M.; Kitan, S.A.; Koblova, E.A.; Galkin, K.N. et al.
Source: Self-asserted source
Kitan' S. A. via Scopus - Elsevier

Photoconductivity and conductivity processes in Si-Sn films grown on Si(100) substrate at room temperature

Defect and Diffusion Forum
2018 | Journal article
EID:

2-s2.0-85054791051

Part of ISSN: 16629507 10120386
Contributors: Goroshko, D.L.; Galkin, N.G.; Chusovitin, E.A.; Kitan, S.A.; Subbotin, E.Y.; Tupkalo, A.V.
Source: Self-asserted source
Kitan' S. A. via Scopus - Elsevier
grade
Preferred source (of 2)‎

SWIR-NIR highly absorbent Si<sub>1-x</sub>Sn<sub>x</sub> alloy film on Si(100) substrate: Crystal structure, optical properties and thermal stability

Defect and Diffusion Forum
2018 | Journal article
EID:

2-s2.0-85054798904

Contributors: Dotsenko, S.A.; Goroshko, D.L.; Chusovitin, E.A.; Kitan, S.A.; Galkin, K.N.; Galkin, N.G.
Source: Self-asserted source
Kitan' S. A. via Scopus - Elsevier
grade
Preferred source (of 2)‎

Influence of the thermal power of a Fe atomic flux on the formation of Cu/Fe nanofilms on a Si(001) substrate

Technical Physics
2014 | Journal article
EID:

2-s2.0-84904509390

Part of ISSN: 10637842
Contributors: Plyusnin, N.I.; Il'yashchenko, V.M.; Kitan, S.A.; Lin, W.-C.; Kuo, C.-C.
Source: Self-asserted source
Kitan' S. A. via Scopus - Elsevier

The effect of underlayer-modified atomic monolayer on the mechanism of subsequent film growth

Technical Physics Letters
2012 | Journal article
EID:

2-s2.0-84861744073

Part of ISSN: 10637850
Contributors: Plyusnin, N.I.; Tarima, N.A.; Il'yashchenko, V.M.; Kitan', S.A.
Source: Self-asserted source
Kitan' S. A. via Scopus - Elsevier

Structural and phase transformations during initial stages of copper condensation on Si(001)

Journal of Surface Investigation
2011 | Journal article
EID:

2-s2.0-79961162762

Part of ISSN: 10274510 18197094
Contributors: Plyusnin, N.I.; Il'yashchenko, V.M.; Kitan', S.A.; Tarima, N.A.
Source: Self-asserted source
Kitan' S. A. via Scopus - Elsevier

Formation, electronic structure, and stability of film nanophases of transition metals on silicon

Journal of Surface Investigation
2009 | Journal article
EID:

2-s2.0-76349111537

Part of ISSN: 10274510 18197094
Contributors: Plyusnin, N.I.; Il'yashchenko, V.M.; Kitan', S.A.; Krylov, S.V.
Source: Self-asserted source
Kitan' S. A. via Scopus - Elsevier

Development of nanometrology for nanoelectronics: Growth and characterization of transition metal monolayer films on silicon

Key Engineering Materials
2008 | Book
EID:

2-s2.0-47049124482

Part of ISSN: 16629795 10139826
Contributors: Plusnin, N.I.; Il'yashenko, V.M.; Kitan, S.A.; Krylov, S.V.
Source: Self-asserted source
Kitan' S. A. via Scopus - Elsevier

Metal thin-film nanophases and their interface with silicon

Journal of Physics: Conference Series
2008 | Conference paper
EID:

2-s2.0-77954328594

Part of ISSN: 17426596 17426588
Contributors: Plusnin, N.I.; Il'iashchenko, V.M.; Kitan, S.A.; Krylov, S.V.
Source: Self-asserted source
Kitan' S. A. via Scopus - Elsevier

Effect of incident atomic beam power on the formation of a Fe/Si(111)7 × 7 interface

Technical Physics Letters
2007 | Journal article
EID:

2-s2.0-34547416648

Part of ISSN: 10637850
Contributors: Plyusnin, N.I.; Il'yashchenko, V.M.; Krylov, S.V.; Kitan, S.A.
Source: Self-asserted source
Kitan' S. A. via Scopus - Elsevier

Formation of Co ultrathin films on Si(1 1 1): Growth mechanisms, electronic structure and transport

Applied Surface Science
2007 | Journal article
EID:

2-s2.0-34249099784

Part of ISSN: 01694332
Contributors: Plusnin, N.I.; Il'yashenko, V.M.; Kitan, S.A.; Krylov, S.V.
Source: Self-asserted source
Kitan' S. A. via Scopus - Elsevier