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Other IDs

ResearcherID: J-4288-2015
Researcher Name Resolver ID: 1000070397602

Keywords

Surface science, Scanning Probe Microscopy, Power electronics

Countries

Japan

Activities

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Employment (5)

Chiba Institute of Technology: 2-17-1, Tsudanuma Narashino, Chiba, JP

2016-04-01 to present | professor (Department of Innovative Mechanical and Electronic Engineering)
Employment
Source: Self-asserted source
Nobuo Satoh

Chiba Institute of Technology: 2-17-1, Tsudanuma, Narashino, Chiba, JP

2015-04-01 to 2016-03-31 | Professor (Department of Electrical, Electronics and Computer Engineering)
Employment
Source: Self-asserted source
Nobuo Satoh

Chiba Institute of Technology: 2-17-1, Tsudanuma, Narashino, Chiba, JP

2012-04-01 to 2015-03-31 | Associate professor (Department of Electrical, Electronics and Computer Engineering)
Employment
Source: Self-asserted source
Nobuo Satoh

Kyoto University: Katsura, Nishikyo-ku, Kyoto, Kyoto, JP

2008-05-01 to 2012-03-31 | Assistant professor (Department of Electrical Engineering)
Employment
Source: Self-asserted source
Nobuo Satoh

Kyoto University: Katsura, Nishikyo-ku, Kyoto, Kyoto, JP

2007-04-01 to 2008-04-30 | assistant professor (Department of Electronic Science and Engineering)
Employment
Source: Self-asserted source
Nobuo Satoh

Works (17)

Power-Sharing Mechanism for a Modular Robot Using Power Packet Technology

2024-12-01 | Conference paper
DOI: 10.1109/TENCON61640.2024.10902811
Contributors: Kotaro Sanada; Nobuo Satoh; Hiroshi Arai
Source: check_circle
Crossref

Photo radiation pressure at resonance of frequency modulated micro cantilever

Nonlinear Theory and Its Applications, IEICE
2021 | Journal article
DOI: 10.1587/nolta.12.718
Contributors: Nobuo Satoh; Jimin Oh; Takashi Hikihara
Source: check_circle
Crossref

Development of scanning capacitance force microscopy using the dissipative force modulation method

Measurement Science and Technology
2020-03-01 | Journal article
DOI: 10.1088/1361-6501/ab5373
Contributors: Takeshi Uruma; Nobuo Satoh; Hidekazu Yamamoto; Futoshi Iwata
Source: check_circle
Crossref

Development of atomic force microscopy combined with scanning electron microscopy for investigating electronic devices

AIP Advances
2019-11-01 | Journal article
DOI: 10.1063/1.5125163
Contributors: Takeshi Uruma; Chiaki Tsunemitsu; Katsuki Terao; Kenta Nakazawa; Nobuo Satoh; Hidekazu Yamamoto; Futoshi Iwata
Source: check_circle
Crossref

Scanning near-feild optical microscopy system based on frequency-modulation atomic force microscopy using a piezoelectric cantilever

Japanese Journal of Applied Physics
2014 | Journal article
DOI: 10.7567/JJAP.53.125201
WOSUID:

WOS:000346957800019
Contributors: Satoh, Nobuo; Kobayashi, Kei; Watanabe, Shunji; Fujii, Toru; Matsushige, Kazumi; Yamada, Hirofumi
Source: Self-asserted source
Nobuo Satoh via ResearcherID

Surface potential measurement of fullerene/copper phthalocyanine films on indium tin oxide electrode by Kelvin probe force microscopy

Japanese Journal of Applied Physics
2014 | Journal article
DOI: 10.7567/JJAP.53.05FY03
WOSUID:

WOS:000338316200159
Contributors: Satoh, Nobuo; Katori, Shigetaka; Kobayashi, Kei; Matsushige, Kazumi; Yamada, Hirofumi
Source: Self-asserted source
Nobuo Satoh via ResearcherID

Nanoscale liquid droplet deposition using the ultrasmall aperture on a dynamic mode AFM tip

Nanotechnology
2011 | Journal article
DOI: 10.1088/0957-4484/22/17/175301
WOSUID:

WOS:000288509700006
Contributors: Kaisei, Kiyohiro; Satoh, Nobuo; Kobayashi, Kei; Matsushige, Kazumi; Yamada, Hirofumi
Source: Self-asserted source
Nobuo Satoh via ResearcherID

Surface potential measurement of organic thin film on metal electrodes by dynamic force microscopy using a piezoelectric cantilever

Journal of Applied Physics
2011 | Journal article
DOI: 10.1063/1.3585865
WOSUID:

WOS:000292214700129
Contributors: Satoh, Nobuo; Katori, Shigetaka; Kobayashi, Kei; Watanabe, Shunji; Fujii, Toru; Matsushige, Kazumi; Yamada, Hirofumi
Source: Self-asserted source
Nobuo Satoh via ResearcherID

Surface Potential Measurement of Tris(8-hydroxyquinolinato)aluminum and Bis[N-(1-naphthyl)-N-phenyl]benzidine Thin Films Fabricated on Indium-Tin Oxide by Kelvin Probe Force Microscopy

Japanese Journal of Applied Physics
2011 | Journal article
DOI: 10.1143/JJAP.50.071601
WOSUID:

WOS:000292878200042
Contributors: Katori, Shigetaka; Satoh, Nobuo; Yahiro, Masayuki; Kobayashi, Kei; Yamada, Hirofumi; Matsushige, Kazumi; Fujita, Shizuo
Source: Self-asserted source
Nobuo Satoh via ResearcherID

Near-field light detection by conservative and dissipative force modulation methods using a piezoelectric cantilever

Applied Physics Letters
2010 | Journal article
DOI: 10.1063/1.3449131
WOSUID:

WOS:000278695900061
Contributors: Satoh, Nobuo; Fukuma, Takeshi; Kobayashi, Kei; Watanabe, Shunji; Fujii, Toru; Matsushige, Kazumi; Yamada, Hirofumi
Source: Self-asserted source
Nobuo Satoh via ResearcherID

Multi-probe atomic force microscopy using piezoelectric cantilevers

Japanese Journal of Applied Physics Part 1-Regular Papers Brief Communications & Review Papers
2007 | Journal article
DOI: 10.1143/JJAP.46.5543
WOSUID:

WOS:000249219200030
Contributors: Satoh, Nobuo; Tsunemi, Eika; Miyato, Yuji; Kobayashi, Kei; Watanabe, Shunji; Fuji, Toru; Matsushige, Kazumi; Yamada, Hirofumi
Source: Self-asserted source
Nobuo Satoh via ResearcherID

Multi-probe atomic force Microscopy with optical beam deflection method

Japanese Journal of Applied Physics Part 1-Regular Papers Brief Communications & Review Papers
2007 | Journal article
DOI: 10.1143/JJAP.46.5636
WOSUID:

WOS:000249219200052
Contributors: Tsunemi, Eika; Satoh, Nobuo; Miyato, Yuji; Kobayashi, Kei; Matsushige, Kazumi; Yamada, Hirofumi
Source: Self-asserted source
Nobuo Satoh via ResearcherID

Investigations of nanoparticles by scanning near-field optical microscopy combined with Kelvin probe force microscopy using a piezoelectric cantilever

Japanese Journal of Applied Physics Part 1-Regular Papers Short Notes & Review Papers
2004 | Journal article
DOI: 10.1143/JJAP.43.4651
WOSUID:

WOS:000223477600045
Contributors: Satoh, N; Kobayashi, K; Watanabe, S; Fujii, T; Horiuchi, T; Yamada, H; Matsushige, K
Source: Self-asserted source
Nobuo Satoh via ResearcherID

Nanoscale investigation of optical and electrical properties by dynamic-mode atomic force microscopy using a piezoelectric cantilever

Japanese Journal of Applied Physics Part 1-Regular Papers Short Notes & Review Papers
2003 | Journal article
DOI: 10.1143/JJAP.42.4878
WOSUID:

WOS:000184780100065
Contributors: Satoh, N; Kobayashi, K; Watanabe, S; Fujii, T; Horiuchi, T; Yamada, H; Matsushige, K
Source: Self-asserted source
Nobuo Satoh via ResearcherID

Dynamic-mode AFM using the piezoelectric cantilever: investigations of local optical and electrical properties

Applied Surface Science
2002 | Journal article
DOI: 10.1016/S0169-4332(01)00969-2
WOSUID:

WOS:000176131300032
Contributors: Satoh, N; Kobayashi, K; Watanabe, S; Fujii, T; Horiuchi, T; Yamada, H; Matsushige, K
Source: Self-asserted source
Nobuo Satoh via ResearcherID

Investigations of local surface properties by SNOM combined with KFM using a PZT cantilever

Ieice Transactions on Electronics
2002 | Journal article
WOSUID:

WOS:000179899300020
Contributors: Satoh, N; Watanabe, S; Fujii, T; Kobayashi, K; Yamada, H; Matsushige, K
Source: Self-asserted source
Nobuo Satoh via ResearcherID

Stress reduction and structural duality improvement due to In doping in GaAs/Si

Materials Science and Engineering B-Solid State Materials For Advanced Technology
2000 | Journal article
DOI: 10.1016/S0921-5107(99)00476-6
WOSUID:

WOS:000085613000007
Contributors: Saravanan, S; Adachi, M; Satoh, N; Soga, T; Jimbo, T; Umeno, M
Source: Self-asserted source
Nobuo Satoh via ResearcherID

Peer review (9 reviews for 4 publications/grants)

Review activity for IEEE journal of emerging and selected topics in power electronics. (3)
Review activity for Japanese journal of applied physics. (1)
Review activity for Journal of electrostatics. (1)
Review activity for Journal of engineering. (4)
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