Personal information
Activities
Employment (2)
2023-10
to
present
|
Technical Specialist (SEM/FIB)
(Faculty of Science and Engineering)
Employment
Source:
Thomas O'Hanlon
2019-11
to
2023-10
|
Technical Specialist (Electron Microscopy)
(Plymouth Electron Microscopy Centre)
Employment
Source:
Thomas O'Hanlon
Education and qualifications (2)
PhD: Development of Multi-Microscopy Techniques for the Characterisation of Nitride Semiconductors
(Materials Science & Metallurgy)
Education
Source:
Thomas O'Hanlon
MSci
(Materials Science and Metallurgy)
Education
Source:
Thomas O'Hanlon
Works (10)
Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
2024
|
Journal article
EID:
2-s2.0-85191899921
Contributors:
Sarkar, M.;
Adams, F.;
Dar, S.A.;
Penn, J.;
Ji, Y.;
Gundimeda, A.;
Zhu, T.;
Liu, C.;
Hirshy, H.;
Massabuau, F.C.P.
et al.
Source:
Thomas O'Hanlon
via
Scopus - Elsevier
Japanese Journal of Applied Physics
2023-06-01
|
Journal article
Contributors:
Fabien C.-P. Massabuau;
Francesca Adams;
David Nicol;
John C. Jarman;
Martin Frentrup;
Joseph W. Roberts;
Thomas J. O’Hanlon;
Andras Kovács;
Paul R. Chalker;
R. A. Oliver
Source:
check_circle
Crossref
Ultramicroscopy
2021
|
Journal article
EID:
2-s2.0-85103029723
Contributors:
O'Hanlon, T.J.;
Massabuau, F.C.-P.;
Bao, A.;
Kappers, M.J.;
Oliver, R.A.
Source:
Thomas O'Hanlon
via
Scopus - Elsevier
Ultramicroscopy
2021
|
Journal article
EID:
2-s2.0-85103702352
Contributors:
O'Hanlon, T.J.;
Zhu, T.;
Massabuau, F.C.-P.;
Oliver, R.A.
Source:
Thomas O'Hanlon
via
Scopus - Elsevier
Ultramicroscopy
2020
|
Journal article
EID:
2-s2.0-85080050065
Contributors:
O'Hanlon, T.J.;
Bao, A.;
Massabuau, F.C.-P.;
Kappers, M.J.;
Oliver, R.A.
Source:
Thomas O'Hanlon
via
Scopus - Elsevier
Proceedings of SPIE - The International Society for Optical Engineering
2018
|
Conference paper
EID:
2-s2.0-85047822779
Contributors:
Massabuau, F.C.;
Chen, P.;
Rhode, S.L.;
Horton, M.K.;
O'Hanlon, T.J.;
Kovács, A.;
Zielinski, M.S.;
Kappers, M.J.;
Dunin-Borkowski, R.E.;
Humphreys, C.J.
et al.
Source:
Thomas O'Hanlon
via
Scopus - Elsevier
Microscopy and Microanalysis
2018-08
|
Journal article
Source:
Thomas O'Hanlon
Journal of Applied Physics
2017
|
Journal article
EID:
2-s2.0-85008512235
Contributors:
Massabuau, F.C.-P.;
Chen, P.;
Horton, M.K.;
Rhode, S.L.;
Ren, C.X.;
O'Hanlon, T.J.;
Kovács, A.;
Kappers, M.J.;
Humphreys, C.J.;
Dunin-Borkowski, R.E.
et al.
Source:
Thomas O'Hanlon
via
Scopus - Elsevier
Nano Letters
2017
|
Journal article
EID:
2-s2.0-85027230973
Contributors:
Massabuau, F.C.-P.;
Rhode, S.L.;
Horton, M.K.;
O'Hanlon, T.J.;
Kovács, A.;
Zielinski, M.S.;
Kappers, M.J.;
Dunin-Borkowski, R.E.;
Humphreys, C.J.;
Oliver, R.A.
Source:
Thomas O'Hanlon
via
Scopus - Elsevier
Physica Status Solidi (B) Basic Research
2016
|
Journal article
EID:
2-s2.0-84949936532
Contributors:
Springbett, H.;
Griffiths, J.;
Ren, C.;
O'Hanlon, T.;
Barnard, J.;
Sahonta, S.-L.;
Zhu, T.;
Oliver, R.
Source:
Thomas O'Hanlon
via
Scopus - Elsevier