Personal information
Si, alloy, nanocrystallites, heterostructures, , sublimation, Knudsen, Raman , AFM, PLS, Hall, VAC
Activities
Employment (1)
2002-01-01
to
present
|
senior electronics engineer
(Department of Surface Physics: Laboratory of Optics and Electrophysics (№ 105))
Employment
Source:
Kitan' S. A.
Education and qualifications (1)
1998-09-01
to
2003-06-17
|
diploma with honors (red diploma)
(Institute of Physics and Information Technologies: Department of Physics and Technology of Materials for Semiconductor Microelectronics)
Education
Source:
Kitan' S. A.
Professional activities (1)
2003-07-15
to
2003-08-31
|
Intern Student
(Samsung Advanced Institute of Technologies)
Invited position
Source:
Kitan' S. A.
Works (11)
Applied Surface Science
2018
|
Journal article
EID:
2-s2.0-85040360903
Contributors:
Gouralnik, A.S.;
Maslov, A.M.;
Ustinov, A.Y.;
Dotsenko, S.A.;
Shevlyagin, A.V.;
Chernev, I.M.;
Il'yashenko, V.M.;
Kitan, S.A.;
Koblova, E.A.;
Galkin, K.N.
et al.
Source:
Kitan' S. A.
via
Scopus - Elsevier
Defect and Diffusion Forum
2018
|
Journal article
EID:
2-s2.0-85054791051
Contributors:
Goroshko, D.L.;
Galkin, N.G.;
Chusovitin, E.A.;
Kitan, S.A.;
Subbotin, E.Y.;
Tupkalo, A.V.
Source:
Kitan' S. A.
via
Scopus - Elsevier
grade
Preferred source
(of
2)
Defect and Diffusion Forum
2018
|
Journal article
EID:
2-s2.0-85054798904
Contributors:
Dotsenko, S.A.;
Goroshko, D.L.;
Chusovitin, E.A.;
Kitan, S.A.;
Galkin, K.N.;
Galkin, N.G.
Source:
Kitan' S. A.
via
Scopus - Elsevier
grade
Preferred source
(of
2)
Technical Physics
2014
|
Journal article
EID:
2-s2.0-84904509390
Contributors:
Plyusnin, N.I.;
Il'yashchenko, V.M.;
Kitan, S.A.;
Lin, W.-C.;
Kuo, C.-C.
Source:
Kitan' S. A.
via
Scopus - Elsevier
Technical Physics Letters
2012
|
Journal article
EID:
2-s2.0-84861744073
Contributors:
Plyusnin, N.I.;
Tarima, N.A.;
Il'yashchenko, V.M.;
Kitan', S.A.
Source:
Kitan' S. A.
via
Scopus - Elsevier
Journal of Surface Investigation
2011
|
Journal article
EID:
2-s2.0-79961162762
Contributors:
Plyusnin, N.I.;
Il'yashchenko, V.M.;
Kitan', S.A.;
Tarima, N.A.
Source:
Kitan' S. A.
via
Scopus - Elsevier
Journal of Surface Investigation
2009
|
Journal article
EID:
2-s2.0-76349111537
Contributors:
Plyusnin, N.I.;
Il'yashchenko, V.M.;
Kitan', S.A.;
Krylov, S.V.
Source:
Kitan' S. A.
via
Scopus - Elsevier
Key Engineering Materials
2008
|
Book
EID:
2-s2.0-47049124482
Contributors:
Plusnin, N.I.;
Il'yashenko, V.M.;
Kitan, S.A.;
Krylov, S.V.
Source:
Kitan' S. A.
via
Scopus - Elsevier
Journal of Physics: Conference Series
2008
|
Conference paper
EID:
2-s2.0-77954328594
Contributors:
Plusnin, N.I.;
Il'iashchenko, V.M.;
Kitan, S.A.;
Krylov, S.V.
Source:
Kitan' S. A.
via
Scopus - Elsevier
Technical Physics Letters
2007
|
Journal article
EID:
2-s2.0-34547416648
Contributors:
Plyusnin, N.I.;
Il'yashchenko, V.M.;
Krylov, S.V.;
Kitan, S.A.
Source:
Kitan' S. A.
via
Scopus - Elsevier
Applied Surface Science
2007
|
Journal article
EID:
2-s2.0-34249099784
Contributors:
Plusnin, N.I.;
Il'yashenko, V.M.;
Kitan, S.A.;
Krylov, S.V.
Source:
Kitan' S. A.
via
Scopus - Elsevier