Personal information
Poland
Activities
Employment (1)
1978-10-01
to
present
|
Phd
(Department of Measurement and Electronic)
Employment
Source:
Tadeusz Żegleń
Education and qualifications (1)
1978-10-01
to
present
|
Phd
(Department of Measurement and Electronic)
Education
Source:
Tadeusz Żegleń
Works (14)
2022
|
Book chapter
Contributors:
Janusz Gajda;
Zbigniew Marszałek;
Piotr Burnos;
Ryszard Sroka;
Piotr Piwowar;
Marek Stencel;
Tadeusz Żegleń;
Mateusz Danioł
Source:
check_circle
Crossref
Sensors (Switzerland)
2018
|
Journal article
EID:
2-s2.0-85050581398
Contributors:
Marszalek, Z.;
Zeglen, T.;
Sroka, R.;
Gajda, J.
Source:
Tadeusz Żegleń
via
Scopus - Elsevier
2017 22nd International Conference on Methods and Models in Automation and Robotics, MMAR 2017
2017
|
Conference paper
EID:
2-s2.0-85035350287
Contributors:
Marszalek, Z.;
Sroka, R.;
Zeglen, T.
Source:
Tadeusz Żegleń
via
Scopus - Elsevier
Przeglad Elektrotechniczny
2016
|
Journal article
EID:
2-s2.0-84994633367
Contributors:
Stencel, M.;
Żegleń, T.;
Marszałek, Z.;
Piwowar, P.
Source:
Tadeusz Żegleń
via
Scopus - Elsevier
Conference Record - IEEE Instrumentation and Measurement Technology Conference
2015
|
Conference paper
EID:
2-s2.0-84938823429
Contributors:
Gajda, J.;
Sroka, R.;
Stencel, M.;
Zeglen, T.;
Piwowar, P.;
Burnos, P.;
Marszalek, Z.
Source:
Tadeusz Żegleń
via
Scopus - Elsevier
2015 20th International Conference on Methods and Models in Automation and Robotics, MMAR 2015
2015
|
Conference paper
EID:
2-s2.0-84964523967
Contributors:
Marszalek, Z.;
Sroka, R.;
Zeglen, T.
Source:
Tadeusz Żegleń
via
Scopus - Elsevier
XXI IMEKO World Congress "Measurement in Research and Industry"
2015
|
Conference paper
EID:
2-s2.0-84951075549
Contributors:
Gajda, J.;
Burnos, P.;
Zeglen, T.
Source:
Tadeusz Żegleń
via
Scopus - Elsevier
Metrology and Measurement Systems
2013
|
Journal article
EID:
2-s2.0-84878419040
Contributors:
Gajda, J.;
Sroka, R.;
Zeglen, T.;
Burnos, P.
Source:
Tadeusz Żegleń
via
Scopus - Elsevier
2012 IEEE I2MTC - International Instrumentation and Measurement Technology Conference, Proceedings
2012
|
Conference paper
EID:
2-s2.0-84864189539
Contributors:
Gajda, J.;
Sroka, R.;
Stencel, M.;
Zeglen, T.;
Piwowar, P.;
Burnos, P.
Source:
Tadeusz Żegleń
via
Scopus - Elsevier
Transportation Research Part C: Emerging Technologies
2012
|
Journal article
EID:
2-s2.0-80054693564
Contributors:
Gajda, J.;
Piwowar, P.;
Sroka, R.;
Stencel, M.;
Zeglen, T.
Source:
Tadeusz Żegleń
via
Scopus - Elsevier
Metrology and Measurement Systems
2011
|
Journal article
EID:
2-s2.0-84856561410
Contributors:
Burnos, P.;
Gajda, J.;
Marszałek, Z.;
Piwowar, P.;
Sroka, R.;
Stencel, M.;
Zegleń, T.
Source:
Tadeusz Żegleń
via
Scopus - Elsevier
Conference Record - IEEE Instrumentation and Measurement Technology Conference
2001
|
Conference paper
EID:
2-s2.0-0034835104
Contributors:
Gajda, J.;
Sroka, R.;
Stencel, M.;
Wajda, A.;
Zeglen, T.
Source:
Tadeusz Żegleń
via
Scopus - Elsevier
Journal of Loss Prevention in the Process Industries
2001
|
Journal article
EID:
2-s2.0-0035283603
Contributors:
Ptasinski, L.;
Zeglen, T.;
Gajda, J.
Source:
Tadeusz Żegleń
via
Scopus - Elsevier
Electrical Overstress/Electrostatic Discharge Symposium Proceedings
1996
|
Conference paper
EID:
2-s2.0-0030387119
Contributors:
Ptasinski, Leszek;
Zeglen, Tadeusz;
Gajewski, Andrzej
Source:
Tadeusz Żegleń
via
Scopus - Elsevier