Personal information

Activities

Employment (7)

CNM Technologies GmbH: Bielefeld, DE

2012-01 to present | Co-Founder and Managing Director
Employment
Source: Self-asserted source
Albert Schnieders

Tascon USA, Inc.: Chestnut Ridge, NY, US

2006-01 to 2011-12 | General Manager, Application Scientist
Employment
Source: Self-asserted source
Albert Schnieders

ION-TOF USA, Inc.: Chestnut Ridge, NY, US

2002-07 to 2011-12 | Application Scientist
Employment
Source: Self-asserted source
Albert Schnieders

ION-TOF GmbH: Münster, DE

2002-01 to 2002-07 | Application Scientist
Employment
Source: Self-asserted source
Albert Schnieders

University of Delaware: Newark, DE, US

2001-09 to 2001-12 | Postdoctoral Researcher (Department of Chemistry and Biochemistry)
Employment
Source: Self-asserted source
Albert Schnieders

The University of Utah: Salt Lake City, UT, US

2001-01 to 2001-08 | Postdoctoral Researcher (Department of Chemistry)
Employment
Source: Self-asserted source
Albert Schnieders

Westfälische Wilhelms-Universität Münster: Munster, DE

1999-07 to 2000-12 | Staff Scientist (Physikalisches Institut)
Employment
Source: Self-asserted source
Albert Schnieders

Education and qualifications (2)

Westfälische Wilhelms-Universität Münster: Münster, DE

1994-02 to 1999-07 | Ph.D. (Physikalisches Institut)
Education
Source: Self-asserted source
Albert Schnieders

Westfälische Wilhelms-Universität Münster: Münster, DE

1988-09 to 1993-09 | Diplom-Physiker (Physikalisches Institut)
Education
Source: Self-asserted source
Albert Schnieders

Funding (1)

Einfluß der lateralen Ordnung von Alkylsilan-Self-Assembly-Schichten auf die Sekundärionenemission

2000-01-01 to 2002-12-31 | Grant
German Research Foundation (Bonn, DE)
GRANT_NUMBER: 5294272
Source: Self-asserted source
Albert Schnieders via DimensionsWizard

Works (20)

Nanomechanics of Ultrathin Carbon Nanomembranes

Nanomaterials
2023-01-08 | Journal article
Contributors: Marinos Dimitropoulos; George Trakakis; Nikolaus Meyerbröker; Raphael Gehra; Polina Angelova; Albert Schnieders; Christos Pavlou; Christos Kostaras; Costas Galiotis; Konstantinos Dassios
Source: check_circle
Crossref

Biomolecular Analysis by Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS)

Surface Analysis and Techniques in Biology
2014 | Book chapter
Part of ISBN: 9783319013596
Part of ISBN: 9783319013602
Source: Self-asserted source
Albert Schnieders

Time-of-Flight Secondary Ion Mass Spectrometry

Microscopy Today
2011-03 | Journal article
Part of ISSN: 1551-9295
Part of ISSN: 2150-3583
Source: Self-asserted source
Albert Schnieders

D & TOF-SIMS failure analysis of P-buried layer from BiCMOS transistors

Surface and Interface Analysis
2011-01 | Journal article
Part of ISSN: 0142-2421
Source: Self-asserted source
Albert Schnieders

Detection of structurally bound hydroxyl in fluorapatite from Apollo Mare basalt 15058,128 using TOF-SIMS

American Mineralogist
2010-08-01 | Journal article
Part of ISSN: 0003-004X
Source: Self-asserted source
Albert Schnieders

Analysis of Writing Inks by Time-of-Flight Secondary Ion Mass Spectrometry – A Forensic Case Study

Microscopy and Microanalysis
2010-07 | Journal article
Part of ISSN: 1431-9276
Part of ISSN: 1435-8115
Source: Self-asserted source
Albert Schnieders

Full wafer defect analysis with time-of-flight secondary Ion Mass Spectrometry

2010 IEEE/SEMI Advanced Semiconductor Manufacturing Conference (ASMC)
2010-07 | Conference paper
Source: Self-asserted source
Albert Schnieders

Multivariate Statistical Analysis of Non-Mass Selected ToF-SIMS Data.

Analytical Chemistry
2007-09 | Journal article
OTHER-ID: 1146549
Contributors: Keenan, Michael R.; ; Ohlhausen, James Anthony; ; Kotula, Paul Gabriel; ; Smentkowski, Vincent S.; ; Ostrowski, Sara G.; ; Kollmer, Felix; ; Schnieders, Albert
Source: Self-asserted source
Albert Schnieders via DOE OSTI.GOV

Time-of-Flight Secondary Ion Mass Spectrometry - A Chemical Microscope

Microscopy and Microanalysis
2006-08 | Journal article
Part of ISSN: 1431-9276
Part of ISSN: 1435-8115
Source: Self-asserted source
Albert Schnieders

Controlled Polymerization of Substituted Diacetylene Self-Organized Monolayers Confined in Molecule Corrals

Langmuir
2005-02 | Journal article
Part of ISSN: 0743-7463
Part of ISSN: 1520-5827
Source: Self-asserted source
Albert Schnieders

Cluster primary ion bombardment facilitates ToF-SIMS analysis of biological/tissue samples

2004-06 | Conference paper
OTHER-ID: 957301
Contributors: Kotula, Paul Gabriel; ; Ohlhausen, James Anthony; ; Kersting, R ; ; Kollmer, F ; ; Smentkowski, Vincent S ; ; Schnieders, Albert ; ; Keenan, Michael Robert
Source: Self-asserted source
Albert Schnieders via DOE OSTI.GOV

Use of multivariate statistics in TOF-SIMS : AXSIA (Automated eXpert Spectrum Image Analysis).

2004-06 | Conference paper
OTHER-ID: 957234
Contributors: Kotula, Paul Gabriel; ; Ohlhausen, James Anthony; ; Keenan, Michael Robert; ; Smentkowski, Vincent S ; ; Schnieders, Albert
Source: Self-asserted source
Albert Schnieders via DOE OSTI.GOV

Molecular secondary ion emission from adenine overlayers in dependence on the primary ion species and substrate material

Surface Science
2003-03 | Journal article
Part of ISSN: 0039-6028
Source: Self-asserted source
Albert Schnieders

Pit-Templated Synthesis and Oxygen Adsorption Properties of Gold Nanostructures on Highly Oriented Pyrolytic Graphite

Langmuir
2002-07 | Journal article
Part of ISSN: 0743-7463
Part of ISSN: 1520-5827
Source: Self-asserted source
Albert Schnieders

Quantitative surface analysis of molecular overlayers by resonantly enhanced multiphoton ionization of sputtered molecules

AIP Conference Proceedings
2001 | Conference paper
Part of ISSN: 0094-243X
Source: Self-asserted source
Albert Schnieders
grade
Preferred source (of 2)‎

Molecular secondary particle emission from molecular overlayers under 10 keV Ar+ primary ion bombardment

Surface Science
2001-01 | Journal article
Part of ISSN: 0039-6028
Source: Self-asserted source
Albert Schnieders

Detection and Quantification of Metals in Organic Materials by Laser-SNMS with Nonresonant Multiphoton Ionization

Analytical Chemistry
2000-09 | Journal article
Part of ISSN: 0003-2700
Part of ISSN: 1520-6882
Source: Self-asserted source
Albert Schnieders

Quantitatve surface analysis by laser postionization of sputtered neutrals

1999 | Dissertation or Thesis
Contributors: Albert Schnieders
Source: Self-asserted source
Albert Schnieders via Deutsche Nationalbibliothek (DNB)

Quantification of metal contaminants on GaAs with time-of-flight secondary ion mass spectrometry

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
1998-05 | Journal article
Part of ISSN: 0734-211X
Source: Self-asserted source
Albert Schnieders

Quantification of metal trace contaminants on Si wafer surfaces by Laser-SNMS and TOF-SIMS using sputter deposited submonolayer standards

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
1996-07 | Journal article
Part of ISSN: 0734-211X
Source: Self-asserted source
Albert Schnieders