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Works (18)

How to capture aesthetic features of complex cultural heritage objects - Active illumination data fusion

IS and T International Symposium on Electronic Imaging Science and Technology
2018 | Conference paper
EID:

2-s2.0-85052868683

Contributors: Maczkowski, G.; Krzesłowski, J.; Bunsch, E.
Source: Self-asserted source
Grzegorz Mączkowski via Scopus - Elsevier

Robust geometric, phase and colour structured light projection system calibration

Opto-electronics Review
2017 | Journal article
EID:

2-s2.0-85035054117

Contributors: Szelag, K.; Maczkowski, G.; Gierwialo, R.; Gebarska, A.; Sitnik, R.
Source: Self-asserted source
Grzegorz Mączkowski via Scopus - Elsevier

Three Dimensional Measurement System for Crime Scene Documentation

Proceedings of SPIE - The International Society for Optical Engineering
2017 | Conference paper
EID:

2-s2.0-85038427957

Contributors: Adamczyk, M.; Hołowko, E.; Lech, K.; Michoński, J.; Mączkowski, G.; Bolewicki, P.; Januszkiewicz, K.; Sitnik, R.
Source: Self-asserted source
Grzegorz Mączkowski via Scopus - Elsevier

Color correction in 3D digital documentation: Case study

Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)
2016 | Book
EID:

2-s2.0-84969234026

Contributors: Lech, K.; Mączkowski, G.; Bunsch, E.
Source: Self-asserted source
Grzegorz Mączkowski via Scopus - Elsevier

Low-cost solution for spectral reflectance estimation of 3D surface

Journal of Imaging Science and Technology
2016 | Journal article
EID:

2-s2.0-85016250074

Contributors: Maczkowski, G.; Lech, K.; Sitnik, R.
Source: Self-asserted source
Grzegorz Mączkowski via Scopus - Elsevier

Towards automated, high resolution 3D scanning of large surfaces for cultural heritage documentation

IS and T International Symposium on Electronic Imaging Science and Technology
2016 | Conference paper
EID:

2-s2.0-85041222235

Contributors: Sitnik, R.; Bunsch, E.; Maczkowski, G.; Załuski, W.; Lech, K.; Michoński, J.; Krzesłowski, J.; Foryś, P.
Source: Self-asserted source
Grzegorz Mączkowski via Scopus - Elsevier

Novel calibration procedure for SVBRDF estimation of 3D objects using directional illumination and structured light projection

Proceedings of SPIE - The International Society for Optical Engineering
2013 | Conference paper
EID:

2-s2.0-84878319464

Contributors: Krzesłowski, J.F.; Sitnik, R.; Maczkowski, G.
Source: Self-asserted source
Grzegorz Mączkowski via Scopus - Elsevier

Archiving shape and appearance of cultural heritage objects using structured light projection and multispectral imaging

Optical Engineering
2012 | Journal article
EID:

2-s2.0-84891804432

Contributors: Sitnik, R.; Krzesłowski, J.; Ma̧czkowski, G.
Source: Self-asserted source
Grzegorz Mączkowski via Scopus - Elsevier

Data acquisition enhancement in shape and multispectral color measurements of 3D objects

Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)
2012 | Book
EID:

2-s2.0-84865688710

Contributors: Ma̧czkowski, G.; Sitnik, R.; Krzesłowski, J.
Source: Self-asserted source
Grzegorz Mączkowski via Scopus - Elsevier

Integrated digitization method for cultural heritage objects

Photonics Letters of Poland
2012 | Journal article
EID:

2-s2.0-84863823873

Contributors: Maczkowski, G.; Sitnik, R.; Krzesłowski, J.
Source: Self-asserted source
Grzegorz Mączkowski via Scopus - Elsevier

Data processing path from multimodal 3D measurement to realistic virtual model

Proceedings of SPIE - The International Society for Optical Engineering
2011 | Conference paper
EID:

2-s2.0-79951607584

Contributors: Sitnik, R.; Krzesłowski, J.; Ma̧cZkowski, G.
Source: Self-asserted source
Grzegorz Mączkowski via Scopus - Elsevier

Integrated method for three-dimensional shape and multispectral color measurement

Journal of Imaging Science and Technology
2011 | Journal article
EID:

2-s2.0-84865689603

Contributors: Ma̧czkowski, G.; Krzeslowski, J.; Sitnik, R.
Source: Self-asserted source
Grzegorz Mączkowski via Scopus - Elsevier

Integrated three-dimensional shape and reflection properties measurement system

Applied Optics
2011 | Journal article
EID:

2-s2.0-79551523767

Contributors: Krzesłowski, J.; Sitnik, R.; Ma̧czkowski, G.
Source: Self-asserted source
Grzegorz Mączkowski via Scopus - Elsevier

On reconstructing models of cultural heritage objects in terms of shape, color and appearance

Advances in Intelligent and Soft Computing
2011 | Book
EID:

2-s2.0-80052860254

Contributors: Sitnik, R.; Krzesłowski, J.; Ma̧cZkowski, G.
Source: Self-asserted source
Grzegorz Mączkowski via Scopus - Elsevier

Study on the currently accessible technology for 3D printing of color objects from the reproduction quality standpoint

Proceedings of SPIE - The International Society for Optical Engineering
2011 | Conference paper
EID:

2-s2.0-79960663216

Contributors: Sitnik, R.; Maçczkowski, G.; Krzesłowski, J.; Gadziński, T.
Source: Self-asserted source
Grzegorz Mączkowski via Scopus - Elsevier

Calculation methods for digital model creation based on integrated shape, color and angular reflectivity measurement

Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)
2010 | Book
EID:

2-s2.0-78649564616

Contributors: Sitnik, R.; Ma̧cZkowski, G.; Krzesłowski, J.
Source: Self-asserted source
Grzegorz Mączkowski via Scopus - Elsevier

Extending 3D shape measurement with reflectance estimation

Advances in Intelligent and Soft Computing
2010 | Book
EID:

2-s2.0-80052929123

Contributors: Sitnik, R.; Krzesłowski, J.; Ma̧cZkowski, G.
Source: Self-asserted source
Grzegorz Mączkowski via Scopus - Elsevier

Integrated shape, color, and reflectivity measurement method for 3D digitization of cultural heritage objects

Proceedings of SPIE - The International Society for Optical Engineering
2010 | Conference paper
EID:

2-s2.0-77949462463

Contributors: Sitnik, R.; MacZkowski, G.; Krzesłowski, J.
Source: Self-asserted source
Grzegorz Mączkowski via Scopus - Elsevier