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Employment (1)

Pohang University of Science and Technology: Pohang, Gyeongsangbuk-do, KR

2014-02-01 to present
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Chang-Ki Baek

Education and qualifications (1)

Seoul National University: Seoul, KR

2002-09-01 to 2008-08-26 | Doctor of Philosophy (Electrical and Computer Engineering)
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Chang-Ki Baek

Works (50 of 105)

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Fluoride ion and hydrofluoric acid detection via silicon nanosheet field-effect transistor sensor

Sensors and Actuators B: Chemical
2023 | Journal article
DOI: 10.1016/J.SNB.2023.134123
WOSUID: WOS:001058379700001
Contributors: Kwak, Hyeon-Tak; Kim, Hyangwoo; Yoo, Hyeongseok; Choi, Minkeun; Kong, Byoung Don; Baek, Chang-Ki
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Hydrogen Fluoride Gas Sensor by Silicon Nanosheet Field-Effect Transistor

IEEE Sensors Journal
2023 | Journal article
DOI: 10.1109/JSEN.2023.3285892
WOSUID: WOS:001044265000009
Contributors: Kwak, Hyeon-Tak; Kim, Hyangwoo; Yoo, Hyeongseok; Choi, Minkeun; Oh, Kyounghwan; Kim, Yijoon; Kong, Byoung Don; Baek, Chang-Ki
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A drain extended FinFET with enhanced DC/RF performance for high-voltage RF applications

Semiconductor Science and Technology
2022 | Journal article
DOI: 10.1088/1361-6641/AC93AC
WOSUID: WOS:000863988000001
Contributors: Oh, Kyounghwan; Kim, Hyangwoo; Park, Kangwook; Lee, Hyung-jin; Kong, Byoung Don; Baek, Chang-Ki
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A FinFET Design for Superior High-Voltage Performance

IEEE International Conference on Nanotechnology (IEEE-NANO)
2022 | Conference paper
DOI: 10.1109/NANO54668.2022.9928741
WOSUID: WOS:000886541400062
Contributors: Oh, Kyounghwan; Kim, Hyangwoo; Kong, Byoung Don; Baek, Chang-Ki
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Highly Reliable Memory Operation of High-Density Three-Terminal Thyristor Random Access Memory

Nanoscale Research Letters
2022 | Journal article
DOI: 10.1186/S11671-022-03667-7
WOSUID: WOS:000760203600001
Contributors: Kim, Hyangwoo; Cho, Hyeonsu; Kwak, Hyeon-Tak; Seo, Myunghae; Lee, Seungho; Kong, Byoung Don; Baek, Chang-Ki
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mm-band surface acoustic wave devices utilizing two-dimensional boron nitride

Scientific Reports
2022 | Journal article
DOI: 10.1038/S41598-022-24852-9
WOSUID: WOS:000955946400013
Contributors: Yoon, Seok Hyun; Baek, Chang-Ki; Kong, Byoung Don
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Enhanced Thermoelectric Properties of Cobalt Silicide-Silicon Heterostructured Nanowires

IEEE Transactions on Nanotechnology
2021 | Journal article
DOI: 10.1109/TNANO.2020.3044318
WOSUID: WOS:000607373100003
Contributors: Lee, Seungho; Cho, Hyeonsu; Yoon, Sol; Seo, Myunghae; Yoo, Hyeongseok; Kong, Byoung Don; Meyyappan, M.; Baek, Chang-Ki
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Inverse Design of Graphene FET by Deep Neural Network

IEEE International Conference on Nanotechnology (IEEE-NANO)
2021 | Conference paper
DOI: 10.1109/NANO51122.2021.9514338
WOSUID: WOS:000702270900023
Contributors: Seo, Gyeong Min; Baek, Chang-Ki; Kong, Byoung Don
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mm-Wave Surface Acoustic Wave Filter based on Hexagonal Boron Nitride

IEEE International Conference on Nanotechnology (IEEE-NANO)
2021 | Conference paper
DOI: 10.1109/NANO51122.2021.9514353
WOSUID: WOS:000702270900024
Contributors: Yoon, Seok Hyun; Baek, Chang-Ki; Kong, Byoung Don
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Buffer solution optimization for accurate fluoride ion detection in tap water

Journal of Electroanalytical Chemistry
2020 | Journal article
DOI: 10.1016/J.JELECHEM.2020.113837
WOSUID: WOS:000515205600050
Contributors: Cho, Hyeonsu; Kim, Kihyun; Kwak, Hyeon-Tak; Lee, Seungho; Meyyappan, M.; Baek, Chang-Ki
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Disorder Originated Unusual Mobility in Crystalline InGaZnO4

IEEE Electron Device Letters
2020 | Journal article
DOI: 10.1109/LED.2020.2988674
WOSUID: WOS:000541155300020
Contributors: Jegal, Yoon; Kulahlioglu, Adem H.; Baek, Chang-Ki; Kong, Byoung Don
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Electrical and Data-Retention Characteristics of Two-Terminal Thyristor Random Access Memory

IEEE Open Journal of Nanotechnology
2020 | Journal article
DOI: 10.1109/OJNANO.2020.3042804
WOSUID: WOS:000669542400020
Contributors: Kim, Hyangwoo; Cho, Hyeonsu; Kong, Byoung Don; Kim, Jin-Woo; Meyyappan, Meyya; Baek, Chang-Ki
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High-Voltage Drain-Extended FinFET With a High-k Dielectric Field Plate

IEEE Transactions on Electron Devices
2020 | Journal article
DOI: 10.1109/TED.2020.2969882
WOSUID: WOS:000519593800046
Contributors: Kim, Hyangwoo; Cho, Hyeonsu; Kong, Byoung Don; Park, Kangwook; Kim, Ilryong; Meyyappan, M.; Baek, Chang-Ki
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Highly Sensitive Silicon-based Electrochemical Sensor for On-site Fluoride Ion Monitoring

IEEE International Conference on Nanotechnology (IEEE-NANO)
2020 | Conference paper
WOSUID: WOS:000833543900021
Contributors: Cho, Hyeonsu; Baek, Chang-Ki
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Intrinsic plasticity of silicon nanowire neurotransistors for dynamic memory and learning functions

Nature Electronics
2020 | Journal article
DOI: 10.1038/S41928-020-0412-1
WOSUID: WOS:000535401000002
Contributors: Baek, Eunhye; Das, Nikhil Ranjan; Cannistraci, Carlo Vittorio; Rim, Taiuk; Bermudez, Gilbert Santiago Canon; Nych, Khrystyna; Cho, Hyeonsu; Kim, Kihyun; Baek, Chang-Ki; Makarov, Denys et al.
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Intrinsic plasticity of silicon nanowire neurotransistors for dynamic memory and learning functions (May, 10.1038/s41928-020-0412-1, 2020)

Nature Electronics
2020 | Journal article
DOI: 10.1038/S41928-020-0442-8
WOSUID: WOS:000541844300013
Contributors: Baek, Eunhye; Das, Nikhil Ranjan; Cannistraci, Carlo Vittorio; Rim, Taiuk; Bermudez, Gilbert Santiago Canon; Nych, Khrystyna; Cho, Hyeonsu; Kim, Kihyun; Baek, Chang-Ki; Makarov, Denys et al.
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Nanosensor-Based Real-Time Monitoring of Stress Biomarkers in Human Saliva Using a Portable Measurement System

ACS Sensors
2020 | Journal article
DOI: 10.1021/ACSSENSORS.0C02267
WOSUID: WOS:000603403600039
Contributors: Klinghammer, Stephanie; Voitsekhivska, Tetiana; Licciardello, Nadia; Kim, Kihyun; Baek, Chang-Ki; Cho, Hyeonsu; Wolter, Klaus-Jurgen; Kirschbaum, Clemens; Baraban, Larysa; Cuniberti, Gianaurelio
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Solar Cell Using Hourglass-Shaped Silicon Nanowires for Increased Light-Trapping Path

IEEE Journal of Photovoltaics
2020 | Journal article
DOI: 10.1109/JPHOTOV.2020.2964329
WOSUID: WOS:000519585600021
Contributors: Seo, Myunghae; Yoon, Sol; Cho, Hyeonsu; Lee, Seungho; Kim, Kihyun; Kong, Byoung Don; Meyyappan, Meyya; Baek, Chang-Ki
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Solar Cell Using Hourglass-Shaped Silicon Nanowires for Increased Light-Trapping Path (vol 10, pg 475, 2020)

IEEE Journal of Photovoltaics
2020 | Journal article
DOI: 10.1109/JPHOTOV.2020.2982565
WOSUID: WOS:000562057700039
Contributors: Seo, Myunghae; Yoon, Sol; Cho, Hyeonsu; Lee, Seungho; Kim, Kihyun; Kong, Byoung Don; Meyyappan, M.; Baek, Chang-Ki
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Thermal conductivity reduction by scallop shaped surface modulation in silicon nanowires

Applied Physics Letters
2020 | Journal article
DOI: 10.1063/5.0006570
WOSUID: WOS:000536171800001
Contributors: Lee, Seungho; Yoo, Hyeongseok; Won, Woo-Yeon; Cho, Hyeonsu; Seo, Myunghae; Kong, Byoung Don; Meyyappan, M.; Baek, Chang-Ki
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Two-Dimensional Boronate Ester Covalent Organic Framework Thin Films with Large Single Crystalline Domains for a Neuromorphic Memory Device

Angewandte Chemie International Edition
2020 | Journal article
DOI: 10.1002/ANIE.201916595
WOSUID: WOS:000520531300001
Contributors: Park, SangWook; Liao, Zhongquan; Ibarlucea, Bergoi; Qi, Haoyuan; Lin, Hung-Hsuan; Becker, Daniel; Melidonie, Jason; Zhang, Tao; Sahabudeen, Hafeesudeen; Baraban, Larysa et al.
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Design Guidelines for High Sensitivity ZnO Nanowire Gas Sensors With Schottky Contact

IEEE Sensors Journal
2019 | Journal article
DOI: 10.1109/JSEN.2018.2878783
WOSUID: WOS:000456165700024
Contributors: Kim, Kihyun; Kwak, Hyeon-Tak; Cho, Hyeonsu; Meyyappan, M.; Baek, Chang-Ki
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LaF3 electrolyte-insulator-semiconductor sensor for detecting fluoride ions

Sensors and Actuators B: Chemical
2019 | Journal article
DOI: 10.1016/J.SNB.2018.09.094
WOSUID: WOS:000449373800023
Contributors: Cho, Hyeonsu; Kim, Kihyun; Meyyappan, M.; Baek, Chang-Ki
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Metal ion-doped sol-gel film for emulating synaptic activity and short-term non-volatile memory

IEEE International Conference on Electronics, Circuits and Systems
2019 | Conference paper
DOI: 10.1109/ICECS46596.2019.8964926
WOSUID: WOS:000534573400208
Contributors: Nych, Khrystyna; Baek, Eunhye; Baek, Chang Ki; Ibarlucea, Bergoi; Baraban, Larysa; Cuniberti, Gianaurelio
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Sensitivity Analysis of Silicon Nanowire ISFET Sensor with LaF3 membrane

IEEE International Conference on Nanotechnology (IEEE-NANO)
2019 | Conference paper
WOSUID: WOS:000703919400052
Contributors: Kwak, Hyeon-Tak; Kim, Kihyun; Cho, Hyeonsu; Meyyappan, M.; Baek, Chang-Ki
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Silicon-based Biochemical Sensor for Point-of-Care Application

6TH IEEE INTERNATIONAL CONFERENCE ON NANO/MOLECULAR MEDICINE AND ENGINEERING (IEEE-NANOMED)
2019 | Journal article
WOSUID: WOS:000621794700139
Contributors: Cho, Hyeonsu; Baek, Chang-Ki
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Vertical Silicon Nanowire Thermoelectric Modules with Enhanced Thermoelectric Properties

Nano Letters
2019 | Journal article
DOI: 10.1021/ACS.NANOLETT.8B03822
WOSUID: WOS:000459222300016
Contributors: Lee, Seungho; Kim, Kihyun; Kang, Deok-Hong; Meyyappan, M.; Baek, Chang-Ki
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Weakly Tapered Silicon Nanopillar Resonators with Spatially Well Separated Whispering Gallery Modes for Si-Based Lasers

ACS Applied Nano Materials
2019 | Journal article
DOI: 10.1021/ACSANM.9B00810
WOSUID: WOS:000483440400020
Contributors: Seo, Myunghae; Kim, Kihyun; Cho, Hyeonsu; Yoon, Sol; Kong, Byoung Don; Meyyappan, M.; Baek, Chang-Ki
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Whispering gallery modes enhance the near-infrared photoresponse of hourglass-shaped silicon nanowire photodiodes

Nature Electronics
2019 | Journal article
DOI: 10.1038/S41928-019-0317-Z
WOSUID: WOS:000512908500011
Contributors: Kim, Kihyun; Yoon, Sol; Seo, Myunghae; Lee, Seungho; Cho, Hyeonsu; Meyyappan, M.; Baek, Chang-Ki
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An array of metal oxides nanoscale hetero p-n junctions toward designable and highly-selective gas sensors

Sensors and Actuators B: Chemical
2018 | Journal article
DOI: 10.1016/J.SNB.2017.08.173
WOSUID: WOS:000414319900061
Contributors: Kwon, Hyunah; Yoon, Jun-Sik; Lee, Yuna; Kim, Dong Yeong; Baek, Chang-Ki; Kim, Jong Kyu
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Bandgap Engineering and Strain Effects of Core-Shell Tunneling Field-Effect Transistors

IEEE Transactions on Electron Devices
2018 | Journal article
DOI: 10.1109/TED.2017.2767628
WOSUID: WOS:000418753200040
Contributors: Yoon, Jun-Sik; Kim, Kihyun; Meyyappan, M.; Baek, Chang-Ki
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Ultrasensitive detection of Ebola matrix protein in a memristor mode

Nano Research
2018 | Journal article
DOI: 10.1007/S12274-017-1720-2
WOSUID: WOS:000419959500042
Contributors: Ibarlucea, Bergoi; Akbar, Teuku Fawzul; Kim, Kihyun; Rim, Taiuk; Baek, Chang-Ki; Ascoli, Alon; Tetzlaff, Ronald; Baraban, Larysa; Cuniberti, Gianaurelio
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Vertical Nanowire Tunneling Field-Effect Transistors adopting Core-shell Structure with Strain Effects

IEEE International Nanoelectronics Conference (INEC)
2018 | Conference paper
DOI: 10.1109/INEC.2018.8441908
WOSUID: WOS:000448323600002
Contributors: Yoon, Jun-Sik; Baek, Chang-Ki
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A 4.8Gb/s/pin 2Gb LPDDR4 SDRAM with Sub-100 mu A Self-Refresh Current for IoT Applications

Digest of Technical Papers - IEEE International Solid-State Circuits Conference Proceedings
2017 | Conference paper
WOSUID: WOS:000403393800164
Contributors: Kwak, Nohhyup; Kim, Saeng-Hwan; Lee, Kyong Ha; Baek, Chang-Ki; Jang, Mun Seon; Joo, Yongsuk; Lee, Seung-Hun; Lee, Woo Young; Lee, Eunryeong; Han, Donghee et al.
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Core-shell homojunction silicon vertical nanowire tunneling field-effect transistors

Scientific Reports
2017 | Journal article
DOI: 10.1038/SREP41142
WOSUID: WOS:000392525200001
Contributors: Yoon, Jun-Sik; Kim, Kihyun; Baek, Chang-Ki
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Electrical Characteristics of Doped Silicon Nanowire Channel Field-Effect Transistor Biosensors

IEEE Sensors Journal
2017 | Journal article
DOI: 10.1109/JSEN.2016.2625420
WOSUID: WOS:000393998700016
Contributors: Rim, Taiuk; Kim, Kihyun; Cho, Hyeonsu; Jeong, Wooju; Yoon, Jun-Sik; Kim, Yumi; Meyyappan, M.; Baek, Chang-Ki
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Gap engineering for improved control of memristor nanosensors

European Conference on Circuit Theory and Design
2017 | Conference paper
DOI: 10.1109/ECCTD.2017.8093293
WOSUID: WOS:000426983700074
Contributors: Ibarlucea, Bergoi; Baraban, Larysa; Cuniberti, Gianaurelio; Kim, Kihyun; Rim, Taiuk; Baek, Chang-Ki; Ascoli, Alon; Tetzlaff, Ronald
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Investigation of DC Characteristics in Polysilicon Nanowire Tunneling Field-Effect Transistors

Journal of Nanoscience and Nanotechnology
2017 | Journal article
DOI: 10.1166/JNN.2017.14047
WOSUID: WOS:000397855000032
Contributors: Choi, Joonyong; Yoon, Jun-Sik; Baek, Chang-Ki
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Nanowire sensors monitor bacterial growth kinetics and response to antibiotics

Lab on a Chip
2017 | Journal article
DOI: 10.1039/C7LC00807D
WOSUID: WOS:000417107500010
Contributors: Ibarlucea, B.; Rim, T.; Baek, C. K.; de Visser, J. A. G. M.; Baraban, L.; Cuniberti, G.
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Negative Photoconductance in Heavily Doped Si Nanowire Field-Effect Transistors

Nano Letters
2017 | Journal article
DOI: 10.1021/ACS.NANOLETT.7B02788
WOSUID: WOS:000415029000034
Contributors: Baek, Eunhye; Rim, Taiuk; Schutt, Julian; Baek, Chang-ki; Kim, Kihyun; Baraban, Larysa; Cuniberti, Gianaurelio
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Optical Characteristics of Silicon-Based Asymmetric Vertical Nanowire Photodetectors

IEEE Transactions on Electron Devices
2017 | Journal article
DOI: 10.1109/TED.2017.2682878
WOSUID: WOS:000399935800055
Contributors: Yoon, Jun-Sik; Kim, Kihyun; Meyyappan, M.; Baek, Chang-Ki
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Optimization of Signal to Noise Ratio in Silicon Nanowire ISFET Sensors

IEEE Sensors Journal
2017 | Journal article
DOI: 10.1109/JSEN.2017.2674672
WOSUID: WOS:000399767900026
Contributors: Cho, Hyeonsu; Kim, Kihyun; Yoon, Jun-Sik; Rim, Taiuk; Meyyappan, M.; Baek, Chang-Ki
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Performance and Variations Induced by Single Interface Trap of Nanowire FETs at 7-nm Node

IEEE Transactions on Electron Devices
2017 | Journal article
DOI: 10.1109/TED.2016.2633970
WOSUID: WOS:000394691600001
Contributors: Yoon, Jun-Sik; Kim, Kihyun; Rim, Taiuk; Baek, Chang-Ki
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Polysilicon near-infrared photodetector with performance comparable to crystalline silicon devices

Optics Express
2017 | Journal article
DOI: 10.1364/OE.25.032910
WOSUID: WOS:000418893200064
Contributors: Yoon, Sol; Kim, Kihyun; Cho, Hyeonsu; Yoon, Jun-Sik; Lee, Myoung Jin; Meyyappan, M.; Baek, Chang-Ki
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Silicon Nanowire based Thermoelectric device for Energy Harvesting

IEEE International Conference on Nanotechnology (IEEE-NANO)
2017 | Conference paper
DOI: 10.1109/NANO.2017.8117487
WOSUID: WOS:000434647500184
Contributors: Kim, Kihyun; Baek, Chang-Ki
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Effects of single grain boundary and random interface traps on electrical variations of sub-30 nm polysilicon nanowire structures

Microelectronic Engineering
2016 | Journal article
DOI: 10.1016/J.MEE.2015.09.018
WOSUID: WOS:000367420200020
Contributors: Oh, Hyeongwan; Kim, Jungsik; Lee, Junyoung; Rim, Taiuk; Baek, Chang-Ki; Lee, Jeong-Soo
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Process-Induced Variations of 10-nm Node Bulk nFinFETs Considering Middle-of-Line Parasitics

IEEE Transactions on Electron Devices
2016 | Journal article
DOI: 10.1109/TED.2016.2586505
WOSUID: WOS:000384574400004
Contributors: Yoon, Jun-Sik; Baek, Chang-Ki; Baek, Rock-Hyun
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Variability study of Si nanowire FETs with different junction gradients

AIP Advances
2016 | Journal article
DOI: 10.1063/1.4941351
WOSUID: WOS:000369442200076
Contributors: Yoon, Jun-Sik; Kim, Kihyun; Rim, Taiuk; Baek, Chang-Ki
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Chemical Gated Field Effect Transistor by Hybrid Integration of One-Dimensional Silicon Nanowire and Two-Dimensional Tin Oxide Thin Film for Low Power Gas Sensor

ACS Applied Materials & Interfaces
2015 | Journal article
DOI: 10.1021/ACSAMI.5B05479
WOSUID: WOS:000362243500031
Contributors: Han, Jin-Woo; Rim, Taiuk; Baek, Chang-Ki; Meyyappan, M.
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High efficiency silicon solar cell based on asymmetric nanowire

Scientific Reports
2015 | Journal article
DOI: 10.1038/SREP11646
WOSUID: WOS:000357574500001
Contributors: Ko, Myung-Dong; Rim, Taiuk; Kim, Kihyun; Meyyappan, M.; Baek, Chang-Ki
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Peer review (31 reviews for 6 publications/grants)

Review activity for IEEE electron device letters : (4)
Review activity for IEEE sensors journal. (15)
Review activity for IEEE transactions on electron devices. (6)
Review activity for IEEE transactions on nanotechnology. (3)
Review activity for Nature communications (1)
Review activity for Small. (2)
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