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ResearcherID: O-7144-2019

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Works (18)

DFT study of water on graphene: Synergistic effect of multilayer p-doping

The Journal of Chemical Physics
2023-12-07 | Journal article
DOI: 10.1063/5.0161160
Contributors: D. Nezval; M. Bartošík; J. Mach; V. Švarc; M. Konečný; J. Piastek; O. Špaček; T. Šikola
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Crossref

Side charge propagation in simultaneous KPFM and transport measurement of humidity exposed graphene FET sensor

Carbon
2023-11 | Journal article
DOI: 10.1016/j.carbon.2023.118471
Contributors: Vojtech Švarc; Miroslav Bartošík; Martin Konečný; Jakub Piastek; David Nezval; Jindrich Mach; Tomas Šikola
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Crossref

Low temperature 2D GaN growth on Si(111) 7 × 7 assisted by hyperthermal nitrogen ions

Nanoscale Advances
2022 | Journal article
DOI: 10.1039/d2na00175f
Part of ISSN: 2516-0230
Contributors: Miroslav Bartošík; Jaroslav Maniš; Jindrich Mach; Miroslav Bartošík; Tomáš Šamořil; Michal Horák; Vojtěch Čalkovský; David Nezval; Lukáš Kachtik; Martin Konečný et al.
Source: Self-asserted source
Miroslav Bartošík

Correlative Raman Imaging and Scanning Electron Microscopy: The Role of Single Ga Islands in Surface-Enhanced Raman Spectroscopy of Graphene

The Journal of Physical Chemistry C
2022-03-10 | Journal article
DOI: 10.1021/acs.jpcc.1c10426
Part of ISSN: 1932-7447
Part of ISSN: 1932-7455
Contributors: Miroslav Bartošík; Jakub Piastek; Jindrich Mach; Stanislav Bardy; Zoltán Édes; Miroslav Bartošík; Jaroslav Maniš; Vojtěch Čalkovský; Martin Konečný; Jiří Spousta et al.
Source: Self-asserted source
Miroslav Bartošík

Mechanical strain and electric-field modulation of graphene transistors integrated on MEMS cantilevers

Journal of Materials Science
2022-01-06 | Journal article
DOI: 10.1007/s10853-021-06846-6
Part of ISSN: 0022-2461
Part of ISSN: 1573-4803
Source: Self-asserted source
Miroslav Bartošík

Density functional study of gallium clusters on graphene: electronic doping and diffusion

Journal of Physics: Condensed Matter
2021-01-13 | Journal article
DOI: 10.1088/1361-648x/abb683
Part of ISSN: 0953-8984
Part of ISSN: 1361-648X
Source: Self-asserted source
Miroslav Bartošík
grade
Preferred source (of 2)‎

Mechanism and Suppression of Physisorbed-Water-Caused Hysteresis in Graphene FET Sensors

ACS Sensors
2020-09-25 | Journal article
DOI: 10.1021/acssensors.0c01441
Part of ISSN: 2379-3694
Part of ISSN: 2379-3694
Source: Self-asserted source
Miroslav Bartošík
grade
Preferred source (of 2)‎

Low temperature selective growth of GaN single crystals on pre-patterned Si substrates

Applied Surface Science
2019-12 | Journal article
DOI: 10.1016/j.apsusc.2019.143705
Part of ISSN: 0169-4332
Source: Self-asserted source
Miroslav Bartošík
grade
Preferred source (of 2)‎

Kelvin Probe Force Microscopy and Calculation of Charge Transport in a Graphene/Silicon Dioxide System at Different Relative Humidity

ACS Applied Materials & Interfaces
2018 | Journal article
DOI: 10.1021/ACSAMI.7B18041
WOSUID: WOS:000430156000068
Contributors: Tomáš Šikola; Aleš Cahlík; Pavel Procházka; Jakub Piastek; David Nezval; Vojtěch Švarc; Jindřich Mach; Miroslav Bartošík; Martin Konečný
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grade
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Electronic transport properties of graphene doped by gallium

Nanotechnology
2017 | Journal article
DOI: 10.1088/1361-6528/AA86A4
WOSUID: WOS:000410793200002
Contributors: Tomas Sikola; Lukáš Kormoš; Martin Konečný; Vojtěch Švarc; Jan Hulva; Jakub Piastek; David Nezval; Miroslav Bartošík; Pavel Procházka; Jindřich Mach
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Web of Science Researcher Profile Sync
grade
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Nanometer-Sized Water Bridge and Pull-Off Force in AFM at Different Relative Humidities: Reproducibility Measurement and Model Based on Surface Tension Change

The Journal of Physical Chemistry B
2017 | Journal article
DOI: 10.1021/ACS.JPCB.6B11108
WOSUID: WOS:000393009100015
Contributors: Tomáš Šikola; Tomáš Šamořil; Vojtěch Švarc; David Nezval; Zuzana Lišková; Jindřich Mach; Radek Kalousek; Lukáš Flajšman; Lukáš Kormoš; Miroslav Bartošík
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Web of Science Researcher Profile Sync
grade
Preferred source (of 2)‎

Optimization of ion-atomic beam source for deposition of GaN ultrathin films

Review of Scientific Instruments
2014 | Journal article
DOI: 10.1063/1.4892800
WOSUID: WOS:000342913500019
Contributors: Tomáš Šikola; Tomáš Šamořil; Miroslav Kolíbal; Miroslav Bartošík; Stanislav Voborny; Jakub Zlámal; Jindřich Mach
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Ultrasmooth metallic foils for growth of high quality graphene by chemical vapor deposition

Nanotechnology
2014 | Journal article
DOI: 10.1088/0957-4484/25/18/185601
WOSUID: WOS:000334363600005
Contributors: Tomáš Šikola; Jan Čechal; Peter Varga; Klaus Ensslin; Miroslav Bartošík; Lukáš Kalina; Martin Petrenec; Dušan Hemzal; Anastasia Varlet; Pauline Simonet et al.
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Web of Science Researcher Profile Sync

Stability of hydrogen-terminated vicinal Si(111) surface under ambient atmosphere

Applied Surface Science
2010 | Journal article
DOI: 10.1016/J.APSUSC.2009.12.045
WOSUID: WOS:000275515100013
Contributors: T. Šikola; J. Mach; M. Bartošík; M. Kolíbal; Jan Čechal
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Role of humidity in local anodic oxidation: A study of water condensation and electric field distribution

Physical Review B
2009 | Journal article
DOI: 10.1103/PHYSREVB.79.195406
WOSUID: WOS:000266501300105
Contributors: Tomáš Šikola; Petr Dub; Jiří Spousta; Jakub Zlámal; Pavel Jánský; Radek Kalousek; Ondřej Tomanec; David Škoda; Miroslav Bartošík
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Selective growth of metallic nanostructures on surfaces patterned by AFM local anodic oxidation

Journal of Nanoscience and Nanotechnology
2009 | Journal article
DOI: 10.1166/JNN.2009.1251
WOSUID: WOS:000269310700031
Contributors: Tomáš Šikola; Jindřich Mach; Miroslav Kolíbal; Miroslav Bartošík; Jan Čechal
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Web of Science Researcher Profile Sync

The influence of humidity on the kinetics of local anodic oxidation

Journal of Physics: Conference Series
2007 | Journal article
DOI: 10.1088/1742-6596/61/1/016
WOSUID: WOS:000291445400016
Contributors: T Sikola; J Spousta; J Zlámal; P Jánský; R Kalousek; O Tomanec; D Skoda; M Bartošík
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Fabrication of nanostructures on Si(100) and GaAs(100) by local anodic oxidation

Applied Surface Science
2006 | Journal article
DOI: 10.1016/J.APSUSC.2006.03.095
WOSUID: WOS:000243244300004
Contributors: Tomáš Šikola; Ondřej Tomanec; David Škoda; Miroslav Bartošík; Radek Kalousek; Jiří Červenka
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Peer review (2 reviews for 2 publications/grants)

Review activity for ACS applied materials & interfaces. (1)
Review activity for Advanced electronic materials (1)
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