Personal information
Verified email domains
upce.cz
Activities
Employment (1)
2019-03-01
to
present
|
Assistant professor
(Department of Graphic Arts and Photophysics)
Employment
Source:
Tomáš Halenkovič
Works (21)
Journal of Materiomics
2022
|
Journal article
EID:
2-s2.0-85129972221
Contributors:
Halenkovič, T.;
Baillieul, M.;
Gutwirth, J.;
Němec, P.;
Nazabal, V.
Source:
Tomáš Halenkovič
via
Scopus - Elsevier
Proceedings of SPIE - The International Society for Optical Engineering
2022
|
Conference paper
EID:
2-s2.0-85133008720
Contributors:
Halenkovič, T.;
Kotrla, M.;
Gutwirth, J.;
Nemec, P.;
Nazabal, V.
Source:
Tomáš Halenkovič
via
Scopus - Elsevier
Journal of the American Ceramic Society
2022
|
Journal article
EID:
2-s2.0-85119868340
Contributors:
Huang, F.;
Halenkovič, T.;
Baillieul, M.;
Nazabal, V.;
Němec, P.;
Havel, J.
Source:
Tomáš Halenkovič
via
Scopus - Elsevier
Photonics Research
2022-09-01
|
Journal article
Contributors:
Tomáš Halenkovič;
Magdaléna Kotrla;
Jan Gutwirth;
Virginie Nazabal;
Petr Němec
Source:
check_circle
Crossref
grade
Preferred source
(of
2)
Nanomaterials
2022-05-27
|
Journal article
Contributors:
Jan Gutwirth;
Magdaléna Kotrla;
Tomáš Halenkovič;
Virginie Nazabal;
Petr Němec
Source:
check_circle
Crossref
grade
Preferred source
(of
3)
Journal of Non-Crystalline Solids
2021
|
Journal article
EID:
2-s2.0-85109419580
Contributors:
Bouška, M.;
Nazabal, V.;
Gutwirth, J.;
Halenkovič, T.;
Němec, P.
Source:
Tomáš Halenkovič
via
Scopus - Elsevier
Optics Letters
2020
|
Journal article
EID:
2-s2.0-85080119414
Contributors:
Bouska, M.;
Nazabal, V.;
Gutwirth, J.;
Halenkovic, T.;
Prikryl, J.;
Normani, S.;
Nemec, P.
Source:
Tomáš Halenkovič
via
Scopus - Elsevier
Optics Letters
2020
|
Journal article
EID:
2-s2.0-85081307220
Contributors:
Halenkovič, T.;
Gutwirth, J.;
Kuriakose, T.;
Bouška, M.;
Chauvet, M.;
Renversez, G.;
Němec, P.;
Nazabal, V.
Source:
Tomáš Halenkovič
via
Scopus - Elsevier
Optics Letters
2020-01-01
|
Journal article
Contributors:
Tomáš Halenkovič
Source:
Tomáš Halenkovič
grade
Preferred source
(of
2)
2019 Conference on Lasers and Electro-Optics Europe and European Quantum Electronics Conference, CLEO/Europe-EQEC 2019
2019
|
Conference paper
EID:
2-s2.0-85074637608
Contributors:
Renversez, G.;
Elsawy, M.M.R.;
Chauvet, M.;
Kuriakose, T.;
Halenkovic, T.;
Nazabal, V.;
Nemec, P.P.
Source:
Tomáš Halenkovič
via
Scopus - Elsevier
Optics InfoBase Conference Papers
2019
|
Conference paper
EID:
2-s2.0-85084588746
Contributors:
Renversez, G.;
Elsawy, M.M.R.;
Chauvet, M.;
Kuriakose, T.;
Halenkovic, T.;
Nazabal, V.;
Nemec, P.P.
Source:
Tomáš Halenkovič
via
Scopus - Elsevier
Optics InfoBase Conference Papers
2019
|
Conference paper
EID:
2-s2.0-85077073100
Contributors:
Chauvet, M.;
Kuriakose, T.;
Renversez, G.;
Elsawy, M.M.R.;
Nazabal, V.;
Halenkovic, T.;
Nemec, P.
Source:
Tomáš Halenkovič
via
Scopus - Elsevier
Journal of Non-Crystalline Solids
2019
|
Journal article
EID:
2-s2.0-85061210035
Contributors:
Mawale, R.;
Halenkovič, T.;
Bouška, M.;
Gutwirth, J.;
Nazabal, V.;
Takáts, V.;
Csík, A.;
Havel, J.;
Prokeš, L.;
Němec, P.
Source:
Tomáš Halenkovič
via
Scopus - Elsevier
Scientific Reports
2019-07-15
|
Journal article
Contributors:
Ravi Mawale;
Tomáš Halenkovič;
Marek Bouška;
Jan Gutwirth;
Virginie Nazabal;
Pankaj Lochan Bora;
Lukáš Pečinka;
Lubomír Prokeš;
Josef Havel;
Petr Němec
Source:
check_circle
Crossref
grade
Preferred source
(of
2)
Journal of the American Ceramic Society
2018
|
Journal article
EID:
2-s2.0-85041203904
Contributors:
Halenkovič, T.;
Gutwirth, J.;
Němec, P.;
Baudet, E.;
Specht, M.;
Gueguen, Y.;
Sangleboeuf, J.-C.;
Nazabal, V.
Source:
Tomáš Halenkovič
via
Scopus - Elsevier
International Conference on Transparent Optical Networks
2018
|
Conference paper
EID:
2-s2.0-85055579359
Contributors:
Baillieul, M.;
Halenkovič, T.;
Gutierrez-Arrovo, A.J.;
Baudet, E.;
Rinnert, E.;
Gutwirth, J.;
Nẽmec, P.;
Charrier, J.;
Bodiou, L.;
Colas, F.
et al.
Source:
Tomáš Halenkovič
via
Scopus - Elsevier
Optics Letters
2018
|
Journal article
EID:
2-s2.0-85054060788
Contributors:
Mandal, D.;
Yadav, R.K.;
Mondal, A.;
Bera, S.K.;
Aswin, J.R.;
Nemec, P.;
Halenkovic, T.;
Adarsh, K.V.
Source:
Tomáš Halenkovič
via
Scopus - Elsevier
Proceedings of SPIE - The International Society for Optical Engineering
2017
|
Conference paper
EID:
2-s2.0-85029160393
Contributors:
Halenkovič, T.;
Němec, P.;
Gutwirth, J.;
Baudet, E.;
Specht, M.;
Gueguen, Y.;
Sangleboeuf, J.-C.;
Nazabal, V.
Source:
Tomáš Halenkovič
via
Scopus - Elsevier
Journal of the American Society for Mass Spectrometry
2017
|
Journal article
EID:
2-s2.0-85037043505
Contributors:
Mawale, R.M.;
Ausekar, M.V.;
Prokeš, L.;
Nazabal, V.;
Baudet, E.;
Halenkovič, T.;
Bouška, M.;
Alberti, M.;
Němec, P.;
Havel, J.
Source:
Tomáš Halenkovič
via
Scopus - Elsevier
Optics Communications
2017
|
Journal article
EID:
2-s2.0-85026728624
Contributors:
Kuriakose, T.;
Baudet, E.;
Halenkovič, T.;
Elsawy, M.M.R.;
Němec, P.;
Nazabal, V.;
Renversez, G.;
Chauvet, M.
Source:
Tomáš Halenkovič
via
Scopus - Elsevier
Ceramics International
2016
|
Journal article
EID:
2-s2.0-84946594501
Contributors:
Boidin, R.;
Halenkovič, T.;
Nazabal, V.;
Beneš, L.;
Němec, P.
Source:
Tomáš Halenkovič
via
Scopus - Elsevier