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Employment (6)

VIT University: Vellore, Tamil Nadu, IN

2017-05-02 to present | Associate Professor (Department of Physics, School of Advanced Sciences)
Employment
Source: Self-asserted source
Dr. Ramesh Thamankar

CMR Group of Institutions: Bangalore, Karnataka, IN

2016-05-01 to 2017-04-30 | Professor (Physics Department, CMR University)
Employment
Source: Self-asserted source
Dr. Ramesh Thamankar

Singapore University of Technology and Design: Singapore, SG

2014-04-01 to 2016-03-31
Employment
Source: Self-asserted source
Dr. Ramesh Thamankar

Institute of Materials Research and Engineering: Singapore, SG

2010-03-01 to 2014-03-31 | Scientist (IMRE)
Employment
Source: Self-asserted source
Dr. Ramesh Thamankar

Max-Planck-Institut für Mikrostrukturphysik: Halle, Sachsen-Anhalt, DE

2006-11-04 to 2009-12-31 | Postdoctoral Fellow (Department of Prof. J. Kirschner)
Employment
Source: Self-asserted source
Dr. Ramesh Thamankar

University of California Riverside: Riverside, CA, US

2004-08-01 to 2006-10-31 | Postdoctoral Fellow (Department of Physics)
Employment
Source: Self-asserted source
Dr. Ramesh Thamankar

Education and qualifications (3)

Freie Universität Berlin: Berlin, Berlin, DE

2000-05-10 to 2004-05-31 | Ph.D. (Department of Physik)
Education
Source: Self-asserted source
Dr. Ramesh Thamankar

National Institute of Technology Karnataka: Surathkal, Karnataka, IN

1997-09-01 to 1999-05-31 | M.Tech. (Materials Engineering)
Education
Source: Self-asserted source
Dr. Ramesh Thamankar

Mangalore University: Mangalagangotri, Karnataka, IN

1992-06-01 to 1994-05-31 | M.Sc. (Physics)
Education
Source: Self-asserted source
Dr. Ramesh Thamankar

Works (50)

A low-energy consuming, optically and electrically stimulated artificial synapse based on lead-free metal halide perovskite (Cs3Cu2I5) for neuromorphic applications

Materials Advances
2025 | Journal article
Contributors: Amrita Bharati Mishra; Mrunal Shete; R. Thamankar
Source: check_circle
Crossref

Persistent photoconductivity and Emulating Ebbinghaus forgetting curve via characterization of excitatory synaptic transmission in a ZnO-based optoelectronic synapse with ultra-low power (∼ fJ) consumption

Applied Surface Science
2025-03 | Journal article
Contributors: Ashly Sunny; R. Thamankar
Source: check_circle
Crossref

Combined optical and electrical control of a low-power consuming (∼fJ) two-terminal organic artificial synapse for associative learning and neuromorphic applications

Nanoscale
2024 | Journal article
Contributors: Amrita Bharati Mishra; R. Thamankar
Source: check_circle
Crossref

Investigation of the transient photo-response and switching window of an Al/indigo/Al device: unveiling negative photoconductivity and the photo-enhanced memory window

Materials Advances
2024 | Journal article
Contributors: Sreelakshmi B.; R. Thamankar
Source: check_circle
Crossref

Spike rate dependent synaptic characteristics in lamellar, multilayered alpha-MoO3 based two-terminal devices – efficient way to control the synaptic amplification

RSC Advances
2024 | Journal article
Contributors: Meenu Maria Sunny; R. Thamankar
Source: check_circle
Crossref

Emulating Ebbinghaus forgetting behavior in a neuromorphic device based on low dimensional h-BN

AIP Advances
2024-08-01 | Journal article
Contributors: Ashly Sunny; R. Thamankar
Source: check_circle
Crossref

Guidelines for the Design of Random Telegraph Noise-Based True Random Number Generators

IEEE Transactions on Device and Materials Reliability
2024-06 | Journal article
Contributors: Tommaso Zanotti; Alok Ranjan; Sean J. O’Shea; Nagarajan Raghavan; Ramesh Thamankar; Kin Leong Pey; Francesco Maria Puglisi
Source: check_circle
Crossref

Coexistence of synaptic behaviour and negative differential resistance at room temperature in the resistive switching device based on natural indigo molecules

Dyes and Pigments
2023-11 | Journal article
Contributors: B. Sreelakshmi; R. Thamankar
Source: check_circle
Crossref

Reliability Analysis of Random Telegraph Noisebased True Random Number Generators

2023 IEEE International Integrated Reliability Workshop (IIRW)
2023-10-08 | Conference paper
Contributors: Tommaso Zanotti; Alok Ranjan; Sean J. O’Shea; Nagarajan Raghavan; Ramesh Thamankar; Kin Leong Pey; Francesco Maria Puglisi
Source: Self-asserted source
Dr. Ramesh Thamankar

Bio-inspired artificial synapse for neuromorphic computing based on NiO nanoparticle thin film

Scientific Reports
2023-05-09 | Journal article
Part of ISSN: 2045-2322
Contributors: Keval Hadiyal; Ramakrishnan Ganesan; A. Rastogi; R. Thamankar
Source: Self-asserted source
Dr. Ramesh Thamankar

Artificial synapse based on carbon quantum dots dispersed in indigo molecular layer for neuromorphic applications

APL Materials
2023-04-01 | Journal article
Contributors: Amrita Bharati Mishra; R. Thamankar
Source: check_circle
Crossref

Room-Temperature Deep-UV Photoluminescence from Low-Dimensional Hexagonal Boron Nitride Prepared Using a Facile Synthesis

ACS Omega
2022-09-27 | Journal article
Contributors: Ashly Sunny; Aniket Balapure; Ramakrishnan Ganesan; R. Thamankar
Source: check_circle
Crossref

Effect of controlled humidity on resistive switching of multilayer VO2 devices

Materials Science and Engineering: B
2021-02-01 | Journal article
Source: Self-asserted source
Dr. Ramesh Thamankar

A Comparative Study of Crystallography and Defect Structure of Corneal Nipple Array in Daphnis nerii Moth and Papilio polytes Butterfly Eye

ACS Omega
2020-09-22 | Journal article
Contributors: Shamprasad Varija Raghu; R. Thamankar
Source: check_circle
Crossref

A non-volatile resistive memory effect in 2,2′,6,6′-tetraphenyl-dipyranylidene thin films as observed in field-effect transistors and by conductive atomic force microscopy

RSC Adv.
2017 | Journal article
Contributors: Marc Courté; Sandeep G. Surya; Ramesh Thamankar; Chao Shen; V. Ramgopal Rao; Subodh G. Mhailsalkar; Denis Fichou
Source: Self-asserted source
Dr. Ramesh Thamankar via Crossref Metadata Search

Correction: A non-volatile resistive memory effect in 2,2′,6,6′-tetraphenyl-dipyranylidene thin films as observed in field-effect transistors and by conductive atomic force microscopy

RSC Adv.
2017 | Journal article
Contributors: Marc Courté; Sandeep G. Surya; Ramesh Thamankar; Chao Shen; V. Ramgopal Rao; Subodh G. Mhaisalkar; Denis Fichou
Source: Self-asserted source
Dr. Ramesh Thamankar via Crossref Metadata Search

Localized characterization of charge transport and random telegraph noise at the nanoscale in HfO2 films combining scanning tunneling microscopy and multi-scale simulations

Journal of Applied Physics
2017-07-11 | Journal article
Source: Self-asserted source
Dr. Ramesh Thamankar
grade
Preferred source (of 2)‎

Understanding the switching mechanism in RRAM using in-situ TEM

2016 IEEE Silicon Nanoelectronics Workshop (SNW)
2016-06 | Conference paper
Contributors: K.L. Pey; R. Thamankar; M. Sen; M. Bosman; N. Raghavan; K. Shubhakar
Source: Self-asserted source
Dr. Ramesh Thamankar via Crossref Metadata Search
grade
Preferred source (of 2)‎

Highly Luminescent Heterostructured Copper-Doped Zinc Sulfide Nanocrystals for Application in Cancer Cell Labeling

ChemPhysChem
2016-06-07 | Journal article
Contributors: Huixiang Ang; Michel Bosman; Ramesh Thamankar; Muhammad Faizal B. Zulkifli; Swee Kuan Yen; Anushya Hariharan; Thankiah Sudhaharan; Subramanian Tamil Selvan
Source: Self-asserted source
Dr. Ramesh Thamankar via Crossref Metadata Search

Observation of resistive switching by physical analysis techniques

2016 5th International Symposium on Next-Generation Electronics (ISNE)
2016-05 | Conference paper
Contributors: K. L. Pey; S. Mei; A. Ranjan; N. Raghavan; K. Shubhakar; R Thamankar; M. Bosman; S. J. O'Shea
Source: Self-asserted source
Dr. Ramesh Thamankar via Crossref Metadata Search
grade
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CAFM based spectroscopy of stress-induced defects in HfO<inf>2</inf> with experimental evidence of the clustering model and metastable vacancy defect state

2016 IEEE International Reliability Physics Symposium (IRPS)
2016-04 | Conference paper
Contributors: A. Ranjan; N. Raghavan; K. Shubhakar; R. Thamankar; J. Molina; S. J. O'Shea; M. Bosman; K. L. Pey
Source: Self-asserted source
Dr. Ramesh Thamankar via Crossref Metadata Search
grade
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Performance of ultra-thin HfO2-based MIM devices after oxygen modulation and post-metallization annealing in N2

physica status solidi (a)
2016-03-04 | Journal article
Contributors: Joel Molina; Ramesh Thamankar; Kin Leong Pey
Source: Self-asserted source
Dr. Ramesh Thamankar via Crossref Metadata Search

Single vacancy defect spectroscopy on HfO2 using random telegraph noise signals from scanning tunneling microscopy

Journal of Applied Physics
2016-02-28 | Journal article
Contributors: R. Thamankar; N. Raghavan; J. Molina; F. M. Puglisi; S. J. O'Shea; K. Shubhakar; L. Larcher; P. Pavan; A. Padovani; K. L. Pey
Source: check_circle
Crossref

Single-Crystal Au Triangles as Reconfigurable Contacts for Atomically Smooth Surfaces: Ultra-High Vacuum Transfer-Printing

Nanopackaging: From Nanomaterials to the Atomic Scale
2015 | Other
Contributors: Cedric Troadec; René Heimbuch; Deng Jie; Olga Neucheva; Ramesh Thamankar; Yap Tiong Leh; Christian Joachim
Source: Self-asserted source
Dr. Ramesh Thamankar via Crossref Metadata Search

An SEM/STM based nanoprobing and TEM study of breakdown locations in HfO2/SiOx dielectric stacks for failure analysis

Microelectronics Reliability
2015-08 | Journal article
Contributors: K. Shubhakar; M. Bosman; O.A. Neucheva; Y.C. Loke; N. Raghavan; R. Thamankar; A. Ranjan; S.J. O'Shea; K.L. Pey
Source: Self-asserted source
Dr. Ramesh Thamankar via Crossref Metadata Search

Localized Random Telegraphic Noise Study in HfO<inf>2</inf> dielectric stacks using Scanning Tunneling Microscopy &#x2014; Analysis of process and stress-induced traps

2015 IEEE 22nd International Symposium on the Physical and Failure Analysis of Integrated Circuits
2015-06 | Conference paper
Contributors: A. Ranjan; K. Shubhakar; N. Raghavan; R. Thamankar; M. Bosman; S. J. O'Shea; K. L. Pey
Source: Self-asserted source
Dr. Ramesh Thamankar via Crossref Metadata Search
grade
Preferred source (of 2)‎

Understanding defect kinetics in ultra-thin dielectric logic and memory devices using random telegraph noise analysis

2015 IEEE 22nd International Symposium on the Physical and Failure Analysis of Integrated Circuits
2015-06 | Conference paper
Contributors: N. Raghavan; W. H. Liu; R. Thamankar; M. Bosman; K. L. Pey
Source: Self-asserted source
Dr. Ramesh Thamankar via Crossref Metadata Search
grade
Preferred source (of 2)‎

Low temperature nanoscale electronic transport on the MoS2 surface

Applied Physics Letters
2013-08 | Journal article
Contributors: R. Thamankar; T. L. Yap; K. E. J. Goh; C. Troadec; C. Joachim
Source: Self-asserted source
Dr. Ramesh Thamankar via Crossref Metadata Search

Atomic Scale Interconnection Machine

Atomic Scale Interconnection Machines
2012 | Other
Contributors: O. A. Neucheva; R. Thamankar; T. L. Yap; C. Troadec; J. Deng; C. Joachim
Source: Self-asserted source
Dr. Ramesh Thamankar via Crossref Metadata Search

Solid State Nano Gears Manipulations

Atomic Scale Interconnection Machines
2012 | Other
Contributors: Cedric Troadec; Jie Deng; Francisco Ample; Ramesh Thamankar; Christian Joachim
Source: Self-asserted source
Dr. Ramesh Thamankar via Crossref Metadata Search

Surface Conductance Measurements on a MoS2 Surface Using a UHV-Nanoprobe System

Atomic Scale Interconnection Machines
2012 | Other
Contributors: R. Thamankar; O. A. Neucheva; T. L. Yap; C. Joachim
Source: Self-asserted source
Dr. Ramesh Thamankar via Crossref Metadata Search

Nanoscale physical analysis of localized breakdown events in HfO<inf>2</inf>/SiO<inf>X</inf> dielectric stacks: A correlation study of STM induced BD with C-AFM and TEM

2012 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits
2012-07 | Conference paper
Contributors: K. Shubhakar; K. L. Pey; M. Bosman; R. Thamankar; S. S. Kushvaha; Y. C. Loke; Z. R. Wang; N. Raghavan; X. Wu; S. J. O'Shea
Source: Self-asserted source
Dr. Ramesh Thamankar via Crossref Metadata Search
grade
Preferred source (of 2)‎

Tilting, Bending, and Nonterminal Sites inCO/Cu(001)

Physical Review Letters
2011-03-07 | Journal article
Contributors: R. Thamankar; H. L. Meyerheim; A. Ernst; S. Ostanin; I. V. Maznichenko; E. Soyka; I. Mertig; J. Kirschner
Source: Self-asserted source
Dr. Ramesh Thamankar via Crossref Metadata Search
grade
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Spin-polarized transport in magnetically assembled carbon nanotube spin valves

Applied Physics Letters
2006-07 | Journal article
Contributors: R. Thamankar; S. Niyogi; B. Y. Yoo; Y. W. Rheem; N. V. Myung; R. C. Haddon; R. K. Kawakami
Source: Self-asserted source
Dr. Ramesh Thamankar via Crossref Metadata Search

Evidence for superparamagnetism in ultrathin Fe and FexMn1−x films on Cu(100)

Journal of Magnetism and Magnetic Materials
2005-04 | Journal article
Contributors: S. Bhagwat; R. Thamankar; F.O. Schumann
Source: Self-asserted source
Dr. Ramesh Thamankar via Crossref Metadata Search

Structural and magnetic properties of Fe-rich FexMn1−x ultrathin alloy films on Cu(1117)

Journal of Magnetism and Magnetic Materials
2005-04 | Journal article
Contributors: S. Bhagwat; R. Thamankar; F.O. Schumann
Source: Self-asserted source
Dr. Ramesh Thamankar via Crossref Metadata Search

Evolution of magnetic properties at the interface FexMn1-x/Ni

physica status solidi (c)
2004 | Journal article
Contributors: S. Bhagwat; R. Thamankar; F. O. Schumann
Source: Self-asserted source
Dr. Ramesh Thamankar via Crossref Metadata Search

Magnetically Assembled Multiwalled Carbon Nanotubes on Ferromagnetic Contacts†

The Journal of Physical Chemistry B
2004 | Journal article
Contributors: Sandip Niyogi; Carlos Hangarter; Ramesh M. Thamankar; Yueh-Feng Chiang; Roland Kawakami; Nosang V. Myung; Robert C. Haddon
Source: Self-asserted source
Dr. Ramesh Thamankar via Crossref Metadata Search

Structural and magnetic instabilities in ultrathin Fe-rich alloy films on Cu(100)

Physical Review B - Condensed Matter and Materials Physics
2004 | Journal article
EID:

2-s2.0-1642414415

Contributors: Thamankar, R.; Bhagwat, S.; Schumann, F.O.
Source: Self-asserted source
Dr. Ramesh Thamankar via Scopus - Elsevier

Structural and magnetic properties of ultrathin fcc FexMn 1-x films on Cu(100)

Physical Review B - Condensed Matter and Materials Physics
2004 | Journal article
EID:

2-s2.0-1642307303

Contributors: Thamankar, R.; Bhagwat, S.; Schumann, F.O.
Source: Self-asserted source
Dr. Ramesh Thamankar via Scopus - Elsevier

Effect of submonolayer coverage of Fe and Mn films on the magnetization direction of Ni/Cu(100)

Journal of Magnetism and Magnetic Materials
2004-10 | Journal article
Contributors: R. Thamankar; S. Bhagwat; F.O. Schumann
Source: Self-asserted source
Dr. Ramesh Thamankar via Crossref Metadata Search

Perpendicular anisotropy in Ni rich NixMn1 x ultrathin films

Journal of Physics: Condensed Matter
2004-08 | Journal article
Contributors: R Thamankar; S Bhagwat; F O Schumann
Source: Self-asserted source
Dr. Ramesh Thamankar via Crossref Metadata Search

Instabilites in ultrathin Fe-rich alloy films on

Journal of Magnetism and Magnetic Materials
2004-05 | Journal article
Contributors: R. Thamankar; S. Bhagwat; F.O. Schumann
Source: Self-asserted source
Dr. Ramesh Thamankar via Crossref Metadata Search

Tuning spin reorientation transition of Ni/Cu(100) by Fe cap layers

Journal of Magnetism and Magnetic Materials
2004-05 | Journal article
Contributors: R. Thamankar; F.O. Schumann
Source: Self-asserted source
Dr. Ramesh Thamankar via Crossref Metadata Search

Tuning spin reorientation transition of Ni/Cu(100) by Fe cap layers

Journal of Magnetism and Magnetic Materials
2004-05 | Journal article
Contributors: R THAMANKAR
Source: Self-asserted source
Dr. Ramesh Thamankar via Crossref Metadata Search

Structural and magnetic instabilities in ultrathin Fe-rich alloy films on Cu(100)

Physical Review B
2004-02 | Journal article
Contributors: R. Thamankar; S. Bhagwat; F. O. Schumann
Source: Self-asserted source
Dr. Ramesh Thamankar via Crossref Metadata Search

Structural and magnetic properties of ultrathin fccFexMn1−xfilms on Cu(100)

Physical Review B
2004-02 | Journal article
Contributors: R. Thamankar; S. Bhagwat; F. O. Schumann
Source: Self-asserted source
Dr. Ramesh Thamankar via Crossref Metadata Search

Spin-reorientation transition inFexNi1−xalloy films

Physical Review B
2002-10 | Journal article
Contributors: R. Thamankar; A. Ostroukhova; F. O. Schumann
Source: Self-asserted source
Dr. Ramesh Thamankar via Crossref Metadata Search
grade
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Spin reorientation transition in Fe/sub x/Ni/sub 1-x/ alloy films

IEEE Transactions on Magnetics
2002-09 | Journal article
Contributors: R. Thamankar; A. Ostroukhova; F.O. Schumann
Source: Self-asserted source
Dr. Ramesh Thamankar via Crossref Metadata Search
grade
Preferred source (of 2)‎

Reorientation transition in ultrathin alloy films

IEEE International Digest of Technical Papers on Magnetics Conference
Conference paper
Contributors: R. Thamankar; A. Ostroukhova; F.O. Schumann
Source: Self-asserted source
Dr. Ramesh Thamankar via Crossref Metadata Search
grade
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Peer review (4 reviews for 4 publications/grants)

Review activity for Advanced optical materials (1)
Review activity for Journal of materials research. (1)
Review activity for Materials letters. (1)
Review activity for Microelectronic engineering. (1)