Personal information

Activities

Collapse all

Works (7)

Influence of Short-Circuit Time on Short-Circuit Failure Modes of Planar Silicon Carbide MOSFETs

IEEE Transactions on Device and Materials Reliability
2024 | Journal article
DOI: 10.1109/TDMR.2024.3503280
Contributors: JiaHui Meng; Peng Sun; YuMeng Cai; HaoRan Zhang; ZhiBin Zhao; Zhen Xin
Source: check_circle
Crossref

Dynamic Analytical Switching Loss Model of SiC MOSFET Considering Threshold Voltage Instability

IEEE Transactions on Power Electronics
2024-11 | Journal article
DOI: 10.1109/TPEL.2024.3406517
Contributors: Yumeng Cai; Peng Sun; Yuankui Zhang; Cong Chen; Zhibin Zhao; Xuebao Li; Lei Qi; Zhong Chen; Hans-Peter Nee
Source: check_circle
Crossref

Investigation on Gate Oxide Degradation of SiC MOSFET in Switching Operation

IEEE Transactions on Power Electronics
2024-08 | Journal article
DOI: 10.1109/TPEL.2024.3392974
Contributors: Yumeng Cai; Peng Sun; Cong Chen; Yuankui Zhang; Zhibin Zhao; Xuebao Li; Lei Qi; Zhong Chen; Hans-Peter Nee
Source: check_circle
Crossref

Characterization of Gate-Oxide Degradation Location for SiC MOSFETs Based on the Split C–V Method Under Bias Temperature Instability Conditions

IEEE Transactions on Power Electronics
2023-05 | Journal article
DOI: 10.1109/TPEL.2023.3239228
Contributors: Yumeng Cai; Cong Chen; Zhibin Zhao; Peng Sun; Xuebao Li; Manhong Zhang; Hui Wang; Zhong Chen; Hans-Peter Nee
Source: check_circle
Crossref

Device Screening Strategy for Suppressing Current Imbalance in Parallel-Connected SiC MOSFETs

IEEE Transactions on Device and Materials Reliability
2021-12 | Journal article
DOI: 10.1109/TDMR.2021.3116458
Contributors: Bin Zhao; Qiuping Yu; Peng Sun; Yumeng Cai; Zhibin Zhao
Source: check_circle
Crossref

Effect of Threshold Voltage Hysteresis on Switching Characteristics of Silicon Carbide MOSFETs

IEEE Transactions on Electron Devices
2021-10 | Journal article
DOI: 10.1109/TED.2021.3101459
Contributors: Yumeng Cai; Hao Xu; Peng Sun; Junji Ke; Erping Deng; Zhibin Zhao; Xuebao Li; Zhong Chen
Source: check_circle
Crossref

Layout-Dominated Dynamic Imbalanced Current Analysis and Its Suppression Strategy of Parallel SiC MOSFETs

IEEE Transactions on Device and Materials Reliability
2021-09 | Journal article
DOI: 10.1109/TDMR.2021.3101719
Contributors: Bin Zhao; Peng Sun; Qiuping Yu; Yumeng Cai; Zhibin Zhao
Source: check_circle
Crossref

Peer review (1 review for 1 publication/grant)

Review activity for Microelectronics and reliability. (1)
How many people are using ORCID?