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Scopus Author ID: 57189244846

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Employment (1)

National University of Singapore: Singapore, SG

2020-12-28 to present | Research Fellow (School of Computing)
Employment
Source: Self-asserted source
Arpita Dutta

Education and qualifications (1)

Indian Institute of Technology Kharagpur: Kharagpur, West Bengal, IN

2017-07-11 to 2021-05-31 | Ph.D. (computer science)
Education
Source: Self-asserted source
Arpita Dutta

Works (32)

TracerX: Pruning Dynamic Symbolic Execution with Deletion and Weakest Precondition Interpolation (Competition Contribution)

2024 | Book chapter
DOI: 10.1007/978-3-031-57259-3_19
Contributors: Arpita Dutta; Rasool Maghareh; Joxan Jaffar; Sangharatna Godboley; Xiao Liang Yu
Source: check_circle
Crossref

SMUP: A technique to improve MC/DC using specified patterns

Computers and Electrical Engineering
2024-12 | Journal article
DOI: 10.1016/j.compeleceng.2024.109706
Contributors: Swadhin Kumar Barisal; Arpita Dutta; Sangharatna Godboley; Bibhudatta Sahoo; Durga Prasad Mohapatra
Source: check_circle
Crossref

MC/DC guided Test Sequence Prioritization using Firefly Algorithm

Evolutionary Intelligence
2021 | Journal article
DOI: 10.1007/s12065-019-00322-6
EID:

2-s2.0-85075330305

Part of ISSN: 18645917 18645909
Contributors: Barisal, S.K.; Dutta, A.; Godboley, S.; Sahoo, B.; Mohapatra, D.P.
Source: Self-asserted source
Arpita Dutta via Scopus - Elsevier

MSFL: A Model for Fault Localization Using Mutation-Spectra Technique

Lecture Notes in Business Information Processing
2021 | Book
DOI: 10.1007/978-3-030-67084-9_10
EID:

2-s2.0-85101551288

Part of ISSN: 18651356 18651348
Contributors: Dutta, A.; Godboley, S.
Source: Self-asserted source
Arpita Dutta via Scopus - Elsevier

MuSim: Mutation-based Fault Localization Using Test Case Proximity

International Journal of Software Engineering and Knowledge Engineering
2021 | Journal article
DOI: 10.1142/S0218194021500212
EID:

2-s2.0-85106709004

Part of ISSN: 02181940
Contributors: Dutta, A.; Jha, A.; Mall, R.
Source: Self-asserted source
Arpita Dutta via Scopus - Elsevier

Toward optimal mc/dc test case generation

ISSTA 2021 - Proceedings of the 30th ACM SIGSOFT International Symposium on Software Testing and Analysis
2021 | Conference paper
DOI: 10.1145/3460319.3464841
EID:

2-s2.0-85111449488
Contributors: Godboley, S.; Jaffar, J.; Maghareh, R.; Dutta, A.
Source: Self-asserted source
Arpita Dutta via Scopus - Elsevier
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FTFL: A Fisher’s test-based approach for fault localization

Innovations in Systems and Software Engineering
2021-12-17 | Journal article
DOI: 10.1007/s11334-021-00403-9
Contributors: Arpita Dutta; Krishna Kunal; Saksham Sahai Srivastava; Shubham Shankar; Rajib Mall
Source: check_circle
Crossref
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Combi-FL: Neural network and SBFL based fault localization using mutation analysis

Journal of Computer Languages
2021-10 | Journal article
DOI: 10.1016/j.cola.2021.101064
Contributors: Arpita Dutta; Saksham Sahai Srivastava; Sangharatna Godboley; Durga Prasad Mohapatra
Source: check_circle
Crossref

Software fault localization using BP neural network based on function and branch coverage

Evolutionary Intelligence
2021-03-09 | Journal article
DOI: 10.1007/s12065-019-00318-2
Contributors: Abha Maru; Arpita Dutta; K. Vinod Kumar; Durga Prasad Mohapatra
Source: check_circle
Crossref
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A function dependency based approach for fault localization with D<sup>*</sup>

ICSOFT 2020 - Proceedings of the 15th International Conference on Software Technologies
2020 | Conference paper
EID:

2-s2.0-85091757232
Contributors: Dutta, A.; Mall, R.
Source: Self-asserted source
Arpita Dutta via Scopus - Elsevier

Effective Software Fault Localization Using a Back Propagation Neural Network

Advances in Intelligent Systems and Computing
2020 | Book
DOI: 10.1007/978-981-13-8676-3_44
EID:

2-s2.0-85075180552

Part of ISSN: 21945365 21945357
Contributors: Maru, A.; Dutta, A.; Kumar, K.V.; Mohapatra, D.P.
Source: Self-asserted source
Arpita Dutta via Scopus - Elsevier

Hierarchically Localizing Software Faults Using DNN

IEEE Transactions on Reliability
2020-12 | Journal article
DOI: 10.1109/TR.2019.2956120
Contributors: Arpita Dutta; Richa Manral; Pabitra Mitra; Rajib Mall
Source: check_circle
Crossref
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Effective Fault Localization using an Ensemble Classifier

Proceedings of 2019 International Conference on Quality, Reliability, Risk, Maintenance, and Safety Engineering, QR2MSE 2019
2019 | Conference paper
DOI: 10.1109/QR2MSE46217.2019.9021187
EID:

2-s2.0-85082387242
Contributors: Dutta, A.; Pant, N.; Mitra, P.; Mall, R.
Source: Self-asserted source
Arpita Dutta via Scopus - Elsevier

Enhancing test cases generated by concolic testing

ACM International Conference Proceeding Series
2019 | Conference paper
DOI: 10.1145/3299771.3299781
EID:

2-s2.0-85062331395
Contributors: Dutta, A.; Kumar, S.; Godboley, S.
Source: Self-asserted source
Arpita Dutta via Scopus - Elsevier

Fault Localization Using a Weighted Function Dependency Graph

Proceedings of 2019 International Conference on Quality, Reliability, Risk, Maintenance, and Safety Engineering, QR2MSE 2019
2019 | Conference paper
DOI: 10.1109/QR2MSE46217.2019.9021217
EID:

2-s2.0-85082386240
Contributors: Dutta, A.; Jain, R.; Gupta, S.; Mall, R.
Source: Self-asserted source
Arpita Dutta via Scopus - Elsevier

Investigation into the effectiveness of white-box T-way testing

IET Software
2019 | Journal article
DOI: 10.1049/iet-sen.2018.5309
EID:

2-s2.0-85075821290

Part of ISSN: 17518806
Contributors: Dutta, A.; Patel, A.; Mall, R.
Source: Self-asserted source
Arpita Dutta via Scopus - Elsevier

Predicate Proximity in Failure: An MLP based Fault Localization approach

IEEE Region 10 Annual International Conference, Proceedings/TENCON
2019 | Conference paper
DOI: 10.1109/TENCON.2019.8929728
EID:

2-s2.0-85077721588

Part of ISSN: 21593450 21593442
Contributors: Dutta, A.; Sahay, R.; Mitra, P.; Mall, R.
Source: Self-asserted source
Arpita Dutta via Scopus - Elsevier

ProTecht - Implementation of an IoT based 3 -Way Women Safety Device

Proceedings of the 3rd International Conference on Electronics and Communication and Aerospace Technology, ICECA 2019
2019 | Conference paper
DOI: 10.1109/ICECA.2019.8821913
EID:

2-s2.0-85072822058
Contributors: Sen, T.; Dutta, A.; Singh, S.; Kumar, V.N.
Source: Self-asserted source
Arpita Dutta via Scopus - Elsevier

An efficient code coverage technique for UML StateChart Diagram

2017 14th IEEE India Council International Conference, INDICON 2017
2018 | Conference paper
DOI: 10.1109/INDICON.2017.8487872
EID:

2-s2.0-85056402023
Contributors: Dutta, A.; Godboley, S.; Mohapatra, D.P.
Source: Self-asserted source
Arpita Dutta via Scopus - Elsevier

GECOJAP: A novel source-code preprocessing technique to improve code coverage

Computer Standards and Interfaces
2018 | Journal article
DOI: 10.1016/j.csi.2017.04.003
EID:

2-s2.0-85019550284

Part of ISSN: 09205489
Contributors: Godboley, S.; Dutta, A.; Mohapatra, D.P.; Mall, R.
Source: Self-asserted source
Arpita Dutta via Scopus - Elsevier

MEMOSA: MEasuring MC/DC of SOA Applications using Concolic Testing

2017 14th IEEE India Council International Conference, INDICON 2017
2018 | Conference paper
DOI: 10.1109/INDICON.2017.8487566
EID:

2-s2.0-85056403396
Contributors: Dutta, A.; Godboley, S.; Mohapatra, D.P.
Source: Self-asserted source
Arpita Dutta via Scopus - Elsevier

Reduced energy consumption for MC/DC testing

International Journal of Business Information Systems
2018 | Journal article
DOI: 10.1504/IJBIS.2018.093657
EID:

2-s2.0-85051080282

Part of ISSN: 17460980 17460972
Contributors: Godboley, S.; Dutta, A.; Mohapatra, D.P.
Source: Self-asserted source
Arpita Dutta via Scopus - Elsevier

Scaling modified condition/decision coverage using distributed concolic testing for Java programs

Computer Standards and Interfaces
2018 | Journal article
DOI: 10.1016/j.csi.2018.02.005
EID:

2-s2.0-85043350571

Part of ISSN: 09205489
Contributors: Godboley, S.; Dutta, A.; Mohapatra, D.P.; Mall, R.
Source: Self-asserted source
Arpita Dutta via Scopus - Elsevier

An Automated Analysis of the Branch Coverage and Energy Consumption Using Concolic Testing

Arabian Journal for Science and Engineering
2017 | Journal article
DOI: 10.1007/s13369-016-2284-2
EID:

2-s2.0-85012164029

Part of ISSN: 21914281 2193567X
Contributors: Godboley, S.; Panda, S.; Dutta, A.; Mohapatra, D.P.
Source: Self-asserted source
Arpita Dutta via Scopus - Elsevier

COLT: Extending CONCOLIC testing to measure LCSAJ Coverage

IEEE Region 10 Annual International Conference, Proceedings/TENCON
2017 | Conference paper
DOI: 10.1109/TENCON.2016.7848024
EID:

2-s2.0-85015361040

Part of ISSN: 21593450 21593442
Contributors: Dutta, A.; Godboley, S.; Mohapatra, D.P.
Source: Self-asserted source
Arpita Dutta via Scopus - Elsevier

J<sup>3</sup> Model: A novel framework for improved Modified Condition/Decision Coverage analysis

Computer Standards and Interfaces
2017 | Journal article
DOI: 10.1016/j.csi.2016.09.006
EID:

2-s2.0-84988944052

Part of ISSN: 09205489
Contributors: Godboley, S.; Dutta, A.; Mohapatra, D.P.; Mall, R.
Source: Self-asserted source
Arpita Dutta via Scopus - Elsevier

Measuring branch coverage for the SOA based application using concolic testing

Communications in Computer and Information Science
2017 | Book
DOI: 10.1007/978-981-10-5427-3_18
EID:

2-s2.0-85028305273

Part of ISSN: 18650929
Contributors: Dutta, A.; Godboley, S.; Mohapatra, D.P.
Source: Self-asserted source
Arpita Dutta via Scopus - Elsevier

Measuring hit ratio metric for SOA-based application using black-box testing

Advances in Intelligent Systems and Computing
2017 | Book
DOI: 10.1007/978-981-10-3874-7_56
EID:

2-s2.0-85019681339

Part of ISSN: 21945357
Contributors: Dutta, A.; Godboley, S.; Mohapatra, D.P.
Source: Self-asserted source
Arpita Dutta via Scopus - Elsevier

Measuring MC/DC at design phase using UML sequence diagram and concolic testing

2016 IEEE Annual India Conference, INDICON 2016
2017 | Conference paper
DOI: 10.1109/INDICON.2016.7839079
EID:

2-s2.0-85015180797
Contributors: Godboley, S.; Dutta, A.; Das, A.; Mohapatra, D.P.
Source: Self-asserted source
Arpita Dutta via Scopus - Elsevier

Green-JEXJ: A new tool to measure energy consumption of improved concolic testing

Proceedings of the 2015 International Conference on Green Computing and Internet of Things, ICGCIoT 2015
2016 | Conference paper
DOI: 10.1109/ICGCIoT.2015.7380424
EID:

2-s2.0-84966615426
Contributors: Godboley, S.; Dutta, A.; Besra, B.; Mohapatra, D.P.
Source: Self-asserted source
Arpita Dutta via Scopus - Elsevier

Java-HCT: An approach to increase MC/DC using hybrid concolic testing for Java programs

Proceedings of the 2016 Federated Conference on Computer Science and Information Systems, FedCSIS 2016
2016 | Conference paper
DOI: 10.15439/2016F289
EID:

2-s2.0-85007190166
Contributors: Godboley, S.; Dutta, A.; Mohapatra, D.P.
Source: Self-asserted source
Arpita Dutta via Scopus - Elsevier

Making a concolic tester achieve increased MC/DC

Innovations in Systems and Software Engineering
2016 | Journal article
DOI: 10.1007/s11334-016-0284-8
EID:

2-s2.0-84986328078

Part of ISSN: 16145054 16145046
Contributors: Godboley, S.; Dutta, A.; Mohapatra, D.P.; Das, A.; Mall, R.
Source: Self-asserted source
Arpita Dutta via Scopus - Elsevier

Peer review (35 reviews for 10 publications/grants)

Review activity for Biomedical signal processing and control. (3)
Review activity for Expert systems with applications. (1)
Review activity for Information and software technology. (13)
Review activity for International journal of system assurance engineering and management. (3)
Review activity for Journal of computer languages. (1)
Review activity for Machine learning with applications. (1)
Review activity for Maǧalaẗ ǧamʼaẗ al-malīk Saud : ùlm al-ḥasib wa al-maʼlumat. (2)
Review activity for Simulation modelling practice and theory. (1)
Review activity for SoftwareX. (1)
Review activity for The Journal of systems and software. (9)
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