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Scopus Author ID: 57195633105

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Employment (2)

CERN: Geneva, Select State, CH

2016-03-01 to present | Post-doctoral fellow
Employment
Source: Self-asserted source
Carlo Baccigalupi

CERN: Geneva, Select State, CH

2013-02-01 to 2016-01-31 | Ph.D. student
Employment
Source: Self-asserted source
Carlo Baccigalupi

Works (10)

Proof of principle of an on-line digitizer with ±18 ppm repeatability and 1.2 μs real-time delay for power converters control loop

Journal of Instrumentation
2017 | Journal article
DOI: 10.1088/1748-0221/12/09/P09002
EID:

2-s2.0-85030985320
Contributors: Arpaia, P.; Baccigalupi, C.; Bastos, M.C.; Martino, M.
Source: Self-asserted source
Carlo Baccigalupi via Scopus - Elsevier

Design of a real-time acquisition system for the CLIC klystron modulators control loop

Conference Record - IEEE Instrumentation and Measurement Technology Conference
2016 | Conference paper
DOI: 10.1109/I2MTC.2016.7520437
EID:

2-s2.0-84980411252
Contributors: Arpaia, P.; Baccigalupi, C.; Bastos, M.C.; Martino, M.
Source: Self-asserted source
Carlo Baccigalupi via Scopus - Elsevier

Design of a 1 μs real-time low-noise data acquisition for power converters control loop

XXI IMEKO World Congress "Measurement in Research and Industry"
2015 | Conference paper
EID:

2-s2.0-84950992466
Contributors: Arpaia, P.; Baccigalupi, C.; Bastos, M.C.; Martino, M.
Source: Self-asserted source
Carlo Baccigalupi via Scopus - Elsevier

Enhanced analogue front-end for the measurement of the high state of wide-band voltage pulses with 87 dB common-mode rejection ratio and ±0.65 ppm 1-day offset stability

Review of Scientific Instruments
2015 | Journal article
DOI: 10.1063/1.4930553
EID:

2-s2.0-84941966248
Contributors: Arpaia, P.; Baccigalupi, C.; Martino, M.
Source: Self-asserted source
Carlo Baccigalupi via Scopus - Elsevier

Metrological characterization of an ultra-low noise acquisition system for fast voltage pulses measurements

Conference Record - IEEE Instrumentation and Measurement Technology Conference
2015 | Conference paper
DOI: 10.1109/I2MTC.2015.7151506
EID:

2-s2.0-84938857316
Contributors: Arpaia, P.; Baccigalupi, C.; Martino, M.
Source: Self-asserted source
Carlo Baccigalupi via Scopus - Elsevier

Type-A Worst-Case Uncertainty for Gaussian noise instruments

Journal of Instrumentation
2015 | Journal article
DOI: 10.1088/1748-0221/10/07/P07007
EID:

2-s2.0-84937876860
Contributors: Arpaia, P.; Baccigalupi, C.; Martino, M.
Source: Self-asserted source
Carlo Baccigalupi via Scopus - Elsevier

Design of an ultra-low noise analogue front-end for fast voltage pulses measurement

20th IMEKO TC4 Symposium on Measurements of Electrical Quantities: Research on Electrical and Electronic Measurement for the Economic Upturn, Together with 18th TC4 International Workshop on ADC and DCA Modeling and Testing, IWADC 2014
2014 | Conference paper
EID:

2-s2.0-84918825043
Contributors: Arpaia, P.; Baccigalupi, C.; Bastos, M.C.; Martino, M.
Source: Self-asserted source
Carlo Baccigalupi via Scopus - Elsevier

Extreme value statistical characterization of time domain pulse-to-pulse measurements

20th IMEKO TC4 Symposium on Measurements of Electrical Quantities: Research on Electrical and Electronic Measurement for the Economic Upturn, Together with 18th TC4 International Workshop on ADC and DCA Modeling and Testing, IWADC 2014
2014 | Conference paper
EID:

2-s2.0-84918801503
Contributors: Arpaia, P.; Baccigalupi, C.; Martino, M.
Source: Self-asserted source
Carlo Baccigalupi via Scopus - Elsevier

±25 ppm repeatable measurement of trapezoidal pulses with 5 MHz bandwidth

Journal of Instrumentation
2014 | Journal article
DOI: 10.1088/1748-0221/9/06/P06002
EID:

2-s2.0-84903643079
Contributors: Arpaia, P.; Baccigalupi, C.; Bastos, M.C.; Martino, M.
Source: Self-asserted source
Carlo Baccigalupi via Scopus - Elsevier

Acoustic measurements in the collimation region of the LHC

IPAC 2011 - 2nd International Particle Accelerator Conference
2011 | Conference paper
EID:

2-s2.0-84885732422
Contributors: Deboy, D.; Assmann, R.; Baccigalupi, C.; Burkart, F.; Cauchi, M.; Derrez, C.S.; Lendaro, J.; Masi, A.; Redaelli, S.; Spiezia, G. et al.
Source: Self-asserted source
Carlo Baccigalupi via Scopus - Elsevier
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