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Employment (1)

CEA LETI: Grenoble, FR

2020-01-06 to present | Bonding Process Engineer
Employment
Source: Self-asserted source
Karine Abadie

Works (11)

TEOS and thermal oxide low temperature direct wafer bonding dynamics

Japanese Journal of Applied Physics
2025-04-01 | Journal article
Contributors: L. G. Michaud; K. Abadie; F. Fournel; C. Morales; V. Larrey; B. Caulfield; M. Wimplinger
Source: check_circle
Crossref

Surface activated Cu/SiO2 hybrid bonding for room temperature 3D integration

Japanese Journal of Applied Physics
2025-03-01 | Journal article
Contributors: K. Abadie; P. Renaud; F. Fournel; L. G. Michaud; M. Danner; M. Dornetshumer; C. Lecouvey; A.-M. Papon; I. Chevalier; T. Monniez et al.
Source: check_circle
Crossref

Modulation of post-fracture roughness with induced shear stress in the smart cut process

Journal of Applied Physics
2024-07-28 | Journal article
Contributors: Lucas Colonel; Q. Lomonaco; K. Abadie; L. G. Michaud; C. Morales; S. Moreau; F. Mazen; F. Fournel; D. Landru; F. Rieutord
Source: check_circle
Crossref

Germanium thin film manufacturing using covalent bonding process

Semiconductor Science and Technology
2022-04-01 | Journal article
Contributors: K Abadie; F Fournel; C Morales; F Mazen; L Vignoud; J-P Colonna; J Widiez
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Crossref
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Preferred source (of 2)‎

Application of temporary adherence to improve the manufacturing of 3D thin silicon wafers

International Journal of Adhesion and Adhesives
2019 | Journal article
EID:

2-s2.0-85063632393

Part of ISSN: 01437496
Contributors: Abadie, K.; Montméat, P.; Enot, T.; Fournel, F.; Wimplinger, M.
Source: Self-asserted source
Karine Abadie via Scopus - Elsevier

Various GaAs to Si wafer bonding approaches for solar cells applications

Proceedings of 2017 5th International Workshop on Low Temperature Bonding for 3D Integration, LTB-3D 2017
2017 | Conference paper
EID:

2-s2.0-85022197299

Contributors: Larrey, V.; Vauche, L.; Veinberg-Vidal, E.; Tedjini, M.; Morales, C.; Foumel, F.; Abadie, K.
Source: Self-asserted source
Karine Abadie via Scopus - Elsevier

Critical process parameters and failure analysis for temporary bonded wafer stacks

IMAPS 12th International Conference and Exhibition on Device Packaging
2016 | Conference paper
EID:

2-s2.0-84995569120

Contributors: Uhrmann, T.; Brandl, E.; Abadie, K.; Wimplinger, M.; Burggraf, J.; Bravin, J.; Fournel, F.; Fournel, P.
Source: Self-asserted source
Karine Abadie via Scopus - Elsevier

Mechanical behaviour and delamination mechanisms in temporary bonding

2016 6th Electronic System-Integration Technology Conference, ESTC 2016
2016 | Conference paper
EID:

2-s2.0-85015037602

Contributors: Abadie, K.; Fournel, F.; Montmeat, P.; Wimplinger, M.
Source: Self-asserted source
Karine Abadie via Scopus - Elsevier

Thin layer transfer using room temperature wafer-level bonding process

ECS Transactions
2016 | Conference paper
EID:

2-s2.0-84991516833

Part of ISSN: 19385862 19386737
Contributors: Abadie, K.; Fournel, F.; Morales, C.; Moriceau, H.; Wimplinger, M.
Source: Self-asserted source
Karine Abadie via Scopus - Elsevier

Title: Critical process parameters and failure analysis for temporary bonded wafer stacks

IMAPS 12th International Conference and Exhibition on Device Packaging
2016 | Conference paper
EID:

2-s2.0-84995680639

Contributors: Abadie, K.; Brandl, E.; Fournel, F.; Montméat, P.; Wimplinger, M.; Burggraf, J.; Uhrmann, T.; Bravin, J.
Source: Self-asserted source
Karine Abadie via Scopus - Elsevier

Delamination root cause in temporary bonding

ECS Transactions
2014 | Conference paper
EID:

2-s2.0-84921386236

Part of ISSN: 19386737 19385862
Contributors: Vial, K.; Fournel, F.; Wimplinger, M.; Burggraf, J.; Bravin, J.; Montméat, P.; Pellat, M.
Source: Self-asserted source
Karine Abadie via Scopus - Elsevier