Personal information
Activities
Works (25)
Micromachines
2023-01-03
|
Journal article
Contributors:
Yolanda Lechuga;
Gregoire Kandel;
Jose Angel Miguel;
Mar Martinez
Source:
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Crossref
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2)
2019 22nd Euromicro Conference on Digital System Design (DSD)
2019-08
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Conference paper
Source:
Yolanda Lechuga
Micromachines
2018-07-06
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Journal article
Contributors:
Jose Angel Miguel;
Yolanda Lechuga;
Mar Martinez
Source:
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Crossref
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2)
2017 32nd Conference on Design of Circuits and Integrated Systems (DCIS)
2017-11
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Conference paper
Source:
Yolanda Lechuga
Microprocessors and Microsystems
2016
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Journal article
WOSUID:
WOS:000389164700009
Contributors:
Miguel, J. A.;
Rivas, D.;
Lechuga, Y.;
Allende, M. A.;
Martinez, M.
Source:
Yolanda Lechuga
via
ResearcherID
2016 Conference on Design of Circuits and Integrated Systems (Dcis 2016)
2016
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Journal article
WOSUID:
WOS:000399129000028
Contributors:
Lechuga, Y.;
Diaz, F. J.;
IEEE
Source:
Yolanda Lechuga
via
ResearcherID
2015 Conference on Design of Circuits and Integrated Systems (DCIS)
2015
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Journal article
WOSUID:
WOS:000380543200061
Contributors:
Lechuga, Y.;
Martinez, M.;
Casanueva, R.;
IEEE
Source:
Yolanda Lechuga
via
ResearcherID
2015 37th Annual International Conference of the Ieee Engineering in Medicine and Biology Society (Embc)
2015
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Book chapter
WOSUID:
WOS:000371717203150
Contributors:
Rivas, David;
Miguel, Jose A.;
Lechuga, Yolanda;
Allende, Miguel A.;
Martinez, Mar;
IEEE
Source:
Yolanda Lechuga
via
ResearcherID
BIODEVICES: Proceedings of the 2015 International Conference on Biomedical Electronics and Devices
2015
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Journal article
WOSUID:
WOS:000380546700025
Contributors:
Miguel, J. A.;
Lechuga, Y.;
Martinez, M.;
Berrazueta, J. R.
Source:
Yolanda Lechuga
via
ResearcherID
2015 Euromicro Conference on Digital System Design (Dsd)
2015
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Journal article
WOSUID:
WOS:000382382300023
Contributors:
Miguel, J. A.;
Rivas, D.;
Lechuga, Y.;
Allende, M. A.;
Martinez, M.;
IEEE
Source:
Yolanda Lechuga
via
ResearcherID
Proceedings of the 2015 Ieee 20th International Mixed-Signal Testing Workshop (Imstw)
2015
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Journal article
WOSUID:
WOS:000380488400020
Contributors:
Miguel, J. A.;
Rivas, D.;
Lechuga, Y.;
Allende, M. A.;
Martinez, M.;
IEEE
Source:
Yolanda Lechuga
via
ResearcherID
2015 11th Conference on Ph.d. Research in Microelectronics and Electronics (Prime)
2015
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Journal article
WOSUID:
WOS:000380398700068
Contributors:
Miguel, J. A.;
Rivas, D.;
Lechuga, Y.;
Allende, M. A.;
Martinez, M.;
IEEE
Source:
Yolanda Lechuga
via
ResearcherID
2014 26th International Conference on Microelectronics (Icm)
2014
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Book chapter
WOSUID:
WOS:000398529400021
Contributors:
Miguel, J. A.;
Lechuga, Y.;
Martinez, M.;
Bracho, S.;
IEEE
Source:
Yolanda Lechuga
via
ResearcherID
Microelectronics Journal
2013
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Journal article
WOSUID:
WOS:000318466900003
Contributors:
Mozuelos, R.;
Lechuga, Y.;
Martinez, M.;
Bracho, S.
Source:
Yolanda Lechuga
via
ResearcherID
Technological Innovation For the Internet of Things
2013
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Journal article
WOSUID:
WOS:000323186100018
Contributors:
Miguel, J. A.;
Lechuga, Y.;
Mozuelos, R.;
Martinez, M.
Source:
Yolanda Lechuga
via
ResearcherID
Source:
Yolanda Lechuga
grade
Preferred source
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2)
Journal of Electronic Testing-Theory and Applications
2011
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Journal article
WOSUID:
WOS:000290044500007
Contributors:
Mozuelos, Roman;
Lechuga, Yolanda;
Martinez, Mar;
Bracho, Salvador
Source:
Yolanda Lechuga
via
ResearcherID
Emerging Trends in Technological Innovation
2010
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Journal article
WOSUID:
WOS:000277119500059
Contributors:
Lechuga, Yolanda;
Mozuelos, Roman;
Martinez, Mar;
Bracho, Salvador
Source:
Yolanda Lechuga
via
ResearcherID
Emerging Trends in Technological Innovation
2010
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Journal article
WOSUID:
WOS:000277119500058
Contributors:
Mozuelos, Roman;
Lechuga, Yolanda;
Martinez, Mar;
Bracho, Salvador
Source:
Yolanda Lechuga
via
ResearcherID
2010 15th IEEE European Test Symposium
2010-05
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Conference paper
Source:
Yolanda Lechuga
2007 14th Ieee International Conference on Electronics, Circuits and Systems, Vols 1-4
2007
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Book chapter
WOSUID:
WOS:000255014800056
Contributors:
Mozuelos, R.;
Lechuga, Y.;
Martinez, M.;
Bracho, S.;
IEEE
Source:
Yolanda Lechuga
via
ResearcherID
Journal of Electronic Testing-Theory and Applications
2005
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Journal article
WOSUID:
WOS:000233988200002
Contributors:
Lechuga, Y;
Mozuelos, R;
Allende, MA;
Martinez, M;
Bracho, S
Source:
Yolanda Lechuga
via
ResearcherID
Microelectronics Journal
2005
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Journal article
WOSUID:
WOS:000232975300002
Contributors:
Mozuelos, R;
Lechuga, Y;
Martinez, M;
Bracho, S
Source:
Yolanda Lechuga
via
ResearcherID
Electronics Letters
2003
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Journal article
WOSUID:
WOS:000183353700012
Contributors:
Lechuga, Y;
Mozuelos, R;
Martinez, M;
Bracho, S
Source:
Yolanda Lechuga
via
ResearcherID
Design, Automation and Test in Europe Conference and Exhibition, 2002 Proceedings
2002
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Journal article
WOSUID:
WOS:000176953300031
Contributors:
Lechuga, Y;
Mozuelos, R;
Martinez, M;
Bracho, S
Source:
Yolanda Lechuga
via
ResearcherID