Personal information

China

Activities

Employment (1)

Politecnico di Torino: Torino, Piemonte, IT

2014-09-01 to present | Research Assistant (Department of Computer and Control Engineering)
Employment
Source: Self-asserted source
Boyang Du

Education and qualifications (3)

Politecnico di Torino: Torino, Piemonte, IT

2013-03 to present | PhD (Department of Control and Computer Engineering)
Education
Source: Self-asserted source
Boyang Du

Politecnico di Torino: Torino, Piemonte, IT

2010-09 to 2012-11 | Master (Department of Control and Computer Engineering)
Education
Source: Self-asserted source
Boyang Du

Harbin Institute of Technology: Harbin, Heilongjiang, CN

2006-09 to 2010-07 | Bachelor
Education
Source: Self-asserted source
Boyang Du

Works (17)

An Automated Continuous Integration Multitest Platform for Automotive Systems

IEEE Systems Journal
2022-06 | Journal article
Contributors: Boyang Du; Sarah Azimi; Annarita Moramarco; Davide Sabena; Filippo Parisi; Luca Sterpone
Source: check_circle
Crossref

A 3-D Simulation-Based Approach to Analyze Heavy Ions-Induced SET on Digital Circuits

IEEE Transactions on Nuclear Science
2020-09 | Journal article
Contributors: L. Sterpone; F. Luoni; S. Azimi; B. Du
Source: check_circle
Crossref

A new CAD tool for Single Event Transient Analysis and mitigation on Flash-based FPGAs

Integration
2019-07 | Journal article
Contributors: S. Azimi; B. Du; L. Sterpone; D.M. Codinachs; R. Grimoldi; L. Cattaneo
Source: check_circle
Crossref

Ultrahigh Energy Heavy Ion Test Beam on Xilinx Kintex-7 SRAM-Based FPGA

IEEE Transactions on Nuclear Science
2019-07 | Journal article
Contributors: Boyang Du; Luca Sterpone; Sarah Azimi; David Merodio Codinachs; Veronique Ferlet-Cavrois; Cesar Boatella Polo; Ruben Garcia Alia; Maria Kastriotou; Pablo Fernandez-Martinez
Source: check_circle
Crossref

A new approach for Total Ionizing Dose effect analysis on Flash-based FPGA

Microelectronics Reliability
2017-09 | Journal article
Contributors: Qiutao Zhang; Sarah Azimi; Germano La Vaccara; Luca Sterpone; Boyang Du
Source: check_circle
Crossref

A new simulation-based fault injection approach for the evaluation of transient errors in GPGPUs

Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)
2016 | Book
EID:

2-s2.0-84962440387

Contributors: Azimi, S.; Du, B.; Sterpone, L.
Source: Self-asserted source
Boyang Du via Scopus - Elsevier

FPGA-controlled PCBA power-on self-test using processor's debug features

Formal Proceedings of the 2016 IEEE 19th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2016
2016 | Conference paper
EID:

2-s2.0-84978499146

Contributors: Du, B.; Sanchez, E.; Reorda, M.S.; Acle, J.P.; Tsertov, A.
Source: Self-asserted source
Boyang Du via Scopus - Elsevier

Hybrid soft error mitigation techniques for COTS processor-based systems

LATS 2016 - 17th IEEE Latin-American Test Symposium
2016 | Conference paper
EID:

2-s2.0-84978543422

Contributors: Chielle, E.; Du, B.; Kastensmidt, F.L.; Cuenca-Asensi, S.; Sterpone, L.; Reorda, M.S.
Source: Self-asserted source
Boyang Du via Scopus - Elsevier

Online Test of Control Flow Errors: A New Debug Interface-Based Approach

IEEE Transactions on Computers
2016-06-01 | Journal article
Contributors: Boyang Du; Matteo Sonza Reorda; Luca Sterpone; Luis Parra; Marta Portela-García; Almudena Lindoso; Luis Entrena
Source: check_circle
Crossref
grade
Preferred source (of 2)‎

Analysis and mitigation of SEUs in ARM-based SoC on Xilinx Virtex-V SRAM-based FPGAS

2015 11th Conference on Ph.D. Research in Microelectronics and Electronics, PRIME 2015
2015 | Conference paper
EID:

2-s2.0-84946845828

Contributors: Du, B.; Desogus, M.; Sterpone, L.
Source: Self-asserted source
Boyang Du via Scopus - Elsevier

Radiation-induced single event transients modeling and testing on nanometric flash-based technologies

Microelectronics Reliability
2015 | Journal article
EID:

2-s2.0-84943396189

Contributors: Sterpone, L.; Du, B.; Azimi, S.
Source: Self-asserted source
Boyang Du via Scopus - Elsevier

SET-PAR: Place and route tools for the mitigation of single event transients on flash-based FPGAs

Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)
2015 | Book
EID:

2-s2.0-84926677047

Contributors: Sterpone, L.; Du, B.
Source: Self-asserted source
Boyang Du via Scopus - Elsevier

A new hybrid nonintrusive error-detection technique using dual control-flow monitoring

IEEE Transactions on Nuclear Science
2014 | Journal article
EID:

2-s2.0-84919924149

Contributors: Parra, L.; Lindoso, A.; Portela-Garcia, M.; Entrena, L.; Du, B.; Reorda, M.S.; Sterpone, L.
Source: Self-asserted source
Boyang Du via Scopus - Elsevier

A new solution to on-line detection of Control Flow Errors

Proceedings of the 2014 IEEE 20th International On-Line Testing Symposium, IOLTS 2014
2014 | Conference paper
EID:

2-s2.0-84906653205

Contributors: Du, B.; Reorda, M.S.; Sterpone, L.; Parra, L.; Portela-Garcia, M.; Lindoso, A.; Entrena, L.
Source: Self-asserted source
Boyang Du via Scopus - Elsevier

Analysis and mitigation of single event effects on flash-based FPGAS

Proceedings - 2014 19th IEEE European Test Symposium, ETS 2014
2014 | Conference paper
EID:

2-s2.0-84904489016

Contributors: Sterpone, L.; Du, B.
Source: Self-asserted source
Boyang Du via Scopus - Elsevier

On the functional test of the register forwarding and pipeline interlocking unit in pipelined processors

Proceedings - International Workshop on Microprocessor Test and Verification
2014 | Conference paper
EID:

2-s2.0-84908460887

Contributors: Bernardi, P.; Cantoro, R.; Ciganda, L.; Du, B.; Sanchez, E.; Reorda, M.S.; Grosso, M.; Ballan, O.
Source: Self-asserted source
Boyang Du via Scopus - Elsevier

Exploiting the debug interface to support on-line test of control flow errors

Proceedings of the 2013 IEEE 19th International On-Line Testing Symposium, IOLTS 2013
2013 | Conference paper
EID:

2-s2.0-84885206200

Contributors: Du, B.; Reorda, M.S.; Sterpone, L.; Parra, L.; Portela-Garcia, M.; Lindoso, A.; Entrena, L.
Source: Self-asserted source
Boyang Du via Scopus - Elsevier

Peer review (1 review for 1 publication/grant)

Review activity for Electronics. (1)