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Employment (1)

Dublin City University: Dublin, IE

2012-09-01 to present | Assistant Professor (School of Physical Sciences)
Employment
Source: Self-asserted source
Robert O'Connor

Professional activities (1)

Institute of Physics: Dublin, IE

2012-09-01 to present | Committee Member
Membership
Source: Self-asserted source
Robert O'Connor

Funding (4)

Reliable and Efficient Photo-electrochemical Water Splitting for Hydrogen Fuel

2018-12 to 2022-12 | Grant
Sustainable Energy Authority of Ireland (Dublin, IE)
GRANT_NUMBER:

RDD185

Source: Self-asserted source
Robert O'Connor

Manganese Oxide Based Protective Layers for Photo-electrochemical Water Splitting Cells

2015-01-01 to 2016-04-30 | Grant
Science Foundation Ireland (Dublin, IE)
GRANT_NUMBER:

14/TIDA/2279

Source: Self-asserted source
Robert O'Connor via DimensionsWizard

Towards a Consortium for a Horizon 2020 Proposal to Study Copper Diffusion Barrier Layers

2013-01-01 to present | Grant
Irish Research Council (Dublin, IE)
GRANT_NUMBER:

irc1b33a2ba2ed97fbd9a1c6c8808128f43

Source: Self-asserted source
Robert O'Connor via DimensionsWizard

Exploratory Study of Material Systems for Future CMOS Technology

2008-01-01 to present | Grant
Irish Research Council (Dublin, IE)
GRANT_NUMBER:

irc2c2f04cfaca936d46a50d93f6f1ad4fd

Source: Self-asserted source
Robert O'Connor via DimensionsWizard

Works (50 of 72)

Items per page:
Page 1 of 2

2D-reduced graphene oxide induced bi-functional plasmonic CuBi<sub>2</sub>O<sub>4</sub>/RGO/BiVO<sub>4</sub>/Au heterostructure for visible light driven photoelectrochemical water splitting

International Journal of Hydrogen Energy
2024 | Journal article
EID:

2-s2.0-85210127999

Part of ISSN: 03603199
Contributors: Haris, M.; Midveris, K.; Shabbir, S.A.; Nawaz, S.; Tamulevičius, T.; Klyvis, G.; Mikalkevičius, M.; Monshi, M.; Lazauskas, A.; O'Connor, R. et al.
Source: Self-asserted source
Robert O'Connor via Scopus - Elsevier

Deposition of high-quality, nanoscale SiO<sub>2</sub> films and 3D structures

Applied Materials Today
2024 | Journal article
EID:

2-s2.0-85189513805

Part of ISSN: 23529407
Contributors: Cannon, P.; McGlynn, E.; O'Neill, D.; Darcy, C.; Rouse, E.; O'Connor, R.; Freeland, B.; O'Connell, B.; Gaughran, J.
Source: Self-asserted source
Robert O'Connor via Scopus - Elsevier

Insights into the feature size required for the death of Pseudomonas fluorescens on nanostructured silicon fabricated by block copolymer lithography

Materials Today Communications
2024 | Journal article
EID:

2-s2.0-85185841541

Part of ISSN: 23524928
Contributors: Reid, G.; Podhorska, L.; Mc Fadden, J.; O'Connor, R.; Rodriguez, B.J.; Quinn, L.; Hiebner, D.; Casey, E.; Kelleher, S.M.
Source: Self-asserted source
Robert O'Connor via Scopus - Elsevier

A comprehensive characterization of the effect of spatter powder on IN939 parts fabricated by laser powder bed fusion

Materials and Design
2023 | Journal article
EID:

2-s2.0-85177226893

Part of ISSN: 18734197 02641275
Contributors: Doğu, M.N.; Mussatto, A.; Yalçın, M.A.; Ozer, S.; Davut, K.; Obeidi, M.A.; Kumar, A.; Hudson, S.; O'Neill, D.; O'Connor, R. et al.
Source: Self-asserted source
Robert O'Connor via Scopus - Elsevier

Fabrication of sub-5 nm uniform zirconium oxide films on corrugated copper substrates by a scalable polymer brush assisted deposition method

Applied Surface Science
2023 | Journal article
EID:

2-s2.0-85153484220

Part of ISSN: 01694332
Contributors: Yadav, P.; Singh, S.; Prochukhan, N.; Davó-Quiñonero, A.; Conway, J.; Gatensby, R.; Padmanabhan, S.C.; Snelgrove, M.; McFeely, C.; Shiel, K. et al.
Source: Self-asserted source
Robert O'Connor via Scopus - Elsevier

Plasma-enhanced atomic layer deposition of nickel and nickel oxide on silicon for photoelectrochemical applications

Journal of Physics D: Applied Physics
2023-10-12 | Journal article
Contributors: S O’Donnell; D O’Neill; K Shiel; M Snelgrove; F Jose; C McFeely; R O’Connor
Source: check_circle
Crossref

Fabrication of High-κ Dielectric Metal Oxide Films on Topographically Patterned Substrates: Polymer Brush-Mediated Depositions

ACS Applied Materials and Interfaces
2022 | Journal article
EID:

2-s2.0-85134854853

Part of ISSN: 19448252 19448244
Contributors: Yadav, P.; Gatensby, R.; Prochukhan, N.; C. Padmanabhan, S.; Davó-Quiñonero, A.; Darragh, P.; Senthamaraikannan, R.; Murphy, B.; Snelgrove, M.; McFeely, C. et al.
Source: Self-asserted source
Robert O'Connor via Scopus - Elsevier

Growth chemistry and electrical performance of ultrathin alumina formed by area selective vapor phase infiltration

Microelectronic Engineering
2022 | Journal article
EID:

2-s2.0-85139834693

Part of ISSN: 01679317
Contributors: Snelgrove, M.; McFeely, C.; Hughes, G.; Weiland, C.; Woicik, J.C.; Shiel, K.; González, P.G.M.; Ornelas, C.; Solís-Canto, Ó.; Cherkaoui, K. et al.
Source: Self-asserted source
Robert O'Connor via Scopus - Elsevier

Growth chemistry of cobalt nitride by plasma enhanced atomic layer deposition

Materials Research Express
2022 | Journal article
EID:

2-s2.0-85141071910

Part of ISSN: 20531591
Contributors: O'Donnell, S.; Snelgrove, M.; Shiel, K.; Weiland, C.; Hughes, G.; Woicik, J.; O'Neill, D.; Jose, F.; McFeely, C.; O'Connor, R.
Source: Self-asserted source
Robert O'Connor via Scopus - Elsevier
grade
Preferred source (of 2)‎

The role of atomic oxygen in the decomposition of self-assembled monolayers during area-selective atomic layer deposition

Applied Surface Science
2022 | Journal article
EID:

2-s2.0-85124456581

Part of ISSN: 01694332
Contributors: Brady-Boyd, A.; O'Connor, R.; Armini, S.; Selvaraju, V.; Pasquali, M.; Hughes, G.; Bogan, J.
Source: Self-asserted source
Robert O'Connor via Scopus - Elsevier

Thermal and plasma enhanced atomic layer deposition of ultrathin TiO<sub>2</sub>on silicon from amide and alkoxide precursors: Growth chemistry and photoelectrochemical performance

Journal of Physics D: Applied Physics
2022 | Journal article
EID:

2-s2.0-85120617678

Part of ISSN: 13616463 00223727
Contributors: O'Donnell, S.; Jose, F.; Shiel, K.; Snelgrove, M.; McFeely, C.; McGill, E.; O'Connor, R.
Source: Self-asserted source
Robert O'Connor via Scopus - Elsevier
grade
Preferred source (of 2)‎

Use of plasma oxidation for conversion of metal salt infiltrated thin polymer films to metal oxide

Journal of Physics D: Applied Physics
2022-11-03 | Journal article
Contributors: J Conway; M Snelgrove; P Yadav; K Shiel; R Lundy; A Selkirk; R O’Connor; M A Morris; M M Turner; S Daniels
Source: check_circle
Crossref

Analysing trimethylaluminum infiltration into polymer brushes using a scalable area selective vapor phase process

Materials Advances
2021 | Journal article
Part of ISSN: 2633-5409
Source: Self-asserted source
Robert O'Connor
grade
Preferred source (of 2)‎

XPS and SEM characterization for powder recycling within 3d printing process

ESAFORM 2021 - 24th International Conference on Material Forming
2021 | Conference paper
EID:

2-s2.0-85119374086

Contributors: Gorji, N.E.; O'Connor, R.; Brabazon, D.
Source: Self-asserted source
Robert O'Connor via Scopus - Elsevier

Titanium infiltration into ultrathin PMMA brushes

Journal of Vacuum Science & Technology A
2021-07 | Journal article
Part of ISSN: 0734-2101
Part of ISSN: 1520-8559
Source: Self-asserted source
Robert O'Connor

Corrigendum to ``Recyclability of stainless steel (316 L) powder within the additive manufacturing process'' [Materialia, 8 (2019) 100489] (Materialia (2019) 8, (S2589152919302856), (10.1016/j.mtla.2019.100489))

Materialia
2020 | Journal article
EID:

2-s2.0-85088038967

Part of ISSN: 25891529
Contributors: Gorji, N.E.; O'Connor, R.; Mussatto, A.; Snelgrove, M.; Mani González, P.G.; Brabazon, D.
Source: Self-asserted source
Robert O'Connor via Scopus - Elsevier

X-ray Tomography, AFM and Nanoindentation Measurements for Recyclability Analysis of 316L Powders in 3D Printing Process

Procedia Manufacturing
2020 | Journal article
Part of ISSN: 2351-9789
Source: Self-asserted source
Robert O'Connor
grade
Preferred source (of 2)‎

Comprehensive assessment of spatter material generated during selective laser melting of stainless steel

Materials Today Communications
2020-12 | Journal article
Part of ISSN: 2352-4928
Source: Self-asserted source
Robert O'Connor
grade
Preferred source (of 2)‎

Tuning of oxygen vacancy-induced electrical conductivity in Ti-doped hematite films and its impact on photoelectrochemical water splitting

Scientific Reports
2020-12 | Journal article
Part of ISSN: 2045-2322
Source: Self-asserted source
Robert O'Connor

Precise Definition of a “Monolayer Point” in Polymer Brush Films for Fabricating Highly Coherent TiO2 Thin Films by Vapor-Phase Infiltration

Langmuir
2020-10-20 | Journal article
Part of ISSN: 0743-7463
Part of ISSN: 1520-5827
Source: Self-asserted source
Robert O'Connor
grade
Preferred source (of 2)‎

Aluminium oxide formation via atomic layer deposition using a polymer brush mediated selective infiltration approach

Applied Surface Science
2020-06 | Journal article
Part of ISSN: 0169-4332
Source: Self-asserted source
Robert O'Connor
grade
Preferred source (of 2)‎

A new method for assessing the utility of powder bed fusion (PBF) feedstock

Materials Characterization
2020-03 | Journal article
Part of ISSN: 1044-5803
Source: Self-asserted source
Robert O'Connor
grade
Preferred source (of 2)‎

Analysis of Al and Cu salt infiltration into a poly 2-vinylpyridine (P2vP) polymer layer for area selective deposition applications

Journal of Physics D: Applied Physics
2020-03-11 | Journal article
Part of ISSN: 0022-3727
Part of ISSN: 1361-6463
Source: Self-asserted source
Robert O'Connor
grade
Preferred source (of 2)‎

Area-Selective ALD of Ru on Nanometer-Scale Cu Lines through Dimerization of Amino-Functionalized Alkoxy Silane Passivation Films

ACS Applied Materials & Interfaces
2020-01-29 | Journal article
Part of ISSN: 1944-8244
Part of ISSN: 1944-8252
Source: Self-asserted source
Robert O'Connor
grade
Preferred source (of 2)‎

Hard x-ray photoelectron spectroscopy study of copper formation by metal salt inclusion in a polymer film

Journal of Physics D: Applied Physics
2019 | Journal article
EID:

2-s2.0-85070187371

Contributors: Snelgrove, M.; Mani-Gonzalez, P.G.; Bogan, J.; Lundy, R.; Rueff, J.-P.; Hughes, G.; Yadav, P.; McGlynn, E.; Morris, M.; O'Connor, R.
Source: Self-asserted source
Robert O'Connor via Scopus - Elsevier

Recyclability of stainless steel (316 L) powder within the additive manufacturing process

Materialia
2019 | Journal article
EID:

2-s2.0-85072969480

Contributors: Gorji, N.E.; O'Connor, R.; Mussatto, A.; Snelgrove, M.; González, P.G.M.; Brabazon, D.
Source: Self-asserted source
Robert O'Connor via Scopus - Elsevier

Surface characterization of poly-2-vinylpyridine - A polymer for area selective deposition techniques

Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
2019 | Journal article
EID:

2-s2.0-85070228963

Contributors: Snelgrove, M.; Zehe, C.; Lundy, R.; Yadav, P.; Rueff, J.-P.; O'Connor, R.; Bogan, J.; Hughes, G.; McGlynn, E.; Morris, M. et al.
Source: Self-asserted source
Robert O'Connor via Scopus - Elsevier

XPS, XRD, and SEM characterization of the virgin and recycled metallic powders for 3D printing applications

IOP Conference Series: Materials Science and Engineering
2019 | Conference paper
EID:

2-s2.0-85072106027

Part of ISSN: 1757899X 17578981
Contributors: Gorji, N.E.; O'Connor, R.; Brabazon, D.
Source: Self-asserted source
Robert O'Connor via Scopus - Elsevier

Characterisation of Electroless Deposited Cobalt by Hard and Soft X-ray Photoemission Spectroscopy

Proceedings of the IEEE Conference on Nanotechnology
2018 | Conference paper
EID:

2-s2.0-85062267644

Part of ISBN: 9781538653364
Part of ISSN: 19449380 19449399
Contributors: Brady-Boyd, A.; O'Connor, R.; Armini, S.; Selvaraju, S.; Hughes, G.; Bogan, J.
Source: Self-asserted source
Robert O'Connor via Scopus - Elsevier

Investigation of nitrogen incorporation into manganese based copper diffusion barrier layers for future interconnect applications

Surfaces and Interfaces
2018 | Journal article
EID:

2-s2.0-85053387556

Contributors: Selvaraju, V.; Brady-Boyd, A.; O'Connor, R.; Hughes, G.; Bogan, J.
Source: Self-asserted source
Robert O'Connor via Scopus - Elsevier

Nitrogen reactive ion etch processes for the selective removal of poly-(4-vinylpyridine) in block copolymer films

Nanotechnology
2018 | Journal article
EID:

2-s2.0-85049299084

Contributors: Flynn, S.P.; Bogan, J.; Lundy, R.; Khalafalla, K.E.; Shaw, M.; Rodriguez, B.J.; Swift, P.; Daniels, S.; O'Connor, R.; Hughes, G. et al.
Source: Self-asserted source
Robert O'Connor via Scopus - Elsevier

Nucleation and adhesion of ultra-thin copper films on amino-terminated self-assembled monolayers

Applied Surface Science
2018 | Journal article
EID:

2-s2.0-85051364576

Contributors: Bogan, J.; Brady-Boyd, A.; Armini, S.; Lundy, R.; Selvaraju, V.; O'Connor, R.
Source: Self-asserted source
Robert O'Connor via Scopus - Elsevier

On the use of (3-trimethoxysilylpropyl)diethylenetriamine self-assembled monolayers as seed layers for the growth of Mn based copper diffusion barrier layers

Applied Surface Science
2018 | Journal article
EID:

2-s2.0-85029168846

Contributors: Brady-Boyd, A.; O'Connor, R.; Armini, S.; Selvaraju, V.; Hughes, G.; Bogan, J.
Source: Self-asserted source
Robert O'Connor via Scopus - Elsevier

Synchrotron radiation study of metallic titanium deposited on dielectric substrates

Journal of Vacuum Science and Technology B: Nanotechnology and Microelectronics
2018 | Journal article
EID:

2-s2.0-85049241122

Contributors: Bogan, J.; Selvaraju, V.; Brady-Boyd, A.; Hughes, G.; O'Connor, R.
Source: Self-asserted source
Robert O'Connor via Scopus - Elsevier

A photoemission study of the effectiveness of nickel, manganese, and cobalt based corrosion barriers for silicon photo-anodes during water oxidation

Journal of Applied Physics
2016 | Journal article
EID:

2-s2.0-84971276057

Contributors: O'Connor, R.; Bogan, J.; McCoy, A.; Byrne, C.; Hughes, G.
Source: Self-asserted source
Robert O'Connor via Scopus - Elsevier

In-situ surface and interface study of atomic oxygen modified carbon containing porous low-κ dielectric films for barrier layer applications

Journal of Applied Physics
2016 | Journal article
EID:

2-s2.0-84987768428

Contributors: Bogan, J.; Lundy, R.; McCoy, A.; O'Connor, R.; Byrne, C.; Walsh, L.; Casey, P.; Hughes, G.
Source: Self-asserted source
Robert O'Connor via Scopus - Elsevier

Atomic oxygen treatment of carbon containing low-k dielectric materials to facilitate manganese silicate barrier formation

2015 IEEE International Interconnect Technology Conference and 2015 IEEE Materials for Advanced Metallization Conference, IITC/MAM 2015
2015 | Conference paper
EID:

2-s2.0-84961938112

Contributors: Bogan, J.; McCoy, A.P.; Byrne, C.; O'Connor, R.; Hughes, G.
Source: Self-asserted source
Robert O'Connor via Scopus - Elsevier

Growth and characterization of thin manganese oxide corrosion barrier layers for silicon photoanode protection during water oxidation

Solar Energy Materials and Solar Cells
2015 | Journal article
EID:

2-s2.0-84921358968

Contributors: O'Connor, R.; Bogan, J.; Fleck, N.; McCoy, A.; Walsh, L.A.; Byrne, C.; Casey, P.; Hughes, G.
Source: Self-asserted source
Robert O'Connor via Scopus - Elsevier

The impact of porosity on the formation of manganese based copper diffusion barrier layers on low-κ dielectric materials

Journal of Physics D: Applied Physics
2015 | Journal article
EID:

2-s2.0-84938766082

Contributors: McCoy, A.P.; Bogan, J.; Walsh, L.; Byrne, C.; O'Connor, R.; Woicik, J.C.; Hughes, G.
Source: Self-asserted source
Robert O'Connor via Scopus - Elsevier

Photoemission study of the identification of Mn silicate barrier formation on carbon containing low-κ dielectrics

Microelectronic Engineering
2014 | Journal article
EID:

2-s2.0-84911929732

Contributors: Bogan, J.; McCoy, A.P.; O'Connor, R.; Casey, P.; Byrne, C.; Hughes, G.
Source: Self-asserted source
Robert O'Connor via Scopus - Elsevier

Photoemission study of the impact of carbon content on Mn silicate barrier formation on low-k dielectric materials

2014 IEEE International Interconnect Technology Conference / Advanced Metallization Conference, IITC/AMC 2014
2014 | Conference paper
EID:

2-s2.0-84903692489

Contributors: Bogan, J.; McCoy, A.P.; Casey, P.; O'Connor, R.; Byrne, C.; Hughes, G.
Source: Self-asserted source
Robert O'Connor via Scopus - Elsevier

In situ investigations into the mechanism of oxygen catalysis on ruthenium/manganese surfaces and the thermodynamic stability of Ru/Mn-based copper diffusion barrier layers

Journal of Physical Chemistry C
2013 | Journal article
EID:

2-s2.0-84881428728

Contributors: Casey, P.; McCoy, A.P.; Bogan, J.; Byrne, C.; Walsh, L.; O'Connor, R.; Hughes, G.
Source: Self-asserted source
Robert O'Connor via Scopus - Elsevier

Stress induced defect generation implications of doping HfO<inf>2</inf> with Al

Microelectronic Engineering
2013 | Journal article
EID:

2-s2.0-84876767753

Contributors: O'Connor, R.; Kauerauf, T.; Arimura, H.; Ragnarsson, L.A.
Source: Self-asserted source
Robert O'Connor via Scopus - Elsevier

Improved reliability of Al <sub>2</sub>O <sub>3</sub>/InGaAs/InP MOS structures through in-situ forming gas annealing

IEEE International Reliability Physics Symposium Proceedings
2012 | Conference paper
EID:

2-s2.0-84866634896

Part of ISBN: 9781457716799
Part of ISSN: 15417026
Contributors: O'Connor, R.; Cherkaoui, K.; Nagle, R.; Schmidt, M.; Povey, I.M.; Pemble, M.; Hurley, P.K.
Source: Self-asserted source
Robert O'Connor via Scopus - Elsevier

Methodologies for sub-1nm EOT TDDB evaluation

IEEE International Reliability Physics Symposium Proceedings
2011 | Conference paper
EID:

2-s2.0-79959303404

Contributors: Kauerauf, T.; Degraeve, R.; Ragnarsson, L.-Å.; Roussel, P.; Sahhaf, S.; Groeseneken, G.; O'Connor, R.
Source: Self-asserted source
Robert O'Connor via Scopus - Elsevier

Reliability of thin ZrO<sub>2</sub> gate dielectric layers

Microelectronics Reliability
2011 | Conference paper
EID:

2-s2.0-79955919915

Part of ISSN: 00262714
Contributors: O'Connor, R.; Hughes, G.; Kauerauf, T.; Ragnarsson, L.-A.
Source: Self-asserted source
Robert O'Connor via Scopus - Elsevier

The effect of a post processing thermal anneal on pre-existing and stress induced electrically active defects in ultra-thin SiON dielectric layers

Microelectronics Reliability
2011 | Journal article
EID:

2-s2.0-79951959659

Contributors: Oconnor, R.; Hughes, G.
Source: Self-asserted source
Robert O'Connor via Scopus - Elsevier

Time-Dependent Dielectric Breakdown and Stress-Induced Leakage Current Characteristics of 0.7-nm-EOT HfO<inf>2</inf> pFETs

IEEE Transactions on Device and Materials Reliability
2011 | Journal article
EID:

2-s2.0-79959525552

Contributors: O'Connor, R.; Hughes, G.; Kauerauf, T.
Source: Self-asserted source
Robert O'Connor via Scopus - Elsevier

Degradation and breakdown characteristics of thin MgO dielectric layers

Journal of Applied Physics
2010 | Journal article
EID:

2-s2.0-75749093447

Contributors: O'Connor, R.; Hughes, G.; Casey, P.; Newcomb, S.B.
Source: Self-asserted source
Robert O'Connor via Scopus - Elsevier

Time dependent dielectric breakdown and stress induced leakage current characteristics of 8Å EOT HfO<inf>2</inf> N-MOSFETS

IEEE International Reliability Physics Symposium Proceedings
2010 | Conference paper
EID:

2-s2.0-77957925744

Contributors: O'Connor, R.; Hughes, G.; Kauerauf, T.; Ragnarsson, L.-A.
Source: Self-asserted source
Robert O'Connor via Scopus - Elsevier
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