Personal information

sensors, FEA modeling, MEMS, Microelectronics, Mechanical Properties
Brazil

Activities

Employment (7)

Faculdade de Tecnologia de São José dos Campos: Sao Jose dos Campos, SP, BR

2011-08-01 to present | Professor
Employment
Source: Self-asserted source
Leandro Koberstein

Estrutural Indústria e Comércio: São José dos Campos, São Paulo, BR

2007-04-05 to present | Projetista
Employment
Source: Self-asserted source
Leandro Koberstein

Instituto Federal de Educação Ciência e Tecnologia de São Paulo: Sao Paulo, SP, BR

2014-02-01 to 2016-01-31 | Professor (Campus São José dos Campos)
Employment
Source: Self-asserted source
Leandro Koberstein

Centro de Educação Tecnológica Expoente: São José dos Campos, São Paulo, BR

2008-03-01 to 2014-01-20 | Professor
Employment
Source: Self-asserted source
Leandro Koberstein

Microlins Centro de Formação Profissional: São Paulo, SP, BR

2004-08-01 to 2007-08-27 | Professor
Employment
Source: Self-asserted source
Leandro Koberstein

Embrapa Pecuária Sudeste: Sao Carlos, SP, BR

2006-03-01 to 2007-05-30 | Bolsista DTI
Employment
Source: Self-asserted source
Leandro Koberstein

Faculdade de Tecnologia de São Paulo: Sao Paulo, São Paulo, BR

2001-08-01 to 2002-07-30 | Estagiário
Employment
Source: Self-asserted source
Leandro Koberstein

Education and qualifications (1)

Universidade de São Paulo: Sao Paulo, SP, BR

2005-09-01 to 2005-11-09 | Mestre em Engenharia Elétrica (Escola Politécnica)
Education
Source: Self-asserted source
Leandro Koberstein

Works (5)

Design and Analytical Studies of a DLC Thin-Film Piezoresistive Pressure Microsensor

2017 | Book chapter
Contributors: Luiz Antonio Rasia; Gabriela Leal; Leandro Léo Koberstein; Humber Furlan; Marcos Massi; Mariana Amorim Fraga
Source: check_circle
Crossref

Study on the correlation between film composition and piezoresistive properties of PECVD Si<inf>x</inf>C<inf>y</inf> thin films

Materials Science Forum
2013 | Book
EID:

2-s2.0-84874075522

Contributors: Fraga, M.A.; Koberstein, L.L.
Source: Self-asserted source
Leandro Koberstein via Scopus - Elsevier

An overview on the modeling of silicon piezoresistive pressure microsensors

2012 Workshop on Engineering Applications, WEA 2012
2012 | Conference paper
EID:

2-s2.0-84864202774

Contributors: Fraga, M.A.; Koberstein, L.L.
Source: Self-asserted source
Leandro Koberstein via Scopus - Elsevier

Effects of the Substrate on Piezoresistive Properties of Silicon Carbide Thin Films

2012 | Conference paper
Contributors: Mariana A. Fraga; Humber Furlan; Luiz A. Rasia; Leandro L. Koberstein
Source: Self-asserted source
Leandro Koberstein via Crossref Metadata Search
grade
Preferred source (of 2)‎

Fabrication and characterization of a SiC/SiO2/Si piezoresistive pressure sensor

Procedia Engineering
2010 | Conference paper
EID:

2-s2.0-78650598348

Contributors: Fraga, M.A.; Furlan, H.; Massi, M.; Oliveira, I.C.; Koberstein, L.L.
Source: Self-asserted source
Leandro Koberstein via Scopus - Elsevier