Personal information
Ultrasonics, Superconductors, mechanical properties
Egypt
Activities
Employment (1)
2012-12-02
to
present
|
Researcher
(Ultrasonics)
Employment
Source:
Ahmed M. Abd El-Aziz
Education and qualifications (1)
2014
to
present
|
PhD.
(Solid State Physics)
Education
Source:
Ahmed M. Abd El-Aziz
Works (14)
Applied Physics A: Materials Science and Processing
2022
|
Journal article
EID:
2-s2.0-85132115452
Contributors:
Abdel-Aziz, A.M.;
Shams, M.S.;
Ahmed, E.M.;
Rammah, Y.S.;
Elsad, R.A.
Source:
Ahmed M. Abd El-Aziz
via
Scopus - Elsevier
Journal of Materials Science: Materials in Electronics
2022
|
Journal article
EID:
2-s2.0-85131815878
Contributors:
Misbah, M.H.;
Shams, M.S.;
Ahmed, E.M.;
Elsad, R.A.;
Abdel-Aziz, A.M.;
Olarinoye, I.O.;
Rammah, Y.S.
Source:
Ahmed M. Abd El-Aziz
via
Scopus - Elsevier
Journal of Materials Science: Materials in Electronics
2022
|
Journal article
EID:
2-s2.0-85124070496
Contributors:
Abdel-Aziz, A.M.;
Elsad, R.A.;
Ahmed, E.M.;
Rammah, Y.S.;
Shams, M.S.;
Misbah, M.H.
Source:
Ahmed M. Abd El-Aziz
via
Scopus - Elsevier
Polymer Testing
2021
|
Journal article
EID:
2-s2.0-85105087654
Contributors:
Abdel-Hakim, A.;
El-Basheer, T.M.;
Abd El-Aziz, A.M.;
Afifi, M.
Source:
Ahmed M. Abd El-Aziz
via
Scopus - Elsevier
Journal of Materials Research and Technology
2021
|
Journal article
EID:
2-s2.0-85112783525
Contributors:
Elsad, R.A.;
Abdel-Aziz, A.M.;
Ahmed, E.M.;
Rammah, Y.S.;
El-Agawany, F.I.;
Shams, M.S.
Source:
Ahmed M. Abd El-Aziz
via
Scopus - Elsevier
Journal of Materials Science: Materials in Electronics
2021
|
Journal article
EID:
2-s2.0-85109366116
Contributors:
Abdel-Aziz, A.M.;
Elsad, R.A.;
Ahmed, E.M.;
Rammah, Y.S.;
El-Agawany, F.I.;
Shams, M.S.
Source:
Ahmed M. Abd El-Aziz
via
Scopus - Elsevier
Physica Scripta
2021-10-01
|
Journal article
Contributors:
M S Gaafar;
S Y Marzouk;
I S Mahmoud;
M Afifi;
Ahmed M Abd El-Aziz;
Hussain ElRashidy
Source:
check_circle
Crossref
grade
Preferred source
(of
2)
Journal of Materials Research and Technology
2020
|
Journal article
EID:
2-s2.0-85091485248
Contributors:
Gaafar, M.S.;
Marzouk, S.Y.;
Mahmoud, I.S.;
Ben Henda, M.;
Afifi, M.;
Abd El-Aziz, A.M.;
Alhabradi, M.
Source:
Ahmed M. Abd El-Aziz
via
Scopus - Elsevier
Journal of Superconductivity and Novel Magnetism
2020
|
Journal article
EID:
2-s2.0-85072021994
Part of
ISBN:
15571947 15571939
Contributors:
Abd El-Aziz, A.M.;
Afifi, H.A.;
Hager, I.Z.;
Abdel Aal, N.S.;
Naqib, S.H.
Source:
Ahmed M. Abd El-Aziz
via
Scopus - Elsevier
Journal of Materials Science: Materials in Electronics
2020-10-24
|
Journal article
Source:
Ahmed M. Abd El-Aziz
grade
Preferred source
(of
2)
Measurement: Journal of the International Measurement Confederation
2019
|
Journal article
EID:
2-s2.0-85058812378
Part of
ISBN:
02632241
Contributors:
Afifi, H.A.;
Hager, I.Z.;
Aal, N.S.A.;
Abd El-Aziz, A.M.
Source:
Ahmed M. Abd El-Aziz
via
Scopus - Elsevier
Source:
Ahmed M. Abd El-Aziz
Key Engineering Materials
2014
|
Book
EID:
2-s2.0-84900396367
Part of
ISBN:
16629795 10139826
Contributors:
El-Hofy, M.;
Dawoud, M.;
Elkhatib, M.;
Aziz, A.A.
Source:
Ahmed M. Abd El-Aziz
via
Scopus - Elsevier
Defect and Diffusion Forum
2012
|
Journal article
EID:
2-s2.0-84872482039
Part of
ISBN:
16629507 10120386
Contributors:
El-Hofya, M.;
El-Taablb, A.;
Abdel Aziza, A.M.;
Elkhatiba, M.
Source:
Ahmed M. Abd El-Aziz
via
Scopus - Elsevier