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Scopus Author ID: 9840221300

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Works (10)

NBTI Degradation and Recovery in Analog Circuits: Accurate and Efficient Circuit-Level Modeling

IEEE Transactions on Electron Devices
2019-04 | Journal article
DOI: 10.1109/TED.2019.2901907
Contributors: K.-U. Giering; K. Puschkarsky; H. Reisinger; G. Rzepa; G. Rott; R. Vollertsen; T. Grasser; R. Jancke
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Prediction of SRAM Reliability Under Mechanical Stress Induced by Harsh En§ironments

2018 48th European Solid-State Device Research Conference (ESSDERC)
2018-09 | Conference paper
DOI: 10.1109/essderc.2018.8486911
ISBN: 9781538654019
Source: Self-asserted source
Kay-Uwe Giering

Analysis of 28 nm SRAM cell stability under mechanical load applied by nanoindentation

2018 IEEE International Reliability Physics Symposium (IRPS)
2018-03 | Conference paper
DOI: 10.1109/irps.2018.8353607
ISBN: 9781538654798
Source: Self-asserted source
Kay-Uwe Giering

Analog-circuit NBTI degradation and time-dependent NBTI variability: An efficient physics-based compact model

IEEE International Reliability Physics Symposium Proceedings
2016 | Conference paper
DOI: 10.1109/IRPS.2016.7574540
EID:

2-s2.0-84990925130
Contributors: Giering, K.-U.; Rott, G.; Rzepa, G.; Reisinger, H.; Puppala, A.K.; Reich, T.; Gustin, W.; Grasser, T.; Jancke, R.
Source: Self-asserted source
Kay-Uwe Giering via Scopus - Elsevier

BTI variability of SRAM cells under periodically changing stress profiles

2016 IEEE International Integrated Reliability Workshop (IIRW)
2016 | Conference paper
DOI: 10.1109/iirw.2016.7904888
ISBN: 9781509041930
Source: Self-asserted source
Kay-Uwe Giering

Functional renormalization and mean-field approach to multiband systems with spin-orbit coupling: Application to the Rashba model with attractive interaction

Physical Review B - Condensed Matter and Materials Physics
2016 | Journal article
DOI: 10.1103/PhysRevB.93.115111
EID:

2-s2.0-84960849552
Contributors: Schober, G.A.H.; Giering, K.-U.; Scherer, M.M.; Honerkamp, C.; Salmhofer, M.
Source: Self-asserted source
Kay-Uwe Giering via Scopus - Elsevier

NBTI modeling in analog circuits and its application to long-term aging simulations

IEEE International Integrated Reliability Workshop Final Report
2014 | Conference paper
DOI: 10.1109/IIRW.2014.7049501
EID:

2-s2.0-84945913109
Contributors: Giering, K.-U.; Sohrmann, C.; Rzepa, G.; Heis, L.; Grasser, T.; Jancke, R.
Source: Self-asserted source
Kay-Uwe Giering via Scopus - Elsevier

Frequency-dependent vertex functions of the (t,t ′) Hubbard model at weak coupling

Physical Review B - Condensed Matter and Materials Physics
2012 | Journal article
DOI: 10.1103/PhysRevB.85.075121
EID:

2-s2.0-84857744661
Contributors: Husemann, C.; Giering, K.-U.; Salmhofer, M.
Source: Self-asserted source
Kay-Uwe Giering via Scopus - Elsevier

Self-energy flows in the two-dimensional repulsive Hubbard model

Physical Review B - Condensed Matter and Materials Physics
2012 | Journal article
DOI: 10.1103/PhysRevB.86.245122
EID:

2-s2.0-84871592968
Contributors: Giering, K.-U.; Salmhofer, M.
Source: Self-asserted source
Kay-Uwe Giering via Scopus - Elsevier

Random quantum Ising chains with competing interactions

Physical Review E - Statistical, Nonlinear, and Soft Matter Physics
2005 | Journal article
DOI: 10.1103/PhysRevE.72.066101
EID:

2-s2.0-28844456516
Contributors: Carpentier, D.; Pujol, P.; Giering, K.-U.
Source: Self-asserted source
Kay-Uwe Giering via Scopus - Elsevier
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