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Works (8)

A 10.5 ppm/°C Modified Sub-1 V Bandgap in 28 nm CMOS Technology with Only Two Operating Points

Electronics
2024-03-07 | Journal article
DOI: 10.3390/electronics13061011
Contributors: Rajasekhar Nagulapalli; Nabil Yassine; Amr A. Tammam; Steve Barker; Khaled Hayatleh
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A 261mV Bandgap reference based on Beta Multiplier with 64ppm/0C temp coefficient

International Journal of Electronics Letters
2022-10-02 | Journal article
DOI: 10.1080/21681724.2021.1966656
Contributors: R. Nagulapalli; N. Yassine; S. Barker; P Georgiou; K. Hayatleh
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A Start-up Assisted Fully Differential Folded Cascode Opamp

Journal of Circuits, Systems and Computers
2019-09-07 | Journal article
DOI: 10.1142/S0218126619501640
Contributors: R. Nagulapalli; K. Hayatleh; S. Barker; B. Yassine; S. Zourob; S. Raparthy; N. Yassine
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A High-Performance Skin Impedance Measurement Circuit for Biomedical Applications

Journal of Circuits, Systems and Computers
2019-06-30 | Journal article
DOI: 10.1142/S021812661950110X
Contributors: K. Hayatleh; S. Zourob; R. Nagulapalli; S. Barker; N. Yassine; P. Georgiou; F. J. Lidgey
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A novel high CMRR trans-impedance instrumentation amplifier for biomedical applications

Analog Integrated Circuits and Signal Processing
2019-02-26 | Journal article
DOI: 10.1007/s10470-018-1256-8
Contributors: Rajasekhar Nagulapalli; Khaled Hayatleh; Steve Barker; Saddam Zourob; Nabil Yassine; Sumathi Raparthy; Amr Tammam
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An OTA gain enhancement technique for low power biomedical applications

Analog Integrated Circuits and Signal Processing
2018-06-08 | Journal article
DOI: 10.1007/s10470-018-1148-y
Contributors: Rajasekhar Nagulapalli; Khaled Hayatleh; Steve Barker; Saddam Zourob; Nabil Yassine
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Increasing signal to noise ratio and minimizing artefacts in biomedical instrumentation systems

Analog Integrated Circuits and Signal Processing
2018-06-08 | Journal article
DOI: 10.1007/s10470-018-1150-4
Contributors: Saddam Zourob; Khaled Hayatleh; Steve Barker; Rajasekhar Nagulapalli; Nabil Yassine; Roger Ramsbottom; John Lidgey
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Simulation of driver fatigue monitoring via blink rate detection, using 65 nm CMOS technology

Analog Integrated Circuits and Signal Processing
2018-06-08 | Journal article
DOI: 10.1007/s10470-018-1151-3
Contributors: Nabil Yassine; Steve Barker; Khaled Hayatleh; Bhaskar Choubey; Rajasekhar Nagulapalli
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