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Electronics
2023-11-11
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Journal article
Contributors:
David Maljar;
Michal Sovcik;
Miroslav Potocny;
Robert Ondica;
Daniel Arbet;
Viera Stopjakova
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Crossref
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Sensors
2023-01
|
Journal article
|
Author
Contributors:
Tomasz Kulej;
Montree Kumngern;
Fabian Khateb;
Daniel Arbet
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Multidisciplinary Digital Publishing Institute
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IEEE Transactions on Circuits and Systems II: Express Briefs
2022
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Journal article
Contributors:
Kulej, Tomasz;
Khateb, Fabian;
Arbet, Daniel;
Stopjakova, Viera
Source:
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Web of Science Researcher Profile Sync
AEÜ - International Journal of Electronics and Communications
2022
|
Journal article
Contributors:
Khateb, Fabian;
Kulej, Tomasz;
Kumngern, Montree;
Arbet, Daniel;
Jaikla, Winai
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Web of Science Researcher Profile Sync
IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)
2022
|
Conference paper
Contributors:
Maljar, David;
Arbet, Daniel;
Kovac, Martin;
Ondica, Robert;
Stopjakova, Viera
Source:
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Web of Science Researcher Profile Sync
AEÜ - International Journal of Electronics and Communications
2022
|
Journal article
Contributors:
Khateb, Fabian;
Kumngern, Montree;
Kulej, Tomasz;
Arbet, Daniel;
Akbari, Meysam
Source:
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Web of Science Researcher Profile Sync
International Conference Radioelektronika (RADIOELEKTRONIKA)
2022
|
Conference paper
Contributors:
Nagy, Lukas;
Arbet, Daniel;
Kovac, Martin;
Potocny, Miroslav;
Stopjakova, Viera
Source:
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Web of Science Researcher Profile Sync
IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)
2022
|
Conference paper
Contributors:
Ravasz, Richard;
Hudec, Adam;
Arbet, Daniel;
Stopjakova, Viera
Source:
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Web of Science Researcher Profile Sync
IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)
2021
|
Conference paper
Contributors:
Nagy, Lukas;
Arbet, Daniel;
Kovac, Martin;
Potocny, Miroslav;
Sovcik, Michal;
Stopjakova, Viera
Source:
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Web of Science Researcher Profile Sync
IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)
2021
|
Conference paper
Contributors:
Maljar, David;
Sovcik, Michal;
Arbet, Daniel;
Stopjakova, Viera
Source:
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Web of Science Researcher Profile Sync
International Conference Mixed Design of Integrated Circuits and Systems
2021
|
Conference paper
Contributors:
Ondica, Robert;
Arbet, Daniel;
Kovac, Martin;
Stopjakova, Viera
Source:
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Web of Science Researcher Profile Sync
Sensors
2021
|
Journal article
Contributors:
Potocny, Miroslav;
Kovac, Martin;
Arbet, Daniel;
Sovcik, Michal;
Nagy, Lukas;
Stopjakova, Viera;
Ravasz, Richard
Source:
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Web of Science Researcher Profile Sync
International Conference on Applied Electronics (AE)
2020
|
Conference paper
Contributors:
Maljar, David;
Arbet, Daniel;
Stopjakova, Viera
Source:
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Web of Science Researcher Profile Sync
International Conference Radioelektronika (RADIOELEKTRONIKA)
2020
|
Conference paper
Contributors:
Sovcik, Michal;
Stopjakova, Viera;
Arbet, Daniel;
Potocny, Miroslav
Source:
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Web of Science Researcher Profile Sync
IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)
2020
|
Conference paper
Contributors:
Nagy, Lukas;
Arbet, Daniel;
Kovac, Martin;
Potocny, Miroslav;
Sovcik, Michal;
Stopjakova, Viera
Source:
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Web of Science Researcher Profile Sync
International Conference on Applied Electronics (AE)
2020
|
Conference paper
Contributors:
Ondica, Robert;
Arbet, Daniel;
Kovac, Martin;
Stopjakova, Viera
Source:
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Web of Science Researcher Profile Sync
International Journal of Electronics
2020
|
Journal article
Contributors:
Arbet, Daniel;
Kovac, Martin;
Stopjakova, Viera;
Potocny, Miroslav
Source:
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Web of Science Researcher Profile Sync
International Convention on Information, Communication and Electronic Technology (MIPRO)
2020
|
Conference paper
Contributors:
Kovac, Martin;
Arbet, Daniel;
Nagy, Lukas;
Sovcik, Michal;
Stopjakova, Viera
Source:
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Web of Science Researcher Profile Sync
Proceedings of the Biennial Baltic Electronics Conference, BEC
2019
|
Conference paper
EID:
2-s2.0-85061484424
Contributors:
Potocny, M.;
Kovac, M.;
Arbet, D.;
Stopjakova, V.
Source:
Daniel Arbet
via
Scopus - Elsevier
AEÜ - International Journal of Electronics and Communications
2019
|
Journal article
Contributors:
Nagy, Lukas;
Stopjakova, Viera;
Arbet, Daniel;
Potocny, Miroslav;
Kovac, Martin
Source:
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Web of Science Researcher Profile Sync
IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)
2019
|
Conference paper
Contributors:
Kovac, Martin;
Arbet, Daniel;
Stopjakova, Viera;
Sovcik, Michal;
Nagy, Lukas
Source:
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Web of Science Researcher Profile Sync
IEEE AFRICON Conference
2019
|
Journal article
Contributors:
Nagy, Lukas;
Arbet, Daniel;
Kovac, Martin;
Potocny, Miroslav;
Sovcik, Michal;
Stopjakova, Viera
Source:
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Web of Science Researcher Profile Sync
International Conference Mixed Design of Integrated Circuits and Systems
2019
|
Conference paper
Contributors:
Stopjakova, Viera;
Kovac, Martin;
Arbet, Daniel;
Nagy, Lukas
Source:
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Web of Science Researcher Profile Sync
IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)
2019
|
Conference paper
Contributors:
Nagy, Lukas;
Arbet, Daniel;
Kovac, Martin;
Potocny, Miroslav;
Stopjakova, Viera
Source:
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Web of Science Researcher Profile Sync
International Convention on Information and Communication Technology, Electronics and Microelectronics (MIPRO)
2019
|
Conference paper
Contributors:
Arbet, Daniel;
Kovac, Martin;
Stopjakova, Viera;
Potocny, Miroslav
Source:
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Web of Science Researcher Profile Sync
BEC INTERNATIONAL BIENNIAL BALTIC ELECTRONICS CONFERENCE, PROCEEDINGS
2018
|
Conference paper
Contributors:
Potocny, Miroslav;
Kovac, Martin;
Arbet, Daniel;
Stopjakova, Viera
Source:
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Web of Science Researcher Profile Sync
2018 28th International Conference Radioelektronika, RADIOELEKTRONIKA 2018
2018
|
Conference paper
EID:
2-s2.0-85049937833
Contributors:
Šovčík, M.;
Stopjaková, V.;
Arbet, D.;
Kováč, M.;
Potočný, M.
Source:
Daniel Arbet
via
Scopus - Elsevier
grade
Preferred source
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2)
Advances in Electrical and Electronic Engineering
2018
|
Journal article
EID:
2-s2.0-85048990117
Contributors:
Rakus, M.;
Stopjakova, V.;
Arbet, D.
Source:
Daniel Arbet
via
Scopus - Elsevier
grade
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2)
2018 41st International Convention on Information and Communication Technology, Electronics and Microelectronics, MIPRO 2018 - Proceedings
2018
|
Conference paper
EID:
2-s2.0-85050211499
Contributors:
Arbet, D.;
Kovac, M.;
Stopjakova, V.;
Potocny, M.
Source:
Daniel Arbet
via
Scopus - Elsevier
grade
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(of
2)
Proceedings - 21st IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2018
2018
|
Conference paper
EID:
2-s2.0-85050982585
Contributors:
Nagy, L.;
Arbet, D.;
Kováč, M.;
Potočný, M.;
Stopjaková, V.
Source:
Daniel Arbet
via
Scopus - Elsevier
grade
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(of
2)
ICETA 2018 - 16th IEEE International Conference on Emerging eLearning Technologies and Applications, Proceedings
2018
|
Conference paper
EID:
2-s2.0-85060313299
Contributors:
Sovčík, M.;
Stopjaková, V.;
Arbet, D.;
Kováč, M.
Source:
Daniel Arbet
via
Scopus - Elsevier
grade
Preferred source
(of
2)
International Conference on Applied Electronics
2018
|
Conference paper
EID:
2-s2.0-85056850025
Contributors:
Sovsik, M.;
Stopjakova, V.;
Arbet, D.;
Nagy, L.;
Kovac, M.
Source:
Daniel Arbet
via
Scopus - Elsevier
grade
Preferred source
(of
2)
International Conference on Applied Electronics
2018
|
Conference paper
EID:
2-s2.0-85056886187
Contributors:
Potocny, M.;
Sovcik, M.;
Arbet, D.;
Stopjakova, V.;
Kovac, M.
Source:
Daniel Arbet
via
Scopus - Elsevier
grade
Preferred source
(of
2)
Proceedings - 21st IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2018
2018
|
Conference paper
EID:
2-s2.0-85050968022
Contributors:
Arbet, D.;
Kováč, M.;
Nagy, L.;
Stopjaková, V.;
Šovčík, M.
Source:
Daniel Arbet
via
Scopus - Elsevier
grade
Preferred source
(of
2)
Radioengineering
2018
|
Journal article
EID:
2-s2.0-85045341627
Contributors:
Stopjakova, V.;
Rakus, M.;
Kovac, M.;
Arbet, D.;
Nagy, L.;
Sovcik, M.;
Potocny, M.
Source:
Daniel Arbet
via
Scopus - Elsevier
grade
Preferred source
(of
2)
Microelectronics Reliability
2018
|
Journal article
EID:
2-s2.0-85038836687
Contributors:
Šovčík, M.;
Kováč, M.;
Arbet, D.;
Stopjaková, V.;
Potočný, M.
Source:
Daniel Arbet
via
Scopus - Elsevier
grade
Preferred source
(of
2)
Journal of Circuits, Systems and Computers
2017
|
Journal article
EID:
2-s2.0-85017343031
Contributors:
Arbet, D.;
Stopjaková, V.;
Kovác, M.;
Nagy, L.;
Rakús, M.;
Šovcík, M.
Source:
Daniel Arbet
via
Scopus - Elsevier
grade
Preferred source
(of
2)
Journal of Circuits, Systems and Computers
2017
|
Journal article
EID:
2-s2.0-85017368725
Contributors:
Brenkuš, J.;
Stopjaková, V.;
Cerňanová, V.;
Arbet, D.;
Nagy, L.;
Sedlák, V.
Source:
Daniel Arbet
via
Scopus - Elsevier
grade
Preferred source
(of
2)
Journal of Electrical Engineering
2017
|
Journal article
EID:
2-s2.0-85044736884
Contributors:
Rakús, M.;
Stopjaková, V.;
Arbet, D.
Source:
Daniel Arbet
via
Scopus - Elsevier
grade
Preferred source
(of
2)
ICETA 2017 - 15th IEEE International Conference on Emerging eLearning Technologies and Applications, Proceedings
2017
|
Conference paper
EID:
2-s2.0-85040778029
Contributors:
Sovcik, M.;
Stopjakova, V.;
Arbet, D.;
Kovac, M.;
Potocny, M.
Source:
Daniel Arbet
via
Scopus - Elsevier
grade
Preferred source
(of
2)
2017 IEEE AFRICON: Science, Technology and Innovation for Africa, AFRICON 2017
2017
|
Conference paper
EID:
2-s2.0-85039928295
Contributors:
Nagy, L.;
Arbet, D.;
Kovac, M.;
Stopjakova, V.
Source:
Daniel Arbet
via
Scopus - Elsevier
grade
Preferred source
(of
2)
Proceedings - 2017 IEEE 20th International Symposium on Design and Diagnostics of Electronic Circuit and Systems, DDECS 2017
2017
|
Conference paper
EID:
2-s2.0-85021446787
Contributors:
Ŝovĉik, M.;
Kováĉ, M.;
Arbet, D.;
Stopjakova, V.
Source:
Daniel Arbet
via
Scopus - Elsevier
grade
Preferred source
(of
2)
ICETA 2016 - 14th IEEE International Conference on Emerging eLearning Technologies and Applications, Proceedings
2016
|
Conference paper
EID:
2-s2.0-85011266678
Contributors:
Rakús, M.;
Stopjaková, V.;
Nagy, L.;
Arbet, D.
Source:
Daniel Arbet
via
Scopus - Elsevier
grade
Preferred source
(of
2)
Formal Proceedings of the 2016 IEEE 19th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2016
2016
|
Conference paper
EID:
2-s2.0-84978524141
Contributors:
Sovcik, M.;
Matuska, M.;
Arbet, D.;
Stopjakova, V.
Source:
Daniel Arbet
via
Scopus - Elsevier
grade
Preferred source
(of
2)
Formal Proceedings of the 2016 IEEE 19th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2016
2016
|
Conference paper
EID:
2-s2.0-84978483972
Contributors:
Rakus, M.;
Stopjakova, V.;
Arbet, D.
Source:
Daniel Arbet
via
Scopus - Elsevier
ICETA 2016 - 14th IEEE International Conference on Emerging eLearning Technologies and Applications, Proceedings
2016
|
Conference paper
EID:
2-s2.0-85011269884
Contributors:
Nagy, L.;
Arbet, D.;
Stopjaková, V.
Source:
Daniel Arbet
via
Scopus - Elsevier
grade
Preferred source
(of
2)
Journal of Circuits, Systems and Computers
2016
|
Journal article
EID:
2-s2.0-84952717266
Contributors:
Arbet, D.;
Nagy, G.;
Kovác, M.;
Stopjaková, V.
Source:
Daniel Arbet
via
Scopus - Elsevier
grade
Preferred source
(of
2)
Formal Proceedings of the 2016 IEEE 19th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2016
2016
|
Conference paper
EID:
2-s2.0-84978511945
Contributors:
Brenkus, J.;
Stopjakova, V.;
Nagy, L.;
Arbet, D.
Source:
Daniel Arbet
via
Scopus - Elsevier
grade
Preferred source
(of
2)
ICETA 2016 - 14th IEEE International Conference on Emerging eLearning Technologies and Applications, Proceedings
2016
|
Conference paper
EID:
2-s2.0-85011269419
Contributors:
Kováč, M.;
Stopjaková, V.;
Arbet, D.;
Nagy, L.;
Brenkuš, J.
Source:
Daniel Arbet
via
Scopus - Elsevier
grade
Preferred source
(of
2)
Formal Proceedings of the 2016 IEEE 19th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2016
2016
|
Conference paper
EID:
2-s2.0-84978538393
Contributors:
Arbet, D.;
Kovac, M.;
Nagy, L.;
Stopjakova, V.;
Brenkus, J.
Source:
Daniel Arbet
via
Scopus - Elsevier
grade
Preferred source
(of
2)
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