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Scopus Author ID: 55605554900
Scopus Author ID: 57929586100

Biography

Jim-Wei Wu (Senior Member, IEEE) received the B.S. and M.S. degrees from National Taiwan Normal University, Taipei, Taiwan, in 2005 and 2007, respectively, and the Ph.D. degree in electrical engineering from National Taiwan University, Taipei, Taiwan, in 2013.
He is currently an Associate Professor with the Department of Electrical Engineering and a Deputy Director with the Center for Academia and Industry Collaboration at National Central University, Taoyuan City, Taiwan. His research interests include robotic systems, visual technology, precision positioning control, micro-/nano-measurement systems, and advanced control theory and applications. Dr. Wu is an Associate Editor of the IEEE Transactions on Instrumentation and Measurement.

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Employment (1)

National Central University: Taoyuan, TW

(Electrical Engineering)
Employment
Source: Self-asserted source
Jim-Wei Wu

Works (35)

A Fast and Precise Piezoelectric-Stage Positioning Scheme Using a Novel Modified Lemniscate Scanning Trajectory with Shunt-Based Model Predictive Control and Long Short-Term Memory

IEEE Transactions on Automation Science and Engineering
2025 | Journal article
DOI: 10.1109/TASE.2025.3531109
Contributors: Jim-Wei Wu; Jui-Tse Weng; Ting-Kuei Hsu; Shih-Hao Chien; Jen-te Yu
Source: check_circle
Crossref

A 3D Optical Microscopic Imaging System Based on PSO-BPNN-PID Control and Image Pyramid Transform Fusion with Experimental Verification

Measurement Science and Technology
2025-02-26 | Journal article
DOI: 10.1088/1361-6501/adba7a
Contributors: Jim-Wei Wu; Bo-Hao Chen; Jia-Cheng Li; Jen-te Yu
Source: check_circle
Crossref

Agent-Like Model for the Fusion of Attention Features for the Extraction of Joint-Entity Relations

IEEE Access
2024 | Journal article
DOI: 10.1109/ACCESS.2024.3487987
Contributors: Jim-Wei Wu; Hang-Kai Ye; Jia-Cheng Li; Jung-Yu Liao
Source: check_circle
Crossref

Design and Control of a Novel 3-D Piezoelectric Scanning Coaxial Optical Microscope System

IEEE Transactions on Instrumentation and Measurement
2023 | Journal article
DOI: 10.1109/TIM.2023.3253879
Contributors: Jim-Wei Wu; Shao-An Chao; Ting-Kuei Hsu
Source: check_circle
Crossref

Mechanism Development and Pulse-Width Modulation Advanced Controller Design of Low Torque Manipulator

IEEE Access
2023 | Journal article
DOI: 10.1109/ACCESS.2023.3326372
Contributors: Jim-Wei Wu; Tzu-Lin Lee; You-Cheng Yan; Chuan-An Chou; Cheng-Chang Ho
Source: check_circle
Crossref

Adaptive Under-Sampling Deep Neural Network for Rapid and Reliable Image Recovery in Confocal Laser Scanning Microscope Measurements

IEEE Transactions on Instrumentation and Measurement
2022 | Journal article
DOI: 10.1109/TIM.2021.3134324
EID:

2-s2.0-85121354503

Part of ISSN: 15579662 00189456
Contributors: Wu, J.-W.; Chang, K.-Y.; Fu, L.-C.
Source: Self-asserted source
Jim-Wei Wu via Scopus - Elsevier
grade
Preferred source (of 2)‎

Novel Vertical Scanning Algorithm with Advanced Control to Increase Range and Accuracy of Differential Confocal Microscopy

IEEE Transactions on Instrumentation and Measurement
2022 | Journal article
DOI: 10.1109/TIM.2022.3178985
EID:

2-s2.0-85131734130

Part of ISSN: 15579662 00189456
Contributors: Wu, J.-W.; Liu, W.-C.; Fu, L.-C.
Source: Self-asserted source
Jim-Wei Wu via Scopus - Elsevier
grade
Preferred source (of 2)‎

Numerical Simulation of Adaptive Radial Basis NN-Based Non-Singular Fast Terminal Sliding Mode Control with Time Delay Estimator for Precise Control of Dual-Axis Manipulator

Applied Sciences
2022-09 | Journal article | Author
DOI: 10.3390/app12199605
Contributors: Jim-Wei Wu; Wen-Shan Cen; Cheng-Chang Ho
Source: check_circle
Multidisciplinary Digital Publishing Institute
grade
Preferred source (of 2)‎

Design and Implementation of Multi-mode Scanning Atomic Force Microscope

2021 International Automatic Control Conference, CACS 2021
2021 | Conference paper
DOI: 10.1109/CACS52606.2021.9639049
EID:

2-s2.0-85123951624
Contributors: Wu, J.-W.; Weng, J.-T.; Chao, S.-A.; Cen, W.-S.; Peng, Y.-C.
Source: Self-asserted source
Jim-Wei Wu via Scopus - Elsevier

Integrated Compressed Sensing and YOLOv4 for Application in Image-storage and Object-recognition of Dashboard Camera

2021 Australian and New Zealand Control Conference, ANZCC 2021
2021 | Conference paper
DOI: 10.1109/ANZCC53563.2021.9628221
EID:

2-s2.0-85123602537
Contributors: Wu, J.-W.; Wu, C.-C.; Cen, W.-S.; Chao, S.-A.; Weng, J.-T.
Source: Self-asserted source
Jim-Wei Wu via Scopus - Elsevier

A fast CLSM undersampling image reconstruction framework with precise stage positioning for random measurements

2017 Asian Control Conference, ASCC 2017
2018 | Conference paper
DOI: 10.1109/ASCC.2017.8287328
EID:

2-s2.0-85047534429
Contributors: Chang, K.-Y.; Liu, Y.-L.; Liu, D.-W.; Chou, M.-H.; Wu, J.-W.; Fu, L.-C.
Source: Self-asserted source
Jim-Wei Wu via Scopus - Elsevier

Adaptive tilting angles to achieve high-precision scanning of a dual probes AFM

Asian Journal of Control
2018 | Journal article
DOI: 10.1002/asjc.1881
EID:

2-s2.0-85050565893

Part of ISSN: 19346093 15618625
Contributors: Wu, J.-W.; Lo, Y.-T.; Liu, W.-C.; Liu, D.-W.; Chang, K.-Y.; Fu, L.-C.
Source: Self-asserted source
Jim-Wei Wu via Scopus - Elsevier

Design of a High-speed and High-precision Hybrid Scanner with a New Path Planning Strategy Based on Spatial Entropy

Proceedings of the American Control Conference
2018 | Conference paper
DOI: 10.23919/ACC.2018.8431289
EID:

2-s2.0-85052550305

Part of ISSN: 07431619
Contributors: Liu, D.-W.; Chen, H.-C.; Chang, K.-Y.; Chou, M.-H.; Liu, Y.-L.; Wu, J.-W.; Chiang, M.-L.; Fu, L.-C.
Source: Self-asserted source
Jim-Wei Wu via Scopus - Elsevier

A Self-Designed Laser Scanning Differential Confocal Microscopy with a Novel Vertical Scan Algorithm for Fast Image Scanning

IFAC-PapersOnLine
2017 | Conference paper
DOI: 10.1016/j.ifacol.2017.08.446
EID:

2-s2.0-85031815268

Part of ISSN: 24058963
Contributors: Liu, W.-C.; Chou, M.-H.; Chang, K.-Y.; Liu, D.-W.; Wu, J.-W.; Fu, L.-C.
Source: Self-asserted source
Jim-Wei Wu via Scopus - Elsevier

Precision sinusoidal tracking for galvanometer scanner with smith predictor-based adaptive sliding mode control

2016 International Automatic Control Conference, CACS 2016
2017 | Conference paper
DOI: 10.1109/CACS.2016.7973891
EID:

2-s2.0-85027557036
Contributors: Liu, W.-C.; Liu, D.-W.; Wu, J.-W.; Chang, K.-Y.; Chou, M.-H.; Fu, L.-C.
Source: Self-asserted source
Jim-Wei Wu via Scopus - Elsevier

Adaptive tilting angles for a dual-probe AFM system to increase image accuracy

IEEE/ASME International Conference on Advanced Intelligent Mechatronics, AIM
2016 | Conference paper
DOI: 10.1109/AIM.2016.7576952
EID:

2-s2.0-84992427907
Contributors: Lo, Y.-T.; Wu, J.-W.; Liu, W.-C.; Liu, D.-W.; Chang, K.-Y.; Fu, L.-C.
Source: Self-asserted source
Jim-Wei Wu via Scopus - Elsevier

Development of a novel plasma scanning technique for high-quality anodic bonding

Journal of Micromechanics and Microengineering
2016 | Journal article
DOI: 10.1088/0960-1317/26/4/045005
EID:

2-s2.0-84962440552

Part of ISSN: 13616439 09601317
Contributors: Wu, J.-W.; Yang, C.-R.; Huang, C.-Y.
Source: Self-asserted source
Jim-Wei Wu via Scopus - Elsevier

Effective Tilting Angles for a Dual Probes AFM System to Achieve High-Precision Scanning

IEEE/ASME Transactions on Mechatronics
2016 | Journal article
DOI: 10.1109/TMECH.2016.2577739
EID:

2-s2.0-84983550846

Part of ISSN: 10834435
Contributors: Wu, J.-W.; Lin, Y.-T.; Lo, Y.-T.; Liu, W.-C.; Chang, K.-Y.; Liu, D.-W.; Fu, L.-C.
Source: Self-asserted source
Jim-Wei Wu via Scopus - Elsevier

Lissajous Hierarchical Local Scanning to Increase the Speed of Atomic Force Microscopy

IEEE Transactions on Nanotechnology
2015 | Journal article
DOI: 10.1109/TNANO.2015.2445712
EID:

2-s2.0-84960336369

Part of ISSN: 1536125X
Contributors: Wu, J.-W.; Lin, Y.-T.; Lo, Y.-T.; Liu, W.-C.; Fu, L.-C.
Source: Self-asserted source
Jim-Wei Wu via Scopus - Elsevier

Lissajous scan trajectory with internal model principle controller for fast AFM image scanning

2015 54th Annual Conference of the Society of Instrument and Control Engineers of Japan, SICE 2015
2015 | Conference paper
DOI: 10.1109/SICE.2015.7285361
EID:

2-s2.0-84960086266
Contributors: Wu, J.-W.; Lo, Y.-T.; Liu, W.-C.; Fu, L.-C.
Source: Self-asserted source
Jim-Wei Wu via Scopus - Elsevier

Precision sinusoidal local scan for large-range atomic force microscopy with auxiliary optical microscopy

IEEE/ASME Transactions on Mechatronics
2015 | Journal article
DOI: 10.1109/TMECH.2014.2313351
EID:

2-s2.0-85027941436

Part of ISSN: 10834435
Contributors: Chen, C.-L.; Wu, J.-W.; Lin, Y.-T.; Fu, L.-C.; Chen, M.-Y.
Source: Self-asserted source
Jim-Wei Wu via Scopus - Elsevier

A dual probes AFM system with effective tilting angles to achieve high-precision scanning

Proceedings of the IEEE Conference on Decision and Control
2014 | Conference paper
DOI: 10.1109/CDC.2014.7040457
EID:

2-s2.0-84988259162

Part of ISSN: 25762370 07431546
Contributors: Lin, Y.-T.; Lo, Y.-T.; Wu, J.-W.; Liu, W.-C.; Fu, L.-C.
Source: Self-asserted source
Jim-Wei Wu via Scopus - Elsevier

Design and control of phase-detection mode atomic force microscopy for reconstruction of cell contours in three dimensions

IEEE Transactions on Nanotechnology
2014 | Journal article
DOI: 10.1109/TNANO.2014.2307073
EID:

2-s2.0-84904278184

Part of ISSN: 1536125X
Contributors: Wu, J.-W.; Chen, J.-J.; Chiang, M.-L.; Yu, J.-T.; Fu, L.-C.
Source: Self-asserted source
Jim-Wei Wu via Scopus - Elsevier

Design and implementation of a novel conical electrode for fast anodic bonding

Journal of Micromechanics and Microengineering
2014 | Journal article
DOI: 10.1088/0960-1317/24/10/105003
EID:

2-s2.0-84907708396

Part of ISSN: 13616439 09601317
Contributors: Yang, C.-R.; Wu, J.-W.; Chang, L.-Y.
Source: Self-asserted source
Jim-Wei Wu via Scopus - Elsevier

Modeling and controller design of a precision hybrid scanner for application in large measurement-range atomic force microscopy

IEEE Transactions on Industrial Electronics
2014 | Journal article
DOI: 10.1109/TIE.2013.2279352
EID:

2-s2.0-84894080645

Part of ISSN: 02780046
Contributors: Wu, J.-W.; Huang, K.-C.; Chiang, M.-L.; Chen, M.-Y.; Fu, L.-C.
Source: Self-asserted source
Jim-Wei Wu via Scopus - Elsevier

Design and control of phase-detection mode atomic force microscopy for cells precision contour reconstruction under different environments

Proceedings of the American Control Conference
2013 | Conference paper
EID:

2-s2.0-84883548958

Part of ISSN: 07431619
Contributors: Wu, J.-W.; Chen, J.-J.; Huang, K.-C.; Chen, C.-L.; Lin, Y.-T.; Chen, M.-Y.; Fu, L.-C.
Source: Self-asserted source
Jim-Wei Wu via Scopus - Elsevier

Realization of ultrafast and high-quality anodic bonding using a non-contact scanning electrode

Journal of Micromechanics and Microengineering
2013 | Journal article
DOI: 10.1088/0960-1317/23/7/075008
EID:

2-s2.0-84879767884

Part of ISSN: 09601317 13616439
Contributors: Wu, J.-W.; Yang, C.-R.; Huang, M.-J.; Yang, C.-H.; Huang, C.-Y.
Source: Self-asserted source
Jim-Wei Wu via Scopus - Elsevier

Sinusoidal trajectory for atomic force microscopy precision local scanning with auxiliary optical microscopy

Proceedings of the IEEE Conference on Decision and Control
2013 | Conference paper
DOI: 10.1109/CDC.2013.6759906
EID:

2-s2.0-84902305526

Part of ISSN: 25762370 07431546
Contributors: Chen, C.-L.; Wu, J.-W.; Lin, Y.-T.; Lo, Y.-T.; Fu, L.-C.
Source: Self-asserted source
Jim-Wei Wu via Scopus - Elsevier

Design and implementation of a large measurement-range AFM scanning system

Proceedings of the American Control Conference
2012 | Conference paper
EID:

2-s2.0-84869402952

Part of ISSN: 07431619
Contributors: Wu, J.-W.; Peng, Y.-Z.; Chen, J.-J.; Huang, K.-C.; Chen, M.-Y.; Fu, L.-C.
Source: Self-asserted source
Jim-Wei Wu via Scopus - Elsevier

Development of a large scanning-range atomic force microscope with adaptive complementary sliding mode controller

Proceedings of the IEEE Conference on Decision and Control
2012 | Conference paper
DOI: 10.1109/CDC.2012.6426057
EID:

2-s2.0-84874277236

Part of ISSN: 25762370 07431546
Contributors: Huang, K.-C.; Wu, J.-W.; Chen, J.-J.; Chen, C.-L.; Chen, M.-Y.; Fu, L.-C.
Source: Self-asserted source
Jim-Wei Wu via Scopus - Elsevier

A compact tapping mode AFM with sliding mode controller for precision image scanning

ASCC 2011 - 8th Asian Control Conference - Final Program and Proceedings
2011 | Conference paper
EID:

2-s2.0-80051988737
Contributors: Wu, J.-W.; Chen, M.-Y.; Hung, S.-K.; Fu, L.-C.
Source: Self-asserted source
Jim-Wei Wu via Scopus - Elsevier

Design and implementation of an atomic force microscope with adaptive sliding mode controller for large image scanning

Proceedings of the IEEE Conference on Decision and Control
2011 | Conference paper
DOI: 10.1109/CDC.2011.6161500
EID:

2-s2.0-84860668752

Part of ISSN: 25762370 07431546
Contributors: Peng, Y.-Z.; Wu, J.-W.; Huang, K.-C.; Chen, J.-J.; Chen, M.-Y.; Fu, L.-C.
Source: Self-asserted source
Jim-Wei Wu via Scopus - Elsevier

Design and implementation of an electromagnetically damped positioner with flexure suspension

Proceedings of the IEEE International Conference on Control Applications
2011 | Conference paper
DOI: 10.1109/CCA.2011.6044458
EID:

2-s2.0-80155174956
Contributors: Huang, K.-L.; Peng, Y.-Z.; Wu, J.-W.; Chen, M.-Y.; Fu, L.-C.
Source: Self-asserted source
Jim-Wei Wu via Scopus - Elsevier

Apply tapping mode atomic force microscope with CD/DVD pickup head in fluid

Proceedings of the 2010 American Control Conference, ACC 2010
2010 | Conference paper
EID:

2-s2.0-77957814617
Contributors: Yen, S.-H.; Wu, J.-W.; Fu, L.-C.
Source: Self-asserted source
Jim-Wei Wu via Scopus - Elsevier

Design and control of long travel range electromagnetically actuated positioning stage with application to precise machining

Proceedings of the IEEE International Conference on Control Applications
2010 | Conference paper
DOI: 10.1109/CCA.2010.5611286
EID:

2-s2.0-78649415355
Contributors: Lee, S.-T.; Huang, K.-L.; Wu, J.-W.; Fu, L.-C.
Source: Self-asserted source
Jim-Wei Wu via Scopus - Elsevier
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