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Biography

Qinghao Zhang(S'19) received the B.Eng. degree from Tsinghua University, Beijing, China, in 2019, in electrical engineering. He is currently studying as doctoral candidate in Department of Electrical Engineering, Tsinghua University, Beijing, China. His current research interests include state monitoring, thermal management, and diagnosis and prediction techniques for real-time applications of power electronic devices. He received 2 best paper awards from the IEEE IAS society.

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Works (26)

Data-Driven Incipient Ageing Location for Underground Power Distribution System Informed by Common-Mode Voltage Distribution

IEEE Transactions on Industry Applications
2025-01 | Journal article
DOI: 10.1109/TIA.2024.3399695
Contributors: Yang Wu; Qinghao Zhang; Ziyu Wei; Pinjia Zhang
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A Decoupled Junction Temperature and Aging Level Evaluating Method for SiC MOSFETs

IEEE Journal of Emerging and Selected Topics in Power Electronics
2024 | Journal article
DOI: 10.1109/JESTPE.2024.3387697
WOSUID: WOS:001241593700049
Contributors: Zhang, Qinghao; Li, Wenrui; Zhang, Pinjia
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A Junction Temperature Smoothing Control Method for SiC MOSFETs Based on the Gate Driving Signal Delay

IEEE Transactions on Industrial Electronics
2024 | Journal article
DOI: 10.1109/TIE.2023.3270530
WOSUID: WOS:001080899800090
Contributors: Zhang, Qinghao; Zhang, Pinjia
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An Online Junction Temperature Estimating Method for SiC MOSFETs Based on Steady-State Features and GPR

IEEE Transactions on Industrial Electronics
2024 | Journal article
DOI: 10.1109/TIE.2024.3349585
WOSUID: WOS:001173826500002
Contributors: Zhang, Qinghao; Li, Wenrui; Zhang, Pinjia
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Online Detection and Classification of Interturn and Groundwall Insulation Aging Based on Broadband Common-Mode Impedance Spectrum

IEEE Transactions on Industrial Electronics
2024 | Journal article
DOI: 10.1109/TIE.2023.3265024
WOSUID: WOS:001080899800092
Contributors: Zheng, Dayong; Lu, Geye; Wu, Yang; Zhang, Qinghao; Zhang, Pinjia
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Weakly-supervised causal discovery based on fuzzy knowledge and complex data complementarity

ArXiv
2024 | Journal article
WOSUID: PPRN:89046983
Contributors: Li, Wenrui; Zhang, Wei; Zhang, Qinghao; Zhang, Xuegong; Wang, Xiaowo
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Weakly Supervised Causal Discovery Based on Fuzzy Knowledge and Complex Data Complementarity

IEEE Transactions on Fuzzy Systems
2024-12 | Journal article
DOI: 10.1109/TFUZZ.2024.3471187
Contributors: Wenrui Li; Wei Zhang; Qinghao Zhang; Xuegong Zhang; Xiaowo Wang
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A High-Frequency Online Junction Temperature Monitoring Method for SiC mosfets Based on on-State Resistance With Aging Compensation

IEEE Transactions on Industrial Electronics
2023 | Journal article
DOI: 10.1109/TIE.2022.3204948
WOSUID: WOS:000966841500001
Contributors: Zhang, Qinghao; Lu, Geye; Yang, Yanyong; Zhang, Pinjia
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A Junction Temperature and Package Aging Decoupling Evaluating Method for SiC MOSFETs Based on the Turn-on Drain-Source Current Overshoot

IEEE Transactions on Power Electronics
2023 | Journal article
DOI: 10.1109/TPEL.2023.3307241
WOSUID: WOS:001105213800104
Contributors: Zhang, Qinghao; Zhang, Pinjia
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A Novel Junction Temperature Balance Control Method for Typical Three-Phase Converters Based on a Hybrid Modulation Strategy

IEEE Transactions on Power Electronics
2023 | Journal article
DOI: 10.1109/TPEL.2022.3225930
WOSUID: WOS:000922862100105
Contributors: Zhang, Qinghao; Zhang, Pinjia
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A Novel Model of the Aging Effect on the ON-State Resistance of SiC Power MOSFETs for High-Accuracy Package-Related Aging Evaluation

IEEE Transactions on Industrial Electronics
2023 | Journal article
DOI: 10.1109/TIE.2022.3212405
WOSUID: WOS:000975959600082
Contributors: Zhang, Qinghao; Zhang, Pinjia
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A Novel Online Chip-Related Aging Monitoring Method for IGBTs Based on the Leakage Current

IEEE Transactions on Industrial Electronics
2023 | Journal article
DOI: 10.1109/TIE.2022.3163516
WOSUID: WOS:000865104500089
Contributors: Zhang, Qinghao; Yang, Yanyong; Zhang, Pinjia
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Detection and Location Approach to Incipient Grounding Defect in Transformer Winding Based on Sequence Voltage Ratios at PV Inverter Switching Frequency

IEEE Transactions on Industrial Electronics
2023 | Journal article
DOI: 10.1109/TIE.2022.3199923
WOSUID: WOS:000966783700001
Contributors: Lu, Geye; Zhang, Qinghao; Zheng, Dayong; Mirsaeidi, Sohrab; Zhang, Pinjia
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Online Monitoring for Underground Power Cable Insulation Based on Resonance Frequency Analysis Under Chirp Signal Injection

IEEE Transactions on Industrial Electronics
2023 | Journal article
DOI: 10.1109/TIE.2022.3159922
WOSUID: WOS:000865104500085
Contributors: Wu, Yang; Yang, Yanyong; Lin, Qiuqiong; Zhang, Qinghao; Zhang, Pinjia
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A High-Sensitivity Online Junction Temperature Monitoring Method for SiC mosfets Based on the Turn-on DrainSource Current Overshoot

IEEE Transactions on Power Electronics
2022 | Journal article
DOI: 10.1109/TPEL.2022.3186977
WOSUID: WOS:000849354800123
Contributors: Zhang, Qinghao; Lu, Geye; Zhang, Pinjia
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A Novel Online Monitoring Strategy for the Localized Grounding Insulation Defect of Converter Transformers Based on Converter Switching States Control

IEEE Transactions on Power Electronics
2022 | Journal article
DOI: 10.1109/TPEL.2022.3152670
WOSUID: WOS:000800282600097
Contributors: Lu, Geye; Zhang, Qinghao; Zheng, Dayong; Zhang, Pinjia
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Effects of Converter Harmonic Voltages on Transformer Insulation Ageing and an Online Monitoring Method for Interlayer Insulation

IEEE Transactions on Power Electronics
2022 | Journal article
DOI: 10.1109/TPEL.2021.3118020
WOSUID: WOS:000725828900089
Contributors: Lu, Geye; Zheng, Dayong; Zhang, Qinghao; Zhang, Pinjia
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A Fast IGBT Junction Temperature Estimation Approach Based on ON-State Voltage Drop

IEEE Transactions on Industry Applications
2021 | Journal article
DOI: 10.1109/TIA.2020.3030753
WOSUID: WOS:000604908700062
Contributors: Yang, Yanyong; Zhang, Qinghao; Zhang, Pinjia
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A Novel Converter-level Si Material Degradation Monitoring Method Based on the DC Bus Leakage Current

Proceedings of the Annual Conference of IEEE Industrial Electronics Society, IECON
2021 | Conference paper
DOI: 10.1109/IECON48115.2021.9589133
WOSUID: WOS:000767230600086
Contributors: Zhang, Qinghao; Lu, Geye; Zhang, Pinjia
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An Online Junction Temperature Monitoring Method for SiC MOSFETs Based on a Novel Gate Conduction Model

IEEE Transactions on Power Electronics
2021 | Journal article
DOI: 10.1109/TPEL.2021.3072436
WOSUID: WOS:000670630400020
Contributors: Zhang, Qinghao; Zhang, Pinjia
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The Online Stator Winding Insulation Monitoring for PMSG-PWM rectifier System under Various Working Conditions

Proceedings of the Annual Conference of IEEE Industrial Electronics Society, IECON
2021 | Conference paper
DOI: 10.1109/IECON48115.2021.9589591
WOSUID: WOS:000767230603018
Contributors: Zheng, Dayong; Lu, Geye; Yang, Yanyong; Zhang, Qinghao; Zhang, Pinjia
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A Flexible Power Control for PV-Battery Hybrid System Using Cascaded H-Bridge Converters

IEEE Journal of Emerging and Selected Topics in Power Electronics
2019 | Journal article
DOI: 10.1109/JESTPE.2018.2887002
WOSUID: WOS:000495672400005
Contributors: Zhang, Qinghao; Sun, Kai
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A Novel Methodfor Monitoring the Junction Temperature of SiC MOSFET On-line Based on On-state Resistance

International Conference on Electrical Machines and Systems (ICEMS)
2019 | Conference paper
WOSUID: WOS:000537504802016
Contributors: Zhang, Qinghao; Yang, Yanyong; Zhang, Pinjia
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A Novel On-line IGBT Junction Temperature Measurement Method Based on On-state Voltage Drop

International Conference on Electrical Machines and Systems (ICEMS)
2019 | Conference paper
DOI: 10.1109/ICEMS.2019.8921527
WOSUID: WOS:000537504804159
Contributors: Yang, Yanyong; Zhang, Qinghao; Zhang, Pinjia
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Space Vector Modulation Method for Simultaneous Common Mode Voltage and Circulating Current Reduction in Parallel Three-Level Inverters

IEEE Transactions on Power Electronics
2019 | Journal article
DOI: 10.1109/TPEL.2018.2848928
WOSUID: WOS:000461254000010
Contributors: Zhang, Qinghao; Xing, Xiangyang; Sun, Kai
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Control of PV Battery Hybrid System Using Cascaded H Bridge Converter

IEEE INTERNATIONAL FUTURE ENERGY ELECTRONICS CONFERENCE AND ECCE ASIA (IFEEC-ECCE ASIA)
2017 | Journal article
WOSUID: WOS:000426696300358
Contributors: Zhang, Qinghao
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