Personal information
Numerical Modeling, Ultrasonic Non-Destructive Testing & Evaluation, Contact Acoustic Nonlinearities, Non-Contact Ultrasound, Time-Reversed Acoustics, Nonlinear Elastic Wave Spectroscopy, Ultrasonic Thermography, Ultrasonic Sensor Arrays
Belgium
Activities
Employment (3)
2014-10
to
present
|
Doctor-Assistant Applied Mathematics/Mathematical Physics
Employment
Source:
Steven Delrue
2011-10
to
2014-09
|
Scientific Fellow
Employment
Source:
Steven Delrue
2007-09
to
2011-09
|
PhD Research Fellow
Employment
Source:
Steven Delrue
Education and qualifications (4)
2007-09
to
2011-11
|
PhD in Sciences (Physics)
Education
Source:
Steven Delrue
2005-09
to
2008-02
|
Aggregated for teaching (Mathematics)
Education
Source:
Steven Delrue
2005-09
to
2007-07
|
Licentiate in Sciences (Mathematics)
Education
Source:
Steven Delrue
2003-09
to
2005-07
|
Candidate in Sciences (Mathematics)
Education
Source:
Steven Delrue
Funding (6)
2018-10
to
2022-09
|
Grant
I-SITE ULNE
(Lille, FR)
Source:
Steven Delrue
2018-01
to
2021-12
|
Grant
Fonds Wetenschappelijk Onderzoek
(Brussels, BE)
GRANT_NUMBER:
G066618N
Source:
Steven Delrue
2016-04
to
2017-10
|
Contract
National Aerospace Technology Exploitation Program (NATEP)
(Hampshire, GB)
Source:
Steven Delrue
2016-01
to
2019-12
|
Grant
Fonds Wetenschappelijk Onderzoek
(Brussels, BE)
GRANT_NUMBER:
151474
Source:
Steven Delrue
2015-10
to
2019-09
|
Grant
Onderzoeksraad, KU Leuven
(Leuven, BE)
GRANT_NUMBER:
C24/15/021
Source:
Steven Delrue
2015-01
to
2018-12
|
Grant
Fonds Wetenschappelijk Onderzoek
(Brussels, BE)
GRANT_NUMBER:
G0B9515N
Source:
Steven Delrue
Works (37)
Energy and Buildings
2021-05
|
Journal article
Contributors:
Shamila Haddad;
Afroditi Synnefa;
Miguel Ángel Padilla Marcos;
Riccardo Paolini;
Steven Delrue;
Deo Prasad;
Mattheos Santamouris
Source:
check_circle
Crossref
Exploration Geophysics
2020-07-03
|
Journal article
Contributors:
Steven Delrue;
Benjamin Maveau;
David Dudal
Source:
check_circle
Crossref
2019
|
Book chapter
Contributors:
K. Truyaert;
V. Aleshin;
S. Delrue;
K. Van Den Abeele
Source:
check_circle
Crossref
International Journal of Solids and Structures
2019-02
|
Journal article
Contributors:
Kevin Truyaert;
Vladislav Aleshin;
Koen Van Den Abeele;
Steven Delrue
Source:
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Crossref
2018-07-19
|
Conference paper
Contributors:
Erik Verboven;
Mathias Kersemans;
Arvid Martens;
Jannes Daemen;
Steven Delrue;
Koen Van Den Abeele;
Wim Van Paepegem
Source:
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Crossref
2018-06-11
|
Conference paper
Contributors:
Jannes Daemen;
Arvid Martens;
Mathias Kersemans;
Erik Verboven;
Steven Delrue;
Wim Van Paepegem;
Koen Van Den Abeele
Source:
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Crossref
Ultrasonics
2018-01
|
Journal article
Contributors:
Vladislav Aleshin;
Steven Delrue;
Andrey Trifonov;
Olivier Bou Matar;
Koen Van Den Abeele
Source:
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Crossref
grade
Preferred source
(of
2)
Ultrasonics
2018-01
|
Journal article
Contributors:
Steven Delrue;
Vladislav Aleshin;
Kevin Truyaert;
Olivier Bou Matar;
Koen Van Den Abeele
Source:
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Crossref
grade
Preferred source
(of
2)
Journal of Nondestructive Evaluation
2017
|
Journal article
EID:
2-s2.0-85006856460
Contributors:
Hettler, J.;
Tabatabaeipour, M.;
Delrue, S.;
Van Den Abeele, K.
Source:
Steven Delrue
via
Scopus - Elsevier
24th International Congress on Sound and Vibration, ICSV 2017
2017
|
Conference paper
EID:
2-s2.0-85029437680
Contributors:
Delrue, S.;
Aleshin, V.
Source:
Steven Delrue
via
Scopus - Elsevier
Composite Structures
2017
|
Journal article
EID:
2-s2.0-85026807463
Contributors:
Martens, A.;
Kersemans, M.;
Daemen, J.;
Verboven, E.;
Van Paepegem, W.;
Degrieck, J.;
Delrue, S.;
Van Den Abeele, K.
Source:
Steven Delrue
via
Scopus - Elsevier
Journal of Nondestructive Evaluation
2017
|
Journal article
EID:
2-s2.0-85032176321
Contributors:
Tabatabaeipour, M.;
Hettler, J.;
Sewell, N.T.;
Wright, J.R.;
Wright, J.C.S.;
Delrue, S.;
Van Den Abeele, K.
Source:
Steven Delrue
via
Scopus - Elsevier
Acta Acustica united with Acustica
2017
|
Journal article
EID:
2-s2.0-85034089913
Contributors:
Tabatabaeipour, M.;
Hettler, J.;
Delrue, S.;
Abeele, K.V.D.
Source:
Steven Delrue
via
Scopus - Elsevier
Sensors
2017-04-22
|
Journal article
Contributors:
Steven Delrue;
Vladislav Aleshin;
Mikael Sørensen;
Lieven Lathauwer
Source:
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Crossref
grade
Preferred source
(of
3)
Emerging Technologies in Non-Destructive Testing VI - Proceedings of the 6th International Conference on Emerging Technologies in Nondestructive Testing, ETNDT 2016
2016
|
Conference paper
EID:
2-s2.0-84949921744
Contributors:
Delrue, S.;
Van Den Abeele, K.
Source:
Steven Delrue
via
Scopus - Elsevier
Ultrasonics
2016
|
Journal article
EID:
2-s2.0-84959010205
Contributors:
Delrue, S.;
Tabatabaeipour, M.;
Hettler, J.;
Van Den Abeele, K.
Source:
Steven Delrue
via
Scopus - Elsevier
Emerging Technologies in Non-Destructive Testing VI - Proceedings of the 6th International Conference on Emerging Technologies in Nondestructive Testing, ETNDT 2016
2016
|
Conference paper
EID:
2-s2.0-84949895311
Contributors:
Hettler, J.;
Tabatabaeipour, M.;
Delrue, S.;
Van Den Abeele, K.
Source:
Steven Delrue
via
Scopus - Elsevier
NDT and E International
2016
|
Journal article
EID:
2-s2.0-84958977187
Contributors:
Tabatabaeipour, M.;
Hettler, J.;
Delrue, S.;
Van Den Abeele, K.
Source:
Steven Delrue
via
Scopus - Elsevier
Emerging Technologies in Non-Destructive Testing VI - Proceedings of the 6th International Conference on Emerging Technologies in Nondestructive Testing, ETNDT 2016
2016
|
Conference paper
EID:
2-s2.0-84949908619
Contributors:
Tabatabaeipour, M.;
Hettler, J.;
Delrue, S.;
Van Den Abeele, K.
Source:
Steven Delrue
via
Scopus - Elsevier
Ultrasonics
2016
|
Journal article
EID:
2-s2.0-84962163490
Contributors:
Delrue, S.;
Van Den Abeele, K.;
Bou Matar, O.
Source:
Steven Delrue
via
Scopus - Elsevier
Applied Sciences (Switzerland)
2016
|
Journal article
EID:
2-s2.0-84973520317
Contributors:
Kersemans, M.;
Martens, A.;
Degrieck, J.;
Van Den Abeele, K.;
Delrue, S.;
Pyl, L.;
Zastavnik, F.;
Sol, H.;
Van Paepegem, W.
Source:
Steven Delrue
via
Scopus - Elsevier
Emerging Technologies in Non-Destructive Testing VI - Proceedings of the 6th International Conference on Emerging Technologies in Nondestructive Testing, ETNDT 2016
2016
|
Conference paper
EID:
2-s2.0-84949844536
Contributors:
Kersemans, M.;
Martens, A.;
Delrue, S.;
Van Den Abeele, K.;
Pyl, L.;
Zastavnik, F.;
Sol, H.;
Degrieck, J.;
Van Paepegem, W.
Source:
Steven Delrue
via
Scopus - Elsevier
Emerging Technologies in Non-Destructive Testing VI - Proceedings of the 6th International Conference on Emerging Technologies in Nondestructive Testing, ETNDT 2016
2016
|
Conference paper
EID:
2-s2.0-84949845682
Contributors:
Martens, A.;
Kersemans, M.;
Degrieck, J.;
Van Paepegem, W.;
Delrue, S.;
Van Den Abeele, K.
Source:
Steven Delrue
via
Scopus - Elsevier
Materials
2016-11-07
|
Journal article
Contributors:
Jan Hettler;
Morteza Tabatabaeipour;
Steven Delrue;
Koen Van Den Abeele
Source:
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Crossref
grade
Preferred source
(of
2)
Physics Procedia
2015
|
Conference paper
EID:
2-s2.0-84948690569
Contributors:
Hettler, J.;
Tabatabateipour, M.;
Delrue, S.;
Van Den Abeele, K.
Source:
Steven Delrue
via
Scopus - Elsevier
Ultrasonics
2015
|
Journal article
EID:
2-s2.0-84952631256
Contributors:
Delrue, S.;
Van Den Abeele, K.
Source:
Steven Delrue
via
Scopus - Elsevier
Physics Procedia
2015
|
Conference paper
EID:
2-s2.0-84948701305
Contributors:
Bilcke, M.;
Lust, P.;
Naert, H.;
Blomme, E.;
Delrue, S.;
Van Den Abeele, K.
Source:
Steven Delrue
via
Scopus - Elsevier
Physics Procedia
2015
|
Conference paper
EID:
2-s2.0-84948670503
Contributors:
Delrue, S.;
Tabatabaeipour, M.;
Hettler, J.;
Van Den Abeele, K.
Source:
Steven Delrue
via
Scopus - Elsevier
Physics Procedia
2015
|
Conference paper
EID:
2-s2.0-84948657019
Contributors:
Tabatabaeipour, M.;
Hettler, J.;
Delrue, S.;
Van Den Abeele, K.
Source:
Steven Delrue
via
Scopus - Elsevier
NDT 2014 - 53rd Annual Conference of the British Institute of Non-Destructive Testing
2014
|
Conference paper
EID:
2-s2.0-84917705628
Contributors:
Yan, D.;
Avramidis, S.;
Liaptsis, D.;
Lindop, M.;
Cooper, I.;
Michau, S.;
Nguyen-Dinh, A.;
Hettler, J.;
Tabatabaeipour, M.;
Delrue, S.
et al.
Source:
Steven Delrue
via
Scopus - Elsevier
Proceedings of Forum Acusticum
2014
|
Conference paper
EID:
2-s2.0-84953303899
Contributors:
Blomme, E.;
Naert, H.;
Bilcke, M.;
Lust, P.;
Delrue, S.;
Van Den Abeele, K.
Source:
Steven Delrue
via
Scopus - Elsevier
Emerging Technologies in Non-Destructive Testing V - Proceedings of the 5th Conference on Emerging Technologies in NDT
2012
|
Conference paper
EID:
2-s2.0-84856668750
Contributors:
Delrue, S.;
Van Den Abeele, K.
Source:
Steven Delrue
via
Scopus - Elsevier
Proceedings of Meetings on Acoustics
2012
|
Conference paper
EID:
2-s2.0-84878973417
Contributors:
Delrue, S.;
Le Bas, P.-Y.;
Ulrich, T.J.;
Anderson, B.;
Van Den Abeele, K.
Source:
Steven Delrue
via
Scopus - Elsevier
Proceedings of Meetings on Acoustics
2012
|
Conference paper
EID:
2-s2.0-84878989133
Contributors:
Van Den Abeele, K.;
Delrue, S.;
Haupert, S.;
Aleshin, V.
Source:
Steven Delrue
via
Scopus - Elsevier
AIP Conference Proceedings
2012
|
Conference paper
EID:
2-s2.0-84870011559
Contributors:
Delrue, S.;
Abeele, K.V.D.
Source:
Steven Delrue
via
Scopus - Elsevier
Ultrasonics
2012
|
Journal article
EID:
2-s2.0-81855194491
Contributors:
Delrue, S.;
Van Den Abeele, K.
Source:
Steven Delrue
via
Scopus - Elsevier
Ultrasonics
2010
|
Journal article
EID:
2-s2.0-71849105005
Contributors:
Delrue, S.;
Van Den Abeele, K.;
Blomme, E.;
Deveugele, J.;
Lust, P.;
Matar, O.B.
Source:
Steven Delrue
via
Scopus - Elsevier