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Scopus Author ID: 57197747104

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Employment (1)

IHP GmbH - Leibniz Institute for High Performance Microelectronics: Frankfurt (Oder), Brandenburg, DE

Scientist
Employment
Source: Self-asserted source
Anselm Breitenreiter

Education and qualifications (2)

University of Potsdam: Potsdam, DE

Education
Source: Self-asserted source
Anselm Breitenreiter

Technical University of Berlin: Berlin, DE

Education
Source: Self-asserted source
Anselm Breitenreiter

Works (24)

Laser Fault Injection Attacks against Radiation Tolerant TMR Registers

arXiv
2024 | Other
DOI: 10.48550/arXiv.2407.06751
EID:

2-s2.0-85200262013

Part of ISSN: 23318422
Contributors: Petryk, D.; Dyka, Z.; Kabin, I.; Breitenreiter, A.; Schäffner, J.; Krstic, M.
Source: Self-asserted source
Anselm Breitenreiter via Scopus - Elsevier

Bits, Flips and RISCs

Proceedings - 2023 26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2023
2023 | Conference paper
DOI: 10.1109/DDECS57882.2023.10139331
EID:

2-s2.0-85162219010

Part of ISBN: 9798350332773
Contributors: Gerlin, N.; Kaja, E.; Vargas, F.; Lu, L.; Breitenreiter, A.; Chen, J.; Ulbricht, M.; Gomez, M.; Tahiraga, A.; Prebeck, S. et al.
Source: Self-asserted source
Anselm Breitenreiter via Scopus - Elsevier

SET and SEU Hardened Clock Gating Cell

2023 38th Conference on Design of Circuits and Integrated Systems, DCIS 2023
2023 | Conference paper
DOI: 10.1109/DCIS58620.2023.10335985
EID:

2-s2.0-85181540349

Part of ISBN: 9798350303858
Contributors: Andjelkovic, M.; Schrape, O.; Breitenreiter, A.; Krstic, M.
Source: Self-asserted source
Anselm Breitenreiter via Scopus - Elsevier

Fast Error Propagation Probability Estimates by Answer Set Programming and Approximate Model Counting

IEEE Access
2022 | Journal article
DOI: 10.1109/ACCESS.2022.3174564
EID:

2-s2.0-85131289878

Part of ISSN: 21693536
Contributors: Breitenreiter, A.; Andjelkovic, M.; Schrape, O.; Krstic, M.
Source: Self-asserted source
Anselm Breitenreiter via Scopus - Elsevier
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Preferred source (of 2)‎

Laser Fault Injection Attacks against Radiation Tolerant TMR Registers

2022 IEEE 23rd Latin American Test Symposium, LATS 2022
2022 | Conference paper
DOI: 10.1109/LATS57337.2022.9936987
EID:

2-s2.0-85142811082

Part of ISBN: 9781665457071
Contributors: Petryk, D.; Dyka, Z.; Kabin, I.; Breitenreiter, A.; Schäffner, J.; Krstic, M.
Source: Self-asserted source
Anselm Breitenreiter via Scopus - Elsevier

A Tunable Single Event Transient Filter Based on Digitally Controlled Capacitive Delay Cells

Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT
2021 | Conference paper
DOI: 10.1109/DFT52944.2021.9568355
EID:

2-s2.0-85142917104

Part of ISBN: 9781665416092
Part of ISSN: 2765933X 25761501
Contributors: Andjelkovic, M.; Schrape, O.; Breitenreiter, A.; Chen, J.; Krstic, M.
Source: Self-asserted source
Anselm Breitenreiter via Scopus - Elsevier

Cross-Layer Digital Design Flow for Space Applications

Proceedings of the International Conference on Microelectronics, ICM
2021 | Conference paper
DOI: 10.1109/MIEL52794.2021.9569065
EID:

2-s2.0-85118456323

Part of ISBN: 9781665445283
Contributors: Krstic, M.; Andjelkovic, M.; Schrape, O.; Breitenreiter, A.; Chen, J.; Balashov, A.; Simevski, A.
Source: Self-asserted source
Anselm Breitenreiter via Scopus - Elsevier

Design and Evaluation of Radiation-Hardened Standard Cell Flip-Flops

IEEE Transactions on Circuits and Systems I: Regular Papers
2021 | Journal article
DOI: 10.1109/TCSI.2021.3109080
EID:

2-s2.0-85114720376

Part of ISSN: 15580806 15498328
Contributors: Schrape, O.; Andjelkovic, M.; Breitenreiter, A.; Zeidler, S.; Balashov, A.; Krstic, M.
Source: Self-asserted source
Anselm Breitenreiter via Scopus - Elsevier
grade
Preferred source (of 2)‎

Machine Learning Approach for Accelerating Simulation-based Fault Injection

2021 IEEE Nordic Circuits and Systems Conference, NORCAS 2021 - Proceedings
2021 | Conference paper
DOI: 10.1109/NorCAS53631.2021.9599646
EID:

2-s2.0-85123493289

Part of ISBN: 9781665407120
Contributors: Lu, L.; Chen, J.; Breitenreiter, A.; Schrape, O.; Ulbricht, M.; Krstic, M.
Source: Self-asserted source
Anselm Breitenreiter via Scopus - Elsevier

Power- and Area-optimized Neural Network IC-Design for Academic Education

2021 28th IEEE International Conference on Electronics, Circuits, and Systems, ICECS 2021 - Proceedings
2021 | Conference paper
DOI: 10.1109/ICECS53924.2021.9665471
EID:

2-s2.0-85124613130

Part of ISBN: 9781728182810
Contributors: Frankreiter, F.; Breitenreiter, A.; Schrape, O.; Krstic, M.
Source: Self-asserted source
Anselm Breitenreiter via Scopus - Elsevier

Radiation-Hardness-by-Design Latch-based Triple Modular Redundancy Flip-Flops

2021 IEEE 12th Latin American Symposium on Circuits and Systems, LASCAS 2021
2021 | Conference paper
DOI: 10.1109/LASCAS51355.2021.9459134
EID:

2-s2.0-85113915468

Part of ISBN: 9781728176703
Contributors: Schrape, O.; Breitenreiter, A.; Schulze, C.; Zeidler, S.; Krstic, M.
Source: Self-asserted source
Anselm Breitenreiter via Scopus - Elsevier

Reliability Analysis in Less than 200 Lines of Code

2021 IEEE 12th Latin American Symposium on Circuits and Systems, LASCAS 2021
2021 | Conference paper
DOI: 10.1109/LASCAS51355.2021.9459116
EID:

2-s2.0-85113986518

Part of ISBN: 9781728176703
Contributors: Breitenreiter, A.; Schrape, O.; Andjelkovic, M.; Krstic, M.
Source: Self-asserted source
Anselm Breitenreiter via Scopus - Elsevier

A Glitch-free Clock Multiplexer for Non-Continuously Running Clocks

Proceedings - Euromicro Conference on Digital System Design, DSD 2020
2020 | Conference paper
DOI: 10.1109/DSD51259.2020.00013
EID:

2-s2.0-85096356442

Part of ISBN: 9781728195353
Contributors: Zeidler, S.; Schrape, O.; Breitenreiter, A.; Krstic, M.
Source: Self-asserted source
Anselm Breitenreiter via Scopus - Elsevier

Characterization of single event transient effects in standard delay cells

ICECS 2020 - 27th IEEE International Conference on Electronics, Circuits and Systems, Proceedings
2020 | Conference paper
DOI: 10.1109/ICECS49266.2020.9294817
EID:

2-s2.0-85099442086

Part of ISBN: 9781728160443
Contributors: Andjelkovic, M.; Schrape, O.; Breitenreiter, A.; Krstic, M.; Kraemer, R.
Source: Self-asserted source
Anselm Breitenreiter via Scopus - Elsevier

Design Concept for Radiation-Hardening of Triple Modular Redundancy TSPC Flip-Flops

Proceedings - Euromicro Conference on Digital System Design, DSD 2020
2020 | Conference paper
DOI: 10.1109/DSD51259.2020.00101
EID:

2-s2.0-85096364521

Part of ISBN: 9781728195353
Contributors: Schrape, O.; Andjelkovic, M.; Breitenreiter, A.; Balashov, A.; Krstic, M.
Source: Self-asserted source
Anselm Breitenreiter via Scopus - Elsevier

Double cell upsets mitigation through triple modular redundancy

Microelectronics Journal
2020 | Journal article
DOI: 10.1016/j.mejo.2019.104683
EID:

2-s2.0-85076841987

Part of ISSN: 00262692
Contributors: Li, Y.; Breitenreiter, A.; Andjelkovic, M.; Chen, J.; Babic, M.; Krstic, M.
Source: Self-asserted source
Anselm Breitenreiter via Scopus - Elsevier

R-Abax: A radiation hardening legalisation algorithm satisfying TMR spacing constraints

Proceedings of IEEE Computer Society Annual Symposium on VLSI, ISVLSI
2020 | Conference paper
DOI: 10.1109/ISVLSI49217.2020.00065
EID:

2-s2.0-85090409011

Part of ISBN: 9781728157757
Part of ISSN: 21593477 21593469
Contributors: Georgakidis, C.; Sotiriou, C.; Sketopoulos, N.; Krstic, M.; Schrape, O.; Breitenreiter, A.
Source: Self-asserted source
Anselm Breitenreiter via Scopus - Elsevier

A Radiation Tolerant 10/100 Ethernet Transceiver for Space Applications

2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design, IOLTS 2019
2019 | Conference paper
DOI: 10.1109/IOLTS.2019.8854370
EID:

2-s2.0-85073761558

Part of ISBN: 9781728124902
Contributors: Breitenreiter, A.; Lopez, J.; Reviriego, P.; Krstic, M.; Gutierro, U.; Sanchez-Renedo, M.; Gonzalez, D.
Source: Self-asserted source
Anselm Breitenreiter via Scopus - Elsevier

Aspects on Timing Modeling of Radiation-Hardness by Design Standard Cell-Based ΔtMR Flip-Flops

Proceedings - Euromicro Conference on Digital System Design, DSD 2019
2019 | Conference paper
DOI: 10.1109/DSD.2019.00100
EID:

2-s2.0-85074909312

Part of ISBN: 9781728128610
Contributors: Schrape, O.; Breitenereiter, A.; Zeidler, S.; Krstic, M.
Source: Self-asserted source
Anselm Breitenreiter via Scopus - Elsevier

Selective Fault Tolerance by Counting Gates with Controlling Value

2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design, IOLTS 2019
2019 | Conference paper
DOI: 10.1109/IOLTS.2019.8854380
EID:

2-s2.0-85073725187

Part of ISBN: 9781728124902
Contributors: Breitenreiter, A.; Weidling, S.; Schrape, O.; Zeidler, S.; Reviriego, P.; Krstic, M.
Source: Self-asserted source
Anselm Breitenreiter via Scopus - Elsevier

A methodology to verify digital IP's within mixed-signal systems

Proceedings - 21st IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2018
2018 | Conference paper
DOI: 10.1109/DDECS.2018.00036
EID:

2-s2.0-85050979527

Part of ISBN: 9781538657546
Contributors: Navaneetha, C.M.; Breitenreiter, A.; Ulbricht, M.; Krstić, M.
Source: Self-asserted source
Anselm Breitenreiter via Scopus - Elsevier

D-SET mitigation using common clock tree insertion techniques for triple-clock TMR Flip-Flop

Proceedings - 21st Euromicro Conference on Digital System Design, DSD 2018
2018 | Conference paper
DOI: 10.1109/DSD.2018.00047
EID:

2-s2.0-85056452545

Part of ISBN: 9781538673768
Contributors: Schrape, O.; Breitenreiter, A.; Andjelkovic, M.; Krstic, M.
Source: Self-asserted source
Anselm Breitenreiter via Scopus - Elsevier

Flip-flop SEUs mitigation through partial hardening of internal latch and adjustment of clock duty cycle

Proceedings - 21st IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2018
2018 | Conference paper
DOI: 10.1109/DDECS.2018.00009
EID:

2-s2.0-85050956522

Part of ISBN: 9781538657546
Contributors: Li, Y.; Breitenreiter, A.; Andjelkovic, M.; Schrape, O.; Krstic, M.
Source: Self-asserted source
Anselm Breitenreiter via Scopus - Elsevier

Design of an On-chip System for the SET Pulse Width Measurement

Proceedings - 20th Euromicro Conference on Digital System Design, DSD 2017
2017 | Conference paper
DOI: 10.1109/DSD.2017.70
EID:

2-s2.0-85034444708

Part of ISBN: 9781538621455
Contributors: Andjelkovic, M.; Petrovic, V.; Nenadovic, M.; Breitenreiter, A.; Krstic, M.; Kraemer, R.
Source: Self-asserted source
Anselm Breitenreiter via Scopus - Elsevier
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