Personal information
Switzerland
Activities
Employment (1)
2012-05-01
to
2019-05-31
|
Scientist
(LAMP)
Employment
Source:
Bastian Meylan
Education and qualifications (2)
2006-12-10
to
2010-12-01
|
PhD
(Enginneering)
Education
Source:
Bastian Meylan
2001-10-01
to
2006-04-01
|
Master
(Materials Science)
Education
Source:
Bastian Meylan
Works (20)
Mechanical Systems and Signal Processing
2019
|
Journal article
EID:
2-s2.0-85053804989
Contributors:
Shevchik, S.A.;
Meylan, B.;
Violakis, G.;
Wasmer, K.
Source:
Bastian Meylan
via
Scopus - Elsevier
Journal of Materials Engineering and Performance
2019
|
Journal article
EID:
2-s2.0-85055535743
Contributors:
Wasmer, K.;
Le-Quang, T.;
Meylan, B.;
Shevchik, S.A.
Source:
Bastian Meylan
via
Scopus - Elsevier
IEEE Access
2018
|
Journal article
EID:
2-s2.0-85049680254
Contributors:
Shevchik, S.A.;
Meylan, B.;
Mosaddeghi, A.;
Wasmer, K.
Source:
Bastian Meylan
via
Scopus - Elsevier
Lubricants
2018
|
Journal article
EID:
2-s2.0-85041181185
Contributors:
Meylan, B.;
Saeidi, F.;
Wasmer, K.
Source:
Bastian Meylan
via
Scopus - Elsevier
grade
Preferred source
(of
2)
Procedia CIRP
2018
|
Conference paper
EID:
2-s2.0-85055523426
Contributors:
Wasmer, K.;
Le-Quang, T.;
Meylan, B.;
Vakili-Farahani, F.;
Olbinado, M.P.;
Rack, A.;
Shevchik, S.A.
Source:
Bastian Meylan
via
Scopus - Elsevier
Procedia CIRP
2018
|
Conference paper
EID:
2-s2.0-85055502769
Contributors:
Le-Quang, T.;
Shevchik, S.A.;
Meylan, B.;
Vakili-Farahani, F.;
Olbinado, M.P.;
Rack, A.;
Wasmer, K.
Source:
Bastian Meylan
via
Scopus - Elsevier
Progress in Biomedical Optics and Imaging - Proceedings of SPIE
2017
|
Conference paper
EID:
2-s2.0-85033390806
Contributors:
Nguendon, H.K.;
Faivre, N.;
Meylan, B.;
Shevchik, S.;
Rauter, G.;
Guzman, R.;
Cattin, P.C.;
Wasmer, K.;
Zam, A.
Source:
Bastian Meylan
via
Scopus - Elsevier
Materials and Design
2017
|
Journal article
EID:
2-s2.0-85007452796
Contributors:
Saeidi, F.;
Taylor, A.A.;
Meylan, B.;
Hoffmann, P.;
Wasmer, K.
Source:
Bastian Meylan
via
Scopus - Elsevier
IEEE Transactions on Industrial Informatics
2017
|
Journal article
EID:
2-s2.0-85029689397
Contributors:
Shevchik, S.A.;
Saeidi, F.;
Meylan, B.;
Wasmer, K.
Source:
Bastian Meylan
via
Scopus - Elsevier
Surface Topography: Metrology and Properties
2017-11-09
|
Journal article
Contributors:
B Meylan;
D Ciani;
B Zhang;
E Cuche;
K Wasmer
Source:
check_circle
Crossref
Wear
2016
|
Journal article
EID:
2-s2.0-84975720695
Contributors:
Meylan, B.;
Dogan, P.;
Sage, D.;
Wasmer, K.
Source:
Bastian Meylan
via
Scopus - Elsevier
Wear
2016
|
Journal article
EID:
2-s2.0-84949818899
Contributors:
Saeidi, F.;
Meylan, B.;
Hoffmann, P.;
Wasmer, K.
Source:
Bastian Meylan
via
Scopus - Elsevier
Acta Materialia
2011
|
Journal article
EID:
2-s2.0-79953168013
Contributors:
Meylan, B.;
Terzi, S.;
Gourlay, C.M.;
Dahle, A.K.
Source:
Bastian Meylan
via
Scopus - Elsevier
Scripta Materialia
2010
|
Journal article
EID:
2-s2.0-77957717388
Contributors:
Meylan, B.;
Terzi, S.;
Gourlay, C.M.;
Suéry, M.;
Dahle, A.K.
Source:
Bastian Meylan
via
Scopus - Elsevier
Thin Solid Films
2009
|
Journal article
EID:
2-s2.0-58149102313
Contributors:
Pinyol, A.;
Meylan, B.;
Gilliéron, D.;
Mewani, V.;
Leterrier, Y.;
Månson, J.-A.E.
Source:
Bastian Meylan
via
Scopus - Elsevier
Materials Research Society Symposium Proceedings
2008
|
Conference paper
EID:
2-s2.0-70350290262
Contributors:
Pinyol, A.;
Meylan, B.;
Gilliéron, D.;
Mottet, A.;
Mewani, V.;
Leterrier, Y.;
Månson, J.-A.E.
Source:
Bastian Meylan
via
Scopus - Elsevier
Solid State Phenomena
2008
|
Book
EID:
2-s2.0-58049196941
Contributors:
Gourlay, C.M.;
Otarawanna, S.;
Meylan, B.;
Dahle, A.K.
Source:
Bastian Meylan
via
Scopus - Elsevier
Acta Materialia
2008
|
Journal article
EID:
2-s2.0-47349117718
Contributors:
Gourlay, C.M.;
Meylan, B.;
Dahle, A.K.
Source:
Bastian Meylan
via
Scopus - Elsevier
Materials Forum
2008
|
Journal article
EID:
2-s2.0-84875875313
Contributors:
Meylan, B.;
Gourlay, C.M.;
Dahle, A.K.
Source:
Bastian Meylan
via
Scopus - Elsevier
Materials Science Forum
2007
|
Book
EID:
2-s2.0-38349111442
Contributors:
Gourlay, C.M.;
Meylan, B.;
Dahle, A.K.
Source:
Bastian Meylan
via
Scopus - Elsevier