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Works (29)
Radiotherapy and Oncology
2024
|
Journal article
EID:
2-s2.0-85178389027
Contributors:
Sengupta, C.;
Nguyen, D.T.;
Moodie, T.;
Mason, D.;
Luo, J.;
Causer, T.;
Liu, S.F.;
Brown, E.;
Inskip, L.;
Hazem, M.
et al.
Source:
Eireann Cosgriff
via
Scopus - Elsevier
Brachytherapy
2023
|
Journal article
EID:
2-s2.0-85161347257
Contributors:
Flower, E.;
Sykes, J.;
Sullivan, E.;
Busuttil, G.;
Thiruthaneeswaran, N.;
Cosgriff, E.;
Chard, J.;
Salkeld, A.;
Thwaites, D.
Source:
Eireann Cosgriff
via
Scopus - Elsevier
grade
Preferred source
(of
2)
Medical Dosimetry
2021
|
Journal article
EID:
2-s2.0-85102419132
Contributors:
Chao, M.;
Coburn, N.;
Cosgriff, E.;
Brown, C.;
Van Tilburg, K.;
Hayden, A.
Source:
Eireann Cosgriff
via
Scopus - Elsevier
Ultramicroscopy
2012
|
Journal article
EID:
2-s2.0-84855766674
Contributors:
Ruben, G.;
Cosgriff, E.C.;
D'Alfonso, A.J.;
Findlay, S.D.;
LeBeau, J.M.;
Allen, L.J.
Source:
Eireann Cosgriff
via
Scopus - Elsevier
Ultramicroscopy
2011
|
Journal article
EID:
2-s2.0-80053052681
Contributors:
Wang, P.;
Behan, G.;
Kirkland, A.I.;
Nellist, P.D.;
Cosgriff, E.C.;
D'Alfonso, A.J.;
Morgan, A.J.;
Allen, L.J.;
Hashimoto, A.;
Takeguchi, M.
et al.
Source:
Eireann Cosgriff
via
Scopus - Elsevier
Philosophical Magazine
2010
|
Journal article
EID:
2-s2.0-77957153542
Contributors:
Cosgriff, E.C.;
Nellist, P.D.;
Hirsch, P.B.;
Zhou, Z.;
Cockayne, D.J.H.
Source:
Eireann Cosgriff
via
Scopus - Elsevier
Advances in Imaging and Electron Physics
2010
|
Book
EID:
2-s2.0-77954188678
Contributors:
Cosgriff, E.C.;
Nellist, P.D.;
D'Alfonso, A.J.;
Findlay, S.D.;
Behan, G.;
Wang, P.;
Allen, L.J.;
Kirkland, A.I.
Source:
Eireann Cosgriff
via
Scopus - Elsevier
grade
Preferred source
(of
2)
Philosophical Transactions of the Royal Society A: Mathematical, Physical and Engineering Sciences
2009
|
Journal article
EID:
2-s2.0-70349416634
Contributors:
Behan, G.;
Cosgriff, E.C.;
Kirkland, A.I.;
Nellist, P.D.
Source:
Eireann Cosgriff
via
Scopus - Elsevier
Microscopy and Microanalysis
2008
|
Conference paper
EID:
2-s2.0-49549120381
Contributors:
Nellist, P.D.;
Cosgriff, E.C.;
Hirsch, P.B.;
Cockayne, D.J.
Source:
Eireann Cosgriff
via
Scopus - Elsevier
Journal of Physics: Conference Series
2008
|
Conference paper
EID:
2-s2.0-65649106218
Contributors:
D'Alfonso, A.J.;
Cosgriff, E.C.;
Findlay, S.D.;
Kirkland, A.I.;
Nellist, P.D.;
Oxley, M.P.;
Allen, L.J.
Source:
Eireann Cosgriff
via
Scopus - Elsevier
Microscopy and Microanalysis
2008
|
Conference paper
EID:
2-s2.0-38349137963
Contributors:
Nellist, P.D.;
Cosgriff, E.C.;
Behan, G.;
Kirkland, A.I.
Source:
Eireann Cosgriff
via
Scopus - Elsevier
Philosophical Magazine
2008
|
Journal article
EID:
2-s2.0-38349160699
Contributors:
Nellist, P.D.;
Cosgriff, E.C.;
Hirsch, P.B.;
Cockayne, D.J.H.
Source:
Eireann Cosgriff
via
Scopus - Elsevier
Microscopy and Microanalysis
2008
|
Conference paper
EID:
2-s2.0-49549107290
Contributors:
Findlay, S.D.;
D'Alfonso, A.J.;
Allen, L.J.;
Oxley, M.P.;
Nellist, P.D.;
Cosgriff, E.C.;
Behan, G.;
Kirkland, A.;
Shibata, N.;
Mizoguchi, T.
et al.
Source:
Eireann Cosgriff
via
Scopus - Elsevier
AIP Conference Proceedings
2008
|
Conference paper
EID:
2-s2.0-43849110443
Contributors:
Allen, L.J.;
D'Alfonso, A.J.;
Findlay, S.D.;
Oxley, M.P.;
Bosman, M.;
Keast, V.J.;
Cosgriff, E.C.;
Behan, G.;
Nellist, P.D.;
Kirkland, A.I.
Source:
Eireann Cosgriff
via
Scopus - Elsevier
Microscopy and Microanalysis
2008
|
Conference paper
EID:
2-s2.0-49549088155
Contributors:
Nellist, P.D.;
Cosgriff, E.C.;
Behan, G.;
Kirkland, A.I.;
D'Alfonso, A.J.;
Findlay, S.D.;
Allen, L.
Source:
Eireann Cosgriff
via
Scopus - Elsevier
Ultramicroscopy
2008
|
Journal article
EID:
2-s2.0-53249130974
Contributors:
Cosgriff, E.C.;
D'Alfonso, A.J.;
Allen, L.J.;
Findlay, S.D.;
Kirkland, A.I.;
Nellist, P.D.
Source:
Eireann Cosgriff
via
Scopus - Elsevier
Ultramicroscopy
2008
|
Journal article
EID:
2-s2.0-53249097641
Contributors:
D'Alfonso, A.J.;
Cosgriff, E.C.;
Findlay, S.D.;
Behan, G.;
Kirkland, A.I.;
Nellist, P.D.;
Allen, L.J.
Source:
Eireann Cosgriff
via
Scopus - Elsevier
Journal of Physics: Conference Series
2008
|
Conference paper
EID:
2-s2.0-65649137769
Contributors:
Cosgriff, E.C.;
D'Alfonso, A.J.;
Allen, L.J.;
Findlay, S.D.;
Kirkland, A.I.;
Nellist, P.D.
Source:
Eireann Cosgriff
via
Scopus - Elsevier
Ultramicroscopy
2007
|
Journal article
EID:
2-s2.0-34247104038
Contributors:
Cosgriff, E.C.;
Nellist, P.D.
Source:
Eireann Cosgriff
via
Scopus - Elsevier
Advanced Materials
2007
|
Journal article
EID:
2-s2.0-34250672081
Contributors:
Nicolosi, V.;
Nellist, P.D.;
Sanvito, S.;
Cosgriff, E.C.;
Krishnamurthy, S.;
Blau, W.J.;
Green, M.L.H.;
Vengust, D.;
Dvorsek, D.;
Mihailovic, D.
et al.
Source:
Eireann Cosgriff
via
Scopus - Elsevier
Radiation Physics and Chemistry
2006
|
Journal article
EID:
2-s2.0-33750181833
Contributors:
Witte, C.;
Chantler, C.T.;
Cosgriff, E.C.;
Tran, C.Q.
Source:
Eireann Cosgriff
via
Scopus - Elsevier
Journal of Physics: Conference Series
2006
|
Conference paper
EID:
2-s2.0-33644522348
Contributors:
Cosgriff, E.C.;
Nicolosi, V.;
Coleman, J.N.;
Nellist, P.D.
Source:
Eireann Cosgriff
via
Scopus - Elsevier
Journal of Physics: Conference Series
2006
|
Conference paper
EID:
2-s2.0-33644537022
Contributors:
Cosgriff, E.C.;
Oxley, M.P.;
Allen, L.J.;
Pennycook, S.J.
Source:
Eireann Cosgriff
via
Scopus - Elsevier
Microscopy and Microanalysis
2006
|
Conference paper
EID:
2-s2.0-33750891841
Contributors:
Nellist, P.D.;
Cosgriff, E.C.;
Nicolosi, V.;
Coleman, J.N.
Source:
Eireann Cosgriff
via
Scopus - Elsevier
Physics Letters, Section A: General, Atomic and Solid State Physics
2005
|
Journal article
EID:
2-s2.0-21744450732
Contributors:
Cosgriff, E.C.;
Chantler, C.T.;
Witte, C.;
Smale, L.F.;
Tran, C.Q.
Source:
Eireann Cosgriff
via
Scopus - Elsevier
Physical Review Letters
2005
|
Journal article
EID:
2-s2.0-33244481540
Contributors:
Oxley, M.P.;
Cosgriff, E.C.;
Allen, L.J.
Source:
Eireann Cosgriff
via
Scopus - Elsevier
Ultramicroscopy
2005
|
Journal article
EID:
2-s2.0-13444270656
Contributors:
Cosgriff, E.C.;
Oxley, M.P.;
Allen, L.J.;
Pennycook, S.J.
Source:
Eireann Cosgriff
via
Scopus - Elsevier
EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany
Other
Contributors:
P. D. Nellist;
E. C. Cosgriff;
P. B. Hirsch;
D. J. H. Cockayne
Source:
Eireann Cosgriff
via
Crossref Metadata Search
EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany
Other
Contributors:
P. D. Nellist;
E. C. Cosgriff;
G. Behan;
A. I. Kirkland;
A. J. D’Alfonso;
S. D. Findlay;
L. J. Allen
Source:
Eireann Cosgriff
via
Crossref Metadata Search